JPS5243066B2 - - Google Patents

Info

Publication number
JPS5243066B2
JPS5243066B2 JP49059420A JP5942074A JPS5243066B2 JP S5243066 B2 JPS5243066 B2 JP S5243066B2 JP 49059420 A JP49059420 A JP 49059420A JP 5942074 A JP5942074 A JP 5942074A JP S5243066 B2 JPS5243066 B2 JP S5243066B2
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP49059420A
Other languages
Japanese (ja)
Other versions
JPS5029167A (https=
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPS5029167A publication Critical patent/JPS5029167A/ja
Publication of JPS5243066B2 publication Critical patent/JPS5243066B2/ja
Expired legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P14/00Formation of materials, e.g. in the shape of layers or pillars
    • H10P14/60Formation of materials, e.g. in the shape of layers or pillars of insulating materials
    • H10P14/63Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by the formation processes
    • H10P14/6302Non-deposition formation processes
    • H10P14/6304Formation by oxidation, e.g. oxidation of the substrate
    • H10P14/6306Formation by oxidation, e.g. oxidation of the substrate of the semiconductor materials
    • H10P14/6308Formation by oxidation, e.g. oxidation of the substrate of the semiconductor materials of Group IV semiconductors
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S438/00Semiconductor device manufacturing: process
    • Y10S438/934Sheet resistance, i.e. dopant parameters

Landscapes

  • Formation Of Insulating Films (AREA)
  • Electrodes Of Semiconductors (AREA)
JP49059420A 1973-06-28 1974-05-28 Expired JPS5243066B2 (https=)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US374426A US3874920A (en) 1973-06-28 1973-06-28 Boron silicide method for making thermally oxidized boron doped poly-crystalline silicon having minimum resistivity

Publications (2)

Publication Number Publication Date
JPS5029167A JPS5029167A (https=) 1975-03-25
JPS5243066B2 true JPS5243066B2 (https=) 1977-10-28

Family

ID=23476767

Family Applications (1)

Application Number Title Priority Date Filing Date
JP49059420A Expired JPS5243066B2 (https=) 1973-06-28 1974-05-28

Country Status (6)

Country Link
US (1) US3874920A (https=)
JP (1) JPS5243066B2 (https=)
CA (1) CA1027025A (https=)
DE (1) DE2430859C3 (https=)
FR (1) FR2234921B1 (https=)
GB (1) GB1455949A (https=)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IT1089298B (it) * 1977-01-17 1985-06-18 Mostek Corp Procedimento per fabbricare un dispositivo semiconduttore
US4381213A (en) * 1980-12-15 1983-04-26 Motorola, Inc. Partial vacuum boron diffusion process
US4356211A (en) * 1980-12-19 1982-10-26 International Business Machines Corporation Forming air-dielectric isolation regions in a monocrystalline silicon substrate by differential oxidation of polysilicon
US5213670A (en) * 1989-06-30 1993-05-25 Siemens Aktiengesellschaft Method for manufacturing a polycrystalline layer on a substrate
JP3119190B2 (ja) * 1997-01-24 2000-12-18 日本電気株式会社 半導体装置の製造方法
DE102007010563A1 (de) * 2007-02-22 2008-08-28 IHP GmbH - Innovations for High Performance Microelectronics/Institut für innovative Mikroelektronik Selektives Wachstum von polykristallinem siliziumhaltigen Halbleitermaterial auf siliziumhaltiger Halbleiteroberfläche

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1245335B (de) * 1964-06-26 1967-07-27 Siemens Ag Verfahren zur Herstellung einkristalliner, homogen bordotierter, insbesondere aus Silicium oder Germanium bestehender Aufwachsschichten auf einkristallinen Grundkoerpern
GB699545A (en) * 1966-09-08 1953-11-11 Harold Stuart Hallewell Improvements in forming means for profile grinding wheels
US3558374A (en) * 1968-01-15 1971-01-26 Ibm Polycrystalline film having controlled grain size and method of making same
US3765940A (en) * 1971-11-08 1973-10-16 Texas Instruments Inc Vacuum evaporated thin film resistors

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
SEMICONDUCTOR SILICON=1973US *

Also Published As

Publication number Publication date
CA1027025A (en) 1978-02-28
FR2234921B1 (https=) 1976-06-25
DE2430859A1 (de) 1975-01-09
US3874920A (en) 1975-04-01
JPS5029167A (https=) 1975-03-25
FR2234921A1 (https=) 1975-01-24
GB1455949A (en) 1976-11-17
DE2430859C3 (de) 1981-10-22
DE2430859B2 (de) 1980-12-04

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