JPH09160794A - Module test method using flash memory and test program storage rom card - Google Patents

Abstract

PROBLEM TO BE SOLVED: To secure the storage area for a test program, to shorten the loading time of the test program and also to hold the loaded test program even in the cut-off of a power supply so as to improve the operability and the working efficiency in a module test method. SOLUTION: When a TP ROM card 12 is put into a prescribed slot of a module 11 to be tested, a TP boot program 22 of the ROM of a CPU card 13 detects the card 12 to transfer and load the programs 23' and 24' included in the card 12 into a flash memory of the card 13. The control is shifted to a TP program 23 of the flash memory, and a test program 24 is set in an executable state. Then, a tester receives a test execution instruction through a terminal 17 connected to the card 13 and performs the test of the module 11 by analyzing the test result.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a module test system in a one-chip microcomputer mounting system having a flash memory as a component.

[0002]

2. Description of the Related Art A conventional technique related to this type of module test method will be described below. I incorporating an IC chip having a non-volatile data memory and a control element such as a CPU
In a portable electronic device called a C card, in a conventional method of loading a test program (test program) for determining pass / fail of a manufactured IC card into a data memory of the IC card and executing the test program, In order to solve the problem that a new test program cannot be written and executed after manufacturing, for example, in JP-A-63-73339, it is possible to electrically erase and write in the program section in addition to the mask ROM, for example. Read only memory (EEPROM), electrically writable read only memory (EPROM) or RA
A means for writing a test program for allocating a writable memory unit such as M (random access memory), and determining whether the portable electronic device is good or bad to the writable memory unit when a predetermined condition is satisfied, and the writing unit. There has been proposed a portable electronic device characterized in that it comprises means for executing a test program.

[0003]

However, the first problem of the above-mentioned conventional method is that when the ROM (read-only memory) incorporated in the product is selected as the test program storage memory, the test program It is limited by capacity (size).

This is because the ROM built into the product normally stores the user program, and it is impossible to easily increase the ROM capacity from the viewpoint of manufacturing cost. Therefore, the test program capacity is naturally limited. Because you will receive.

The second problem of the above conventional method is that
When the product built-in RAM is selected as the test program storage memory, the work efficiency of the module test by the test program becomes low.

[0006] This is due to the built-in R
This is because the test program on the AM has been erased, and thus the test program loading operation is required again.

Therefore, the present invention solves the above-mentioned problems of the prior art, improves the maintainability of the product by securing a sufficient storage area for the test program, and shortens the load time of the test program. Further, it is an object of the present invention to provide a module test system that improves the operability and the work efficiency by holding the loaded test program even when the product is powered off.

[0008]

In order to achieve the above-mentioned object, the present invention provides a one-chip microcomputer mounting system having a flash memory as a component, from a test program storing ROM card equipped with a ROM storing a test program. There is provided a module test method characterized in that a test program is loaded into the flash memory and a module under test is tested by the test program on the flash memory.

In the present invention, a test program storage ROM (“TP_ROM”) is preferably provided in the product module.
It has a dedicated slot for the card, and the product CPU
By expanding the logical access memory space of the card in advance, the CPU has means for directly accessing the program storage area of the TP_ROM card.
By inserting the TP_ROM card into the ROM card-dedicated slot, the test program is loaded into the flash memory built into the product by the memory-memory transfer, and thereafter the means for controlling the test program on the flash memory to be executed is provided. It is characterized by having.

According to the present invention, the product built-in flash memory (batch erasing type EEPROM (electrically erasable and writable read-only memory)) in which a large-scale user program is stored is operated before the operation of the product. By adopting the form used during product testing, it is possible to secure a sufficient area for the capacity of the test program.

Since the test program is stored in the flash memory, the program is not erased even when the power of the product is cut off. Therefore, during the module inspection period, the test program is deleted every time the power is turned off and the power is turned on. It is not necessary to reload, and work efficiency can be improved.

[0012]

Embodiments of the present invention will be described in detail below with reference to the drawings.

FIG. 1 shows a configuration example of hardware according to a test system according to an embodiment of the present invention.

