JPH11241155A - Sealing member and vacuum device - Google Patents

Sealing member and vacuum device

Info

Publication number
JPH11241155A
JPH11241155A JP10046504A JP4650498A JPH11241155A JP H11241155 A JPH11241155 A JP H11241155A JP 10046504 A JP10046504 A JP 10046504A JP 4650498 A JP4650498 A JP 4650498A JP H11241155 A JPH11241155 A JP H11241155A
Authority
JP
Japan
Prior art keywords
sealing
ring
resistant polymer
vacuum
chamber
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP10046504A
Other languages
Japanese (ja)
Inventor
Masanori Ono
真徳 小野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Applied Materials Inc
Original Assignee
Applied Materials Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Applied Materials Inc filed Critical Applied Materials Inc
Priority to JP10046504A priority Critical patent/JPH11241155A/en
Priority to PCT/JP1999/000901 priority patent/WO1999044221A1/en
Publication of JPH11241155A publication Critical patent/JPH11241155A/en
Withdrawn legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67155Apparatus for manufacturing or treating in a plurality of work-stations
    • H01L21/67196Apparatus for manufacturing or treating in a plurality of work-stations characterized by the construction of the transfer chamber
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/56Apparatus specially adapted for continuous coating; Arrangements for maintaining the vacuum, e.g. vacuum locks
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67126Apparatus for sealing, encapsulating, glassing, decapsulating or the like
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67155Apparatus for manufacturing or treating in a plurality of work-stations
    • H01L21/6719Apparatus for manufacturing or treating in a plurality of work-stations characterized by the construction of the processing chambers, e.g. modular processing chambers

Abstract

PROBLEM TO BE SOLVED: To provide an air tight seal suitable for forming a high vacuum envi ronment and durable against the use at high temp. SOLUTION: The surface of an O-ring like sealant 401 is covered with a coating film of a heat resistant polymer. As the O-ring like sealant, a silicone rubber is used and as the heat resistant polymer, a polyimide is used. Vacuum seal free from the permeation of a light element such as hydrogen, helium and capable of being used at high temp. is obtained by using a sealing member composed of the O-ring like sealant and a covering member 402 of a heat resistant polymer, which has a center part and two legs extending from both end of the center part and receiving the sealant.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】この発明は、被処理物を減圧
下で処理する真空装置を気密にシールするためのシール
部材および、このシール部材を用いて気密にシールされ
た真空装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a sealing member for hermetically sealing a vacuum device for processing an object to be processed under reduced pressure, and a vacuum device hermetically sealed using the sealing member.

【0002】[0002]

【従来の技術】半導体装置、液晶表示装置などの製造過
程には、多数の成膜プロセスおよびパターン形成のため
のエッチングプロセスが含まれる。これらの成膜プロセ
スおよびエッチングプロセスは、減圧されたチャンバ内
で行われる。たとえば、成膜プロセスの代表例であるプ
ラズマ励起CVD、スパッタリング、イオンプレーティ
ング、真空蒸着は、いずれも減圧されたチャンバ内で行
われる。
2. Description of the Related Art Manufacturing processes of semiconductor devices, liquid crystal display devices and the like include a number of film forming processes and etching processes for forming patterns. These film forming processes and etching processes are performed in a reduced-pressure chamber. For example, plasma excitation CVD, sputtering, ion plating, and vacuum deposition, which are typical examples of the film forming process, are all performed in a reduced-pressure chamber.

【0003】これらの真空装置には単独のものおよび複
数のチャンバを連結したマルチチャンバのものがある。
いずれの装置も一般的には、装置への被処理物の取り入
れおよび取り出しを行うためのロードロック室を備えて
おり、ロードロック室の開口部を通して1枚または1組
の被処理物が大気の雰囲気からロードロック室に入れら
れる。開口部を閉じた後、ロードロック室が減圧されて
被処理物が大気から遮蔽される。この後、ロードロック
室の装置側の開閉可能なゲートから搬送用ロボットが被
処理物を1枚ずつ取り出して、成膜室、エッチング室な
どの予め高真空に排気されたチャンバに搬送する。
[0003] These vacuum devices include a single type and a multi-chamber type in which a plurality of chambers are connected.
Each of the apparatuses generally has a load lock chamber for taking in and taking out the object to be processed into the apparatus, and one or a set of the objects to be processed are discharged through the opening of the load lock chamber. It can be put into the road lock room from the atmosphere. After closing the opening, the load lock chamber is depressurized and the object to be processed is shielded from the atmosphere. Thereafter, the transfer robot takes out the objects to be processed one by one from the openable gate on the apparatus side of the load lock chamber and transports them to a chamber evacuated to a high vacuum in advance, such as a film formation chamber or an etching chamber.

