JPH1084076A - Semiconductor device and method for manufacturing the same - Google Patents

Semiconductor device and method for manufacturing the same

Info

Publication number
JPH1084076A
JPH1084076A JP8255576A JP25557696A JPH1084076A JP H1084076 A JPH1084076 A JP H1084076A JP 8255576 A JP8255576 A JP 8255576A JP 25557696 A JP25557696 A JP 25557696A JP H1084076 A JPH1084076 A JP H1084076A
Authority
JP
Japan
Prior art keywords
chip
wiring board
main surface
electrically connected
semiconductor device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP8255576A
Other languages
Japanese (ja)
Inventor
Hajime Hasebe
一 長谷部
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Renesas Semiconductor Package and Test Solutions Co Ltd
Original Assignee
Hitachi Hokkai Semiconductor Ltd
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Hokkai Semiconductor Ltd, Hitachi Ltd filed Critical Hitachi Hokkai Semiconductor Ltd
Priority to JP8255576A priority Critical patent/JPH1084076A/en
Publication of JPH1084076A publication Critical patent/JPH1084076A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/12Structure, shape, material or disposition of the bump connectors prior to the connecting process
    • H01L2224/14Structure, shape, material or disposition of the bump connectors prior to the connecting process of a plurality of bump connectors
    • H01L2224/141Disposition
    • H01L2224/1418Disposition being disposed on at least two different sides of the body, e.g. dual array
    • H01L2224/14181On opposite sides of the body
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/15Structure, shape, material or disposition of the bump connectors after the connecting process
    • H01L2224/16Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
    • H01L2224/161Disposition
    • H01L2224/16135Disposition the bump connector connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip
    • H01L2224/16145Disposition the bump connector connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip the bodies being stacked
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/15Structure, shape, material or disposition of the bump connectors after the connecting process
    • H01L2224/16Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
    • H01L2224/161Disposition
    • H01L2224/16151Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/16221Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/16225Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/15Structure, shape, material or disposition of the bump connectors after the connecting process
    • H01L2224/16Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
    • H01L2224/161Disposition
    • H01L2224/16151Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/16221Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/16225Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • H01L2224/16235Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation the bump connector connecting to a via metallisation of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/15Structure, shape, material or disposition of the bump connectors after the connecting process
    • H01L2224/17Structure, shape, material or disposition of the bump connectors after the connecting process of a plurality of bump connectors
    • H01L2224/171Disposition
    • H01L2224/1718Disposition being disposed on at least two different sides of the body, e.g. dual array
    • H01L2224/17181On opposite sides of the body
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/151Die mounting substrate
    • H01L2924/153Connection portion
    • H01L2924/1531Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface
    • H01L2924/15311Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface being a ball array, e.g. BGA

Abstract

PROBLEM TO BE SOLVED: To reduce a package of MCM IC (Multi-Chip Module). SOLUTION: A MCM IC 51 is provided with a small chip 10, a large chip 20, a wiring board 30 with electrical wiring 38 electrically connected between each of internal terminals 33 and each of external terminals 36, and an auxiliary frame 40 with electrical wiring 47 electrically connected between each of terminals 43 of the chips and each of terminals 46 of the board. The small chip 10 is arranged on the center of the wiring board 30 and each of electrode pads 13 is connected to each of the internal terminals 33 by each of connecting terminals 14. The auxiliary frame 40 engages the perimeter of the small chip 10 and each of the terminals 46 of the board is connected to each of the internal terminals 33 by each of connecting terminals 48. The large chip 20 is overlaid on the small chip 10 and the auxiliary frame 40 and each of electrode pads 23 is connected to each of the internal terminals 33 by each of connecting terminals 24. This enables a multifunction, multion, MCM IC of CSP (Chip Size Package) to be enabled by diverting various chips which have been developed.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、半導体装置、特
に、パッケージの縮小技術に関し、例えば、MCM(m
ulti chip module)パッケージを備え
ている半導体集積回路装置(以下、ICという。)に利
用して有効な技術に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a semiconductor device, and more particularly, to a technology for reducing a size of a package.
The present invention relates to a technology that is effective when used in a semiconductor integrated circuit device (hereinafter, referred to as an IC) having an ultra chip module package.

【従来の技術】[Prior art]

【0002】一般に、MCMパッケージは一枚の配線基
板の上に複数個の半導体チップ(以下、チップとい
う。)が二次元的に配置され、樹脂封止体や気密封止体
によって封止されて構成されている。
In general, an MCM package has a plurality of semiconductor chips (hereinafter, referred to as chips) two-dimensionally arranged on a single wiring board, and is sealed with a resin sealing body or an airtight sealing body. It is configured.

【0003】なお、MCMパッケージを述べてある例と
しては、株式会社日経BP社1993年5月31日発行
の「VLSIパッケージング技術(下)」P213〜P
253、がある。
[0003] As an example of the description of the MCM package, see "VLSI Packaging Technology (Lower)" P213 to P213-M issued on May 31, 1993 by Nikkei BP Co., Ltd.
253.

【0004】[0004]

【発明が解決しようとする課題】ところで、ICを使用
する電子機器の小型薄形化に伴って、ICのパッケージ
の縮小が要求されている。そこで、半導体素子を含む集
積回路が作り込まれた半導体チップ(以下、チップとい
う。)のサイズと同等または略同等のサイズのチップ・
サイズ・パッケージ(Chip Size Packa
geまたはChip Scale Package。以
下、CSPという。)が開発されている。ICのパッケ
ージの縮小の要求は、MCMパッケージを備えているI
Cにおいても例外ではない。
As electronic devices using ICs become smaller and thinner, there is a demand for smaller IC packages. Therefore, a chip having a size equal to or substantially equal to the size of a semiconductor chip (hereinafter, referred to as a chip) in which an integrated circuit including a semiconductor element is built.
Size Package (Chip Size Packa)
ge or Chip Scale Package. Hereinafter, it is called CSP. ) Has been developed. The demand for reducing the size of the IC package is based on the fact that the
C is no exception.

