JPH09126712A - Laser length measuring machine - Google Patents

Laser length measuring machine

Info

Publication number
JPH09126712A
JPH09126712A JP7281549A JP28154995A JPH09126712A JP H09126712 A JPH09126712 A JP H09126712A JP 7281549 A JP7281549 A JP 7281549A JP 28154995 A JP28154995 A JP 28154995A JP H09126712 A JPH09126712 A JP H09126712A
Authority
JP
Japan
Prior art keywords
light
prism
beam splitter
corner
reflected
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP7281549A
Other languages
Japanese (ja)
Other versions
JP3739121B2 (en
Inventor
Kazunori Tanaka
和規 田中
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sokkia Co Ltd
Original Assignee
Sokkia Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sokkia Co Ltd filed Critical Sokkia Co Ltd
Priority to JP28154995A priority Critical patent/JP3739121B2/en
Publication of JPH09126712A publication Critical patent/JPH09126712A/en
Application granted granted Critical
Publication of JP3739121B2 publication Critical patent/JP3739121B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Length Measuring Devices By Optical Means (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)

Abstract

PROBLEM TO BE SOLVED: To simplify the alignment work and to provide a length measuring device in which no shifting of alignment occurs by constituting a reflection target of a corner prism and providing a small corner prism for receiving a reflected light and reflecting an incident light on the same optical path in the vicinity of an interference gauge. SOLUTION: A corner prism 18 is provided on the lower side of the 1/4λ plate 16 of the prism part of a polarizing beam splitter 12, a corner prism 4 is provided in the upper part of a traveling object 3 and small corner prism 20 is provided on the upper front face of a housing. A reference light is reflected by the polarizing beam splitter 12, reflected by the prism 18 after passing through the 1/4λ plate 16, passed through 1/4λ plate 16 again and made incident on the polarizing beam splitter 12. A measuring light is made incident on the prism 4 after passing through the 1/4λplate 16. A reflected light from the prism 4 is reflected by the prism 20 and made incident again on the polarizing beam splitter 12 after being sent on the same optical path. The measuring light is made to interfere with the reference light and received by a length measuring optical system 5.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】この発明は、レーザ光のダブ
ルパスによって測定精度をさらに向上させることができ
るレーザ測長機に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a laser length measuring machine capable of further improving measurement accuracy by double-passing laser light.

【0002】[0002]

【従来の技術】レーザ測長機は、精密X−Yテーブルの
移動長さの精密測定などに使用されている。この種のレ
ーザ測長機の一般的な構成を図4に示している。同図に
示すレーザ測長機は、レーザヘッド1と、干渉計2(具
体的には、偏光ビームスプリッタ)と、測定対象物であ
る移動体3上に設置される反射ターゲット4(具体的に
は、コーナープリズム)と、測長光学系5および参照光
用プリズム6とから構成されている。
2. Description of the Related Art A laser length measuring machine is used for precise measurement of a moving length of a precision XY table. A general configuration of this type of laser length measuring machine is shown in FIG. The laser length-measuring machine shown in FIG. 1 includes a laser head 1, an interferometer 2 (specifically, a polarization beam splitter), and a reflection target 4 (specifically, a reflection target 4 installed on a moving body 3 which is an object to be measured. Is a corner prism), a length measuring optical system 5 and a reference light prism 6.

【0003】この測長機においては、レーザヘッド1か
ら発射されたレーザ光は、偏光ビームスプリッタ2に入
射し、この偏光ビームスプリッタ2で反射光と透過光と
に分割され、透過光が測定光としてコーナープリズム4
を照射するとともに、反射光が、参照光としてプリズム
6を照射する。コーナープリズム4およびプリズム6か
らの反射光は、再び偏光ビームスプリッタ2に入射し、
この偏光ビームスプリッタ2で干渉させられ、干渉光が
測長光学系5に入射する。
In this length measuring machine, the laser beam emitted from the laser head 1 is incident on a polarization beam splitter 2, and is split into reflected light and transmitted light by the polarized beam splitter 2, and the transmitted light is measured light. As corner prism 4
And the reflected light illuminates the prism 6 as reference light. The reflected light from the corner prism 4 and the prism 6 is incident on the polarization beam splitter 2 again,
The polarized beam splitter 2 interferes with each other, and the interference light enters the length measurement optical system 5.

