JPS55140168A - Inspection system - Google Patents

Inspection system

Info

Publication number
JPS55140168A
JPS55140168A JP4765979A JP4765979A JPS55140168A JP S55140168 A JPS55140168 A JP S55140168A JP 4765979 A JP4765979 A JP 4765979A JP 4765979 A JP4765979 A JP 4765979A JP S55140168 A JPS55140168 A JP S55140168A
Authority
JP
Japan
Prior art keywords
circuit
inspection
state
inspected
transistor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP4765979A
Other languages
Japanese (ja)
Inventor
Kiyoaki Nakayama
Hiroshi Ozawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP4765979A priority Critical patent/JPS55140168A/en
Publication of JPS55140168A publication Critical patent/JPS55140168A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE: To simplify the construction of the circuit by providing an inspection circuit commonly used in items to be inspected and comparing each piece of information in normal states memorized beforehand individually for the items to be inspected with the results of the inspection.
CONSTITUTION: The contact 3 of a pass selection relay PSR is closed by a drive timing signal from a control part 10, and, at the same time, the transistor Q of a drive circuit 1 is turned on to excite a switch magnet 4. At this time, when the transistor is in normal state, -48V is supplied from a drive line 2 to an inspection circuit 9 via a protective circuit 6, and when the transistor Q is in off-state, the ground becomes an input of the circuit 9 via magnet 4, contact 3, drive line 2 and a circuit 6. Accordingly, at the time of on-state inspection, when the circuit 1 operate normally, the inspection output signal A becomes an "L" level. If the memorized information pieces of the items to be on-state-inspected are in "L" levels, the values obtained by the comparison coincide to each other, and therefore it is determined that the result of the inspection is satisfactory. By these procedures, the construction of the circuit can be simplified.
COPYRIGHT: (C)1980,JPO&Japio
JP4765979A 1979-04-18 1979-04-18 Inspection system Pending JPS55140168A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4765979A JPS55140168A (en) 1979-04-18 1979-04-18 Inspection system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4765979A JPS55140168A (en) 1979-04-18 1979-04-18 Inspection system

Publications (1)

Publication Number Publication Date
JPS55140168A true JPS55140168A (en) 1980-11-01

Family

ID=12781376

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4765979A Pending JPS55140168A (en) 1979-04-18 1979-04-18 Inspection system

Country Status (1)

Country Link
JP (1) JPS55140168A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01225996A (en) * 1988-03-07 1989-09-08 Hitachi Ltd Display device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01225996A (en) * 1988-03-07 1989-09-08 Hitachi Ltd Display device

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