JPH0979388A - Gate valve - Google Patents

Gate valve

Info

Publication number
JPH0979388A
JPH0979388A JP26244495A JP26244495A JPH0979388A JP H0979388 A JPH0979388 A JP H0979388A JP 26244495 A JP26244495 A JP 26244495A JP 26244495 A JP26244495 A JP 26244495A JP H0979388 A JPH0979388 A JP H0979388A
Authority
JP
Japan
Prior art keywords
gate valve
reaction
reaction pipe
distribution chamber
valve
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP26244495A
Other languages
Japanese (ja)
Inventor
Fumihide Ikeda
文秀 池田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kokusai Electric Corp
Original Assignee
Kokusai Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kokusai Electric Corp filed Critical Kokusai Electric Corp
Priority to JP26244495A priority Critical patent/JPH0979388A/en
Publication of JPH0979388A publication Critical patent/JPH0979388A/en
Pending legal-status Critical Current

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  • Sliding Valves (AREA)

Abstract

PROBLEM TO BE SOLVED: To add a gas feed and discharge function to a gate valve, to reduce a cost, and to effectively utilize a space by a method wherein an introduction hole is formed in a valve body and gas is fed in a container through the introduction hole. SOLUTION: A distribution chamber 18 extending in a lateral direction (a horizontal direction) is formed in the valve element 17 of a horizontally elongated rectangular gate valve 15 to close a carrier D for intercommunicating a reaction pipe and a conveyance chamber. The given number of introduction holes 19 are formed in the valve element 17 from the reaction pipe side, and the introduction holes 19 are communicated with the distribution chamber 18. A rod 20 to support the valve element 17, and a continuity flow passage 21 is formed along the axis of a rod 20 in such a state to span between the rod 20 and the valve element 17, the continuity flow passage 21 is communicated with the distribution chamber 18 and connected to a reaction gas feed source. In such a state that the interior of a reaction pipe is heated to a given temperature, a wafer is conveyed in the reaction pipe and the reaction pipe is closed with the gate valve 15. Reaction gas is introduced in the reaction pipe through the continuity flow passage 21, the distribution chamber 18, and the introduction hole 19, and exhausted through an exhaust port.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】本発明は気密な容器の開口部
に設けられ、該開口部を気密に閉塞するゲートバルブに
関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a gate valve provided at an opening of an airtight container and hermetically closing the opening.

【0002】[0002]

【従来の技術】半導体製造装置等では所要の雰囲気下で
或は真空下で処理がなされ、複数の処理室が連設され、
或は搬送室等を介して連設されている。従って、各処理
室間、或は処理室と搬送室等の間にはゲートバルブが設
けられ、処理室、搬送室を気密に雰囲気遮断、真空遮断
している。
2. Description of the Related Art In a semiconductor manufacturing apparatus or the like, processing is performed under a required atmosphere or under vacuum, and a plurality of processing chambers are provided in series.
Alternatively, they are continuously provided via a transfer chamber or the like. Therefore, a gate valve is provided between the processing chambers, or between the processing chamber and the transfer chamber, etc., to hermetically shut off the atmosphere and the vacuum between the processing chamber and the transport chamber.

【0003】従来のゲートバルブを図4に於いて説明す
る。
A conventional gate valve will be described with reference to FIG.

【0004】図4は枚葉式半導体製造装置を示してお
り、図中1は偏平な空間を画成する石英製の筒状反応
管、該反応管1の周囲にはヒータ2、該ヒータ2の更に
周囲には絶縁材3が設けられている。前記反応管1の上
流側端には給気フランジ4、下流側端には排気フランジ
5が設けられている。前記給気フランジ4には搬送室6
が気密に設けられ、前記搬送室6と反応管1を連絡する
開口部はゲートバルブ7により閉塞され、開口部とゲー
トバルブ7間にはOリング12が設けられ、閉塞状態で
の気密性が維持されている。前記ゲートバルブ7の開閉
機構部は前記搬送室6の外部下方に設けられ、該開閉機
構部の搬送室6貫通部はベローズ13により気密にシー
ルされている。又、前記排気フランジ5の開口部は閉塞
板8により気密に密閉されている。
FIG. 4 shows a single-wafer semiconductor manufacturing apparatus. In the figure, reference numeral 1 is a cylindrical reaction tube made of quartz that defines a flat space, a heater 2 is provided around the reaction tube 1, and a heater 2 is provided around the reaction tube 1. Further, an insulating material 3 is provided on the periphery. An air supply flange 4 is provided at the upstream end of the reaction tube 1, and an exhaust flange 5 is provided at the downstream end. A transfer chamber 6 is provided on the air supply flange 4.
Is provided in an airtight manner, and the opening that connects the transfer chamber 6 and the reaction tube 1 is closed by a gate valve 7, and an O-ring 12 is provided between the opening and the gate valve 7, so that the airtightness in the closed state is improved. Has been maintained. The opening / closing mechanism portion of the gate valve 7 is provided below the transfer chamber 6, and the penetrating portion of the opening / closing mechanism portion of the transfer chamber 6 is hermetically sealed by a bellows 13. The opening of the exhaust flange 5 is hermetically sealed by a closing plate 8.