【0004】干渉光を受けた測長光学系5では、干渉縞
を検出,計数することにより、干渉計2からコーナープ
リズム4までの距離Lを演算する。このような構成の測
長機における分解能は、通常、0.01μm程度であ
り、精度の高い測定を行うことができる。一方、この分
解能をさらに向上させるための手法として、プレーンミ
ラー(平面鏡)を用いたダブルパス方法がある。図5
は、そのダブルパス方式による測定系を示すものであ
る。図における干渉計は、図4の構成に加え、偏光ビー
ムスプリッタ2の下部にもプリズム6を配置するととも
に、偏光ビームスプリッタ2の前面に1/4λ板7を配
置している。また、移動体3の測定位置には、コーナプ
リズム4に換えてプレーンミラー8を対向配置してい
る。
The length-measuring optical system 5 which has received the interference light calculates the distance L from the interferometer 2 to the corner prism 4 by detecting and counting interference fringes. The resolution of the length measuring machine having such a configuration is usually about 0.01 μm, and highly accurate measurement can be performed. On the other hand, as a method for further improving this resolution, there is a double-pass method using a plane mirror. FIG.
Shows the measurement system by the double pass method. In the interferometer in the figure, in addition to the configuration of FIG. 4, a prism 6 is arranged below the polarization beam splitter 2 and a 1/4 λ plate 7 is arranged in front of the polarization beam splitter 2. Further, at the measurement position of the moving body 3, instead of the corner prism 4, a plane mirror 8 is arranged so as to face it.

【0005】この構成においては、レーザ光のうちの参
照光は、前記測長機と同様に偏光ビームスプリッタ2
内で反射して、偏光ビームスプリッタ2に戻る。これに
対し、偏光ビームスプリッタ2を透過した測定光は、
1/4λ板7を通過することにより円偏光となってプレ
ーンミラー8を照射する。プレーミラー8からの反射光
は、再び1/4λ板7を通過して偏光ビームスプリッ
タ2に入射する。
In this structure, the reference beam of the laser beam is the same as that of the length measuring machine, which is the polarization beam splitter 2.
It is reflected inside and returns to the polarization beam splitter 2. On the other hand, the measurement light transmitted through the polarization beam splitter 2 is
Circularly polarized light passes through the 1/4 λ plate 7 to illuminate the plane mirror 8. The reflected light from the play mirror 8 passes through the quarter-wave plate 7 again and enters the polarization beam splitter 2.

【0006】この入射光は、参照光と同じく90°傾
いた直線偏光であるため、偏光ビームスプリッタ2内で
反射し、下部側のプリズム6に入射する。この入射光
は、プリズム6で反射して、再び偏光ビームスプリッタ
2に入射し、偏光ビームスプリッタ2内で反射した後の
反射光は、1/4λ板7を通過して、測定光と平行
にプレーンミラー8を照射する。
Since the incident light is linearly polarized light inclined by 90 ° like the reference light, it is reflected in the polarization beam splitter 2 and enters the prism 6 on the lower side. This incident light is reflected by the prism 6 and again enters the polarization beam splitter 2, and the reflected light after being reflected in the polarization beam splitter 2 passes through the 1/4 λ plate 7 and becomes parallel to the measurement light. The plane mirror 8 is illuminated.

【0007】プレーンミラー8からの反射光は、反射
光と同じ光路上を通って、再び1/4λ板7を通過す
ることで、さらに90°傾いた直線偏光となって偏光ビ
ームスプリッタ2に戻るので、今度は、偏光ビームスプ
リッタ2を透過し、この部分で参照光と合成されれ
て、干渉させられる。この構成においては、測定光の光
路長がシングルパスの場合に比べて二倍となるため、実
質上、同一測長距離Lの二倍の長さを計測することにな
り、従ってその分解能は、シングルパスの場合よりも向
上して0.005μm程度となり、さらに測長精度を高
くすることができるため、超精密測定に好適である。
The reflected light from the plane mirror 8 passes through the same optical path as the reflected light and again passes through the 1/4 λ plate 7 to become linearly polarized light inclined by 90 ° and returns to the polarization beam splitter 2. Therefore, this time, the light passes through the polarization beam splitter 2, and is combined with the reference light at this portion to cause interference. In this configuration, the optical path length of the measuring light is twice as long as that in the case of a single path, so that the length of the same measuring distance L is actually measured, and therefore the resolution is It is improved to about 0.005 μm as compared with the case of a single pass, and the length measurement accuracy can be further increased, which is suitable for ultra-precision measurement.