【0004】このように単独のチャンバであるとマルチ
チャンバシステムであるとを問わず、多くのプロセス室
は、高真空に保たれ、汚染物の侵入があってはならない
から大気あるいは隣接するチャンバ(被処理物の搬送室
を含む)から気密にシールされねばならない。一方にお
いて成膜室、エッチング室などの内壁および内部の部品
には成膜する物質、エッチングされる物質、被処理物ま
たはターゲットから飛散する物質が付着し、これらの付
着物がプロセスの障害となることがあることから、かな
りの頻度で室内のクリーニングを行う必要がある。この
ため、特開平6−151365号公報に見られるように
チャンバのハウジングを上部と下部に分離可能な構造と
し、クリーニング時には上部を分離して内部のクリーニ
ングを実施することが行われている。また、特開平6−
60997号公報および特開平9−263944号公報
に見られるようにチャンバの上部を天板構造としてチャ
ンバの側壁に分離可能に固定し、クリーニング時には天
板をはずして内部のクリーニングを実施することが行わ
れている。このような分離可能なハウジング構造をとる
場合、上部と下部あるいは天板と側壁との接合部の間隙
にOリングを介在させて圧接し、気密にシールするよう
になっている。
[0004] Regardless of whether the chamber is a single chamber or a multi-chamber system, many process chambers are kept at a high vacuum and must be free from contaminants. (Including the transfer chamber of the workpiece) must be hermetically sealed. On the other hand, a substance to be deposited, a substance to be etched, a substance to be processed, or a substance scattered from a target adheres to inner walls and internal parts of the film formation chamber, the etching chamber, and the like, and these adhered substances hinder the process. Therefore, it is necessary to clean the room quite frequently. For this reason, as disclosed in Japanese Patent Application Laid-Open No. 6-151365, the housing of the chamber is structured to be separable into an upper portion and a lower portion, and at the time of cleaning, the upper portion is separated to clean the inside. In addition, Japanese Unexamined Patent Publication No.
As disclosed in Japanese Patent Application Laid-Open No. 60997 and Japanese Patent Application Laid-Open No. 9-263944, the upper portion of the chamber is fixed to the side wall of the chamber as a top plate structure so that the top plate is removed and the inside is cleaned at the time of cleaning. Have been done. When such a separable housing structure is adopted, an O-ring is interposed in a gap between an upper portion and a lower portion or a joint portion between a top plate and a side wall to press and seal air-tightly.

【0005】また、特開平6−60997号公報のもの
では、プラズマエッチング装置において、半導体ウェハ
を支持する静電チャックとベースとの間の間隙をOリン
グで気密にシールしている。
In Japanese Patent Application Laid-Open No. 6-60997, in a plasma etching apparatus, a gap between an electrostatic chuck supporting a semiconductor wafer and a base is hermetically sealed with an O-ring.

【0006】真空シール用のシール材としては、特開平
9ー263944号公報に見られるようにフッ素系ゴム
(製品名、バイトン)が広く使われているが、バイトン
シールは、使用に適した温度範囲が−20度Cから12
0度Cと狭く、たとえば300度Cのような高温での使
用には適さない。また、このバイトンを耐薬品性に優れ
たテフロンでコーティングしたシール材も用いられてい
る。この場合テフロン自体は200度Cの高温に耐えら
れるがバイトンが耐熱性に劣るために全体としては10
0数十度の温度にしか耐えることができない。200度
Cから250度Cの高温での使用に耐えられるシール材
としてシリコーンゴムのシール材がある。この発明の発
明者は、このシリコーンシール材は、細孔(ポア)を多
く含み、水素、ヘリウムなどの軽い元素を透過する性質
があり、高真空環境を作り出す上で問題となることを認
識した。
As a sealing material for a vacuum seal, a fluorine-based rubber (product name, Viton) is widely used as disclosed in Japanese Patent Application Laid-Open No. Hei 9-263944. Viton seal has a temperature suitable for use. Range from -20 degrees C to 12
It is as narrow as 0 ° C. and is not suitable for use at high temperatures such as 300 ° C. Further, a sealing material obtained by coating Viton with Teflon having excellent chemical resistance is also used. In this case, Teflon itself can withstand a high temperature of 200 ° C., but since Viton is inferior in heat resistance, 10% as a whole.
It can only withstand temperatures of a few tens of degrees. As a sealing material that can withstand use at a high temperature of 200 ° C. to 250 ° C., there is a sealing material made of silicone rubber. The inventor of the present invention has recognized that this silicone sealing material has many pores and has a property of transmitting light elements such as hydrogen and helium, which is a problem in creating a high vacuum environment. .

