JPH0729483Y2 - Mounted printed circuit board automatic inspection device - Google Patents

Mounted printed circuit board automatic inspection device

Info

Publication number
JPH0729483Y2
JPH0729483Y2 JP1987005622U JP562287U JPH0729483Y2 JP H0729483 Y2 JPH0729483 Y2 JP H0729483Y2 JP 1987005622 U JP1987005622 U JP 1987005622U JP 562287 U JP562287 U JP 562287U JP H0729483 Y2 JPH0729483 Y2 JP H0729483Y2
Authority
JP
Japan
Prior art keywords
circuit board
printed circuit
inspected
light
light receiving
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP1987005622U
Other languages
Japanese (ja)
Other versions
JPS63113946U (en
Inventor
建樹 村岡
雅彦 池口
恒 平野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nagoya Electric Works Co Ltd
Original Assignee
Nagoya Electric Works Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nagoya Electric Works Co Ltd filed Critical Nagoya Electric Works Co Ltd
Priority to JP1987005622U priority Critical patent/JPH0729483Y2/en
Publication of JPS63113946U publication Critical patent/JPS63113946U/ja
Application granted granted Critical
Publication of JPH0729483Y2 publication Critical patent/JPH0729483Y2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Description

【考案の詳細な説明】 〔産業上の利用分野〕 本考案は、細く絞られたレーザ光などのビームを実装済
プリント基板上で掃引し、半田付け不良により実装済プ
リント基板上に形成されたブリッジあるいは半田フヌレ
(半田付け欠陥)の有無の検出などを自動的に行うよう
にした実装済プリント基板自動検査装置に関する。
[Detailed Description of the Invention] [Industrial field of application] The present invention was formed on a mounted printed circuit board by sweeping a narrowed beam of laser light or the like on the mounted printed circuit board and soldering failure. The present invention relates to a mounted printed circuit board automatic inspection device that automatically detects the presence or absence of a bridge or solder funnel (soldering defect).

〔従来の技術〕[Conventional technology]

従来、実装済プリント基板における半田付け不良による
ブリッジの検出などを行う方法として、プリント基板の
部品穴に合わせて多数のピンを配設したヘッドを用い、
このヘッドによってピンを被検査プリント基板の半田面
に接触させて各ピン間の導通状態により不良個所を検出
する接触検査方式がある。
Conventionally, as a method of detecting a bridge due to poor soldering on a mounted printed circuit board, a head having a large number of pins arranged in accordance with the component holes of the printed circuit board is used.
There is a contact inspection method in which a pin is brought into contact with a solder surface of a printed circuit board to be inspected by this head and a defective portion is detected by a conduction state between the pins.

しかしながら、この方式においては、種類の異なるプリ
ント基板毎にヘッドを準備する必要があり、また、ヘッ
ドのピンの間隔はピンの太さによって制限されるため、
チップリードの間隔が密なICチップなどを実装したプリ
ント基板などパターンの緻密なプリント基板に対しては
検査が困難であるという問題があった。
However, in this method, it is necessary to prepare a head for each different type of printed circuit board, and the distance between the pins of the head is limited by the thickness of the pins.
There is a problem that it is difficult to inspect a printed circuit board having a dense pattern such as a printed circuit board on which an IC chip having a close chip lead interval is mounted.

上記のような問題を解消するために、レーザ光などのビ
ームを走査して被検査プリント基板上でビームを掃引
し、このビームのスパッタ光(反射光)を検知してブリ
ッジ等の半田付部の検査を行う非接触式の実装済プリン
ト基板自動検査装置なるものが各種提案され、例えば特
開昭57-165704号公報、特開昭57-196140号公報、特開昭
61-76940号公報に開示されている。また、プリント基板
等の表面状態の検査方式に関しては、特開昭53-87258号
公報、特開昭53-146171号公報、実開昭61-114307号公報
等に開示されたものがある。
In order to solve the above problems, a beam such as a laser beam is scanned to sweep the beam on the printed circuit board to be inspected, and the sputtered light (reflected light) of this beam is detected to solder parts such as bridges. There have been proposed various non-contact type mounted printed circuit board automatic inspection devices for inspecting, for example, JP-A-57-165704, JP-A-57-196140, and JP-A-
It is disclosed in Japanese Patent Publication No. 61-76940. Further, regarding a method of inspecting the surface condition of a printed circuit board or the like, there are those disclosed in JP-A-53-87258, JP-A-53-146171, and JP-A-61-114307.