【0005】しかしながら、従来のMCMパッケージに
おいては、一枚の配線基板の上に複数個のチップが二次
元的に配置されているため、平面視面積は複数個のチッ
プの平面視面積の総和よりも大きくなってしまう。
However, in the conventional MCM package, since a plurality of chips are two-dimensionally arranged on one wiring board, the area in plan is smaller than the total area of the chips in plan. Will also be large.

【0006】本発明の目的は、複数個の半導体チップを
備えた半導体装置のパッケージを縮小することができる
半導体装置の製造技術を提供することにある。
An object of the present invention is to provide a semiconductor device manufacturing technique capable of reducing a package of a semiconductor device having a plurality of semiconductor chips.

【0007】本発明の前記ならびにその他の目的と新規
な特徴は、本明細書の記述および添付図面から明らかに
なるであろう。
[0007] The above and other objects and novel features of the present invention will become apparent from the description of the present specification and the accompanying drawings.

【0008】[0008]

【課題を解決するための手段】本願において開示される
発明のうち代表的なものの概要を説明すれば、次の通り
である。
The outline of a typical invention among the inventions disclosed in the present application is as follows.

【0009】すなわち、半導体装置は、主面の大きさが
異なる複数個の半導体チップが小さい順に下から配線基
板の第1主面の上に積み重なるように配置されていると
ともに、それぞれ対向する内部端子群に機械的かつ電気
的に接続されていることを特徴とする。
That is, in the semiconductor device, a plurality of semiconductor chips having different main surface sizes are arranged so as to be stacked from the bottom on the first main surface of the wiring board in ascending order, and the internal terminals facing each other are arranged. It is characterized by being mechanically and electrically connected to the group.

【0010】前記した半導体装置の製造方法は、第1主
面に内部端子群が形成され第2主面に外部端子群が形成
され各内部端子と各外部端子とが電気的に接続された配
線基板が準備される配線基板準備工程と、主面の大きさ
が異なる複数個の半導体チップが準備される半導体チッ
プ準備工程と、前記各半導体チップが小さい順に下から
前記配線基板の第1主面の上に積み重なるように配置さ
れているとともに、それぞれ対向する前記内部端子群に
機械的かつ電気的に接続される接続工程とを備えてい
る。
In the above-described method of manufacturing a semiconductor device, the wiring in which the internal terminal group is formed on the first main surface and the external terminal group is formed on the second main surface, and each internal terminal is electrically connected to each external terminal. A wiring board preparing step in which a substrate is prepared; a semiconductor chip preparing step in which a plurality of semiconductor chips having different main surface sizes are prepared; And a connection step of being mechanically and electrically connected to the internal terminal groups facing each other.

【0011】前記した半導体装置は複数個の半導体チッ
プが配線基板の上に積み重ねられているため、その平面
視の面積は最大平面視面積の半導体チップの大きさと略
等しくなる。
In the semiconductor device described above, since a plurality of semiconductor chips are stacked on the wiring board, the area in plan view is substantially equal to the size of the semiconductor chip having the maximum plan view area.

【0012】前記した半導体装置の製造方法によれば、
機能や内部構造を変更せずに複数個の半導体チップを搭
載することができるため、ICの新規開発や大幅な設計
変更を省略することができ、ワン・チップ・パッケージ
と同等の新製品の開発期間や諸費用を大幅に低減するこ
とができる。
According to the method of manufacturing a semiconductor device described above,
Since multiple semiconductor chips can be mounted without changing the function and internal structure, new development of ICs and major design changes can be omitted, and new products equivalent to one-chip packages can be developed. The period and various costs can be significantly reduced.

【0013】[0013]

【発明の実施の形態】図1は本発明の一実施形態である
半導体装置を示しており、(a)は一部省略一部切断平
面図、(b)は(a)のb−b線に沿う正面断面図、
(c)は(a)のc−c線に沿う正面断面図である。図
2以降は本発明の一実施形態である半導体装置の製造方
法を示す各工程の説明図である。
1A and 1B show a semiconductor device according to an embodiment of the present invention. FIG. 1A is a partially cutaway plan view with a part omitted, and FIG. 1B is a bb line of FIG. Front sectional view along
(C) is a front sectional view taken along line cc of (a). FIG. 2 is an explanatory view of each step showing a method for manufacturing a semiconductor device according to one embodiment of the present invention.

【0014】本実施形態において、本発明に係る半導体
装置は、MCMパッケージを備えているIC(以下、M
CM・ICという。)として構成されている。図1に示
されているように、MCM・IC51は平面形状の大き
さが大小異なるチップ10およびチップ20と、基板本
体31の第1主面32に内部端子33群が形成され第2
主面35に外部端子36群が形成され各内部端子33と
各外部端子36とが各電気配線38によって電気的に接
続された配線基板30と、枠本体41の第1主面42に
チップ側端子43群が形成され第2主面45に基板側端
子46群が形成され各チップ側端子43と各基板側端子
46とが各電気配線47によって電気的に接続された補
助枠40とを備えている。
In the present embodiment, the semiconductor device according to the present invention is an IC (hereinafter, referred to as M) having an MCM package.
CM / IC. ). As shown in FIG. 1, the MCM / IC 51 includes a chip 10 and a chip 20 whose plane shapes are different in size, and a group of internal terminals 33 formed on a first main surface 32 of a substrate main body 31.
A wiring board 30 on which a group of external terminals 36 is formed on the main surface 35 and each internal terminal 33 and each external terminal 36 are electrically connected by each electric wiring 38, and a first main surface 42 of the frame main body 41 on the chip side A group of terminals 43 is formed, a group of substrate-side terminals 46 is formed on the second main surface 45, and an auxiliary frame 40 in which each chip-side terminal 43 and each substrate-side terminal 46 are electrically connected by each electric wiring 47. ing.