【0008】しかしながら、この構成においては、反射
ターゲットとしてプレーンミラー8を用いているため、
次に述べる欠点が指摘されていた。
However, in this configuration, since the plane mirror 8 is used as the reflection target,
The following drawbacks have been pointed out.

【0009】[0009]

【発明が解決しようとする課題】すなわち、プレーンミ
ラー8を用いた場合には、図6に示すように、プレーン
ミラー8の鏡面が、干渉計2の光軸に対して正確に正対
配置されていないと、反射光がずれやすく、測長光学系
での受光量が不足する原因となる。このため、この種の
ダブルパス方式の測長機では、アライメント作業に高精
度が要求されるので、手間や時間がかかっていた。
That is, when the plane mirror 8 is used, as shown in FIG. 6, the plane surface of the plane mirror 8 is arranged so as to directly face the optical axis of the interferometer 2. If not, the reflected light is likely to be displaced, which causes a shortage of the amount of light received by the length measurement optical system. For this reason, in this type of double-pass type length measuring machine, high precision is required for alignment work, which takes time and effort.

【0010】また、アライメント作業を非常に厳密に行
ったとしても、被測定物である移動体がピッチング、ヨ
ーイングなどの角度運動を行うと、アライメントがず
れ、受光量不足により受光感度が低下する欠点があっ
た。この発明は、以上の欠点を解決するものであって、
その目的とするところは、アライメント作業が簡単で、
アライメントのずれのないレーザ測長機を提供すること
にある。
Further, even if the alignment work is performed very strictly, if the moving body as the object to be measured makes angular movements such as pitching and yawing, the alignment is deviated, and the light receiving sensitivity is lowered due to insufficient light receiving amount. was there. This invention solves the above drawbacks,
The purpose is that the alignment work is easy,
An object of the present invention is to provide a laser length measuring machine having no misalignment.

【0011】[0011]

【課題を解決するための手段】前記目的を達成するた
め、この発明のうち請求項1記載の発明は、レーザヘッ
ドから出射されたレーザ光を、干渉計を介して一対の反
射ターゲットに照射し、これらの反射ターゲットからの
反射光を前記干渉計で相互に干渉させ、得られた干渉光
に基づいて測距するレーザ測長機において、前記反射タ
ーゲットの少なくとも一方をコーナープリズムで構成す
るとともに、前記干渉計の近傍に、前記コーナープリズ
ムの反射光を受け、この反射光と同一光路上に入射光を
反射させる小型コーナープリズムを設けた。請求項1の
構成によれば、光路長を二倍とし、しかも、反射用のタ
ーゲットにコーナープリズムを使用することができるの
で、アライメント作業の簡素化と、移動体のピッチン
グ,ヨーイングなどによる受光光量の減少を防止でき
る。また、請求項2の発明においては、前記反射ターゲ
ットは、上下方向の同軸上に配置されたコーナープリズ
ムから構成され、前記コーナープリズムを移動体などの
測定対象物上に設けるとともに、これらの各コーナープ
リズムからの反射光を受け、各反射光と同一光路上に入
射光を反射させる一対の小型コーナープリズムを設け
た。この構成によれば、測定対象物のピッチング,ヨー
イングなどの角度を超高精度に測定することができる。
In order to achieve the above object, the invention according to claim 1 of the present invention irradiates a pair of reflective targets with laser light emitted from a laser head through an interferometer. In the laser length measuring machine for causing reflected light from these reflective targets to interfere with each other in the interferometer, and performing distance measurement based on the obtained interference light, at least one of the reflective targets is configured with a corner prism, A small corner prism that receives the reflected light of the corner prism and reflects the incident light on the same optical path as the reflected light is provided near the interferometer. According to the configuration of claim 1, since the optical path length is doubled and the corner prism can be used as the reflection target, the alignment work can be simplified and the amount of light received by the pitching, yawing, etc. of the moving body can be simplified. Can be prevented from decreasing. Further, in the invention of claim 2, the reflection target is composed of a corner prism arranged coaxially in the vertical direction, the corner prism is provided on a measurement object such as a moving body, and each of these corners is provided. A pair of small corner prisms are provided which receive the reflected light from the prisms and reflect the incident light on the same optical path as each reflected light. According to this configuration, the pitching, yawing, and other angles of the measuring object can be measured with extremely high accuracy.