〔考案が解決しようとする問題点〕[Problems to be solved by the invention]

被検査プリント基板上にビームを照射し、スパッタ光を
検出してブリッジ検出などの検査を行う前記のような各
装置においては、いずれも、装置が複雑であったり、部
品を実装する半田付部の半田面の形状の認識に必ずしも
適さなかったり、あるいは原理上困難である等の不都合
があった。
In each of the above-mentioned devices that irradiate a beam on the printed circuit board to be inspected and detect sputtered light to perform inspection such as bridge detection, the device is complicated, and the soldering part for mounting components However, there are inconveniences such as not being suitable for recognizing the shape of the solder surface or being difficult in principle.

実装済プリント基板の半田面の形状を認識してブリッジ
や半田フヌレ等の有無を確実に検査するためには、受光
量を多くしたり反射光の検出もれをなくして検出精度を
向上させたり、あるいは、スパッタ光すなわち反射光の
反射方向に応じた検出を行うためにも、あらゆる方向に
反射されるスパッタ光を受光できるようにすることが望
ましい。
In order to recognize the shape of the soldered surface of the mounted printed circuit board and to reliably inspect for the presence of bridges and solder funnels, increase the amount of received light or eliminate the missed detection of reflected light to improve the detection accuracy. Alternatively, it is desirable to be able to receive the sputtered light reflected in all directions in order to perform detection according to the reflection direction of the sputtered light, that is, the reflected light.

〔問題点を解決するための手段〕[Means for solving problems]

本考案は、前記問題点を解決すべくなされたものであっ
て、被検査プリント基板からの反射光が実質的に正反射
光となるように細く絞られたビームを被検査プリント基
板のパターン側に垂直に照射し、前記被検査プリント基
板からの前記ビームの正反射光を検知してプリント基板
の半田付け検査を行う実装済プリント基板自動検査装置
であって、前記ビームを前記被検査プリント基板に垂直
に照射した状態で掃引するビーム掃引手段と、前記ビー
ムを前記被検査プリント基板に向かって垂直に通過させ
る開口が形成され、かつ、被検査プリント基板のビーム
照射面を覆うと共に、照射されるビームを囲う受光面を
有する受光部とを備え、前記受光部により前記垂直の照
射状態で掃引されるビームの被検査プリント基板におけ
る半田面からの正反射光を受光し、前記掃引過程におけ
る半田面の角度を検出するように構成される。
The present invention has been made to solve the above-mentioned problems, and a beam narrowed down so that the reflected light from the inspected printed circuit board becomes substantially specular reflected light is applied to the pattern side of the inspected printed circuit board. Is a mounted printed circuit board automatic inspection device that irradiates the beam vertically to the printed circuit board and detects the regular reflection light of the beam from the printed circuit board to perform soldering inspection of the printed circuit board. Beam sweeping means for sweeping in a state of being vertically irradiated to the substrate, an opening for passing the beam vertically toward the inspected printed circuit board is formed, and the beam irradiation surface of the inspected printed circuit board is covered and irradiated. A light receiving portion having a light receiving surface surrounding the beam, and the beam swept by the light receiving portion in the vertical irradiation state is corrected from the solder surface of the inspected printed circuit board. It receives Shako configured to detect an angle of the solder surface in the sweep process.

