JPH08194160A - Vertically illuminating phase contrast microscope - Google Patents
Vertically illuminating phase contrast microscopeInfo
- Publication number
- JPH08194160A JPH08194160A JP719695A JP719695A JPH08194160A JP H08194160 A JPH08194160 A JP H08194160A JP 719695 A JP719695 A JP 719695A JP 719695 A JP719695 A JP 719695A JP H08194160 A JPH08194160 A JP H08194160A
- Authority
- JP
- Japan
- Prior art keywords
- sample
- objective lens
- illumination
- light
- contrast microscope
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Instruments For Measurement Of Length By Optical Means (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Microscoopes, Condenser (AREA)
Abstract
Description
【0001】[0001]
【産業上の利用分野】本発明は細胞培養装置の培養状態
を観察するのに用いて好適な位相差顕微鏡であって小型
化した落射式位相差顕微鏡に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a miniaturized epi-illumination phase contrast microscope which is a phase contrast microscope suitable for observing a culture state of a cell culture device.
【0002】[0002]
【従来の技術】細胞培養装置、等において培養状態を観
察、監視する場合には、培養細胞は普通無色透明に近く
透過型顕微鏡では観察が困難である。そのため、培養液
と細胞の屈折率差を明暗差に変換する位相差方式が適用
される。従来の位相差顕微鏡の照明光源系は対物レンズ
から試料を挟んだ対向側に設置される透過型であるが、
空間上の制約から小型の自動培養装置に組み込むことは
困難であった。2. Description of the Related Art When observing and monitoring a culture state in a cell culture device or the like, cultured cells are usually colorless and transparent and difficult to observe with a transmission microscope. Therefore, a phase difference method that converts the difference in refractive index between the culture solution and cells into a difference in brightness is applied. The illumination light source system of the conventional phase contrast microscope is a transmission type installed on the opposite side across the sample from the objective lens.
Due to space limitations, it was difficult to incorporate it into a small automatic culture device.
【0003】図3,図4はこのような照明光源系が試料
を挟んで配置している位相差顕微鏡の模式図で、図3は
正立型、図4は倒立型を示している。図3の正立型は、
試料1を挟んで上側には対物レンズ2、鏡筒6、接眼レ
ンズまたはカメラ5が配置され、下側には光源ランプ4
からの光を発射する照明装置3を配置した構成である。FIGS. 3 and 4 are schematic views of a phase contrast microscope in which such an illumination light source system is arranged so as to sandwich a sample. FIG. 3 shows an upright type and FIG. 4 shows an inverted type. The upright type in Fig. 3 is
An objective lens 2, a lens barrel 6, an eyepiece lens or a camera 5 is arranged on the upper side of the sample 1 and a light source lamp 4 is arranged on the lower side.
This is a configuration in which a lighting device 3 that emits light from is arranged.
【0004】図4の倒立型は、試料1を挟んで上側より
光源ランプ4を有する照明装置3を配置し、下側に対物
レンズ2、横に配置した鏡筒6、接眼レンズまたはカメ
ラ5を配置した構成となっている。In the inverted type shown in FIG. 4, an illuminating device 3 having a light source lamp 4 is arranged from the upper side with the sample 1 interposed therebetween, and an objective lens 2, a lens barrel 6 arranged horizontally, an eyepiece lens or a camera 5 are arranged on the lower side. It is arranged.
【0005】[0005]
【発明が解決しようとする課題】前述のように従来の位
相差顕微鏡は図3,図4に示すように試料1を挟んで照
明光学系が対向して配置されており、対物レンズ2の後
方にスペースがとれないような小型の自動培養装置にこ
のような位相差顕微鏡を組込む場合は組込みができず、
培養細胞の観察ができないことになる。このような小型
の自動培養装置に適用するため、対物レンズから試料を
挟んだ対向側の照明光源光学系の容積を最小化する必要
がある。As described above, in the conventional phase contrast microscope, as shown in FIGS. 3 and 4, the illumination optical systems are arranged to face each other with the sample 1 interposed therebetween, and the illumination optical system is arranged behind the objective lens 2. When incorporating such a phase-contrast microscope into a small automatic culture device that does not take up space, it cannot be installed,
The cultured cells cannot be observed. In order to apply to such a small automatic culture device, it is necessary to minimize the volume of the illumination light source optical system on the opposite side with the sample sandwiched from the objective lens.
