JPH0783169B2 - Printed circuit board manufacturing method - Google Patents

Printed circuit board manufacturing method

Info

Publication number
JPH0783169B2
JPH0783169B2 JP24444389A JP24444389A JPH0783169B2 JP H0783169 B2 JPH0783169 B2 JP H0783169B2 JP 24444389 A JP24444389 A JP 24444389A JP 24444389 A JP24444389 A JP 24444389A JP H0783169 B2 JPH0783169 B2 JP H0783169B2
Authority
JP
Japan
Prior art keywords
pattern
copper
printed circuit
circuit board
plating
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP24444389A
Other languages
Japanese (ja)
Other versions
JPH03105993A (en
Inventor
謙一 小林
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP24444389A priority Critical patent/JPH0783169B2/en
Publication of JPH03105993A publication Critical patent/JPH03105993A/en
Publication of JPH0783169B2 publication Critical patent/JPH0783169B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Description

【発明の詳細な説明】 〔概 要〕 プリント基板用の銅張積層板にパターンめっき法により
回路を形成するプリント基板の製造方法に関し、 銅張積層板にレジストパターン形成後のパターン内に混
入する塵埃の除去およびパターンの水濡性を改善するた
めのプリント基板の製造方法の提供を目的とし、 レジストパターンを形成したプリント基板用の銅張積層
板に対してパターンめっき法により回路形成を行うに際
し、酸化銅被膜を除去する塩酸処理工程と高圧水洗処理
工程と真空脱泡処理工程を順次行ない、その後硫酸系薬
品による処理を含む前処理工程を施し、次いで硫酸銅浴
を用いた銅めっきを施すように構成する。
DETAILED DESCRIPTION OF THE INVENTION [Overview] A method for manufacturing a printed circuit board, wherein a circuit is formed on a copper clad laminate for a printed circuit board by a pattern plating method, wherein the copper clad laminate is mixed in a pattern after forming a resist pattern. For the purpose of providing a method for manufacturing a printed circuit board for removing dust and improving the water wettability of a pattern, when forming a circuit on a copper clad laminate for a printed circuit board on which a resist pattern is formed by a pattern plating method. , A hydrochloric acid treatment step for removing the copper oxide film, a high-pressure water washing treatment step, and a vacuum defoaming treatment step are performed in sequence, followed by a pretreatment step including treatment with a sulfuric acid chemical, and then copper plating using a copper sulfate bath. To configure.

〔産業上の利用分野〕[Industrial application field]

本発明は、プリント基板用の銅張積層板にパターンめっ
き法により回路を形成するプリント基板の製造方法に関
する。
The present invention relates to a method of manufacturing a printed circuit board in which a circuit is formed on a copper clad laminate for printed circuit board by a pattern plating method.

最近のプリント基板は実装密度の高度化の要求に伴い、
回路パターンも微細化が強く要求され、回路パターン幅
の場合は100μm以下のパターン形成が要望されてい
る。
With the demand for higher packaging density in recent printed circuit boards,
There is a strong demand for miniaturization of circuit patterns, and in the case of circuit pattern width, pattern formation of 100 μm or less is required.

〔従来の技術〕 第2図は従来のエッチング法のパターン形成工程図を示
す。従来のパターン幅は100〜200μmと広いため回路パ
ターンの形成方法としてエッチング法が用いられてき
た。エッチング法とは第2図工程において板状の樹脂
Aの両面に銅箔Bを貼付した銅張積層板を用意し、工程
でその両面にレジストパターンCを形成し、工程で
エッチングを行いレジストパターンCに被覆されている
部分の銅箔Dを残して、それ以外の部分の銅箔を侵食除
去し、工程でレジストCの剥離を行うことによりパタ
ーンが形成される。しかし、回路パターン幅が100μm
以下の微細パターンを形成する際にエッチング法を用い
ると、工程に示すようにパターンの上幅と下幅の差が
大きくなり、回路の電気特性値(導体抵抗値)が満足で
きなくなるため、一般的にはパターンの上幅と下幅の差
が小さなパターンめっき法が用いられる。
[Prior Art] FIG. 2 shows a pattern forming process diagram of a conventional etching method. Since the conventional pattern width is as wide as 100 to 200 μm, an etching method has been used as a method of forming a circuit pattern. What is the etching method? In Fig. 2, a copper clad laminate is prepared in which copper foils B are attached to both sides of a plate-shaped resin A in the step, resist patterns C are formed on both sides in the step, and etching is performed in the step. A pattern is formed by leaving the copper foil D in the portion covered by C and removing the copper foil in the other portions by erosion, and peeling the resist C in the process. However, the circuit pattern width is 100 μm
If an etching method is used to form the following fine patterns, the difference between the upper width and the lower width of the pattern becomes large as shown in the process, and the electrical characteristic value (conductor resistance value) of the circuit cannot be satisfied. Specifically, a pattern plating method in which the difference between the upper width and the lower width of the pattern is small is used.