〔作用〕[Action]

第1図(A)に示すように、被検査プリント基板からの
反射光が実質的に正反射光となるように細く絞られたビ
ームが、被検査プリント基板のパターン側に垂直に照射
される。受光部1により、反射角度の低いスパッタ光L1
(反射光)は周囲の受光面S1によって受光され、反射角
度の高いスパッタ光L2は天井部の受光面S2によって受光
される。また、同図(B)に示した受光部1によれば、
反射角度の低いスパッタ光L1は被検査プリント基板Pに
近接しビーム照射面を覆う受光面S2によって受光され、
反射角度の高いスパッタ光L2はビームBを囲う受光面S1
によって受光される。
As shown in FIG. 1 (A), a beam narrowed so that the reflected light from the printed circuit board to be inspected is substantially regular reflected light is vertically irradiated to the pattern side of the printed circuit board to be inspected. . Sputtering light L 1 with a low reflection angle by the light receiving unit 1
The (reflected light) is received by the surrounding light receiving surface S 1 , and the sputtered light L 2 having a high reflection angle is received by the ceiling light receiving surface S 2 . Further, according to the light receiving unit 1 shown in FIG.
The sputtered light L 1 having a low reflection angle is received by the light receiving surface S 2 which is close to the printed circuit board P to be inspected and covers the beam irradiation surface.
The sputtered light L 2 having a high reflection angle surrounds the beam B and is a light-receiving surface S 1
Is received by.

前記受光部は、被検査プリント基板に垂直に照射した状
態で掃引するビームを前記被検査プリント基板に向かっ
て垂直に通過させる開口が形成されており、かつ、被検
査プリント基板のビーム照射面を覆うと共に、照射され
るビームを囲う受光面を有するように構成される。
The light receiving portion is formed with an opening that allows a beam to be swept in a state where the printed circuit board is vertically irradiated toward the printed circuit board to be inspected, and the beam irradiation surface of the printed circuit board to be inspected is formed. It is configured to have a light receiving surface that covers and surrounds the beam to be irradiated.

この受光部によれば前記垂直の照射状態で掃引されるビ
ームの被検査プリント基板における半田面からの正反射
光を受光し、その反射方向から前記掃引過程における半
田面の角度を検出することができるので、ビームの掃引
過程における半田面の各角度から半田面の形状を認識す
ることが可能となって、実装済プリント基板に発生した
ブリッジや半田フヌレの有無を確実に検出することがで
きる。
With this light receiving unit, it is possible to receive the specularly reflected light of the beam swept in the vertical irradiation state from the solder surface on the printed circuit board to be inspected, and detect the angle of the solder surface in the sweep process from the reflection direction. Therefore, it is possible to recognize the shape of the solder surface from each angle of the solder surface during the beam sweeping process, and it is possible to reliably detect the presence or absence of a bridge or a solder funnel generated on the mounted printed circuit board.

〔実施例〕〔Example〕

第3図は実施例の実装済プリント基板自動検査装置の全
体を示す正面図であり、11はケーシング、12はこのケー
シング内に配設された被検査物であるプリント基板Pが
載置されてX軸方向とY軸方向とに自由に移動されるX-
Yステージである。1は後記で詳細に説明するように、
上記X-Yステージ12の上方に配置され上記被検査プリン
ト基板Pからのスパッタ光を検出する受光部であり、内
部の受光面には受光素子が多数配置されている。13は上
記X-Yステージ12の下方に設置された受光器であり、プ
リント基板上の基準点等を設定するときに上記受光部1
を通過するレーザ光をプリント基板に設けられた基準孔
を介して受光するものである。14はケーシング11の上面
に設けられた操作スイッチ群であり、15は装置の動作状
態を示す表示灯、16は検査結果をプリントアウトするプ
リンタである。
FIG. 3 is a front view showing the entire mounted printed circuit board automatic inspection apparatus of the embodiment, in which 11 is a casing, and 12 is a printed circuit board P which is an object to be inspected disposed in this casing. X- freely moved in the X-axis and Y-axis directions
This is the Y stage. 1 is as described in detail later,
The light receiving portion is arranged above the XY stage 12 and detects the sputtered light from the printed circuit board P to be inspected. A large number of light receiving elements are arranged on the light receiving surface inside. Reference numeral 13 denotes a light receiver installed below the XY stage 12, which is used for setting the reference point or the like on the printed circuit board.
The laser light passing through is received through a reference hole provided in the printed board. Reference numeral 14 is a group of operation switches provided on the upper surface of the casing 11, 15 is an indicator light showing the operating state of the apparatus, and 16 is a printer for printing out the inspection result.