【0006】本発明は自動化された細胞培養装置の培養
状態観察・監視に適用され、位相差顕微鏡観察を行うの
に用いて好適な機構であって照明光学系を試料を挟んで
対物レンズに対向する側に設置する余地が無い場合に適
用される同軸型の落射式位相差顕微鏡を提供することを
目的としている。The present invention is applied to the observation / monitoring of the culture state of an automated cell culture apparatus, and is a mechanism suitable for performing phase contrast microscope observation, and the illumination optical system is opposed to the objective lens with the sample interposed therebetween. It is an object of the present invention to provide a coaxial epi-illumination type phase contrast microscope which is applied when there is no room for installation on the operating side.
【0007】[0007]
【課題を解決するための手段】そこで本発明は、位相差
顕微鏡の照明光源および照明光学系を対物レンズ側に設
け、対物レンズを通して試料に照明光を照射し、試料を
透過した光を反射し、観察部に導く反射装置を設けた構
成とする。Therefore, the present invention provides an illumination light source and an illumination optical system of a phase contrast microscope on the objective lens side, illuminates the sample with illumination light through the objective lens, and reflects the light transmitted through the sample. A reflection device for guiding to the observation section is provided.
【0008】即ち、本発明は、照明光源からの光を照明
光学系を介して試料に照射し、同試料を透過した光を対
物レンズに導き、同対物レンズを通した接眼レンズ、カ
メラ等の観察部に導き、前記試料を観察する位相差顕微
鏡であって、前記照明光源および照明光学系は前記対物
レンズ側に設けられ、照明光を同対物レンズを通して前
記試料に向けて照射するように配置し、前記試料を透過
した光を反射し、前記観察部に導くための反射装置を設
けたことを特徴とする落射式位相差顕微鏡を提供する。That is, according to the present invention, the light from the illumination light source is applied to the sample through the illumination optical system, the light transmitted through the sample is guided to the objective lens, and the eyepiece lens, camera, etc. passing through the objective lens are used. A phase-contrast microscope that guides the sample to an observation section and observes the sample, wherein the illumination light source and the illumination optical system are provided on the objective lens side, and are arranged to irradiate illumination light toward the sample through the objective lens. Further, there is provided an epi-illumination type phase contrast microscope characterized in that a reflection device for reflecting the light transmitted through the sample and guiding it to the observation part is provided.
【0009】[0009]
【作用】本発明はこのような手段により、照明光源から
の光は照明光学系を介して対物レンズ側から入射し、試
料に照射される。試料を透過した光は反射装置で反射
し、観察部に導かれ、観察される。従って、従来のよう
に試料の後方、即ち、試料を透過した光の出射側に照明
光源や照明光学系がないので試料後方に大きな空間を確
保する必要性がなくなる。照明光を顕微鏡光軸に導く場
合は例えば、ハーフミラー等によって対物レンズを通し
て試料に導き、試料を挟み対物レンズに対向する側に反
射鏡を置き、試料を透過した照明光を対物レンズに戻す
ようにすればよい。According to the present invention, the light from the illuminating light source is incident from the objective lens side through the illuminating optical system and is applied to the sample by such means. The light transmitted through the sample is reflected by the reflection device, guided to the observation section, and observed. Therefore, there is no need to secure a large space behind the sample because there is no illumination light source or illumination optical system on the rear side of the sample, that is, on the exit side of the light transmitted through the sample, unlike the conventional case. When guiding the illumination light to the optical axis of the microscope, for example, it is guided to the sample through the objective lens by a half mirror, etc., a reflecting mirror is placed on the side facing the objective lens with the sample in between, and the illumination light transmitted through the sample is returned to the objective lens. You can do this.