第3図は従来のパターンめっき法による回路形成工程図
を示す。パターンめっき法とは第3図工程において第
2図工程に示す銅箔より薄い銅箔Bを貼付した銅張積
層板を用意し、工程でその両面に第2図工程に示す
レジストパーンとは逆のレジストパターンCを第2図工
程に示すレジストより厚く形成し、工程で銅めっき
Eと半田めっきFの2層のパターンめっきを施し、工程
でレジストパターンCの剥離を行い、工程で剥離さ
れて露出した部分の銅箔をエッチングにより侵食除去
し、工程で半田めっきFを銅には作用しない専用の薬
剤を用いてエッチングにより侵食除去して回路形成が完
了する。
FIG. 3 shows a circuit formation process diagram by a conventional pattern plating method. What is the pattern plating method is to prepare a copper clad laminate in which the copper foil B, which is thinner than the copper foil shown in FIG. 2, is attached in the step shown in FIG. 3, and the opposite of the resist pattern shown in the step shown in FIG. The resist pattern C is formed thicker than the resist shown in FIG. 2, the pattern plating of two layers of the copper plating E and the solder plating F is performed in the process, the resist pattern C is peeled in the process, and the resist pattern C is peeled in the process. The exposed portion of the copper foil is eroded and removed by etching, and the solder plating F is eroded and removed by etching using a special chemical that does not act on the copper in the process to complete the circuit formation.

第4図は従来のパターンめっき法の前処理工程図を示
す。図において、1は現像によりレジストパターンを形
成後の銅張積層板であって以下基材1と略称する。2は
懸架機、3は一連のめっきラインに配置された複数の処
理槽を示す。基材1は懸架機2の懸垂具に懸垂保持さ
れ、上下動を行って各処理槽3に満たされた処理液に順
次浸漬される。最初に硫酸+脱脂剤処理にて表面脱脂清
浄化と酸化銅被膜除去処理を行い、以後水洗→純水によ
る水洗→過硫酸アンモニウム処理(アルカリ性薬液によ
る酸化銅被膜除去処理)→水洗→硫酸処理(次の硫酸銅
浴に対する親和性を高める処理)→水洗→純水による水
洗の各硫酸系薬品による処理を含む前処理工程を通過し
た後に硫酸銅浴による銅めっきが行われる。
FIG. 4 shows a pretreatment process diagram of a conventional pattern plating method. In the figure, reference numeral 1 is a copper clad laminate after a resist pattern has been formed by development, and will be abbreviated as substrate 1 hereinafter. 2 is a suspension machine, 3 is a plurality of processing tanks arranged in a series of plating lines. The base material 1 is suspended and held by a suspending tool of a suspension device 2, vertically moved, and sequentially dipped in the treatment liquid filled in each treatment tank 3. First, the surface is degreased and cleaned with sulfuric acid + a degreasing agent and the copper oxide film is removed, and then washed with water → washed with pure water → ammonium persulfate treatment (copper oxide film removed with an alkaline chemical solution) → washed with water → sulfuric acid treatment (next To increase the affinity for the copper sulfate bath) → Washing → Washing with pure water After passing through a pretreatment step including treatment with each sulfuric acid chemical, copper plating is performed with the copper sulfate bath.

〔発明が解決しようとする課題〕[Problems to be Solved by the Invention]

第5図は微細パターンに形成される異常形状を示す斜視
図であって、第5図(イ)は塵埃の影響により発生する
回路パターンの凹み形状図、第5図(ロ)は水濡れ性が
悪いために発生する回路パターンの凹み形状図をそれぞ
れ示す。
FIG. 5 is a perspective view showing an abnormal shape formed in a fine pattern. FIG. 5 (a) is a concave shape view of a circuit pattern generated by the influence of dust, and FIG. 5 (b) is water wettability. 6A and 6B respectively show a dent shape diagram of a circuit pattern that is generated due to a bad condition.