この実装済プリント基板自動検査装置では、検査に先立
って被検査プリント基板上の基準位置、検査位置あるい
はプリント基板の種類などを識別する基板名などの検査
用データが予め記憶装置などに登録され、検査を行うと
きには、被検査プリント基板をX-Yステージ12に設置し
て基板名などを図示しない端末装置から入力すると、予
め記録された検査個所の位置情報などの検査用データに
基づいて自動的に検査が行われ、検査が終了すると検出
したブリッジの個所あるいは個数などの検査結果がプリ
ンタ16からプリントアウトされると共に、図示しないマ
ーカにより被検査プリント基板のブリッジ個所付近にマ
ークがつけられる。
In this mounted printed circuit board automatic inspection device, inspection data such as the reference position on the inspected printed circuit board, the inspection position or the board name for identifying the type of the printed circuit board is registered in advance in the storage device or the like before the inspection. When inspecting, place the inspected printed circuit board on the XY stage 12 and input the board name etc. from the terminal device (not shown), and it will be automatically inspected based on the inspection data such as the position information of the inspection point recorded in advance. When the inspection is completed, the inspection result such as the location or the number of the detected bridges is printed out from the printer 16, and a mark (not shown) is attached to the vicinity of the bridge location on the printed circuit board to be inspected.

第4図は上記第3図に示した装置の光学系を示す斜視図
であり、21はレーザ光を放射するHe-Neレーザ銃、22は
ビームを充分に絞るために上記He-Neレーザ銃21が放射
するレーザ光を一旦5mm径程度の平行ビームに拡張する
ためのエキスパンダである。23は前記X-Yステージ12の
Y軸方向にビームが掃引されるようにレーザビームを走
査するY軸回転ミラー23aと、同様にX軸方向にビーム
が掃引されるようにレーザビームを走査するX軸回転ミ
ラー23bとを備えたガルバノメータであり、このガルバ
ノメータ23によって各回転ミラーの可動範囲に基づく立
体角内でレーザビームが走査される。24は上記ガルバノ
メータ23によって走査されたレーザビームを第1のミラ
ー25および第2のミラー26を介してプリント基板P上に
集光する集光レンズである。
FIG. 4 is a perspective view showing an optical system of the apparatus shown in FIG. 3, 21 is a He-Ne laser gun for emitting a laser beam, and 22 is the He-Ne laser gun for sufficiently narrowing the beam. This is an expander for expanding the laser beam emitted by 21 into a parallel beam with a diameter of about 5 mm. Reference numeral 23 denotes a Y-axis rotating mirror 23a that scans the laser beam so that the beam is swept in the Y-axis direction of the XY stage 12, and X-axis that similarly scans the laser beam so that the beam is swept in the X-axis direction. This is a galvanometer including a rotating mirror 23b, and the galvanometer 23 scans the laser beam within a solid angle based on the movable range of each rotating mirror. A condenser lens 24 condenses the laser beam scanned by the galvanometer 23 on the printed circuit board P via the first mirror 25 and the second mirror 26.

上記Y軸回転ミラー23a及びX軸回転ミラー23bによるY
軸及びX軸方向の走査距離に対し、各回転ミラーからプ
リント基板Pまでの距離は十分大きく、かつ、集光レン
ズ24により集光されるので,上記レーザビームは充分に
細いビームとなってプリント基板Pのパターン側に垂直
に照射されることになる。
Y by the Y-axis rotating mirror 23a and the X-axis rotating mirror 23b
The distance from each rotating mirror to the printed circuit board P is sufficiently large with respect to the scanning distance in the axial and X-axis directions, and the light is condensed by the condenser lens 24. Therefore, the laser beam is printed as a sufficiently narrow beam for printing. The pattern side of the substrate P is vertically irradiated.