【0010】このような落射方式を採用することによ
り、試料後方に大きな空間を必要としないため、容積に
余裕のない装置に組み込むことができる。By adopting such an epi-illumination method, a large space is not required at the rear of the sample, so that the sample can be incorporated in an apparatus having a small volume.
【0011】[0011]
【実施例】以下、本発明の実施例を図面に基づいて具体
的に説明する。図1は本発明の落射式位相差顕微鏡の基
本的な配置を示す模式図である。図において、使用する
符号は図3,図4に示す位相差顕微鏡と対比できるよう
に同種の構成要素には同じ符号を用いて示している。1
は観察すべき試料、7は試料の下部に配置した反射鏡、
2は対物レンズ、3は照明装置、4は照明装置3に光を
供給する光源ランプ、6は試料を透過し、反射鏡7より
反射した反射光を導く鏡筒で上部に接眼レンズまたはカ
メラ5を搭載している構成であり、同軸に配置されてい
る。Embodiments of the present invention will be described below in detail with reference to the drawings. FIG. 1 is a schematic view showing the basic arrangement of an epi-illumination type phase contrast microscope of the present invention. In the drawings, the reference numerals used are the same as those used for the phase difference microscopes shown in FIGS. 1
Is a sample to be observed, 7 is a reflector placed under the sample,
Reference numeral 2 is an objective lens, 3 is an illuminating device, 4 is a light source lamp for supplying light to the illuminating device 3, 6 is a lens barrel for guiding the reflected light reflected by the reflecting mirror 7 through the sample, and an eyepiece or a camera 5 at the top. Is installed, and is coaxially arranged.
【0012】図2はこのような構成の同軸型の落射式位
相差顕微鏡の作動を示す模式図である。図において、符
号1乃至7は図1に示すものと同じであるので、説明は
省略するが、8はコンデンサレンズで平行光線を作り出
すレンズである。9は中央部に空間を有するドーナツ状
ミラー、10は遮光板、11は試料1の培養容器となる
試料ステージ、12は中央部の光を遮断するための遮光
板である。FIG. 2 is a schematic view showing the operation of the coaxial epi-illumination type phase contrast microscope having such a structure. In the figure, reference numerals 1 to 7 are the same as those shown in FIG. 1, so description thereof will be omitted. Reference numeral 8 is a condenser lens which produces parallel rays. Reference numeral 9 is a doughnut-shaped mirror having a space in the central portion, 10 is a light shielding plate, 11 is a sample stage that serves as a culture container for the sample 1, and 12 is a light shielding plate for blocking light in the central portion.
【0013】前述の落射式位相差顕微鏡において、光源
ランプ4から出た光13はコンデンサレンズ8で平行光
線化して鏡筒6内に導く。中央部の光を遮り、リング状
の光線にするため遮光板12を置くこともできる。この
光は鏡筒6内に45度の角度で取り付けられたリング状
の反射鏡9またはハーフミラーで光線は折り曲げられ、
照明光14となって対物レンズ2の方向に向かう。In the above-mentioned epi-illumination type phase contrast microscope, the light 13 emitted from the light source lamp 4 is collimated by the condenser lens 8 and guided into the lens barrel 6. A light blocking plate 12 may be placed to block the light in the central portion and form a ring-shaped light beam. This light is bent by a ring-shaped reflecting mirror 9 or a half mirror mounted in the lens barrel 6 at an angle of 45 degrees,
It becomes the illumination light 14 and travels toward the objective lens 2.
