JPS5545247U - - Google Patents
Info
- Publication number
- JPS5545247U JPS5545247U JP12803578U JP12803578U JPS5545247U JP S5545247 U JPS5545247 U JP S5545247U JP 12803578 U JP12803578 U JP 12803578U JP 12803578 U JP12803578 U JP 12803578U JP S5545247 U JPS5545247 U JP S5545247U
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Thyristors (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12803578U JPS5545247U (ja) | 1978-09-20 | 1978-09-20 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12803578U JPS5545247U (ja) | 1978-09-20 | 1978-09-20 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5545247U true JPS5545247U (ja) | 1980-03-25 |
Family
ID=29091339
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP12803578U Pending JPS5545247U (ja) | 1978-09-20 | 1978-09-20 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5545247U (ja) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5976888U (ja) * | 1982-11-16 | 1984-05-24 | サンデン株式会社 | 熱交換器 |
| WO2004109306A1 (ja) * | 2003-06-09 | 2004-12-16 | Tokyo Electron Limited | 被検査体の電気的特性を検査する検査方法及び検査装置 |
| JP2012023229A (ja) * | 2010-07-15 | 2012-02-02 | Mitsubishi Electric Corp | 半導体素子の特性測定方法および半導体装置の製造方法 |
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1978
- 1978-09-20 JP JP12803578U patent/JPS5545247U/ja active Pending
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5976888U (ja) * | 1982-11-16 | 1984-05-24 | サンデン株式会社 | 熱交換器 |
| WO2004109306A1 (ja) * | 2003-06-09 | 2004-12-16 | Tokyo Electron Limited | 被検査体の電気的特性を検査する検査方法及び検査装置 |
| JP2012023229A (ja) * | 2010-07-15 | 2012-02-02 | Mitsubishi Electric Corp | 半導体素子の特性測定方法および半導体装置の製造方法 |