JPS55151738A - Electron gun - Google Patents
Electron gunInfo
- Publication number
- JPS55151738A JPS55151738A JP6081379A JP6081379A JPS55151738A JP S55151738 A JPS55151738 A JP S55151738A JP 6081379 A JP6081379 A JP 6081379A JP 6081379 A JP6081379 A JP 6081379A JP S55151738 A JPS55151738 A JP S55151738A
- Authority
- JP
- Japan
- Prior art keywords
- central electrode
- insulator
- electrode
- dislocate
- electron beam
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000012212 insulator Substances 0.000 abstract 3
- 238000010894 electron beam technology Methods 0.000 abstract 2
- 238000010438 heat treatment Methods 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
- H01J37/06—Electron sources; Electron guns
- H01J37/067—Replacing parts of guns; Mutual adjustment of electrodes
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Electron Sources, Ion Sources (AREA)
- Solid Thermionic Cathode (AREA)
Abstract
PURPOSE:To maintain a stable electron beam for a long period of time by providing a concentrically cylindrical external electrode through an insulator on the periphery of a central electrode supporting a cathode and a heating element. CONSTITUTION:An insulator 26 and an external electrode 31 are closely and concentrically provided at a place where a central electrode 23 is centered. Since the central electrode 23 does not dislocate horizontally, although often dislocate vertically due to the thermal expansion of each part, electron beam can be stably emitted for a long period of time because no shifting of the central electrode 23 from the center of a Wehnelt opening 6 occurs. Also, the position of the central electrode 23 can be automatically regulted by means of the insulator 26.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP54060813A JPS6025857B2 (en) | 1979-05-17 | 1979-05-17 | electron gun |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP54060813A JPS6025857B2 (en) | 1979-05-17 | 1979-05-17 | electron gun |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS55151738A true JPS55151738A (en) | 1980-11-26 |
JPS6025857B2 JPS6025857B2 (en) | 1985-06-20 |
Family
ID=13153156
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP54060813A Expired JPS6025857B2 (en) | 1979-05-17 | 1979-05-17 | electron gun |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6025857B2 (en) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2414856A (en) * | 2004-06-03 | 2005-12-07 | Nanobeam Ltd | Charged particle beam gun |
US8159118B2 (en) | 2005-11-02 | 2012-04-17 | United Technologies Corporation | Electron gun |
DE102010049062A1 (en) * | 2010-10-20 | 2012-04-26 | Volodymyr Granovskyy | Device for visual control of position adjustment of cathode of electron gun of electron microscope e.g. scanning microscope, has glasses with diametrically arranged apertures formed corresponding to cathode in working position |
JP6422561B1 (en) * | 2017-09-04 | 2018-11-14 | 国家納米科学中心 | Filament positioning system and filament positioning method |
US10636617B2 (en) | 2016-09-07 | 2020-04-28 | Paton Turbine Technologies Llc | Axial electron gun |
-
1979
- 1979-05-17 JP JP54060813A patent/JPS6025857B2/en not_active Expired
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2414856A (en) * | 2004-06-03 | 2005-12-07 | Nanobeam Ltd | Charged particle beam gun |
GB2414856B (en) * | 2004-06-03 | 2008-11-12 | Nanobeam Ltd | Charged particle gun |
US7855373B2 (en) | 2004-06-03 | 2010-12-21 | Nanobeam Limited | Charged particle gun |
US8159118B2 (en) | 2005-11-02 | 2012-04-17 | United Technologies Corporation | Electron gun |
DE102010049062A1 (en) * | 2010-10-20 | 2012-04-26 | Volodymyr Granovskyy | Device for visual control of position adjustment of cathode of electron gun of electron microscope e.g. scanning microscope, has glasses with diametrically arranged apertures formed corresponding to cathode in working position |
US10636617B2 (en) | 2016-09-07 | 2020-04-28 | Paton Turbine Technologies Llc | Axial electron gun |
JP6422561B1 (en) * | 2017-09-04 | 2018-11-14 | 国家納米科学中心 | Filament positioning system and filament positioning method |
Also Published As
Publication number | Publication date |
---|---|
JPS6025857B2 (en) | 1985-06-20 |
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