【0014】このリング状で対物レンズ2に入射した照
明光14は試料1を載せたステージ11を透過し、その
後方に設けられた反射鏡7で反射され、対物レンズ2の
中央部に入射する。以下、通常の位相差顕微鏡と同様に
試料1に当たらずに入射した光15は遮光板10で遮ら
れるが、試料1を通過して屈折した光16は接眼レンズ
またはカメラ面5に結像する。The illumination light 14 that is incident on the objective lens 2 in the form of a ring passes through the stage 11 on which the sample 1 is mounted, is reflected by the reflecting mirror 7 provided behind it, and is incident on the central portion of the objective lens 2. . Hereinafter, as in the case of a normal phase contrast microscope, the light 15 that does not strike the sample 1 and is incident is blocked by the light shielding plate 10, but the light 16 that is refracted after passing through the sample 1 is imaged on the eyepiece lens or the camera surface 5. .
【0015】このような実施例では、照明のための光源
4およびその光学系となる照明装置3を対物レンズ2の
側に移し、ドーナツ状ミラー9で同軸上に照明光を導
き、試料1のステージ11を挟んで反射鏡7を配置し、
試料1を透過した光を同軸上で接眼レンズまたはカメラ
5に結像するようにしたので試料1の後方に大きな空間
を必要としないので自動培養装置のような容積に余裕の
ない装置にも組込むことができるものである。In such an embodiment, the light source 4 for illumination and the illumination device 3 serving as an optical system thereof are moved to the objective lens 2 side, and the illumination light is guided coaxially by the donut-shaped mirror 9 to obtain the sample 1 of the sample 1. The reflecting mirror 7 is arranged with the stage 11 in between,
Since the light transmitted through the sample 1 is coaxially imaged on the eyepiece lens or the camera 5, a large space is not required behind the sample 1, so that it can be incorporated into a device such as an automatic culture device that does not have enough capacity. Is something that can be done.
【0016】なお、試料1の後方に大きな空間を必要と
しない本発明での特徴は、図1と図3および図4とを比
較すると明らかである。図1の本発明では試料1の後方
には反射鏡7のみであるが、図3の正立型では、光源ラ
ンプ4および光学系となる照明装置4があり、また、図
4の倒立型では、対物レンズ2、鏡筒6、レンズまたは
カメラ5が配置されており、それぞれ大きな空間を占め
ている。従って試料の後方に大きな装置を組込む余地の
ない観察装置としては、このような顕微鏡を組込むこと
ができなくなる。The feature of the present invention that does not require a large space behind the sample 1 is clear when comparing FIG. 1 with FIGS. 3 and 4. In the present invention of FIG. 1, only the reflecting mirror 7 is provided behind the sample 1, but in the upright type of FIG. 3, the light source lamp 4 and the illumination device 4 serving as an optical system are provided, and in the inverted type of FIG. , The objective lens 2, the lens barrel 6, the lens or the camera 5 are arranged, and each occupy a large space. Therefore, such a microscope cannot be incorporated as an observation device without a room for incorporating a large device behind the sample.
【0017】[0017]
【発明の効果】以上、具体的に説明したように、本発明
においては、位相差顕微鏡の照明光源および照明光学系
を対物レンズ側に設け、対物レンズを通して試料に照明
光を照射し、試料を透過した光をは反射し、観察部に導
く反射装置を設けた構成としたので、落射方式を採用す
ることができ、試料後方に大きな空間を必要としないた
め、容積に余裕のない装置に組み込むことができる。As described above in detail, in the present invention, the illumination light source of the phase contrast microscope and the illumination optical system are provided on the objective lens side, and the sample is irradiated with the illumination light through the objective lens. Since it is configured with a reflection device that reflects the transmitted light and guides it to the observation part, it is possible to adopt the epi-illumination method, and it does not require a large space behind the sample, so it is installed in a device with a sufficient volume. be able to.
【図1】本発明の落射式位相差顕微鏡の基本的な配置を
示す模式図である。FIG. 1 is a schematic view showing a basic arrangement of an epi-illumination type phase contrast microscope of the present invention.
【図2】本発明の一実施例に係る落射式位相差顕微鏡の
光路を示す模式図である。FIG. 2 is a schematic diagram showing an optical path of an epi-illumination type phase contrast microscope according to an embodiment of the present invention.
【図3】従来の一般的な正立型の位相差顕微鏡の模式図
である。FIG. 3 is a schematic diagram of a conventional general upright phase contrast microscope.
