JPS5514899U - - Google Patents
Info
- Publication number
- JPS5514899U JPS5514899U JP1979112893U JP11289379U JPS5514899U JP S5514899 U JPS5514899 U JP S5514899U JP 1979112893 U JP1979112893 U JP 1979112893U JP 11289379 U JP11289379 U JP 11289379U JP S5514899 U JPS5514899 U JP S5514899U
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
- H03K5/22—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral
- H03K5/26—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral the characteristic being duration, interval, position, frequency, or sequence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
- G01R19/16533—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application
- G01R19/16557—Logic probes, i.e. circuits indicating logic state (high, low, O)
Landscapes
- Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US05/585,423 US4016492A (en) | 1975-06-09 | 1975-06-09 | Pulse discriminator and misprobe detector for digital logic tester probe |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5514899U true JPS5514899U (US06653308-20031125-C00197.png) | 1980-01-30 |
Family
ID=24341371
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP51065459A Pending JPS51146142A (en) | 1975-06-09 | 1976-06-04 | Logical circuit tester |
| JP1979112893U Pending JPS5514899U (US06653308-20031125-C00197.png) | 1975-06-09 | 1979-08-16 |
Family Applications Before (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP51065459A Pending JPS51146142A (en) | 1975-06-09 | 1976-06-04 | Logical circuit tester |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US4016492A (US06653308-20031125-C00197.png) |
| JP (2) | JPS51146142A (US06653308-20031125-C00197.png) |
| CA (1) | CA1060100A (US06653308-20031125-C00197.png) |
Families Citing this family (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5370893A (en) * | 1976-12-07 | 1978-06-23 | Oki Electric Ind Co Ltd | Buoyancy apparatus of buoy |
| US4390837A (en) * | 1980-08-25 | 1983-06-28 | Kevin Hotvedt | Test unit for a logic circuit analyzer |
| US4634971A (en) * | 1982-09-30 | 1987-01-06 | Ford Motor Company | Portable hand-held voltage sensor with manually adjustable reference voltage for comparison with sensed voltage |
| US4646002A (en) * | 1984-05-10 | 1987-02-24 | Regents Of The University Of Minnesota | Circuit for high impedance broad band probe |
| JPS61193081A (ja) * | 1985-02-22 | 1986-08-27 | Hitachi Ltd | Ｉｃ回路のテスト装置 |
| US4779042A (en) * | 1986-12-23 | 1988-10-18 | Grumman Aerospace Corporation | Computer-aided probe with tri-state circuitry test capability |
| US4743842A (en) * | 1987-03-11 | 1988-05-10 | Grumman Aerospace Corporation | Tri-state circuit tester |
| US5321701A (en) * | 1990-12-06 | 1994-06-14 | Teradyne, Inc. | Method and apparatus for a minimal memory in-circuit digital tester |
| US5196789A (en) * | 1991-01-28 | 1993-03-23 | Golden Joseph R | Coaxial spring contact probe |
| CA2360031C (en) * | 2000-10-30 | 2006-06-20 | Thomas & Betts International, Inc. | Capacitive test point voltage and phasing detector |
| US6970001B2 (en) * | 2003-02-20 | 2005-11-29 | Hewlett-Packard Development Company, L.P. | Variable impedance test probe |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5245453U (US06653308-20031125-C00197.png) * | 1975-09-27 | 1977-03-31 |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3500369A (en) * | 1966-06-27 | 1970-03-10 | Singer General Precision | Pulse width error detector |
| US3753109A (en) * | 1971-03-08 | 1973-08-14 | Smith Kline French Lab | Peak detector |
-
1975
- 1975-06-09 US US05/585,423 patent/US4016492A/en not_active Expired - Lifetime
-
1976
- 1976-04-29 CA CA251,436A patent/CA1060100A/en not_active Expired
- 1976-06-04 JP JP51065459A patent/JPS51146142A/ja active Pending
-
1979
- 1979-08-16 JP JP1979112893U patent/JPS5514899U/ja active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5245453U (US06653308-20031125-C00197.png) * | 1975-09-27 | 1977-03-31 |
Also Published As
| Publication number | Publication date |
|---|---|
| US4016492A (en) | 1977-04-05 |
| CA1060100A (en) | 1979-08-07 |
| JPS51146142A (en) | 1976-12-15 |