【0012】[0012]

【発明の実施の形態】以下、この発明の好ましい実施の
形態について添付図面を参照しつつ詳細に説明する。図
1は、この発明に係るレーザ測長機の一実施例を示して
いる。なお、以下の説明においては、従来と同一若しく
は相当する部分には同一符号を付し、異なる部分にのみ
異なる符号を付して説明する。
BEST MODE FOR CARRYING OUT THE INVENTION Preferred embodiments of the present invention will now be described in detail with reference to the accompanying drawings. FIG. 1 shows an embodiment of a laser length measuring machine according to the present invention. In the following description, the same or corresponding parts as in the related art will be denoted by the same reference numerals, and different parts will be denoted by different reference numerals.

【0013】図1に示した測長機における干渉計10
は、ハウジング内にあって、三角プリズム部12aと平
行四辺形のプリズム部12bとを一体化した偏光ビーム
スプリッタ12と、偏光ビームスプリッタ12のプリズ
ム部12bの前面及びプリズム部12aの底面にそれぞ
れ配置された一対の1/4λ板16a,16bと、1/
4λ板16bの下方に配置されたコーナプリズム18
(反射ターゲット)及びハウジングの上部前面に配置さ
れた小型コーナプリズム20とを備えている。
Interferometer 10 in the length measuring machine shown in FIG.
Is a polarizing beam splitter 12 in which a triangular prism portion 12a and a parallelogram prism portion 12b are integrated in a housing, and is arranged on the front surface of the prism portion 12b and the bottom surface of the prism portion 12a of the polarizing beam splitter 12, respectively. Pair of 1/4 λ plates 16a and 16b
Corner prism 18 arranged below the 4λ plate 16b
(Reflective target) and a small corner prism 20 arranged on the front surface of the upper part of the housing.

【0014】プリズム部12b側に設けられた1/4λ
板16aの前面は、移動体3の上部に固定配置された反
射ターゲットであるコーナプリズム4に対向していると
ともに、前記小型コーナプリズム20は、コーナプリズ
ム4の反射光軸と同軸上に対面し、かつ、干渉計10内
のプリズム部12bの近傍に設置されている。この小型
コーナープリズム20は、コーナープリズム4からの反
射光を受け、この反射光と同一光路上に入射した光を反
射する。
1 / 4λ provided on the prism portion 12b side
The front surface of the plate 16a faces a corner prism 4 which is a reflection target fixedly arranged on the upper part of the moving body 3, and the small corner prism 20 faces the reflection optical axis of the corner prism 4 coaxially. Further, it is installed in the vicinity of the prism portion 12b in the interferometer 10. The small-sized corner prism 20 receives the reflected light from the corner prism 4 and reflects the light incident on the same optical path as the reflected light.

【0015】以上の構成において、レーザヘッド1から
発射されたレーザ光のうち、参照光は、偏光ビームス
プリッタ12によって下部側に反射し、1/4λ板16
を通過することで、円偏光となり、コーナプリズム18
で反射し、再び1/4λ板16を通過して偏光ビームス
プリッタ12内に入射する。このような光路で入射する
参照光は、1/4λ板16を2度通過することで、元
の偏光角度から90°回転させられるので、偏光ビーム
スプリッタ12に入射すると、今度は下から上に通過
し、プリズム部12bで90°反射して、測長光学系5
に入射する。
In the above structure, the reference light of the laser light emitted from the laser head 1 is reflected to the lower side by the polarization beam splitter 12, and the 1/4 λ plate 16
Circularly polarized light by passing through the corner prism 18
The light is reflected by, and again passes through the quarter-wave plate 16 and enters the polarization beam splitter 12. The reference light incident on such an optical path is rotated 90 ° from the original polarization angle by passing through the 1/4 λ plate 16 twice, so that when it is incident on the polarization beam splitter 12, this time from bottom to top. It passes through and is reflected by the prism portion 12b by 90 °, and the length measurement optical system 5
Incident on.