【0007】特開平8−325734号公報には、薄膜
形成装置においてゴム製のシール部材のゴムからの脱ガ
スがチャンバ内に侵入するのを防止するため、ゴムのO
リングを金属製のメタルリングでスプリング状に覆い、
チャンバ内部とゴムのOリングとをメタルリングで隔離
することが記載されている。シール部ではメタルリング
がチャンバの壁と蓋との間に挟まれてシールすることに
なるが、メタルは材質的に堅いため、接合部での接触面
積が小さく十分な機密性を確立する上で難点がある。ま
た、チャンバの接合部の材質をシール材の金属よりも堅
いものしなければならないため、ハウジングの設計に制
約を受けることになる。
Japanese Unexamined Patent Publication No. Hei 8-325734 discloses that in order to prevent degassing of rubber from a rubber sealing member in a thin film forming apparatus from entering a chamber, a rubber O member is used.
Cover the ring with a metal metal ring like a spring,
It is described that the inside of the chamber and the rubber O-ring are separated by a metal ring. In the seal part, a metal ring is sandwiched between the chamber wall and the lid to seal.However, since the metal is rigid in material, the contact area at the joint is small and it is necessary to establish sufficient confidentiality. There are difficulties. Further, since the material of the joint portion of the chamber must be harder than the metal of the sealing material, the design of the housing is restricted.

【0008】[0008]

【発明が解決しようとする課題】この発明は、高真空環
境を作るに適し、かつ高温での使用に耐える気密シール
を提供することを目的とする。
SUMMARY OF THE INVENTION An object of the present invention is to provide a hermetic seal suitable for creating a high vacuum environment and enduring use at high temperatures.

【0009】[0009]

【課題を解決するための手段】この発明の上記課題は、
次の手段によって解決される。すなわち、真空装置を気
密にシールするシール部材であって、Oリング状のシー
ル材と、このシール材の表面を被覆する耐熱性ポリマー
の皮膜と、からなるシール部材。
Means for Solving the Problems The object of the present invention is to provide:
It is solved by the following means. That is, a seal member for hermetically sealing a vacuum device, the seal member comprising an O-ring-shaped seal material and a heat-resistant polymer film covering the surface of the seal material.

【0010】また、この発明は、一面において次の構成
を備える。すなわち、被処理物を減圧下で処理する真空
装置であって、上記真空装置の間隙の少なくとも1つ
を、Oリング状のシール材を耐熱性ポリマーの皮膜で被
覆してなるシール部材で気密にシールした真空装置。
Further, the present invention has the following configuration in one aspect. That is, a vacuum device for processing an object to be processed under reduced pressure, wherein at least one of the gaps of the vacuum device is hermetically sealed by a sealing member obtained by coating an O-ring-shaped sealing material with a heat-resistant polymer film. Sealed vacuum equipment.

【0011】さらにこの発明は、一面において次の構成
を有する。すなわち、真空装置を気密にシールするシー
ル部材であって、Oリング状のシール材と、中央部およ
びこの中央部の両端から延びシール材を受け入れる2つ
の脚部を持つ耐熱性ポリマーのカバー部材と、を備え、
カバー部材に上記シール材をはめ込んだシール部材。
Further, the present invention has the following configuration in one aspect. That is, a sealing member for hermetically sealing a vacuum device, comprising an O-ring-shaped sealing member, and a heat-resistant polymer cover member having a central portion and two legs extending from both ends of the central portion and receiving the sealing member. ,
A sealing member in which the above-mentioned sealing material is fitted in a cover member.

【0012】この発明に従う真空装置は、次の構成をと
ることができる。すなわち、被処理物を減圧下で処理す
る真空装置であって、上記真空装置の間隙の少なくとも
1つを、上記シール部材で気密にシールした真空装置。
The vacuum apparatus according to the present invention can have the following configuration. That is, a vacuum apparatus for processing an object to be processed under reduced pressure, wherein at least one of the gaps of the vacuum apparatus is hermetically sealed with the sealing member.

【0013】上記Oリング状のシール材は耐熱性に優れ
たシリコーンゴムで構成するのが好ましい。上記耐熱性
ポリマーは、エンジニアリング・プラスチックとも呼ば
れ、代表的なものにポリイミド、ポリエーテルエーテル
ケトン、およびポリエーテルイミドがあり、ポリイミド
が最も一般的である。耐熱性ポリマーは、300度C以
上の高温に耐えることができるが、成型すると堅くなる
ので、単体としてシール材として使用するのには適さな
い。この耐熱性ポリマーをシリコーンゴムのシール材の
表面に数ミクロンから数十ミクロンの厚さでコーティン
グすると、シリコーンゴムの弾力性と耐熱性ポリマーの
耐熱性が相まって高温での使用に適したシール部材が得
られる。
The above-mentioned O-ring-shaped sealing material is preferably made of silicone rubber having excellent heat resistance. The heat-resistant polymer is also called engineering plastic, and typical examples include polyimide, polyetheretherketone, and polyetherimide, and polyimide is the most common. The heat-resistant polymer can withstand a high temperature of 300 ° C. or more, but becomes hard when molded, and is not suitable for use as a single body as a sealing material. When this heat-resistant polymer is coated on the surface of silicone rubber sealing material with a thickness of several microns to several tens of microns, the elasticity of silicone rubber and the heat resistance of heat-resistant polymer combine to create a sealing member suitable for use at high temperatures. can get.