【0015】小さいチップ10は配線基板30の第1主
面32の中央部に配置されているとともに、各電極パッ
ド13が対向する各内部端子33に各接続端子14によ
って機械的かつ電気的に接続されている。補助枠40は
小さいチップ10の外周に嵌合されているとともに、各
基板側端子46が配線基板30の第1主面32における
周辺部に配列された各内部端子33に各接続端子48に
よって機械的かつ電気的に接続されている。大きいチッ
プ20は小さいチップ10および補助枠40の上に重ね
られて配置されているとともに、各電極パッド23が対
向する各内部端子33に各接続端子24によって機械的
かつ電気的に接続されている。小さいチップ10、大き
いチップ20および補助枠40は配線基板30の第1主
面32上に成形された樹脂封止体50によって樹脂封止
されている。
The small chip 10 is arranged at the center of the first main surface 32 of the wiring board 30, and is mechanically and electrically connected to each internal terminal 33 facing each electrode pad 13 by each connection terminal 14. Have been. The auxiliary frame 40 is fitted on the outer periphery of the small chip 10, and each of the board-side terminals 46 is mechanically connected to each of the internal terminals 33 arranged on the periphery of the first main surface 32 of the wiring board 30 by each of the connection terminals 48. Connected electrically and electrically. The large chip 20 is disposed so as to overlap the small chip 10 and the auxiliary frame 40, and each electrode pad 23 is mechanically and electrically connected to each of the internal terminals 33 facing each other by the connection terminals 24. . The small chip 10, the large chip 20, and the auxiliary frame 40 are resin-sealed by a resin sealing body 50 formed on the first main surface 32 of the wiring board 30.

【0016】以下、本発明の一実施形態であるMCM・
ICの製造方法を説明する。この説明によって、前記M
CM・ICの構成の詳細が明らかにされる。
Hereinafter, an embodiment of the present invention will be described.
A method for manufacturing an IC will be described. By this explanation, the M
Details of the configuration of the CM / IC will be clarified.

【0017】図2に示されているように、本実施形態に
係るMCM・ICの製造方法においては、平面形状が小
さいチップ(以下、小チップという。)10と、平面形
状が小チップ10よりも大きいチップ(以下、大チップ
という。)20とが用意される。小チップ10および大
チップ20はいずれも、ICの所謂前工程において半導
体ウエハ(図示せず)の状態でそれぞれ所望の半導体集
積回路を作り込まれるとともに、アクティブ・エリア側
である第1主面に半導体集積回路を外部に電気的に取り
出すための電極パッドを形成される。ICの所謂後工程
の最初の工程であるダイシング工程において、半導体ウ
エハが正方形の小さな平板形状に分断されることによ
り、小チップ10および大チップ20がそれぞれ製造さ
れた状態になる。
As shown in FIG. 2, in the MCM / IC manufacturing method according to the present embodiment, a chip 10 having a small planar shape (hereinafter referred to as a small chip) and a small chip 10 having a planar shape are provided. (Hereinafter, referred to as a large chip) 20 is prepared. In both the small chip 10 and the large chip 20, desired semiconductor integrated circuits are formed in the state of a semiconductor wafer (not shown) in a so-called pre-process of the IC, and the small chip 10 and the large chip 20 are formed on the first main surface on the active area side. An electrode pad for electrically taking out the semiconductor integrated circuit to the outside is formed. In the dicing step, which is the first step of the so-called post-processing of the IC, the semiconductor wafer is divided into small square flat plates, so that the small chips 10 and the large chips 20 are manufactured.

【0018】図2(a)および(b)に示されているよ
うに、小チップ10のアクティブ・エリア側である第1
主面11には多数個の電極パッド13が、略全面にわた
ってマトリックス状に配列されている。各電極パッド1
3は後記する配線基板のバンプと機械的かつ電気的に接
続し得るように構成されている。なお、12はアクティ
ブ・エリア側と反対側の第2主面である。
As shown in FIGS. 2A and 2B, a first chip on the active area side of the small chip 10 is formed.
On the main surface 11, a large number of electrode pads 13 are arranged in a matrix over substantially the entire surface. Each electrode pad 1
Reference numeral 3 is configured to be mechanically and electrically connectable to bumps of a wiring board described later. Note that reference numeral 12 denotes a second main surface opposite to the active area side.

【0019】図2(c)および(d)に示されているよ
うに、大チップ20のアクティブ・エリア側である第1
主面21には多数個の電極パッド23が、周辺部におい
てアレイ状に配列されている。各電極パッド23は後記
する配線基板のバンプと機械的かつ電気的に接続し得る
ように構成されている。大チップ20の平面視の大きさ
は小チップ10に対して少なくとも電極パッド23の列
が突き出る分だけは大きくなるように設定されている。
なお、22はアクティブ・エリア側と反対側の第2主面
である。
As shown in FIGS. 2C and 2D, a first chip on the active area side of the large chip 20 is formed.
A large number of electrode pads 23 are arranged on the main surface 21 in an array at the periphery. Each electrode pad 23 is configured so as to be able to be mechanically and electrically connected to a bump of a wiring board described later. The size of the large chip 20 in a plan view is set so as to be larger than the small chip 10 by at least the amount by which the rows of the electrode pads 23 protrude.
Reference numeral 22 denotes a second main surface opposite to the active area side.

【0020】他方、配線基板準備工程において、図3に
示されている配線基板30が製造される。図3に示され
ている配線基板30はセラミックやガラス含浸エポキシ
樹脂等の絶縁基板によって形成された基板本体(以下、
本体という。)31を備えており、本体31は後記する
補助枠40の外径よりも若干大きめの外径を有する正方
形の板形状に形成されている。
On the other hand, in a wiring board preparation step, the wiring board 30 shown in FIG. 3 is manufactured. The wiring substrate 30 shown in FIG. 3 is a substrate main body (hereinafter, referred to as a substrate) formed of an insulating substrate such as ceramic or glass impregnated epoxy resin.
It is called the body. The main body 31 is formed in a square plate shape having an outer diameter slightly larger than the outer diameter of the auxiliary frame 40 described later.

