JPH08279720A - アナログデバイス較正方法、アナログ集積回路およびコーデック - Google Patents
アナログデバイス較正方法、アナログ集積回路およびコーデックInfo
- Publication number
- JPH08279720A JPH08279720A JP7299287A JP29928795A JPH08279720A JP H08279720 A JPH08279720 A JP H08279720A JP 7299287 A JP7299287 A JP 7299287A JP 29928795 A JP29928795 A JP 29928795A JP H08279720 A JPH08279720 A JP H08279720A
- Authority
- JP
- Japan
- Prior art keywords
- path
- channel
- channels
- gain
- signal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000000034 method Methods 0.000 title claims description 26
- 238000009966 trimming Methods 0.000 claims abstract description 24
- 238000012360 testing method Methods 0.000 claims description 15
- 230000004044 response Effects 0.000 claims description 10
- 238000004519 manufacturing process Methods 0.000 claims description 9
- 239000000523 sample Substances 0.000 claims description 6
- 238000012937 correction Methods 0.000 claims description 4
- 238000012986 modification Methods 0.000 claims description 2
- 230000004048 modification Effects 0.000 claims description 2
- 238000010586 diagram Methods 0.000 description 8
- 238000012545 processing Methods 0.000 description 5
- 230000008569 process Effects 0.000 description 3
- 239000008186 active pharmaceutical agent Substances 0.000 description 2
- 230000008901 benefit Effects 0.000 description 2
- 230000015556 catabolic process Effects 0.000 description 2
- 230000009467 reduction Effects 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 238000012546 transfer Methods 0.000 description 2
- 101100182881 Caenorhabditis elegans madd-3 gene Proteins 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 230000001143 conditioned effect Effects 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 230000008018 melting Effects 0.000 description 1
- 238000004377 microelectronic Methods 0.000 description 1
- 238000004806 packaging method and process Methods 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/06—Continuously compensating for, or preventing, undesired influence of physical parameters
- H03M1/0602—Continuously compensating for, or preventing, undesired influence of physical parameters of deviations from the desired transfer characteristic
- H03M1/0604—Continuously compensating for, or preventing, undesired influence of physical parameters of deviations from the desired transfer characteristic at one point, i.e. by adjusting a single reference value, e.g. bias or gain error
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/02—Reversible analogue/digital converters
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/10—Calibration or testing
- H03M1/1009—Calibration
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/10—Calibration or testing
- H03M1/1009—Calibration
- H03M1/1014—Calibration at one point of the transfer characteristic, i.e. by adjusting a single reference value, e.g. bias or gain error
- H03M1/1023—Offset correction
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
- H03M1/1205—Multiplexed conversion systems
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/66—Digital/analogue converters
- H03M1/662—Multiplexed conversion systems
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Analogue/Digital Conversion (AREA)
- Tests Of Electronic Circuits (AREA)
- Semiconductor Integrated Circuits (AREA)
- Control Of Amplification And Gain Control (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US329590 | 1994-10-26 | ||
| US08/329,590 US5596322A (en) | 1994-10-26 | 1994-10-26 | Reducing the number of trim links needed on multi-channel analog integrated circuits |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH08279720A true JPH08279720A (ja) | 1996-10-22 |
Family
ID=23286126
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP7299287A Pending JPH08279720A (ja) | 1994-10-26 | 1995-10-25 | アナログデバイス較正方法、アナログ集積回路およびコーデック |
Country Status (5)
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2003065588A1 (fr) * | 2002-01-31 | 2003-08-07 | Mitsubishi Denki Kabushiki Kaisha | Systeme d'unites analogiques |
Families Citing this family (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5974363A (en) * | 1997-04-09 | 1999-10-26 | Lucent Technologies Inc. | Self-testing of smart line cards |
| US6758080B1 (en) | 1999-03-17 | 2004-07-06 | Input/Output, Inc. | Calibration of sensors |
| EP1847850B1 (en) * | 1999-03-17 | 2013-04-24 | ION Geophysical Corporation | Hydrophone assembly |
| US6307491B1 (en) * | 2000-02-24 | 2001-10-23 | Analog Devices, Inc. | Trim systems and methods having temporary and permanent operational modes |
| US6515464B1 (en) * | 2000-09-29 | 2003-02-04 | Microchip Technology Incorporated | Input voltage offset calibration of an analog device using a microcontroller |
| US7787386B1 (en) * | 2001-12-18 | 2010-08-31 | Cisco Technology, Inc. | Method and system for self-testing a line card |
| US7719993B2 (en) | 2004-12-30 | 2010-05-18 | Intel Corporation | Downlink transmit beamforming |
| CN102830251B (zh) * | 2012-09-04 | 2013-12-18 | 中国兵器工业集团第二一四研究所苏州研发中心 | 晶圆级单支点电容式加速度计性能参数在线评估装置 |
| JP6189085B2 (ja) * | 2013-05-13 | 2017-08-30 | ルネサスエレクトロニクス株式会社 | 電子システムおよびその動作方法 |
| EP2903009A1 (en) | 2014-02-04 | 2015-08-05 | Telefonaktiebolaget L M Ericsson (publ) | Electronic device, circuit and method for trimming electronic components |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS56132815A (en) * | 1980-03-21 | 1981-10-17 | Nec Corp | Reference step voltage generating circuit |
| JPS609211A (ja) * | 1983-06-29 | 1985-01-18 | Fujitsu Ltd | 絶対ゲイン調整回路 |
| CA1266707A (en) * | 1985-12-16 | 1990-03-13 | Steve S. Yang | Method of calibrating and equalizing a multi-channel automatic gain control amplifier |
| US4777471A (en) * | 1987-06-22 | 1988-10-11 | Precision Microdevices Inc. | Apparatus for multiple link trimming in precision integrated circuits |
| US4829236A (en) * | 1987-10-30 | 1989-05-09 | Teradyne, Inc. | Digital-to-analog calibration system |
| US4958139A (en) * | 1988-06-23 | 1990-09-18 | Nicolet Instrument Corporation | Method and apparatus for automatically calibrating the gain and offset of a time-shifted digitizing channel |
| FI86120C (fi) * | 1990-07-02 | 1992-07-10 | Nokia Mobile Phones Ltd | A/d- eller d/a-omvandlare, a/d- eller d/a-omvandlarsystem samt kalibreringsfoerfarande foer dessa. |
| US5164726A (en) * | 1991-06-12 | 1992-11-17 | Eastman Kodak Company | Self calibrating dual range a/d converter |
| US5248970A (en) * | 1991-11-08 | 1993-09-28 | Crystal Semiconductor Corp. | Offset calibration of a dac using a calibrated adc |
-
1994
- 1994-10-26 US US08/329,590 patent/US5596322A/en not_active Expired - Lifetime
-
1995
- 1995-09-08 TW TW084109431A patent/TW283282B/zh active
- 1995-10-18 EP EP95307431A patent/EP0709968A1/en not_active Withdrawn
- 1995-10-25 JP JP7299287A patent/JPH08279720A/ja active Pending
- 1995-10-25 KR KR1019950037032A patent/KR960016158A/ko not_active Withdrawn
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2003065588A1 (fr) * | 2002-01-31 | 2003-08-07 | Mitsubishi Denki Kabushiki Kaisha | Systeme d'unites analogiques |
Also Published As
| Publication number | Publication date |
|---|---|
| EP0709968A1 (en) | 1996-05-01 |
| US5596322A (en) | 1997-01-21 |
| TW283282B (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1996-08-11 |
| KR960016158A (ko) | 1996-05-22 |
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