【0014】この発明の一面によると、耐熱性ポリマー
のコーティングに代えて、耐熱性ポリマーを成型して作
ったカバー部材にシリコーンゴム製のOリング状のシー
ル材をはめ込んでシール部材を形成する。この構造のシ
ール部材は、耐熱性ポリマーのカバー部材の側が真空装
置の真空側になるよう真空装置に設置する。
According to one aspect of the present invention, instead of coating with a heat-resistant polymer, a seal member made of a silicone rubber is inserted into a cover member made of a heat-resistant polymer to form a seal member. The seal member having this structure is installed in a vacuum device such that the side of the heat-resistant polymer cover member is on the vacuum side of the vacuum device.

【0015】この発明のシール部材は、高温での使用に
耐えることができ、真空装置の間隙部で十分な接触を維
持し、気密にシールすることができる。シリコーンゴム
を透過した水素、ヘリウムなどの軽い元素は、耐熱性ポ
リマーの皮膜またはカバー部材によって真空装置への侵
入を阻止されるので高真空環境を作ることができる。
The sealing member of the present invention can withstand use at a high temperature, can maintain sufficient contact in the gap of the vacuum device, and can be hermetically sealed. Light elements such as hydrogen and helium that have passed through the silicone rubber are prevented from entering the vacuum device by the heat-resistant polymer film or cover member, so that a high vacuum environment can be created.

【0016】[0016]

【発明の実施の形態】次に図面を参照してこの発明の実
施の形態を説明する。図1は、被処理物である半導体ウ
ェハまたは液晶パネルの基板に対する成膜プロセスまた
はエッチングプロセスを実行するマルチチャンバ装置の
模型的な平面図である。この装置は、複数の基板を装置
に供給するためのカセットステーション5、複数のプロ
セスチャンバ1、2、3、4、およびカセットステーシ
ョンから基板をプロセスチャンバに移送するロボットを
備えた搬送室6からなる。
Embodiments of the present invention will now be described with reference to the drawings. FIG. 1 is a schematic plan view of a multi-chamber apparatus for executing a film forming process or an etching process on a semiconductor wafer or a liquid crystal panel substrate as an object to be processed. The apparatus comprises a cassette station 5 for supplying a plurality of substrates to the apparatus, a plurality of process chambers 1, 2, 3, 4, and a transfer chamber 6 provided with a robot for transferring the substrates from the cassette station to the process chamber. .

【0017】図2は、図1カセットステーション5、搬
送室6およびプロセスチャンバ3の関係を示す断面図で
ある。カセットステーション5は、複数の基板21を収
容したカセット22を装置に受け入れるためのチャンバ
である。カセットステーション5は、カセットが挿入さ
れた後に排気系57により排気され減圧される。所定の
圧力まで減圧されると、ゲート51が開かれ、排気系6
9によって予め高真空に維持されている搬送室6内のロ
ボット65が基板21を1枚ずつカセットステーション
5から取り出して予め高真空に維持されているプロセス
チャンバ1、2、3、4に搬送する。
FIG. 2 is a sectional view showing the relationship between the cassette station 5, the transfer chamber 6, and the process chamber 3 in FIG. The cassette station 5 is a chamber for receiving a cassette 22 containing a plurality of substrates 21 into the apparatus. The cassette station 5 is evacuated and depressurized by the exhaust system 57 after the cassette is inserted. When the pressure is reduced to a predetermined pressure, the gate 51 is opened and the exhaust system 6 is opened.
9, the robot 65 in the transfer chamber 6 maintained in a high vacuum in advance takes out the substrates 21 one by one from the cassette station 5 and transfers them to the process chambers 1, 2, 3 and 4 maintained in a high vacuum in advance. .

【0018】搬送室6は、天板61が搬送室6のハウジ
ング本体62から分離可能に取り付けられた構造になっ
ている。この天板61は、たとえば複数の固定ボルトに
よりハウジング本体62に取り付けられている。天板6
1とハウジング本体との間の間隙にはこの発明によるシ
ール部材63が設けられている。ロボット65の点検修
理、搬送室のクリーニングの時にはこの天板61がはず
される。
The transfer chamber 6 has a structure in which a top plate 61 is detachably attached to a housing body 62 of the transfer chamber 6. The top plate 61 is attached to the housing main body 62 by a plurality of fixing bolts, for example. Top plate 6
A seal member 63 according to the present invention is provided in a gap between the housing 1 and the housing body. When inspecting and repairing the robot 65 and cleaning the transfer chamber, the top plate 61 is removed.