【0021】本体31の第1主面32には多数個の内部
端子33が略全面にわたってマトリックス状に配列され
ており、各内部端子33には内部端子用バンプ(以下、
内バンプという)34が突設されている。内部端子33
の数は小チップ10の電極パッド13の数と、大チップ
20の電極パッド23の数との和になるように設定され
ており、各内部端子33の配置は小チップ10の各電極
パッド13の配置、および大チップ20の各電極パッド
23の配置に対応するように設定されている。内バンプ
34は導電性材料である金(Au)が使用されて、めっ
き法や蒸着法およびワイヤボンディング法等の手段によ
って半球形状等の適当な突起形状に形成される。内バン
プ34の外径は各電極パッド13、23の外径よりも若
干大きくなるように設定されている。
On the first main surface 32 of the main body 31, a large number of internal terminals 33 are arranged in a matrix over substantially the entire surface. Each internal terminal 33 has an internal terminal bump (hereinafter, referred to as a bump).
34 (referred to as inner bumps). Internal terminal 33
Are set so as to be the sum of the number of electrode pads 13 of the small chip 10 and the number of electrode pads 23 of the large chip 20, and the arrangement of the internal terminals 33 is And the arrangement of the electrode pads 23 of the large chip 20 are set. The inner bumps 34 are formed of an appropriate protrusion such as a hemisphere by using a conductive material such as gold (Au) by a plating method, a vapor deposition method, a wire bonding method, or the like. The outer diameter of the inner bump 34 is set to be slightly larger than the outer diameter of each of the electrode pads 13 and 23.

【0022】本体31の第2主面35には多数個の外部
端子36が外周辺部においてアレイ状に配列されてお
り、外部端子36には外部端子用バンプ(以下、外バン
プという。)37が突設されている。外部端子36の数
は内部端子33の数と等しくなるように設定されてお
り、各外部端子36の配置は実装ボード(図示せず)の
規格に一致するように設定されている。外バンプ37は
ICの実装に際して一般的に使用される半田材料が使用
されて、半田ボールの溶着等の手段によって半球形状等
の適当な突起形状に形成される。
On the second main surface 35 of the main body 31, a large number of external terminals 36 are arranged in an array at the outer peripheral portion. The external terminals 36 are external terminal bumps (hereinafter referred to as external bumps) 37. Is protruding. The number of the external terminals 36 is set to be equal to the number of the internal terminals 33, and the arrangement of the external terminals 36 is set so as to conform to the standard of a mounting board (not shown). The outer bumps 37 are formed of an appropriate protrusion such as a hemisphere by using a solder material generally used when mounting an IC and by welding a solder ball or the like.

【0023】本体31の内部には内部端子33と外部端
子36とを電気的に接続する電気配線38が多数本、互
いに電気的に独立するように敷設されている。
Inside the main body 31, a number of electric wires 38 for electrically connecting the internal terminals 33 and the external terminals 36 are laid so as to be electrically independent of each other.

【0024】本実施形態においては、図4に示されてい
る補助枠40が製造される。図4に示されている補助枠
40はセラミックやガラス含浸エポキシ樹脂等の絶縁材
料によって枠形状に形成された枠本体41を備えてお
り、枠本体41は小チップ10の外径よりも若干大きめ
の内径と配線基板30の外径よりも若干小さめの外径と
を有する正方形の枠形状に形成されている。枠本体41
の厚さは小チップ10の厚さと略等しくなるように設定
されている。
In this embodiment, the auxiliary frame 40 shown in FIG. 4 is manufactured. The auxiliary frame 40 shown in FIG. 4 has a frame main body 41 formed in a frame shape by an insulating material such as ceramic or glass impregnated epoxy resin, and the frame main body 41 is slightly larger than the outer diameter of the small chip 10. And an outer diameter slightly smaller than the outer diameter of the wiring board 30. Frame body 41
Is set to be substantially equal to the thickness of the small chip 10.

【0025】枠本体41の第1主面42には多数個のチ
ップ側端子43がアレイ状に配列されており、各チップ
側端子43には枠バンプ44が突設されている。チップ
側端子43の数は大チップ20の電極パッド23の数と
等しくなるように設定されており、各チップ側端子43
の配置は大チップ20の各電極パッド23の配置に対応
するように設定されている。枠バンプ44は導電性材料
である金(Au)が使用されて、めっき法や蒸着法およ
びワイヤボンディング法等の手段によって半球形状等の
適当な突起形状に形成される。枠バンプ44の外径は大
チップ20の電極パッド23の外径よりも若干大きくな
るように設定されている。
A plurality of chip-side terminals 43 are arranged in an array on the first main surface 42 of the frame main body 41, and each chip-side terminal 43 has a frame bump 44 projecting therefrom. The number of chip terminals 43 is set to be equal to the number of electrode pads 23 of the large chip 20.
Are set so as to correspond to the positions of the electrode pads 23 of the large chip 20. The frame bumps 44 are formed of an appropriate protrusion such as a hemisphere by using a conductive material such as gold (Au) by a plating method, a vapor deposition method, a wire bonding method, or the like. The outer diameter of the frame bump 44 is set to be slightly larger than the outer diameter of the electrode pad 23 of the large chip 20.

【0026】枠本体41の第2主面45にはチップ側端
子43と同数個の基板側端子46がアレイ状に配列され
ており、各基板側端子46の配置は配線基板30の外部
端子36のうち外周辺部における各外部端子36に対応
するように設定されている。枠本体41の内部にはチッ
プ側端子43と基板側端子46とを電気的に接続する電
気配線47が多数本、互いに電気的に独立するように敷
設されている。
On the second main surface 45 of the frame body 41, the same number of substrate-side terminals 46 as the chip-side terminals 43 are arranged in an array. Are set to correspond to the external terminals 36 in the outer peripheral portion. A large number of electric wires 47 for electrically connecting the chip-side terminals 43 and the substrate-side terminals 46 are laid inside the frame main body 41 so as to be electrically independent from each other.