1は前記第1図(A)に示した受光部であり、第2図に
受光面Sを展開して示したように、受光面Sの全面には
多数の受光素子Dが配設されており、これら多数の受光
素子Dによって入射するスパッタ光が検出される。ま
た、上記受光面Sの天井部の受光面S2には開口部Oが設
けられており、この開口部Oを通してレーザビームがプ
リント基板に垂直に照射される。なお、上記開口部Oを
通して照射レーザビームは充分に細く絞られているの
で、受光部に検出されるスパッタ光は、プリント基板P
から反射される正反射光及び乱反射光の中の正反射光部
分となる。
Reference numeral 1 denotes the light receiving portion shown in FIG. 1 (A), and as shown in FIG. 2 in which the light receiving surface S is expanded, a large number of light receiving elements D are arranged on the entire light receiving surface S. The incident sputter light is detected by the large number of light receiving elements D. Further, an opening O is provided in the light receiving surface S 2 on the ceiling of the light receiving surface S, and a laser beam is vertically irradiated to the printed board through the opening O. Since the irradiation laser beam is sufficiently narrowed through the opening O, the sputtered light detected by the light receiving portion is the printed circuit board P.
It is the specular reflection light portion of the specular reflection light and the diffuse reflection light reflected from.

また、この装置においては、上記ガルバノメータ23によ
って走査されたレーザビームからその一部をビームスプ
リッタ27で分離し、このビームスプリッタ27を透過した
ビームBを上記のようにプリント基板P上に照射すると
ともに、ビームスプリッタ27によって反射されたビーム
を第2の集光レンズ28によって光点位置検出素子29の受
光面上に集光させ、この光点位置検出素子29によって検
出されるビームのスポット位置情報に基づいてプリント
基板Pに照射されるビームBのスポット位置をサーボ制
御するようにしてある。
Further, in this apparatus, a part of the laser beam scanned by the galvanometer 23 is separated by the beam splitter 27, and the beam B transmitted through the beam splitter 27 is irradiated onto the printed board P as described above. , The beam reflected by the beam splitter 27 is condensed by the second condenser lens 28 on the light receiving surface of the light spot position detecting element 29, and the spot position information of the beam detected by this light spot position detecting element 29 is obtained. Based on this, the spot position of the beam B irradiated on the printed circuit board P is servo-controlled.

以上の光学系により、プリント基板Pに照射されるレー
ザビームBはガルバノメータ23のY軸回転ミラー23aお
よびX軸回転ミラー23bの可動範囲に基づく矩形の範囲
内を走査されてビームが掃引され、この掃引範囲を包含
し内面に受光素子が多数配置された上記受光部1によっ
て、あらゆる方向に反射されるスパッタ光が受光され、
スパッタ光の強度あるいはスパッタ光の有無等が検出さ
れてプリント基板のブリッジ等の検出など各種検査が行
われる。
With the above optical system, the laser beam B with which the printed board P is irradiated is scanned within a rectangular range based on the movable range of the Y-axis rotary mirror 23a and the X-axis rotary mirror 23b of the galvanometer 23, and the beam is swept. Sputtering light reflected in all directions is received by the light receiving section 1 including a sweep range and having a large number of light receiving elements arranged on the inner surface,
Various inspections such as detection of the bridge of the printed circuit board are performed by detecting the intensity of the sputtered light or the presence or absence of the sputtered light.

すなわち、ビームで実装済プリント基板のパターン側を
垂直照射しながら掃引し、上記受光部1の受光面Sに配
設された多数の受光素子の各出力の示すスパッタ光の正
反射光の反射方向から上記掃引過程における半田面の角
度を検出することにより、照射面の3次元形状を認識す
ることができる。
That is, the pattern direction of the mounted printed circuit board is swept while being vertically irradiated with the beam, and the reflection direction of the specular reflection light of the sputtered light indicated by each output of the plurality of light receiving elements arranged on the light receiving surface S of the light receiving unit 1 is reflected. Therefore, the three-dimensional shape of the irradiation surface can be recognized by detecting the angle of the solder surface in the sweep process.