【0019】プロセスチャンバ3は、排気系38に結合
されて高真空に維持されたスパッタ成膜室であり、搬送
室6から開閉するゲート66を通って搬入された基板2
1が支持台36に載置される。たとえばアルミニウムの
ターゲット37からたたき出されたアルミニウムが基板
上に堆積し、アルミニウムの薄膜が形成される。プロセ
スチャンバ3は、スパッタ成膜室に限られるものではな
く、真空蒸着室、プラズマ成膜室、CVD室、ドライエ
ッチング室、加熱室など減圧ないし真空状態で基板を収
容する任意のチャンバであってよい。
The process chamber 3 is a sputter film formation chamber connected to an exhaust system 38 and maintained at a high vacuum, and the substrate 2 loaded through a gate 66 opened and closed from the transfer chamber 6.
1 is placed on the support base 36. For example, aluminum blown out of the aluminum target 37 is deposited on the substrate to form an aluminum thin film. The process chamber 3 is not limited to a sputter deposition chamber, but may be any chamber that accommodates a substrate under reduced pressure or vacuum, such as a vacuum deposition chamber, a plasma deposition chamber, a CVD chamber, a dry etching chamber, and a heating chamber. Good.

【0020】このプロセスチャンバ3も搬送室と同様に
天板31がシール部材32を介してハウジング本体にた
とえば複数の固定ボルトにより分離可能に取り付けられ
た構造になっている。このように構成してあるから、天
板31を取り外してプロセスチャンバ3の内部をクリー
ニングまたは修理することができる。
The process chamber 3 also has a structure in which a top plate 31 is detachably attached to a housing body via a seal member 32 by, for example, a plurality of fixing bolts, similarly to the transfer chamber. With such a configuration, the inside of the process chamber 3 can be cleaned or repaired by removing the top plate 31.

【0021】プロセスチャンバ3での処理の終了した基
板は、搬送室6のロボット65により、次のプロセスチ
ャンバまたはカセットステーション5に送られる。この
実施例では、カセットステーション5を基板の搬入およ
び搬出兼用のものとしたが、搬入用のカセットステーシ
ョンと搬出用のカセットステーションとを別個に設けて
もよい。処理終了の基板がカセットステーションにスト
ックされると、カセットステーションは、大気圧に戻さ
れ開口部から基板が取り出される。
The substrate that has been processed in the process chamber 3 is sent to the next process chamber or cassette station 5 by the robot 65 in the transfer chamber 6. In this embodiment, the cassette station 5 is used for both loading and unloading substrates, but a cassette station for loading and a cassette station for unloading may be provided separately. When the processed substrate is stocked in the cassette station, the cassette station is returned to the atmospheric pressure and the substrate is taken out from the opening.

【0022】図3は、この発明によるシール部材の断面
図で、シリコーンゴムのOリング状のシール材301の
表面にポリイミドの皮膜302が数ミクロンの厚さに形
成されている。このシール部材は、シリコーンゴムのO
リングに液体状のポリイミド(ポリイミドペースト)を
塗布し、またはシリコーンゴムを金型へ入れてポリイミ
ドペーストを注入して形成し、200℃から300数十
度Cの温度で乾燥させて作られる。
FIG. 3 is a cross-sectional view of a seal member according to the present invention. A polyimide film 302 having a thickness of several microns is formed on the surface of an O-ring seal material 301 made of silicone rubber. This sealing member is made of silicone rubber O.
It is formed by applying liquid polyimide (polyimide paste) to the ring, or by putting silicone rubber into a mold and injecting the polyimide paste, and drying at a temperature of 200 ° C. to 300 ° C. and several tens of degrees C.

【0023】図4は、この発明によるシール部材のもう
1つの実施例を示す断面図で、断面がほぼU字形状の全
体的にリング状のカバー部材402にシリコーンゴムの
Oリング状のシール材401がはめ込まれている。カバ
ー部材402は、金型を用いてポリイミドをモールド成
型して形成される。カバー部材402は、カバー部材の
中心となるベース部403の両端から延びる2つの脚部
404および405を備えており、2つの脚部の先端に
はやや肉厚の先端部406および407がある。この先
端部406および407の外側表面が真空装置のハウジ
ング、天板などと接触するシール面となる。
FIG. 4 is a cross-sectional view showing another embodiment of the seal member according to the present invention, in which an O-ring seal member made of silicone rubber is provided on a generally ring-shaped cover member 402 having a substantially U-shaped cross section. 401 is fitted. The cover member 402 is formed by molding polyimide using a mold. The cover member 402 includes two legs 404 and 405 extending from both ends of a base portion 403 serving as the center of the cover member. At the tips of the two legs, slightly thicker tips 406 and 407 are provided. The outer surfaces of the tips 406 and 407 serve as sealing surfaces that come into contact with the housing, top plate, and the like of the vacuum device.