【0027】配線基板準備工程で準備された前記構成に
係る配線基板30には小チップ10が、小チップ接続工
程において、フリップチップ法によって図5に示されて
いるように機械的かつ電気的に接続される。すなわち、
図5(a)に示されているように、小チップ10が第1
主面11側を配線基板30の第1主面32側に向けて、
かつ、同心的に配置されて、小チップ10の各電極パッ
ド13と配線基板30の内バンプ34群のうち中央部の
各内バンプ34とが整合される。小チップ10と配線基
板30とが加熱下で押接されると、各電極パッド13と
各内バンプ34とが熱圧着されて、図5(b)に示され
ている接続端子14がそれぞれ形成されるため、小チッ
プ10と配線基板30とは機械的かつ電気的に接続され
た状態になる。
The small chip 10 is mounted on the wiring board 30 having the above structure prepared in the wiring board preparing step, and is mechanically and electrically connected by the flip chip method as shown in FIG. 5 in the small chip connecting step. Connected. That is,
As shown in FIG. 5A, the small chip 10
With the main surface 11 side facing the first main surface 32 side of the wiring board 30,
In addition, the electrode pads 13 of the small chip 10 are aligned concentrically with the inner bumps 34 at the center of the group of the inner bumps 34 of the wiring board 30. When the small chip 10 and the wiring board 30 are pressed against each other under heating, the respective electrode pads 13 and the respective inner bumps 34 are thermocompression-bonded to form the connection terminals 14 shown in FIG. Therefore, the small chip 10 and the wiring board 30 are mechanically and electrically connected.

【0028】以上のようにして小チップ10と配線基板
30とが接続された組立体には前記構成に係る補助枠4
0が、補助枠接続工程において、フリップチップ法によ
って図6に示されているように機械的かつ電気的に接続
される。すなわち、図6(a)に示されているように、
補助枠40が第2主面45側を配線基板30の第1主面
32側に向けられて、小チップ10の外周に嵌合される
と、補助枠40の各基板側端子46と配線基板30の内
バンプ34群のうち小チップ10の外側の周辺部で露出
した各内バンプ34とが整合される。補助枠40と配線
基板30とが加熱下で押接されると、各基板側端子46
と各内バンプ34とが熱圧着されて、図6(b)に示さ
れている接続端子48がそれぞれ形成されるため、補助
枠40と配線基板30とは機械的かつ電気的に接続され
た状態になる。
The assembly in which the small chip 10 and the wiring board 30 are connected as described above is provided with the auxiliary frame 4 having the above configuration.
0 are mechanically and electrically connected by the flip chip method in the auxiliary frame connecting step as shown in FIG. That is, as shown in FIG.
When the auxiliary frame 40 is fitted on the outer periphery of the small chip 10 with the second main surface 45 side facing the first main surface 32 side of the wiring board 30, each substrate-side terminal 46 of the auxiliary frame 40 and the wiring board The inner bumps 34 exposed at the outer peripheral portion of the small chip 10 among the 30 inner bumps 34 are aligned. When the auxiliary frame 40 and the wiring board 30 are pressed against each other under heating, each of the board-side terminals 46
And the respective inner bumps 34 are thermocompression-bonded to form the connection terminals 48 shown in FIG. 6B, respectively, so that the auxiliary frame 40 and the wiring board 30 are mechanically and electrically connected. State.

【0029】以上のようにして小チップ配線基板組立体
と補助枠40とが接続された組立体には大チップ20
が、大チップ接続工程において、フリップチップ法によ
って図7に示されているように機械的かつ電気的に接続
される。すなわち、図7(a)に示されているように、
大チップ20が第1主面21側を小チップ10の第2主
面12側に向けて、かつ、同心的に配置されて、大チッ
プ20の各電極パッド23と補助枠40の枠バンプ44
とが整合される。大チップ20と補助枠40とが加熱下
で押接されると、各電極パッド23と各枠バンプ44と
が熱圧着されて図7(b)に示されている接続端子24
がそれぞれ形成されるため、大チップ20と補助枠40
とは機械的かつ電気的に接続された状態になる。補助枠
40は配線基板30に接続端子48によって電気的に接
続されているため、大チップ20は補助枠40を介して
配線基板30に電気的に接続された状態になる。
As described above, the large chip 20 is attached to the assembly in which the small chip wiring board assembly and the auxiliary frame 40 are connected.
Are mechanically and electrically connected by a flip chip method as shown in FIG. 7 in a large chip connecting step. That is, as shown in FIG.
The large chip 20 is arranged concentrically with the first main surface 21 side facing the second main surface 12 side of the small chip 10, and the electrode pads 23 of the large chip 20 and the frame bumps 44 of the auxiliary frame 40 are arranged.
And are matched. When the large chip 20 and the auxiliary frame 40 are pressed against each other under heating, the electrode pads 23 and the frame bumps 44 are thermocompression-bonded, and the connection terminals 24 shown in FIG.
Are formed, the large chip 20 and the auxiliary frame 40 are formed.
Is in a state of being mechanically and electrically connected. Since the auxiliary frame 40 is electrically connected to the wiring board 30 by the connection terminal 48, the large chip 20 is electrically connected to the wiring board 30 via the auxiliary frame 40.

【0030】以上のようにして小チップ10および大チ
ップ20が接続された配線基板30には樹脂封止体成形
工程(図示せず)において、図1に示されている樹脂封
止体50が小チップ10、大チップ20および補助枠4
0を樹脂封止するように成形される。この状態におい
て、小チップ10の半導体集積回路は、電極パッド1
3、接続端子14、配線基板30の内部端子33、電気
配線38および外部端子を介して配線基板30の外バン
プ37に電気的に引き出された状態になっている。ま
た、大チップ20の半導体集積回路は、電極パッド2
3、接続端子24、補助枠40のチップ側端子43、電
気配線47、基板側端子46、接続端子48、配線基板
30の内部端子33、電気配線38および外部端子36
を介して配線基板30の外バンプ37に電気的に引き出
された状態になっている。
In the resin sealing body forming step (not shown), the resin sealing body 50 shown in FIG. 1 is attached to the wiring board 30 to which the small chip 10 and the large chip 20 are connected as described above. Small chip 10, large chip 20, and auxiliary frame 4
0 is molded so as to be sealed with resin. In this state, the semiconductor integrated circuit of the small chip 10
3, the connection terminals 14, the internal terminals 33 of the wiring board 30, the electric wiring 38, and the external bumps 37 are electrically drawn to the outer bumps 37 of the wiring board 30 via the external terminals. Further, the semiconductor integrated circuit of the large chip 20 includes the electrode pad 2
3, connection terminal 24, chip-side terminal 43 of auxiliary frame 40, electric wiring 47, board-side terminal 46, connection terminal 48, internal terminal 33 of wiring board 30, electric wiring 38 and external terminal 36
Through the outer bumps 37 of the wiring board 30 through the wiring board 30.

