JPS3824164B1 - - Google Patents
Info
- Publication number
- JPS3824164B1 JPS3824164B1 JP3121660A JP3121660A JPS3824164B1 JP S3824164 B1 JPS3824164 B1 JP S3824164B1 JP 3121660 A JP3121660 A JP 3121660A JP 3121660 A JP3121660 A JP 3121660A JP S3824164 B1 JPS3824164 B1 JP S3824164B1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2607—Circuits therefor
- G01R31/2608—Circuits therefor for testing bipolar transistors
- G01R31/2614—Circuits therefor for testing bipolar transistors for measuring gain factor thereof
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CA665762T | |||
| US827837A US3056924A (en) | 1959-07-17 | 1959-07-17 | Null-type transistor beta measuring set |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS3824164B1 true JPS3824164B1 (US07696358-20100413-C00002.png) | 1963-11-13 |
Family
ID=75362665
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP3121660A Pending JPS3824164B1 (US07696358-20100413-C00002.png) | 1959-07-17 | 1960-07-15 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US3056924A (US07696358-20100413-C00002.png) |
| JP (1) | JPS3824164B1 (US07696358-20100413-C00002.png) |
| CA (1) | CA665762A (US07696358-20100413-C00002.png) |
| GB (1) | GB952623A (US07696358-20100413-C00002.png) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3287643A (en) * | 1963-04-08 | 1966-11-22 | American Electronic Lab | Method and apparatus for measuring the beta parameter of an in-circuit transistor without the application of d. c. biasing thereto |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2847645A (en) * | 1955-11-23 | 1958-08-12 | Bell Telephone Labor Inc | Null-type transistor alpha measuring set |
| US2946008A (en) * | 1958-10-31 | 1960-07-19 | Heinz E Kallmann | Current gain measuring device |
-
0
- CA CA665762A patent/CA665762A/en not_active Expired
-
1959
- 1959-07-17 US US827837A patent/US3056924A/en not_active Expired - Lifetime
-
1960
- 1960-06-29 GB GB22711/60A patent/GB952623A/en not_active Expired
- 1960-07-15 JP JP3121660A patent/JPS3824164B1/ja active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| CA665762A (en) | 1963-06-25 |
| US3056924A (en) | 1962-10-02 |
| GB952623A (en) | 1964-03-18 |