【0005】前記給気フランジ4には給気ポート10が
設けられ、前記排気フランジ5には排気ポート11が設
けられ、前記給気ポート10よりウェーハ9の処理に必
要な反応ガスが供給され、前記排気ポート11からは反
応後のガスが排気される様になっている。
An air supply port 10 is provided in the air supply flange 4, an exhaust port 11 is provided in the exhaust flange 5, and a reaction gas necessary for processing the wafer 9 is supplied from the air supply port 10. The gas after the reaction is exhausted from the exhaust port 11.

【0006】前記搬送室6内部には被処理物であるウェ
ーハ9を前記反応管1内に搬入搬出する為の搬送機(図
示せず)が設けられており、前記ゲートバルブ7が開放
された状態でウェーハの搬送を行う。
Inside the transfer chamber 6, there is provided a transfer device (not shown) for loading and unloading the wafer 9 to be processed into and out of the reaction tube 1, and the gate valve 7 is opened. The wafer is transferred in this state.

【0007】前記ウェーハ9の処理は前記ヒータ2で反
応管1内を所要温度に加熱した状態で、前記ゲートバル
ブ7で反応管1を密閉し、前記給気フランジ4の給気ポ
ート10より反応ガスが導入され、該反応ガスは前記反
応管1を対角線状に流れて更に排気ポート11から排気
される。
In the processing of the wafer 9, the reaction tube 1 is sealed by the gate valve 7 while the inside of the reaction tube 1 is heated to the required temperature by the heater 2, and the reaction is performed from the air supply port 10 of the air supply flange 4. A gas is introduced, the reaction gas flows diagonally through the reaction tube 1, and is further exhausted from the exhaust port 11.

【0008】[0008]

【発明が解決しようとする課題】上記した従来の半導体
製造装置では反応ガスを給気フランジ4に設けた給気ポ
ート10より導入しているので、装置の構成として給気
フランジ4が必要であり、構造が複雑となり、装置の製
作コストが高くなると共に前記給気フランジ4を設ける
為の空間が必要となり、装置の小型化の弊害となってい
た。
In the conventional semiconductor manufacturing apparatus described above, the reaction gas is introduced from the air supply port 10 provided in the air supply flange 4, so that the air supply flange 4 is required as the structure of the apparatus. However, the structure is complicated, the manufacturing cost of the device is increased, and the space for providing the air supply flange 4 is required, which is an obstacle to downsizing of the device.

【0009】本発明は斯かる実情に鑑み、ゲートバルブ
にガス給排機能を付加して、コストの低減、スペースの
有効利用を図るものである。
In view of the above situation, the present invention aims to reduce the cost and effectively use the space by adding a gas supply / discharge function to the gate valve.

【0010】[0010]

【課題を解決するための手段】本発明は、弁体に導入孔
を設け、該導入孔より容器内にガスを供給可能としたも
のであり、弁体より反応ガスを導入する様にしたので、
構造が簡潔となり、又部品点数が減少するので装置の製
作コストを低減、装置を小型化できると共に、反応ガス
導入時に流れ方向が変向されないので流れの乱れが少な
く、処理が安定する。
According to the present invention, a valve body is provided with an introduction hole so that gas can be supplied into the container through the introduction hole, and the reaction gas is introduced from the valve body. ,
Since the structure is simple and the number of parts is reduced, the manufacturing cost of the apparatus can be reduced, the apparatus can be downsized, and since the flow direction is not changed when the reaction gas is introduced, the flow is less disturbed and the processing is stable.