【0031】前記実施形態によれば、次の効果が得られ
る。 大小のチップを小さい順に下から配線基板の第1主
面の上に積み重なるように配置するとともに、各チップ
の電極パッドをそれぞれ対向する内部端子群に機械的か
つ電気的に接続することにより、パッケージの大きさを
大きいチップの大きさと略等しく縮小することができる
ため、多機能かつ多ピンでしかもCSPのMCM・IC
を実現することができる。
According to the above embodiment, the following effects can be obtained. A package is arranged by arranging large and small chips from the bottom in the ascending order on the first main surface of the wiring board, and mechanically and electrically connecting the electrode pads of each chip to the internal terminal groups facing each other. Can be reduced to be almost equal to the size of a large chip.
Can be realized.

【0032】 MCM・ICを構成する大小のチップ
として既に開発済の各種のチップを機能や内部構造を変
更せずに使用することができるため、MCM・ICの新
規開発や大幅な設計変更を省略することができ、ワン・
チップ・パッケージと同等の新製品の開発期間や諸費用
を大幅に低減することができる。
Since various chips already developed as large and small chips constituting the MCM / IC can be used without changing the functions and the internal structure, new development of the MCM / IC and significant design changes are omitted. Can be one-
The development time and costs of a new product equivalent to a chip package can be significantly reduced.

【0033】図8は本発明の実施形態2である半導体装
置を示しており、(a)は一部省略一部切断平面図、
(b)は(a)のb−b線に沿う正面断面図、(c)は
(a)のc−c線に沿う正面断面図である。
FIG. 8 shows a semiconductor device according to a second embodiment of the present invention, wherein FIG.
(B) is a front sectional view taken along line bb of (a), and (c) is a front sectional view taken along line cc of (a).

【0034】本実施形態2が前記実施形態1と異なる点
は、補助枠が省略されており、配線基板30の第1主面
32における外周辺部に配列の外バンプ(図示せず)に
よって形成された背の高い接続端子25群により、大チ
ップ20が配線基板30に直接的に機械的かつ電気的に
接続されている点にある。
The second embodiment is different from the first embodiment in that the auxiliary frame is omitted and formed by external bumps (not shown) arranged on the outer peripheral portion of the first main surface 32 of the wiring board 30. The large-sized chip 20 is directly and mechanically and electrically connected to the wiring board 30 by the tall connection terminals 25 formed as described above.

【0035】本実施形態2によれば、前記実施形態1の
効果に加えて、補助枠が省略されているため、製造コス
トをより一層低減することができるという効果を得るこ
とができる。
According to the second embodiment, in addition to the effect of the first embodiment, since the auxiliary frame is omitted, the effect that the manufacturing cost can be further reduced can be obtained.

【0036】以上本発明者によってなされた発明を実施
形態に基づき具体的に説明したが、本発明は前記実施形
態に限定されるものではなく、その要旨を逸脱しない範
囲で種々変更可能であることはいうまでもない。
Although the invention made by the inventor has been specifically described based on the embodiment, the invention is not limited to the embodiment, and various changes can be made without departing from the gist of the invention. Needless to say.

【0037】積み重ねるチップの数は大小2個に限ら
ず、大中小の3個またはそれ以上であってもよい。
The number of chips to be stacked is not limited to two large and small, but may be three large, medium, and small or more.

【0038】接続端子を形成するためのバンプは配線基
板に配設するに限らず、各チップにそれぞれ配設しても
よい。
The bumps for forming the connection terminals are not limited to being provided on the wiring board, but may be provided on each chip.

【0039】チップや接続端子群を封止する封止体は、
樹脂封止体に構成するに限らず、気密封止体に構成して
もよい。
The sealing body for sealing the chip and the connection terminal group is as follows:
The present invention is not limited to a resin-sealed body, but may be a hermetically sealed body.

【0040】配線基板の外部端子に突設するアウタリー
ドは、半田バンプによるボール・グリッド・アレr(b
all grid array)構造に構成するに限ら
ず、ピン・グリッド・アレイ(pin grid ar
ray)構造等に構成してもよい。
The outer leads projecting from the external terminals of the wiring board are formed by solder ball bumps and grids (b).
The configuration is not limited to an all grid array structure, but may be a pin grid array (pin grid array).
ray) structure or the like.

【0041】以上の説明では主として本発明者によって
なされた発明をその背景となった利用分野であるMCM
・ICに適用した場合について説明したが、それに限定
されるものではなく、ハイブリットICのように複数個
のチップが搭載される半導体装置全般に適用することが
できる。特に、本発明は、多機能かつ多ピンでしかもパ
ッケージが小さい半導体装置に適用して優れた効果を得
ることができる。
In the above description, the invention made mainly by the present inventor is referred to as the MCM, which is the field of application that served as the background.
The case where the present invention is applied to an IC has been described. However, the present invention is not limited to this. The present invention can be applied to a general semiconductor device on which a plurality of chips are mounted, such as a hybrid IC. In particular, the present invention can achieve excellent effects when applied to a semiconductor device having a multi-function, multi-pin, and small package.

【0042】[0042]

【発明の効果】本願において開示される発明のうち代表
的なものによって得られる効果を簡単に説明すれば、次
の通りである。
The effects obtained by typical aspects of the invention disclosed in the present application will be briefly described as follows.