【図4】従来の一般的な倒立型の位相差顕微鏡の模式図
である。FIG. 4 is a schematic diagram of a conventional general inverted phase contrast microscope.
1 試料 2 対物レンズ 3 照明装置 4 光源ランプ 5 接眼レンズまたはカメラ 6 鏡筒 7 反射鏡 8 コンデンサレンズ 9 ドーナツ状ミラー 10 遮光板 11 試料ステージ 12 遮光板 1 sample 2 objective lens 3 illumination device 4 light source lamp 5 eyepiece or camera 6 lens barrel 7 reflecting mirror 8 condenser lens 9 donut-shaped mirror 10 light-shielding plate 11 sample stage 12 light-shielding plate
Claims (1)
試料に照射し、同試料を透過した光を対物レンズに導
き、同対物レンズを通して接眼レンズ、カメラ等の観察
部に導き、前記試料を観察する位相差顕微鏡であって、
前記照明光源および照明光学系は前記対物レンズ側に設
けられ、照明光を同対物レンズを通して前記試料に向け
て照射するように配置し、前記試料を透過した光を反射
し、前記観察部に導くための反射装置を設けたことを特
徴とする落射式位相差顕微鏡。1. A sample is irradiated with light from an illumination light source through an illumination optical system, the light transmitted through the sample is guided to an objective lens, and is guided through the objective lens to an observation part such as an eyepiece lens and a camera. A phase contrast microscope for observing a sample,
The illumination light source and the illumination optical system are provided on the objective lens side, are arranged so as to illuminate illumination light toward the sample through the objective lens, reflect the light transmitted through the sample, and guide it to the observation section. An epi-illumination phase-contrast microscope characterized by being provided with a reflection device.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP00719695A JP3434064B2 (en) | 1995-01-20 | 1995-01-20 | Epi-illumination phase contrast microscope |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP00719695A JP3434064B2 (en) | 1995-01-20 | 1995-01-20 | Epi-illumination phase contrast microscope |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH08194160A true JPH08194160A (en) | 1996-07-30 |
JP3434064B2 JP3434064B2 (en) | 2003-08-04 |
Family
ID=11659287
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP00719695A Expired - Fee Related JP3434064B2 (en) | 1995-01-20 | 1995-01-20 | Epi-illumination phase contrast microscope |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP3434064B2 (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2013148360A1 (en) * | 2012-03-30 | 2013-10-03 | Trustees Of Boston University | Phase contrast microscopy with oblique back-illumination |
WO2020009186A1 (en) | 2018-07-06 | 2020-01-09 | 北海道公立大学法人札幌医科大学 | Observation device |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4664785B2 (en) | 2005-09-16 | 2011-04-06 | 株式会社Eci | Disc and cell counting and observation apparatus using optical disc using optical disc |
-
1995
- 1995-01-20 JP JP00719695A patent/JP3434064B2/en not_active Expired - Fee Related
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2013148360A1 (en) * | 2012-03-30 | 2013-10-03 | Trustees Of Boston University | Phase contrast microscopy with oblique back-illumination |
WO2020009186A1 (en) | 2018-07-06 | 2020-01-09 | 北海道公立大学法人札幌医科大学 | Observation device |
CN112384606A (en) * | 2018-07-06 | 2021-02-19 | 北海道公立大学法人札幌医科大学 | Observation device |
KR20210028659A (en) | 2018-07-06 | 2021-03-12 | 훗카이도 코리츠 다이가쿠 호진 삿포르 이카 다이가쿠 | Observation device |
JPWO2020009186A1 (en) * | 2018-07-06 | 2021-08-02 | 北海道公立大学法人 札幌医科大学 | Observation device |
CN112384606B (en) * | 2018-07-06 | 2024-04-12 | 北海道公立大学法人札幌医科大学 | Viewing device |
Also Published As
Publication number | Publication date |
---|---|
JP3434064B2 (en) | 2003-08-04 |
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