【0011】[0011]

【発明の実施の形態】以下、図面を参照しつつ本発明の
実施の形態を説明する。
BEST MODE FOR CARRYING OUT THE INVENTION Embodiments of the present invention will be described below with reference to the drawings.

【0012】図1に於いて、図4中で示したものと同一
のものには同符号を付してある。
In FIG. 1, the same parts as those shown in FIG. 4 are designated by the same reference numerals.

【0013】偏平な空間を画成する石英製の筒状反応管
1の周囲にはヒータ2、該ヒータ2の更に周囲には絶縁
材3が設けられている。前記反応管1の上流側端には搬
送室6が気密に設けられ、下流端側には排気フランジ5
が設けられ、該排気フランジ5の開口部は閉塞板8によ
り気密に閉塞される。
A heater 2 is provided around a cylindrical reaction tube 1 made of quartz which defines a flat space, and an insulating material 3 is provided further around the heater 2. A transfer chamber 6 is airtightly provided at the upstream end of the reaction tube 1, and an exhaust flange 5 is provided at the downstream end.
Is provided, and the opening of the exhaust flange 5 is airtightly closed by the closing plate 8.

【0014】前記搬送室6と反応管1を連絡する搬送口
16はゲートバルブ15により閉塞され、該搬送口16
とゲートバルブ15間にはOリング12が設けられ、閉
塞状態での気密性が維持されている。前記ゲートバルブ
15の開閉機構部は前記搬送室6の外部下方に設けら
れ、該開閉機構部の搬送室6貫通部はベローズ(図示せ
ず)により気密にシールされている。又、前記排気フラ
ンジ5の開口部は閉塞板8により気密に密閉されてい
る。
The transfer port 16 connecting the transfer chamber 6 and the reaction tube 1 is closed by a gate valve 15, and the transfer port 16 is closed.
An O-ring 12 is provided between the gate valve 15 and the gate valve 15 to maintain airtightness in the closed state. The opening / closing mechanism part of the gate valve 15 is provided below the transfer chamber 6, and the penetrating part of the opening / closing mechanism part in the transfer chamber 6 is hermetically sealed by a bellows (not shown). The opening of the exhaust flange 5 is hermetically sealed by a closing plate 8.

【0015】前記ゲートバルブ15の構造を図2、図3
により説明する。
The structure of the gate valve 15 is shown in FIGS.
This will be described below.

【0016】前記反応管1、搬送室6を連通する前記搬
送口16を閉塞する横長矩形の弁体17の内部には横方
向(水平方向)に延びる分配室18が穿設され、前記弁
体17には前記反応管1側より導入孔19が所要数穿設
されている。該導入孔19は前記分配室18に連通し、
該分配室18に沿って所要間隔で設けられている。前記
弁体17を支持するロッド20、及び前記弁体17に掛
渡って前記ロッド20の軸心に沿って導通流路21が穿
設され、該導通流路21は前記分配室18に連通すると
共に図示しない反応ガス供給源に接続されている。
A distribution chamber 18 extending in the lateral direction (horizontal direction) is bored inside a horizontally elongated rectangular valve body 17 that closes the transfer port 16 that connects the reaction tube 1 and the transfer chamber 6. The required number of introduction holes 19 are formed in the reaction tube 17 from the side of the reaction tube 1. The introduction hole 19 communicates with the distribution chamber 18,
It is provided along the distribution chamber 18 at required intervals. A rod 20 that supports the valve body 17, and a conduction flow passage 21 that extends over the valve body 17 are provided along the axis of the rod 20, and the conduction flow passage 21 communicates with the distribution chamber 18. It is also connected to a reaction gas supply source (not shown).