【0016】また、偏光ビームスプリッタ12を通過す
る測定光は、1/4λ板16を通過することで、円偏
光となってコーナプリズム4に入射する。コーナープリ
ズム4側に入射した測定光の反射光は、上方に変移
して小型コーナープリズム20にのほぼ中心に入射す
る。小型コーナープリズム20からの反射光は、反射
光と同一光路上を通って、再びコーナープリズム4に
入射し、コーナープリズム4からの反射光は、測定光
と同じ光路を辿って、再び1/4λ板16を介して偏
光ビームスプリッタ12内に入射する。
Further, the measurement light passing through the polarization beam splitter 12 passes through the 1/4 λ plate 16 to become circularly polarized light and enters the corner prism 4. The reflected light of the measurement light that has entered the corner prism 4 side shifts upward and enters the small-sized corner prism 20 substantially at the center thereof. The reflected light from the small-sized corner prism 20 passes through the same optical path as the reflected light and enters the corner prism 4 again, and the reflected light from the corner prism 4 follows the same optical path as the measurement light and again becomes 1 / 4λ. The light enters the polarization beam splitter 12 via the plate 16.

【0017】これによって測定光は、1/4λ板16
を二回通過することになり、もとの偏光角度に対し90
°傾いた直線偏光となるので、偏光ビームスプリッタ1
2内で反射して、この部分で合成される参照光と干渉
させられ、これらの干渉光が測長光学系5に受光され
ることになる。このように構成された測長機によれば、
測定光の光路長がシングルパスの場合に比べて二倍と
なるため、同一測長距離Lの二倍の長さを実質的に計測
することになり、その分解能は、プレーンミラーを用い
た場合と同様に、0.005μm程度となる。またこれ
に加え、図2に示すように、コーナプリズム4は多少傾
いたとしても、その入光及び反射光軸は不動であるた
め、十分な光量で測長光学系5に受光させることができ
る。
As a result, the measuring light is emitted from the quarter-wave plate 16
Will be passed twice, and 90 ° with respect to the original polarization angle.
Polarized beam splitter 1
The reflected light is reflected inside 2 and interferes with the reference light combined in this portion, and these interference lights are received by the length measuring optical system 5. According to the length measuring machine configured in this way,
Since the optical path length of the measuring light is twice as long as that in the case of a single path, it means that a length twice as long as the same measuring distance L is substantially measured, and its resolution is when the plane mirror is used. Similarly, the thickness is about 0.005 μm. In addition to this, as shown in FIG. 2, even if the corner prism 4 is slightly tilted, its incident light and reflected light axes are immovable, so that the length measuring optical system 5 can receive light with a sufficient amount of light. .

【0018】従って、これによってアライメント作業が
簡略化されるとともに、移動体3のピッチング、ヨーイ
ングなどによる光量変動がなく、感度を一定に保持する
ことができ、安定な測定を行うことができる。図3は、
この発明にかかる測長機の他の実施例を示している。同
図に示す測長機は、この発明を角度光学測定系に適用し
た場合であり、以下にその特徴点についてのみ説明す
る。同図に示した実施例では、偏光ビームスプリッタ3
0は、上下方向に一辺を密着するように配置された平行
四辺形状のプリズム部32を一対有している。
Therefore, the alignment work is simplified by this, the light quantity does not change due to the pitching and yawing of the moving body 3, the sensitivity can be kept constant, and stable measurement can be performed. FIG.
The other Example of the length measuring machine concerning this invention is shown. The length measuring machine shown in the figure is a case where the present invention is applied to an angle optical measuring system, and only the characteristic points will be described below. In the embodiment shown in the figure, the polarization beam splitter 3
0 has a pair of parallelogram-shaped prism portions 32 arranged so that one side thereof is closely attached in the vertical direction.

