JPS55109902A - Oblique image pickup correction system of subject size measuring instrument - Google Patents
Oblique image pickup correction system of subject size measuring instrumentInfo
- Publication number
- JPS55109902A JPS55109902A JP1600779A JP1600779A JPS55109902A JP S55109902 A JPS55109902 A JP S55109902A JP 1600779 A JP1600779 A JP 1600779A JP 1600779 A JP1600779 A JP 1600779A JP S55109902 A JPS55109902 A JP S55109902A
- Authority
- JP
- Japan
- Prior art keywords
- subject
- screen
- bright lines
- measuring instrument
- displaying
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Image Analysis (AREA)
- Inking, Control Or Cleaning Of Printing Machines (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Image Processing (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1600779A JPS55109902A (en) | 1979-02-16 | 1979-02-16 | Oblique image pickup correction system of subject size measuring instrument |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1600779A JPS55109902A (en) | 1979-02-16 | 1979-02-16 | Oblique image pickup correction system of subject size measuring instrument |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS55109902A true JPS55109902A (en) | 1980-08-23 |
| JPS6125081B2 JPS6125081B2 (enrdf_load_stackoverflow) | 1986-06-13 |
Family
ID=11904534
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1600779A Granted JPS55109902A (en) | 1979-02-16 | 1979-02-16 | Oblique image pickup correction system of subject size measuring instrument |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS55109902A (enrdf_load_stackoverflow) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61116606A (ja) * | 1984-11-12 | 1986-06-04 | Hitachi Ltd | 測長装置 |
| WO1994024518A1 (en) * | 1993-04-21 | 1994-10-27 | Omron Corporation | Visual inspection support apparatus, substrate inspection apparatus, and soldering inspection and correction methods using the same apparatuses |
| KR100324182B1 (ko) * | 1999-11-03 | 2002-02-16 | 김윤수 | 영상측정방법 및 장치 |
-
1979
- 1979-02-16 JP JP1600779A patent/JPS55109902A/ja active Granted
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61116606A (ja) * | 1984-11-12 | 1986-06-04 | Hitachi Ltd | 測長装置 |
| WO1994024518A1 (en) * | 1993-04-21 | 1994-10-27 | Omron Corporation | Visual inspection support apparatus, substrate inspection apparatus, and soldering inspection and correction methods using the same apparatuses |
| US6362877B1 (en) | 1993-04-21 | 2002-03-26 | Omron Corporation | Visual inspection supporting apparatus and printed circuit board inspecting apparatus, and methods of soldering inspection and correction using the apparatuses |
| KR100324182B1 (ko) * | 1999-11-03 | 2002-02-16 | 김윤수 | 영상측정방법 및 장치 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6125081B2 (enrdf_load_stackoverflow) | 1986-06-13 |
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