【0024】図5は、この発明のカバー部材の他の実施
例を示すもので、カバー部材502は、ポリイミドをモ
ールド成型して作られる。中心となるベース部503か
ら2つの脚部504および505が延び、それらの先端
部506および507は脚部の他の部分よりも肉厚にな
っている。2つの脚部の間にシリコーンゴムのOリング
501がはめ込まれている。先端部506および507
の断面形状は、このシール材が真空装置の間隙において
押圧された使用状態において、図6に示すように、押圧
によって楕円形に変形したOリングの外壁と先端部50
6および507の内壁とが合わさり、2つの脚部の外面
に幅の広い平坦なシール面が形成されるような形状にな
っている。
FIG. 5 shows another embodiment of the cover member of the present invention. The cover member 502 is formed by molding polyimide. Extending from the central base 503 are two legs 504 and 505 with their tips 506 and 507 thicker than the rest of the legs. An O-ring 501 of silicone rubber is fitted between the two legs. Tips 506 and 507
As shown in FIG. 6, the cross-sectional shape of the outer ring of the O-ring and the distal end portion 50 of the O-ring deformed into an elliptical shape by the pressing in a use state in which the sealing material is pressed in the gap of the vacuum device.
6 and 507 are joined together to form a wide flat sealing surface on the outer surfaces of the two legs.

【0025】この発明のカバー部材は、シール部材の耐
熱性を高め、水素、ヘリウムなどの軽い元素の透過をも
許さないシール部材を提供するためのものであるから、
この目的に沿う限り図4および図5の実施例から各種の
変形が可能である。たとえば、ベース部は全体的に丸み
を帯びた形状とし、2つの脚部との境界がない構造にす
ることができる。このベース部は単に2つの脚部の結合
部として形成してもよい。また、脚部の先端部は、脚部
自体に十分な肉厚を与えるときには、この部分を他の部
分より肉厚にする必要はなく、脚部全体にわたって均一
な肉厚であってもよい。さらに脚部は、ベース部から先
端に向かって徐々に肉厚になるようにしてもよい。
The cover member of the present invention is intended to enhance the heat resistance of the seal member and to provide a seal member that does not allow the passage of light elements such as hydrogen and helium.
Various modifications are possible from the embodiment of FIGS. 4 and 5 as long as this purpose is met. For example, the base may be generally rounded in shape and have no boundary between the two legs. The base may be formed simply as a connection of the two legs. In addition, when giving a sufficient thickness to the leg itself, the tip of the leg does not need to be thicker than other portions, and may have a uniform thickness over the entire leg. Further, the leg portion may be gradually thickened from the base portion toward the tip.

【0026】図4、図5および図6に示すカバー部材に
Oリングをはめ込んだシール部材は、カバー部材のベー
ス側が真空装置の真空側すなわち内側を向くように設置
される。ポリイミド材料は金属に比べて柔らかくて変形
しやすいから、天板を取り付ける際の圧力により先端部
406、407のシール面がつぶれ、真空装置の間隙の
接合部と広い面積にわたって接触するようカバー部材の
先端部を形成することができる。また、図6を参照して
上述したように、押圧によって変形するOリングがカバ
ー部材の脚部と一体化し、広いシール面積が形成される
ように構成することもできる。これらのシール部材は、
シリコンシール材の弾力性とカバー部材のベース部およ
び脚部の弾力性とが相まって強い弾力性を持つから、頻
繁にクリーニングおよび保守作業が行われ、頻繁に天板
の分解および締め付け作業が行われても、へたることな
く長期間にわたって十分な弾力性を提供する。また、こ
のシール部材は300度Cの高温に耐えることができ
る。
The seal member in which the O-ring is fitted to the cover member shown in FIGS. 4, 5 and 6 is installed so that the base side of the cover member faces the vacuum side of the vacuum device, that is, the inside. Since the polyimide material is softer and easier to deform than metal, the pressure at the time of mounting the top plate causes the sealing surfaces of the tip portions 406 and 407 to be crushed and the cover member to be in contact with the joint of the vacuum device over a wide area. A tip can be formed. In addition, as described above with reference to FIG. 6, the O-ring that is deformed by pressing may be integrated with the leg of the cover member to form a large sealing area. These sealing members are
Since the elasticity of the silicone seal material and the elasticity of the base and legs of the cover member combine to provide strong elasticity, frequent cleaning and maintenance operations are performed, and the top plate is frequently disassembled and tightened. It provides sufficient elasticity over a long period of time without sagging. This seal member can withstand a high temperature of 300 ° C.