【0019】各プリズム32の出射面側には、1/4λ
板16c,16dがそれぞれ配置され、各1/4λ板1
6c,16dには、移動体3側に設けた一対のコーナプ
リズム4a,4bが対向配置されている。また、偏光ビ
ームスプリッタ30の前部側には、これに近接するよう
にして、各コーナプリズム4からの入射光を同一光路上
に反射する一対の小型コーナプリズム20a,20bが
配置されている。
On the exit surface side of each prism 32, ¼λ
Plates 16c and 16d are arranged, and each ¼ λ plate 1
A pair of corner prisms 4a and 4b provided on the moving body 3 side are arranged to face 6c and 16d. Further, on the front side of the polarization beam splitter 30, a pair of small-sized corner prisms 20a, 20b are arranged so as to be close to the front side of the polarization beam splitter 30 and reflect the incident light from each corner prism 4 on the same optical path.

【0020】このように構成された測長機においては、
例えば、図4に示すように、コーナープリズム4を鉛直
方向の同軸上に配置して、移動体3上に設置すると、偏
光ビームスプリッタ30で分光された透過および反射光
は、それぞれコーナプリズム4a,4bと小型コーナプ
リズム20a,20bとの間で往復して、しかも、コー
ナプリズム4a,4bと1/4λ板16c,16dとの
間で往復した後に、偏光ビームスプリッタ32に入射
し、偏光ビームスプリッタ32で相互に干渉させて、測
長光学系5に受光される。
In the length measuring machine configured as described above,
For example, as shown in FIG. 4, when the corner prism 4 is arranged coaxially in the vertical direction and installed on the moving body 3, the transmitted light and the reflected light separated by the polarization beam splitter 30 are respectively reflected by the corner prisms 4a, 4a. 4b and the small corner prisms 20a, 20b and back and forth between the corner prisms 4a, 4b and the ¼ λ plates 16c, 16d, and then enter the polarization beam splitter 32 and enter the polarization beam splitter. 32 interferes with each other and is received by the length measurement optical system 5.

【0021】このとき、上下方向のコーナープリズム4
a,4b間にに角度変移があると、測長光学計5で受光
される干渉光の干渉状態が変化するので、この変化を検
出すると、移動体3の平面度を測定できる。この場合に
おいて、従来のシングルパスの分解能は0.06秒(角
度)であるが、本実施例の測長機では、実質的な測長距
離を二倍になるので、分解能をその半分の0.03秒ま
でに向上させることができる。
At this time, the vertical corner prism 4
If there is an angular shift between a and 4b, the interference state of the interference light received by the length measuring optics 5 changes, so the flatness of the moving body 3 can be measured by detecting this change. In this case, the resolution of the conventional single pass is 0.06 seconds (angle), but in the length measuring machine of the present embodiment, the substantial length measurement distance is doubled, so the resolution is half that of 0. It can be improved by 0.03 seconds.

【0022】[0022]

【発明の効果】以上各実施例により詳細に説明したよう
に、この発明に係るレーザ測長機にあっては、光路長を
二倍とし、しかも反射用のターゲットにコーナプリズム
を使用することができ、アライメント作業の簡素化と、
移動体のピッチング、ヨーイングなどによる受光光量の
減少を防止でき、常時一定の感度で測定を行うことがで
きる利点がある。
As described in detail in the above embodiments, in the laser length measuring machine according to the present invention, the optical path length is doubled and a corner prism is used as the reflecting target. And simplification of alignment work,
There is an advantage that the received light amount can be prevented from decreasing due to the pitching and yawing of the moving body, and the measurement can always be performed with a constant sensitivity.

【図面の簡単な説明】[Brief description of the drawings]

【図1】この発明にかかるレーザ測長機の一実施例を示
す光学系の説明図である。
FIG. 1 is an explanatory diagram of an optical system showing an embodiment of a laser length measuring machine according to the present invention.

【図2】コーナプリズムの傾きと受光及び反射光軸との
関係を示す説明図である。
FIG. 2 is an explanatory diagram showing the relationship between the inclination of a corner prism and the light receiving and reflecting optical axes.

【図3】この発明を角度光学系に適用した場合の他の実
施例を示す光学系の要部説明図である。
FIG. 3 is an explanatory view of a main part of an optical system showing another embodiment when the present invention is applied to an angle optical system.

【図4】従来のシングルパス型の測長機の光学系の説明
図である。
FIG. 4 is an explanatory diagram of an optical system of a conventional single-pass length measuring machine.

【図5】従来のダブルパス型の測長機の光学系の説明図
である。
FIG. 5 is an explanatory diagram of an optical system of a conventional double-pass type length measuring machine.