【0017】前記ウェーハ9の処理は前記ヒータ2で反
応管1内を所要温度に加熱した状態で、ウェーハ9を反
応管1内に搬入し、前記ゲートバルブ15で反応管1を
密閉し、前記導通流路21、分配室18、導入孔19を
経て反応ガスを反応管1内に導入する。前記導入孔19
より流入した反応ガスは水平方向に流れ、更に排気ポー
ト11から排気される。
In the processing of the wafer 9, the wafer 9 is loaded into the reaction tube 1 while the inside of the reaction tube 1 is heated to the required temperature by the heater 2, and the reaction tube 1 is sealed by the gate valve 15, A reaction gas is introduced into the reaction tube 1 through the flow passage 21, the distribution chamber 18, and the introduction hole 19. The introduction hole 19
The reaction gas further flowing in flows in the horizontal direction and is further exhausted from the exhaust port 11.

【0018】上記した様に反応ガスの流入方向が水平方
向であるので、反応に好ましい層流状態が流入時点より
直ちに得られ、安定した処理が行える。
Since the inflow direction of the reaction gas is horizontal as described above, a laminar flow state suitable for the reaction can be obtained immediately after the inflow time, and stable treatment can be performed.

【0019】尚、上記実施の形態では前記導入孔19は
1列に穿設したが、2列、或は所要の幅で分散させ穿設
してもよい。
Although the introduction holes 19 are formed in one row in the above embodiment, they may be formed in two rows or dispersed in a required width.

【0020】[0020]

【発明の効果】以上述べた如く本発明によれば、弁体よ
り反応ガスを導入する様にしたので、従来の様に給気フ
ランジが不要となり、構造が簡潔となり、又部品点数が
減少するので装置の製作コストを低減、装置を小型化で
きる。反応ガス導入時に流れ方向が変向されないので流
れの乱れが少なく、安定した処理が可能となる。
As described above, according to the present invention, since the reaction gas is introduced from the valve body, the air supply flange is not required as in the conventional case, the structure is simple, and the number of parts is reduced. Therefore, the manufacturing cost of the device can be reduced and the device can be downsized. Since the flow direction is not changed when the reaction gas is introduced, there is little turbulence in the flow, and stable processing is possible.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の実施の形態を示す断面図である。FIG. 1 is a sectional view showing an embodiment of the present invention.

【図2】該実施の形態に於ける弁体を示す正面図であ
る。
FIG. 2 is a front view showing a valve body according to the embodiment.

【図3】同前実施の形態に於ける弁体を示す側断面図で
ある。
FIG. 3 is a side sectional view showing a valve element according to the embodiment.

【図4】従来例を示す断面図である。FIG. 4 is a sectional view showing a conventional example.

【符号の説明】[Explanation of symbols]

1 反応管 2 ヒータ 6 搬送室 15 ゲートバルブ 17 弁体 18 分配室 19 導入孔 21 導通流路 DESCRIPTION OF SYMBOLS 1 Reaction tube 2 Heater 6 Transfer chamber 15 Gate valve 17 Valve body 18 Distribution chamber 19 Introduction hole 21 Conducting flow path

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 弁体に導入孔を設け、該導入孔より容器
内にガスを供給可能としたことを特徴とするゲートバル
ブ。
1. A gate valve characterized in that an introduction hole is provided in a valve body, and gas can be supplied into the container through the introduction hole.
JP26244495A 1995-09-14 1995-09-14 Gate valve Pending JPH0979388A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP26244495A JPH0979388A (en) 1995-09-14 1995-09-14 Gate valve

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP26244495A JPH0979388A (en) 1995-09-14 1995-09-14 Gate valve

Publications (1)

Publication Number Publication Date
JPH0979388A true JPH0979388A (en) 1997-03-25

Family

ID=17375883

Family Applications (1)

Application Number Title Priority Date Filing Date
JP26244495A Pending JPH0979388A (en) 1995-09-14 1995-09-14 Gate valve

Country Status (1)

Country Link
JP (1) JPH0979388A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2012128029A1 (en) * 2011-03-18 2012-09-27 東京エレクトロン株式会社 Gate valve unit, substrate processing device and substrate processing method thereof

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2012128029A1 (en) * 2011-03-18 2012-09-27 東京エレクトロン株式会社 Gate valve unit, substrate processing device and substrate processing method thereof
JP2012197476A (en) * 2011-03-18 2012-10-18 Tokyo Electron Ltd Gate valve device, device for processing substrate, and method for processing the substrate
US9121515B2 (en) 2011-03-18 2015-09-01 Tokyo Electron Limited Gate valve unit, substrate processing device and substrate processing method thereof

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