JPS5572806A - Contour display unit - Google Patents
Contour display unitInfo
- Publication number
- JPS5572806A JPS5572806A JP14650178A JP14650178A JPS5572806A JP S5572806 A JPS5572806 A JP S5572806A JP 14650178 A JP14650178 A JP 14650178A JP 14650178 A JP14650178 A JP 14650178A JP S5572806 A JPS5572806 A JP S5572806A
- Authority
- JP
- Japan
- Prior art keywords
- image
- stripes
- observed
- display unit
- contour display
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000003287 optical effect Effects 0.000 abstract 1
Landscapes
- Length Measuring Devices By Optical Means (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14650178A JPS5572806A (en) | 1978-11-29 | 1978-11-29 | Contour display unit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14650178A JPS5572806A (en) | 1978-11-29 | 1978-11-29 | Contour display unit |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5572806A true JPS5572806A (en) | 1980-06-02 |
| JPS6138401B2 JPS6138401B2 (enrdf_load_stackoverflow) | 1986-08-29 |
Family
ID=15409046
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP14650178A Granted JPS5572806A (en) | 1978-11-29 | 1978-11-29 | Contour display unit |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5572806A (enrdf_load_stackoverflow) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002090261A (ja) * | 2000-09-13 | 2002-03-27 | Hitachi Chem Co Ltd | モアレ縞の測定方法、フィルムの製造方法、およびモアレ縞の測定を行なうためのプログラムを格納する記録媒体 |
| JP2006058092A (ja) * | 2004-08-18 | 2006-03-02 | Fuji Xerox Co Ltd | 3次元形状測定装置および方法 |
| JP2016535278A (ja) * | 2013-09-10 | 2016-11-10 | ビ−エイイ− システムズ パブリック リミテッド カンパニ−BAE SYSTEMS plc | 光学的な表面粗さ測定 |
-
1978
- 1978-11-29 JP JP14650178A patent/JPS5572806A/ja active Granted
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002090261A (ja) * | 2000-09-13 | 2002-03-27 | Hitachi Chem Co Ltd | モアレ縞の測定方法、フィルムの製造方法、およびモアレ縞の測定を行なうためのプログラムを格納する記録媒体 |
| JP2006058092A (ja) * | 2004-08-18 | 2006-03-02 | Fuji Xerox Co Ltd | 3次元形状測定装置および方法 |
| JP2016535278A (ja) * | 2013-09-10 | 2016-11-10 | ビ−エイイ− システムズ パブリック リミテッド カンパニ−BAE SYSTEMS plc | 光学的な表面粗さ測定 |
| US9976850B2 (en) | 2013-09-10 | 2018-05-22 | Bae Systems Plc | Optical surface roughness measurement |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6138401B2 (enrdf_load_stackoverflow) | 1986-08-29 |
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