基材1のレジストパターンは現像処理により形成される
が、現像後の不溶解レジストの残滓や、室内塵埃等らが
パターン幅100μm以下の微細パターン内に混入すると
通常の水洗や薬液処理では微細パターン内から異物を除
去できず、めっきの析出を阻害して第5図(イ)に示す
ような回路の断面積を著しく小さくする欠陥回路が形成
されるという問題点がある。また、パターン形成用のレ
ジストは有機物、かつ疏水性であるため基材1を処理槽
に浸漬したときにパターン内に気泡が残り、その気泡の
存在部分に対する薬液処理が不完全となるため、めっき
が異常析出して第5図(ロ)に示すような欠陥回路が形
成されるという問題点がある。
The resist pattern of the base material 1 is formed by the development process, but if the residue of the insoluble resist after development and indoor dust and the like are mixed into the fine pattern with a pattern width of 100 μm or less, the fine pattern can be obtained by normal washing or chemical treatment. There is a problem that a foreign substance cannot be removed from the inside and a defective circuit is formed which hinders the deposition of plating and significantly reduces the cross-sectional area of the circuit as shown in FIG. Further, since the resist for pattern formation is an organic substance and is hydrophobic, bubbles are left in the pattern when the substrate 1 is immersed in the treatment tank, and the chemical treatment for the portion where the bubbles are present is incomplete, so Is abnormally deposited and a defective circuit as shown in FIG. 5B is formed.

本発明は上記従来の問題点に鑑みてなされたもので、基
材にレジストパターン形成後のパターン内に混入する塵
埃の除去およびパターンの水濡れ性を改善するためのプ
リント基板の製造方法の提供を目的とする。
The present invention has been made in view of the above conventional problems, and provides a method for manufacturing a printed circuit board for removing dust mixed in a pattern after forming a resist pattern on a substrate and improving wettability of the pattern. With the goal.

〔課題を解決するための手段〕[Means for Solving the Problems]

第1図は、本発明の実施例を説明するための概略工程図
を示す。レジストパターンを形成したプリント基板用の
基材1に対してパターンめっき法により回路形成を行う
に際し、酸化銅被膜を除去する塩酸処理工程(a)と高
圧水洗処理工程(c)と真空脱泡処理工程(f)を順次
行ない、その後硫酸系薬品による処理を含む前処理工程
を施し、次いで硫酸銅浴を用いた銅めっきを施すように
構成する。
FIG. 1 is a schematic process drawing for explaining an embodiment of the present invention. A hydrochloric acid treatment step (a) for removing a copper oxide film, a high-pressure water washing treatment step (c), and a vacuum defoaming treatment when a circuit is formed on a substrate 1 for a printed circuit board on which a resist pattern is formed by a pattern plating method. The step (f) is sequentially performed, followed by a pretreatment step including treatment with a sulfuric acid-based chemical, and then copper plating using a copper sulfate bath.

〔作 用〕[Work]

基材1にレジストパターンを形成後に酸化銅被覆除去諸
利用の塩酸洗浄処理を行い、次に高圧水洗処理を行うこ
とにより水圧という圧力によってパターン内に混入して
いる異物を強制的に排除し、真空脱泡処理によりパター
ン内の気泡を膨張させ、浮力増加により気泡を離脱除去
することにより、以後の硫酸系薬品による処理を含む前
処理工程が充分効果的に行えるようになる。
After forming a resist pattern on the base material 1, a hydrochloric acid cleaning process for removing various copper oxide coatings is performed, and then a high pressure water cleaning process is performed to forcibly remove foreign substances mixed in the pattern due to the pressure of water pressure. By expanding the bubbles in the pattern by the vacuum defoaming process and separating and removing the bubbles by increasing the buoyancy, the subsequent pretreatment process including the treatment with the sulfuric acid-based chemical can be performed sufficiently effectively.

〔実施例〕〔Example〕

以下本発明の実施例を図面によって詳述する。なお、構
成、動作の説明を理解し易くするために全図を通じで同
一部分には同一符号を付してその重複説明を省略する。
Embodiments of the present invention will be described in detail below with reference to the drawings. In addition, in order to make the description of the configuration and the operation easy to understand, the same reference numerals are given to the same portions throughout the drawings, and the duplicated description thereof will be omitted.