As shown in FIG. 1, in this embodiment, a product module 11 having a dedicated slot for a TP_ROM card 12 which is a ROM for storing a test program, a test program, and a TP for controlling the test program. (Test program) TP_ROM card 12 having a ROM storing a control program, and TP
Product CPU card 13 having a ROM storing a boot program and a user program, other product cards under test 14, 15, 16 and CPU card 1
3 and a terminal 17 as a man-machine interface (input / output means) connected to the terminal 3.

FIG. 2 shows an example of a software configuration (memory allocation) in the embodiment of the present invention.

The ROM of the TP_ROM card 12 stores a test program 24 'for testing a module and a TP control program 23' for scheduling control of the test program.

The ROM of the CPU card 13 has a T
The insertion of the P_ROM card 12 into the dedicated slot is detected, the program stored and stored in the TP_ROM card 12 is loaded into the flash memory (F_ROM) of the product CPU card 13, and at the end of loading, the loaded TP on the flash memory is loaded. A TP boot program 22 configured to transfer control to a control program 23,
A user program 21 and are stored. Also,
As shown in FIG. 2, the flash memory (F_ROM) of the product CPU card 13 is stored in the TP_ROM by the TP boot program 22 during the test of the product module.
Test program 2 loaded from ROM of card 12
4, and a TP control program 23 that manages and controls this,
Is stored in memory. The flash memory (F_ROM) of the product CPU card 13 stores and holds the user program during product operation.

The operation of one embodiment of the present invention will be described below with reference to the drawings.

When the TP_ROM card 12 is inserted into a predetermined dedicated slot of the module under test 11, the product CPU
The TP boot program 22 in the ROM of the card 13
When the insertion of the P_ROM card 12 is detected, the programs 23 'and 24' in the TP_ROM card 12 are stored in the product CPU.
It is loaded into the flash memory (F_ROM) of the card 13 by memory-memory transfer.

The TP boot program 22 is configured to monitor whether or not the TP_ROM card 12 is inserted into the slot at regular intervals, and TP_R.
The OM card 12 is preferably the module under test 11
It is said that the system can be inserted and removed while the power is on.

When the transfer of the test program to the flash memory (F_ROM) is completed, the control is transferred to the TP control program 23 on the loaded flash memory, and the test program 24 becomes ready for execution.

At this point, the TP_ROM card 12
It is not needed when testing the device.

The module inspector conducts the module inspection from the terminal 17 which is a man-machine interface connected to the CPU card 13 by instructing the test execution and analyzing the test results.

In the first embodiment, the product module is provided with the TP_ROM card 12 dedicated slot.
If the memory can be accessed from the CPU card 13, it is not particularly necessary to provide a dedicated slot, and the existing card slot can be used.

The flash memory 12 of the CPU card 13 usually has a sufficient capacity to store a large-scale user program, and the test program transferred to this flash memory stores the test data in storage. Not subject to capacity restrictions.

[0026]

As described above, according to the present invention,
By using the built-in flash memory that stores a large-scale user program during product operation as a test program storage memory during product testing before operation, a sufficient area for test program capacity can be secured. It has an advantage of being almost free from the capacity limitation of the program.

Further, according to the present invention, since the storage memory of the test program is the flash memory, the test program is not erased even when the power of the product is cut off. Therefore, the test program is reloaded even when the power is cut off. It is not necessary to do so, and this has the effect of improving the work efficiency of the module test by the test program.

[Brief description of the drawings]

FIG. 1 is a diagram showing a hardware configuration for explaining a test method according to an embodiment of the present invention.

FIG. 2 is a diagram showing a software configuration (memory arrangement) for explaining a test method according to an embodiment of the present invention.

[Explanation of symbols]

 11 Module under Test 12 TP_ROM Card 13 CPU Card 14-15 Product Card 21 User Program 22 TP Control Boot Program 23 TP Control Program 24 Test Program F_ROM Flash Memory

Claims (2)

[Claims] 1. In a one-chip microcomputer mounting system having a flash memory as a component, the test program is loaded into the flash memory from a test program storing ROM card having a ROM storing the test program, and the test program is loaded on the flash memory. A module test method characterized in that a module to be tested is tested by the test program. 2. When a card including a read-only memory storing a test program and its control program is inserted into a predetermined slot, the insertion of the card into the slot is detected, and the read-only memory of the card is stored. The program includes means for loading a flash memory in which a user program is stored during product operation, and the test program of the module under test is controlled under the control of the control program of the test program loaded on the flash memory. A module test method characterized by being set to an executable state.