【0027】以上にこの発明の実施例をマルチチャンバ
装置について説明したが、この発明はこのようなマルチ
チャンバ装置に限られるものではなく、単独の各種のプ
ロセス装置に適用することができる。また、この発明
は、真空装置の天板とハウジングとの間の間隙の気密シ
ールに限定されるものではなく、真空装置のあらゆる間
隙の気密シールに適用することができる。
Although the embodiment of the present invention has been described above with reference to a multi-chamber apparatus, the present invention is not limited to such a multi-chamber apparatus, but can be applied to various single processing apparatuses. Further, the present invention is not limited to the hermetic seal of the gap between the top plate and the housing of the vacuum device, but can be applied to the hermetic seal of any gap of the vacuum device.

【0028】[0028]

【発明の効果】この発明によると、真空装置に十分な機
密性を与えかつ高温での使用に耐える気密シールが得ら
れ、さらに水素、ヘリウムなどの軽い元素の透過をも阻
止する気密シールを得ることができる。
According to the present invention, it is possible to obtain a hermetic seal that provides sufficient confidentiality to a vacuum device and withstands use at a high temperature, and also obtains a hermetic seal that prevents light elements such as hydrogen and helium from permeating. be able to.

【図面の簡単な説明】[Brief description of the drawings]

【図1】マルチチャンバ装置の模型的な平面図。FIG. 1 is a schematic plan view of a multi-chamber apparatus.

【図2】図1の装置のAA’断面を示す図。FIG. 2 is a diagram showing an AA ′ section of the device of FIG. 1;

【図3】この発明の実施例のシール部材の断面図。FIG. 3 is a sectional view of the seal member according to the embodiment of the present invention.

【図4】この発明のもう1つの実施例のシール部材の断
面図。
FIG. 4 is a sectional view of a seal member according to another embodiment of the present invention.

【図5】この発明の他の実施例のシール部材の断面図。FIG. 5 is a sectional view of a seal member according to another embodiment of the present invention.

【図6】図6のシール部材の使用状態の断面形状を示す
図。
FIG. 6 is a diagram showing a cross-sectional shape of the seal member of FIG. 6 in a used state.

【符号の説明】[Explanation of symbols]

1、2、3、4 プロセスチャンバ(真空装置) 5 カセットステーション 6 搬送室 21 基板 31、61 天板 63、32 気密シール部材 301、401 Oリング状のシール材 302 ポリイミド皮膜 402 ポリイミドカバー部材 1, 2, 3, 4 Process chamber (vacuum device) 5 Cassette station 6 Transfer chamber 21 Substrate 31, 61 Top plate 63, 32 Hermetic seal member 301, 401 O-ring seal material 302 Polyimide film 402 Polyimide cover member

───────────────────────────────────────────────────── フロントページの続き (51)Int.Cl.6 識別記号 FI H01L 21/3065 H01L 21/302 B ──────────────────────────────────────────────────の Continued on the front page (51) Int.Cl. 6 Identification code FI H01L 21/3065 H01L 21/302 B

Claims (9)