第1図は本発明の実施例を説明するための概略工程図を
示す。図において、4は一連のシャワー室を通過するベ
ルトコンベア装置であって、各シャワー室にはベルトコ
ンベアに水平に載置された現像後の基材1に対して上下
方向より処理液を吹きつけるシャワー装置を備えてい
る。各シャワー室の記号(a)〜(f)はそれぞれ異な
る工程を示す。コンベアスピード0.8m/minに設定し、基
材1は例えば厚み0.1mm,回路パターン幅70μmに形成さ
れたものを例に説明する。
FIG. 1 shows a schematic process diagram for explaining an embodiment of the present invention. In the figure, reference numeral 4 is a belt conveyor device that passes through a series of shower chambers, and the processing liquid is sprayed from above and below onto the substrate 1 after development, which is horizontally placed on the belt conveyor, in each shower chamber. Equipped with shower device. The symbols (a) to (f) of each shower room indicate different steps. The conveyor speed is set to 0.8 m / min, and the base material 1 will be described by way of example with a thickness of 0.1 mm and a circuit pattern width of 70 μm.

工程(a)で処理液として35重量%の塩酸を全量1に
対して100ccの割合に薄めた塩酸液を基材1に噴射洗浄
して酸化銅皮膜を除去する。工程(b)ではシャワー水
洗を行い前工程の塩酸液を洗浄除去する。工程(c)で
は水圧10kg/cm2の高圧シャワー水洗を行う。この水圧は
基材1の厚みに対応して設定されるもので、本例の場合
はこれ以上の水圧は基材1を破壊する恐れがある。ま
た、塵埃の除去能力は水圧5kg/cm2以下では急激に減少
する。工程(d)では前記工程で水圧により強制的に洗
い出された塵埃等を通常のシャワー水洗により完全に基
材1から離脱させた後、工程(e)で乾燥を行いコンベ
ア処理工程を完了する。
In step (a), a hydrochloric acid solution prepared by diluting 35% by weight of hydrochloric acid in a ratio of 100 cc to a total amount of 1 as a treating solution is jet-cleaned on the substrate 1 to remove the copper oxide film. In the step (b), shower water washing is performed to remove the hydrochloric acid solution in the previous step by washing. In step (c), high pressure shower water washing with a water pressure of 10 kg / cm 2 is performed. This water pressure is set corresponding to the thickness of the base material 1, and in the case of this example, a water pressure higher than this may damage the base material 1. In addition, the dust removal capacity sharply decreases when the water pressure is 5 kg / cm 2 or less. In the step (d), the dust and the like forcedly washed out by the water pressure in the above step are completely separated from the base material 1 by a normal shower water washing, and then dried in the step (e) to complete the conveyor treatment step. .

この乾燥工程(e)はコンベア処理工程から次の真空脱
泡工程を含む一連の懸架機2を用いためっきラインに直
結できる場合には省略できる。通常は直結せずにパッチ
処理となるから塵埃の飛来による付着を避けるため乾燥
を行う。乾燥された基材1はめっきラインに移る前に懸
架機2の懸垂具に懸垂される。
This drying step (e) can be omitted if it can be directly connected to a plating line using a series of suspension machines 2 including the following vacuum degassing step from the conveyor processing step. Normally, patch processing is performed without direct connection, so drying is performed in order to avoid adhesion due to flying dust. The dried substrate 1 is suspended in the suspension tool of the suspension machine 2 before being transferred to the plating line.

5は真空脱泡装置であって、上下開閉式に密閉可能の上
蓋6を有する容器に純水を満たし、上蓋6を開放した状
態で懸架機2に懸垂された基材1を受入れ、その水中に
全没するように沈めた後、懸垂を解除し、上方に懸垂具
を退避させ、上蓋6を密閉した後水面より上部の容器内
の空気を排気管7を会して図示しない排気装置で排気す
ることにより基材1に含まれる気泡の外圧を減少させて
膨張させ、水中で増加した浮力により基材1から離脱さ
せるものである。排気装置により真空脱泡装置5の容器
の内部圧力を40〜60mmHg程度に調節する。
Reference numeral 5 denotes a vacuum defoaming device, which is filled with pure water in a container having an upper lid 6 which can be opened and closed in an up and down manner, receives the base material 1 suspended by a suspension machine 2 with the upper lid 6 open, and After submerging it so that it is completely submerged, the suspension is released, the suspension is retracted upwards, the upper lid 6 is closed, and the air in the container above the water surface meets the exhaust pipe 7 by an exhaust device (not shown). By evacuating, the external pressure of the bubbles contained in the substrate 1 is reduced and expanded, and the bubbles are separated from the substrate 1 by the increased buoyancy in water. The internal pressure of the container of the vacuum degassing device 5 is adjusted to about 40 to 60 mmHg by the exhaust device.