【図6】プレーンミラーの傾きによる受光及び反射光軸
の影響を示す説明図である。
FIG. 6 is an explanatory diagram showing the influence of the light receiving and reflecting optical axes due to the inclination of the plane mirror.

【符号の説明】[Explanation of symbols]

1 レーザヘッド 3 移動体 4 コーナプリズム 5 測長光学系 10 干渉計 12 偏光ビームスプリッタ 20 小型コーナプリズム 1 Laser Head 3 Moving Object 4 Corner Prism 5 Length Measuring Optical System 10 Interferometer 12 Polarizing Beam Splitter 20 Small Corner Prism

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 レーザヘッドから出射されたレーザ光
を、干渉計を介して一対の反射ターゲットに照射し、こ
れらの反射ターゲットからの反射光を前記干渉計で相互
に干渉させ、得られた干渉光に基づいて測距するレーザ
測長機において、 前記反射ターゲットの少なくとも一方をコーナープリズ
ムで構成するとともに、前記干渉計の近傍に、前記コー
ナープリズムの反射光を受け、この反射光と同一光路上
に入射光を反射させる小型コーナープリズムを設けたこ
とを特徴とするレーザ測長機。
1. A laser beam emitted from a laser head is applied to a pair of reflective targets through an interferometer, and the reflected lights from these reflective targets are caused to interfere with each other by the interferometer. In a laser length-measuring device that measures distances based on light, at least one of the reflection targets is composed of a corner prism, and the reflection light of the corner prism is received in the vicinity of the interferometer and is on the same optical path as this reflection light. A laser length measuring machine characterized in that a small corner prism for reflecting incident light is provided on the.
【請求項2】 前記反射ターゲットは、上下方向の同軸
上に配置されたコーナープリズムから構成され、前記コ
ーナープリズムを移動体などの測定対象物上に設けると
ともに、これらの各コーナープリズムからの反射光を受
け、各反射光と同一光路上に入射光を反射させる一対の
小型コーナープリズムを設けたことを特徴とする請求項
1記載のレーザ測長機。
2. The reflection target is composed of corner prisms arranged coaxially in the vertical direction, and the corner prisms are provided on an object to be measured such as a moving body, and reflected light from each of the corner prisms is provided. 2. The laser length measuring machine according to claim 1, further comprising a pair of small corner prisms for reflecting the incident light on the same optical path as the reflected light.
JP28154995A 1995-10-30 1995-10-30 Laser measuring machine Expired - Lifetime JP3739121B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP28154995A JP3739121B2 (en) 1995-10-30 1995-10-30 Laser measuring machine

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP28154995A JP3739121B2 (en) 1995-10-30 1995-10-30 Laser measuring machine

Publications (2)

Publication Number Publication Date
JPH09126712A true JPH09126712A (en) 1997-05-16
JP3739121B2 JP3739121B2 (en) 2006-01-25

Family

ID=17640736

Family Applications (1)

Application Number Title Priority Date Filing Date
JP28154995A Expired - Lifetime JP3739121B2 (en) 1995-10-30 1995-10-30 Laser measuring machine

Country Status (1)

Country Link
JP (1) JP3739121B2 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009162629A (en) * 2008-01-08 2009-07-23 Sokkia Topcon Co Ltd Interferometer
JP2015530587A (en) * 2012-09-27 2015-10-15 マッパー・リソグラフィー・アイピー・ビー.ブイ. Multi-axis differential interferometer
US9678443B2 (en) 2011-03-30 2017-06-13 Mapper Lithography Ip B.V. Lithography system with differential interferometer module

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009162629A (en) * 2008-01-08 2009-07-23 Sokkia Topcon Co Ltd Interferometer
US9678443B2 (en) 2011-03-30 2017-06-13 Mapper Lithography Ip B.V. Lithography system with differential interferometer module
US9690215B2 (en) 2011-03-30 2017-06-27 Mapper Lithography Ip B.V. Interferometer module
JP2015530587A (en) * 2012-09-27 2015-10-15 マッパー・リソグラフィー・アイピー・ビー.ブイ. Multi-axis differential interferometer
US9551563B2 (en) 2012-09-27 2017-01-24 Mapper Lithography Ip B.V. Multi-axis differential interferometer

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