【特許請求の範囲】[Claims] 【請求項1】 真空装置を気密にシールするシール部材
であって、 Oリング状のシール材と、 上記シール材の表面を被覆する耐熱性ポリマーの皮膜
と、からなるシール部材。
1. A sealing member for hermetically sealing a vacuum device, comprising: an O-ring-shaped sealing member; and a heat-resistant polymer film covering a surface of the sealing member.
【請求項2】 被処理物を減圧下で処理する真空装置で
あって、 上記真空装置の間隙部の少なくとも1つを、Oリング状
のシール材を耐熱性ポリマーの皮膜で被覆してなるシー
ル部材で気密にシールしたことを特徴とする真空装置。
2. A vacuum apparatus for processing an object to be processed under reduced pressure, wherein at least one of the gaps of the vacuum apparatus is formed by covering an O-ring sealing material with a heat-resistant polymer film. A vacuum device characterized by being hermetically sealed with members.
【請求項3】真空装置を気密にシールするシール部材で
あって、 Oリング状のシール材と、 中央のベース部、および該ベース部の両端から延び上記
シール材を受け入れる2つの脚部を持つ耐熱性ポリマー
のカバー部材と、を備え、上記カバー部材に上記シール
材をはめ込んだシール部材。
3. A sealing member for hermetically sealing a vacuum device, comprising: an O-ring-shaped sealing member; a central base portion; and two legs extending from both ends of the base portion and receiving the sealing member. A seal member comprising a heat-resistant polymer cover member, wherein the seal member is fitted into the cover member.
【請求項4】 被処理物を処理する真空装置であって、
上記真空装置の間隙の少なくとも1つを、 Oリング状のシール材と、 中央のベース部、および該ベース部の両端から延び上記
シール材を受け入れる2つの脚部を持つ耐熱性ポリマー
のカバー部材と、からなるシール部材で気密にシールし
たことを特徴とする真空装置。
4. A vacuum apparatus for processing an object to be processed,
At least one of the gaps of the vacuum device is provided with an O-ring-shaped sealing material; a heat-resistant polymer cover member having a central base portion and two legs extending from both ends of the base portion and receiving the sealing material; A vacuum device, which is hermetically sealed with a sealing member made of:
【請求項5】 上記カバー部材は、上記2つの脚部の先
端部がやや肉厚になっており、圧接されると該先端部の
外側表面がつぶれてシール面を形成することを特徴とす
る請求項4に記載の真空装置。
5. The cover member is characterized in that the distal ends of the two legs are slightly thick, and when pressed, the outer surfaces of the distal ends are crushed to form a sealing surface. The vacuum device according to claim 4.
【請求項6】 上記カバー部材の上記2つの脚部は、上
記シール部材を使用する際に変形する上記シール材の外
壁と合わささるような形状になっている請求項3に記載
のシール部材。
6. The seal member according to claim 3, wherein the two leg portions of the cover member are shaped so as to be fitted with an outer wall of the seal material that is deformed when the seal member is used.
【請求項7】 上記カバー部材の上記2つの脚部は、上
記シール部材を使用する際に変形する上記シール材の外
壁と合わささるような形状になっている請求項4に記載
の真空装置。
7. The vacuum apparatus according to claim 4, wherein the two legs of the cover member are formed so as to be fitted with an outer wall of the sealing material that is deformed when the sealing member is used.
【請求項8】 上記シール材がシリコーンゴムでできて
おり、上記耐熱性ポリマーは、ポリイミドである請求項
1、3または6に記載のシール部材。
8. The sealing member according to claim 1, wherein the sealing material is made of silicone rubber, and the heat-resistant polymer is polyimide.
【請求項9】 上記シール材がシリコーンゴムでできて
おり、上記耐熱性ポリマーは、ポリイミドである請求項
2、4、5または7に記載の真空装置。
9. The vacuum apparatus according to claim 2, wherein the sealing material is made of silicone rubber, and the heat-resistant polymer is polyimide.
JP10046504A 1998-02-27 1998-02-27 Sealing member and vacuum device Withdrawn JPH11241155A (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP10046504A JPH11241155A (en) 1998-02-27 1998-02-27 Sealing member and vacuum device
PCT/JP1999/000901 WO1999044221A1 (en) 1998-02-27 1999-02-26 A seal member and a vacuum chamber

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10046504A JPH11241155A (en) 1998-02-27 1998-02-27 Sealing member and vacuum device

Publications (1)

Publication Number Publication Date
JPH11241155A true JPH11241155A (en) 1999-09-07

Family

ID=12749089

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10046504A Withdrawn JPH11241155A (en) 1998-02-27 1998-02-27 Sealing member and vacuum device

Country Status (2)

Country Link
JP (1) JPH11241155A (en)
WO (1) WO1999044221A1 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20150076132A (en) * 2013-12-26 2015-07-06 램 리써치 코포레이션 Edge seal for lower electrode assembly

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20030047881A1 (en) * 2001-09-13 2003-03-13 Worm Steven Lee Sealing system and pressure chamber assembly including the same
US9859142B2 (en) 2011-10-20 2018-01-02 Lam Research Corporation Edge seal for lower electrode assembly
US9869392B2 (en) 2011-10-20 2018-01-16 Lam Research Corporation Edge seal for lower electrode assembly

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57196535A (en) * 1981-05-28 1982-12-02 Toshiba Corp Semiconductor device for electric power
JPS58199529A (en) * 1982-05-17 1983-11-19 Hitachi Ltd Plasma etching device
GB8713241D0 (en) * 1987-06-05 1987-07-08 Vg Instr Group Bakeable vacuum systems
JP2976329B2 (en) * 1988-01-11 1999-11-10 忠弘 大見 Sealing mechanism for thin film forming equipment
US5246782A (en) * 1990-12-10 1993-09-21 The Dow Chemical Company Laminates of polymers having perfluorocyclobutane rings and polymers containing perfluorocyclobutane rings
US5722668A (en) * 1994-04-29 1998-03-03 Applied Materials, Inc. Protective collar for vacuum seal in a plasma etch reactor
US5746434A (en) * 1996-07-09 1998-05-05 Lam Research Corporation Chamber interfacing O-rings and method for implementing same

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20150076132A (en) * 2013-12-26 2015-07-06 램 리써치 코포레이션 Edge seal for lower electrode assembly
KR20220024367A (en) * 2013-12-26 2022-03-03 램 리써치 코포레이션 Edge seal for lower electrode assembly

Also Published As

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