この結果、塵埃によるパターン欠陥は、従来法に対して
1/5、水濡れ性の悪化によるめっき未析出は1/10にそれ
ぞれ減少させることができた。
As a result, pattern defects due to dust are
1/5, and non-precipitation of plating due to deterioration of water wettability could be reduced to 1/10.

〔発明の効果〕〔The invention's effect〕

以上の説明から明らかなように本発明によれば、パター
ン内に混入する塵埃の除去および基材の水濡れ性が大幅
に改善され、微細パターンの信頼性の向上に大きく寄与
する効果がある。
As is apparent from the above description, according to the present invention, the removal of dust mixed in the pattern and the wettability of the base material are significantly improved, and there is an effect of greatly contributing to the improvement of the reliability of the fine pattern.

【図面の簡単な説明】[Brief description of drawings]

第1図は本発明の実施例を説明するための概略工程図、 第2図は従来のエッチング法のパターン形成工程図、 第3図は従来のパターンめっき法による回路形成工程
図、 第4図は従来のパターンめっき法の前処理工程図、 第5図は微細パターンに形成される異常形状の斜視図で
ある。 第1図において、1は銅張積層板(基材)、(a)は塩
酸処理工程、(c)は高圧水洗処理工程、(f)は真空
脱泡工程をそれぞれ示す。
1 is a schematic process drawing for explaining an embodiment of the present invention, FIG. 2 is a pattern forming process drawing of a conventional etching method, FIG. 3 is a circuit forming process drawing by a conventional pattern plating method, and FIG. Is a pretreatment process diagram of a conventional pattern plating method, and FIG. 5 is a perspective view of an abnormal shape formed in a fine pattern. In FIG. 1, 1 is a copper clad laminate (base material), (a) is a hydrochloric acid treatment step, (c) is a high pressure water washing treatment step, and (f) is a vacuum degassing step.

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】レジストパターンを形成したプリント基板
用の銅張積層板(1)に対してパターンめっき法により
回路形成を行うに際し、酸化銅被膜を除去する塩酸処理
工程と高圧水洗処理工程と真空脱泡処理工程を順次行な
い、その後硫酸系薬品による処理を含む前処理工程を施
し、次いで硫酸銅浴を用いた銅めっきを施すことを特徴
とするプリント基板の製造方法。
1. A hydrochloric acid treatment step of removing a copper oxide film, a high-pressure water washing treatment step, and a vacuum when a circuit is formed on a copper clad laminate (1) for a printed board on which a resist pattern is formed by a pattern plating method. A method for producing a printed circuit board, which comprises sequentially performing a defoaming treatment step, then performing a pretreatment step including treatment with a sulfuric acid chemical, and then performing copper plating using a copper sulfate bath.
JP24444389A 1989-09-19 1989-09-19 Printed circuit board manufacturing method Expired - Lifetime JPH0783169B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP24444389A JPH0783169B2 (en) 1989-09-19 1989-09-19 Printed circuit board manufacturing method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP24444389A JPH0783169B2 (en) 1989-09-19 1989-09-19 Printed circuit board manufacturing method

Publications (2)

Publication Number Publication Date
JPH03105993A JPH03105993A (en) 1991-05-02
JPH0783169B2 true JPH0783169B2 (en) 1995-09-06

Family

ID=17118730

Family Applications (1)

Application Number Title Priority Date Filing Date
JP24444389A Expired - Lifetime JPH0783169B2 (en) 1989-09-19 1989-09-19 Printed circuit board manufacturing method

Country Status (1)

Country Link
JP (1) JPH0783169B2 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6423200B1 (en) * 1999-09-30 2002-07-23 Lam Research Corporation Copper interconnect seed layer treatment methods and apparatuses for treating the same
JP2002266097A (en) * 2001-03-08 2002-09-18 Sumitomo Bakelite Co Ltd Electroplating method and electroplating apparatus

Also Published As

Publication number Publication date
JPH03105993A (en) 1991-05-02

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