JPS5340574A - Method of correcting missed count for radiation measuring apparatus - Google Patents
Method of correcting missed count for radiation measuring apparatusInfo
- Publication number
- JPS5340574A JPS5340574A JP11497076A JP11497076A JPS5340574A JP S5340574 A JPS5340574 A JP S5340574A JP 11497076 A JP11497076 A JP 11497076A JP 11497076 A JP11497076 A JP 11497076A JP S5340574 A JPS5340574 A JP S5340574A
- Authority
- JP
- Japan
- Prior art keywords
- correcting
- measuring apparatus
- radiation measuring
- missed count
- missed
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Measurement Of Radiation (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11497076A JPS5340574A (en) | 1976-09-25 | 1976-09-25 | Method of correcting missed count for radiation measuring apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11497076A JPS5340574A (en) | 1976-09-25 | 1976-09-25 | Method of correcting missed count for radiation measuring apparatus |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5340574A true JPS5340574A (en) | 1978-04-13 |
| JPS5637512B2 JPS5637512B2 (enrdf_load_stackoverflow) | 1981-09-01 |
Family
ID=14651125
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP11497076A Granted JPS5340574A (en) | 1976-09-25 | 1976-09-25 | Method of correcting missed count for radiation measuring apparatus |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5340574A (enrdf_load_stackoverflow) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2012160881A1 (ja) * | 2011-05-20 | 2012-11-29 | 株式会社リガク | 波長分散型蛍光x線分析装置 |
| JP2013246096A (ja) * | 2012-05-28 | 2013-12-09 | Sharp Corp | 線量計、プログラムおよび記録媒体 |
| WO2023017866A1 (ja) * | 2021-08-13 | 2023-02-16 | 株式会社堀場製作所 | 信号処理方法、信号処理装置、放射線検出装置、及びコンピュータプログラム |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2012007899A (ja) * | 2010-06-22 | 2012-01-12 | Mitsubishi Electric Corp | 放射線測定装置 |
| JP5171891B2 (ja) * | 2010-07-01 | 2013-03-27 | 三菱電機株式会社 | 放射線測定装置 |
-
1976
- 1976-09-25 JP JP11497076A patent/JPS5340574A/ja active Granted
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2012160881A1 (ja) * | 2011-05-20 | 2012-11-29 | 株式会社リガク | 波長分散型蛍光x線分析装置 |
| JP2012242285A (ja) * | 2011-05-20 | 2012-12-10 | Rigaku Corp | 波長分散型蛍光x線分析装置 |
| US8774356B2 (en) | 2011-05-20 | 2014-07-08 | Rigaku Corporation | Wavelength dispersive X-ray fluorescence spectrometer |
| JP2013246096A (ja) * | 2012-05-28 | 2013-12-09 | Sharp Corp | 線量計、プログラムおよび記録媒体 |
| WO2023017866A1 (ja) * | 2021-08-13 | 2023-02-16 | 株式会社堀場製作所 | 信号処理方法、信号処理装置、放射線検出装置、及びコンピュータプログラム |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5637512B2 (enrdf_load_stackoverflow) | 1981-09-01 |
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