【0043】大小のチップを小さい順に下から配線基板
の第1主面の上に積み重なるように配置するとともに、
各チップの電極パッドをそれぞれ対向する内部端子群に
機械的かつ電気的に接続することにより、パッケージの
大きさを大きいチップの大きさと略等しく縮小すること
ができるため、多機能かつ多ピンでしかもパッケージの
小さい半導体装置を構成することができる。
The large and small chips are arranged so as to be stacked on the first main surface of the wiring board from the bottom in ascending order.
By mechanically and electrically connecting the electrode pads of each chip to the opposing internal terminal groups, the package size can be reduced approximately equal to the size of a large chip, so that it is multifunctional and has many pins. A semiconductor device with a small package can be formed.

【0044】半導体装置を構成する大小のチップとして
既に開発済の各種のチップを機能や内部構造を変更せず
に使用することができるため、半導体装置の新規開発や
大幅な設計変更を省略することができ、ワン・チップ・
パッケージと同等の新製品の開発期間や諸費用を大幅に
低減することができる。
Since various chips already developed as large and small chips constituting the semiconductor device can be used without changing the functions and the internal structure, it is possible to omit the new development of the semiconductor device and major design changes. And one chip
The development time and costs of new products equivalent to packages can be significantly reduced.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の一実施形態である半導体装置を示して
おり、(a)は一部省略一部切断平面図、(b)は
(a)のb−b線に沿う正面断面図、(c)は(a)の
c−c線に沿う正面断面図である。
1A and 1B show a semiconductor device according to an embodiment of the present invention, in which FIG. 1A is a partially cutaway plan view with a part omitted, FIG. 1B is a front sectional view taken along line bb of FIG. (C) is a front sectional view taken along line cc of (a).

【図2】(a)および(b)は小チップを示す一部切断
正面図および一部省略底面図である。(c)および
(d)は大チップを示す一部切断正面図および一部省略
底面図である。
FIGS. 2A and 2B are a partially cut front view and a partially omitted bottom view showing a small chip. (C) and (d) are a partially cut front view and a partially omitted bottom view showing a large chip.

【図3】本発明の一実施形態である半導体装置の製造方
法に使用される配線基板を示しており、(a)は一部切
断正面図、(b)は上半分が平面図で、下半分が底面図
である。
3A and 3B show a wiring board used in a method of manufacturing a semiconductor device according to an embodiment of the present invention, wherein FIG. 3A is a partially cut front view, FIG. Half is a bottom view.

【図4】同じく補助枠を示しており、(a)は一部切断
正面図、(b)は上半分が平面図で、下半分が底面図で
ある。
4 (a) is a partially cut front view, FIG. 4 (b) is a plan view of an upper half, and a bottom view of a lower half.

【図5】本発明の一実施形態である半導体装置の製造方
法における小チップ接続工程を示しており、(a)は接
続時の一部切断正面図、(b)は接続後の一部切断正面
図である。
5A and 5B show a small chip connecting step in a method for manufacturing a semiconductor device according to an embodiment of the present invention, wherein FIG. 5A is a partially cut front view at the time of connection, and FIG. It is a front view.

【図6】同じく補助枠接続工程を示しており、(a)は
接続時の一部切断正面図、(b)は接続後の一部切断正
面図である。
6A and 6B also show an auxiliary frame connecting step, in which FIG. 6A is a partially cut front view at the time of connection, and FIG. 6B is a partially cut front view after connection.

【図7】同じく大チップ接続工程を示しており、(a)
は接続時の一部切断正面図、(b)は接続後の一部切断
正面図である。
FIG. 7 also shows a large chip connection step, and (a)
Is a partially cut front view at the time of connection, and (b) is a partially cut front view after connection.

【図8】本発明の実施形態2である半導体装置を示して
おり、(a)は一部省略一部切断平面図、(b)は
(a)のb−b線に沿う正面断面図、(c)は(a)の
c−c線に沿う正面断面図である。
8A and 8B show a semiconductor device according to a second embodiment of the present invention, wherein FIG. 8A is a partially cutaway plan view with a part omitted, FIG. 8B is a front sectional view taken along line bb of FIG. (C) is a front sectional view taken along line cc of (a).

【符号の説明】[Explanation of symbols]

10…小チップ(半導体チップ)、11…第1主面、1
2…第2主面、13…電極パッド、14…接続端子、2
0…大チップ(半導体チップ)、21…第1主面、22
…第2主面、23…電極パッド、24…接続端子、25
…背の高い接続端子、30…配線基板、31…基板本
体、32…第1主面、33…内部端子、34…内部端子
用バンプ(内バンプ)、35…第2主面、36…外部端
子、37…外部端子用バンプ(外バンプ)、38…電気
配線、40…補助枠、41…枠本体、42…第1主面、
43…チップ側端子、44…枠バンプ、45…第2主
面、46…基板側端子、47…電気配線、48…接続端
子、50…樹脂封止体、51…MCM・IC(半導体装
置)。
10: small chip (semiconductor chip), 11: first main surface, 1
2: second main surface, 13: electrode pad, 14: connection terminal, 2
0: large chip (semiconductor chip), 21: first main surface, 22
... 2nd main surface, 23 ... electrode pad, 24 ... connection terminal, 25
... tall connection terminals, 30 ... wiring board, 31 ... substrate body, 32 ... first main surface, 33 ... internal terminals, 34 ... internal terminal bumps (inner bumps), 35 ... second main surface, 36 ... external Terminals, 37: external terminal bumps (outer bumps), 38: electric wiring, 40: auxiliary frame, 41: frame body, 42: first main surface,
43: chip side terminal, 44: frame bump, 45: second main surface, 46: substrate side terminal, 47: electric wiring, 48: connection terminal, 50: resin sealing body, 51: MCM / IC (semiconductor device) .

Claims (6)

【特許請求の範囲】[Claims] 【請求項1】 第1主面に内部端子群が形成され第2主
面に外部端子群が形成され各内部端子と各外部端子とが
電気的に接続された配線基板と、主面の大きさが異なる
複数個の半導体チップとを備えており、前記各半導体チ
ップが小さい順に下から前記配線基板の第1主面の上に
積み重なるように配置されているとともに、それぞれ対
向する前記内部端子群に機械的かつ電気的に接続されて
いることを特徴とする半導体装置。
A wiring board in which an internal terminal group is formed on a first main surface and an external terminal group is formed on a second main surface, and each internal terminal is electrically connected to each external terminal; And a plurality of semiconductor chips having different sizes, wherein the semiconductor chips are arranged so as to be stacked on the first main surface of the wiring board from below in ascending order, and the internal terminal groups facing each other A semiconductor device that is mechanically and electrically connected to the semiconductor device.
【請求項2】 小さい半導体チップが前記配線基板の第
1主面の中央部に配置されて対向する内部端子群に機械
的かつ電気的に接続されており、大きい半導体チップが
小さい半導体チップの上に同心的に重ねられて配置され
ているとともに、前記配線基板の第1主面の周辺部に配
置されて周辺部の内部端子群に機械的かつ電気的に接続
された補助枠の接続端子群に機械的かつ電気的に接続さ
れていることを特徴とする請求項1に記載の半導体装
置。
2. A small semiconductor chip is disposed at the center of the first main surface of the wiring substrate and is mechanically and electrically connected to a group of opposing internal terminals. And a connection terminal group of an auxiliary frame which is disposed concentrically on the first wiring board and which is disposed on the periphery of the first main surface of the wiring board and mechanically and electrically connected to the internal terminals on the periphery. 2. The semiconductor device according to claim 1, wherein the semiconductor device is mechanically and electrically connected to the semiconductor device.
【請求項3】 小さい半導体チップが前記配線基板の第
1主面の中央部に配置されて対向する内部端子群に機械
的かつ電気的に接続されており、大きい半導体チップが
小さい半導体チップの上に同心的に重ねられて配置され
ているとともに、前記配線基板の第1主面の周辺部の内
部端子群に機械的かつ電気的に接続されていることを特
徴とする請求項1に記載の半導体装置。
3. A small semiconductor chip is disposed at the center of the first main surface of the wiring board and mechanically and electrically connected to opposing internal terminals. 2. The wiring board according to claim 1, wherein the wiring board is arranged so as to be concentric with the wiring board, and is mechanically and electrically connected to an internal terminal group around the first main surface of the wiring board. Semiconductor device.
【請求項4】 請求項1に記載の半導体装置の製造方法
は次の工程を備えている、(a) 第1主面に内部端子
群が形成され第2主面に外部端子群が形成され各内部端
子と各外部端子とが電気的に接続された配線基板が準備
される配線基板準備工程、(b) 主面の大きさが異な
る複数個の半導体チップが準備される半導体チップ準備
工程、(c) 前記各半導体チップが小さい順に下から
前記配線基板の第1主面の上に積み重なるように配置さ
れているとともに、それぞれ対向する前記内部端子群に
機械的かつ電気的に接続される接続工程。
4. The method for manufacturing a semiconductor device according to claim 1, comprising the following steps: (a) an internal terminal group is formed on a first main surface, and an external terminal group is formed on a second main surface. A wiring board preparing step in which a wiring board in which each internal terminal and each external terminal are electrically connected is prepared; (b) a semiconductor chip preparing step in which a plurality of semiconductor chips having different main surface sizes are prepared; (C) a connection in which the semiconductor chips are arranged from the bottom in the ascending order so as to be stacked on the first main surface of the wiring substrate, and are mechanically and electrically connected to the internal terminal groups facing each other; Process.
【請求項5】 前記接続工程において、小さい半導体チ
ップが前記配線基板の第1主面の中央部に配置されて対
向する内部端子群に機械的かつ電気的に接続され、大き
い半導体チップが小さい半導体チップの上に同心的に重
ねられて配置されるとともに、前記配線基板の第1主面
の周辺部に配置されて周辺部の内部端子群に機械的かつ
電気的に接続された補助枠の接続端子群に機械的かつ電
気的に接続されることを特徴とする請求項4に記載の半
導体装置の製造方法。
5. In the connecting step, a small semiconductor chip is arranged at the center of the first main surface of the wiring board and mechanically and electrically connected to a group of internal terminals facing each other. Connection of an auxiliary frame disposed concentrically on the chip and disposed at the periphery of the first main surface of the wiring board and mechanically and electrically connected to the internal terminals at the periphery The method for manufacturing a semiconductor device according to claim 4, wherein the semiconductor device is mechanically and electrically connected to the terminal group.
【請求項6】 前記接続工程において、小さい半導体チ
ップが前記配線基板の第1主面の中央部に配置されて対
向する内部端子群に機械的かつ電気的に接続され、大き
い半導体チップが小さい半導体チップの上に同心的に重
ねられて配置されるとともに、前記配線基板の第1主面
の周辺部の内部端子群に機械的かつ電気的に接続される
ことを特徴とする請求項4に記載の半導体装置の製造方
法。
6. In the connecting step, a small semiconductor chip is arranged at the center of the first main surface of the wiring substrate and mechanically and electrically connected to a group of opposing internal terminals. 5. The semiconductor device according to claim 4, wherein the semiconductor device is disposed concentrically on the chip and is mechanically and electrically connected to a group of internal terminals in a peripheral portion of the first main surface of the wiring board. Of manufacturing a semiconductor device.
JP8255576A 1996-09-05 1996-09-05 Semiconductor device and method for manufacturing the same Pending JPH1084076A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8255576A JPH1084076A (en) 1996-09-05 1996-09-05 Semiconductor device and method for manufacturing the same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8255576A JPH1084076A (en) 1996-09-05 1996-09-05 Semiconductor device and method for manufacturing the same

Publications (1)

Publication Number Publication Date
JPH1084076A true JPH1084076A (en) 1998-03-31

Family

ID=17280644

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8255576A Pending JPH1084076A (en) 1996-09-05 1996-09-05 Semiconductor device and method for manufacturing the same

Country Status (1)

Country Link
JP (1) JPH1084076A (en)

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