〔考案の効果〕[Effect of device]

以上説明したように、本考案は、被検査プリント基板か
らの反射光が実質的に正反射光となるように細く絞られ
たビームを被検査プリント基板のパターン側に垂直に照
射し、このビームを前記被検査プリント基板に向かって
垂直に通過させる開口が形成され、かつ、被検査プリン
ト基板のビーム照射面を覆うと共に、照射されるビーム
を囲う受光面を有する受光部とを備え、この受光部によ
り前記垂直の照射状態で掃引されるビームの被検査プリ
ント基板における半田面からの正反射光を受光し、その
反射方向から前記掃引過程における半田面の角度を検出
するようにしたので、ビームの掃引過程における半田面
の各角度から半田面の形状を認識することが可能となっ
て、実装済プリント基板に発生したブリッジや半田フヌ
レの有無を確実に検出することができる。
As described above, the present invention irradiates a beam narrowed so that the reflected light from the inspected printed circuit board becomes substantially specularly reflected light vertically to the pattern side of the inspected printed circuit board. An opening is formed to allow the beam to pass through vertically to the printed circuit board to be inspected, and the beam irradiation surface of the printed circuit board to be inspected is covered with a light receiving portion having a light receiving surface surrounding the irradiated beam. Since the specular reflection light from the solder surface of the printed circuit board to be inspected of the beam swept in the vertical irradiation state by the section is received, and the angle of the solder surface in the sweep process is detected from the reflection direction, the beam It is possible to recognize the shape of the solder surface from each angle of the solder surface in the sweeping process of the device, and it is possible to confirm the presence or absence of bridges and solder funnels on the mounted printed circuit board. It can be out.

【図面の簡単な説明】[Brief description of drawings]

第1図は本考案の実装済プリント基板自動検査装置にお
ける受光部の例を示す図であり、 第2図は実施例の受光部の受光面を展開して示す図であ
り、 第3図は実施例の実装済プリント基板自動検査装置の全
体を示す図であり、 第4図は実施例の実装済プリント基板自動検査装置の光
学系を示す図である。 (符号の説明) 1……受光部、S……受光面、P……プリント基板、B
……ビーム、L……スパッタ(反射光)
FIG. 1 is a diagram showing an example of a light-receiving portion in the mounted printed circuit board automatic inspection apparatus of the present invention, FIG. 2 is a diagram showing the light-receiving surface of the light-receiving portion of the embodiment in a developed manner, and FIG. It is a figure which shows the whole mounted printed circuit board automatic inspection apparatus of an Example, and FIG. 4 is a figure which shows the optical system of the mounted printed circuit board automatic inspection apparatus of an Example. (Explanation of symbols) 1 ... Light receiving part, S ... Light receiving surface, P ... Printed circuit board, B
…… Beam, L …… Sputter (reflected light)

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 【請求項1】被検査プリント基板からの反射光が実質的
に正反射光となるように細く絞られたビームを被検査プ
リント基板のパターン側に垂直に照射し、前記被検査プ
リント基板からの前記ビームの正反射光を検知してプリ
ント基板の半田付け検査を行う実装済プリント基板自動
検査装置であって、 前記ビームを前記被検査プリント基板に垂直に照射した
状態で掃引するビーム掃引手段と、 前記ビームを前記被検査プリント基板に向かって垂直に
通過させる開口が形成され、かつ、被検査プリント基板
のビーム照射面を覆うと共に、照射されるビームを囲う
受光面を有する受光部とを備え、 前記受光部により前記垂直の照射状態で掃引されるビー
ムの被検査プリント基板における半田面からの正反射光
を受光し、前記掃引過程における半田面の角度を検出す
るようにしたことを特徴とする実装済プリント基板自動
検査装置。
1. A pattern side of a printed circuit board to be inspected is vertically irradiated with a beam narrowed so that the reflected light from the printed circuit board to be inspected is substantially specularly reflected light. A mounted printed circuit board automatic inspection device for detecting soldering of a printed circuit board by detecting specularly reflected light of the beam, comprising beam sweeping means for sweeping the beam in a state in which the printed circuit board to be inspected is vertically irradiated. A light receiving portion having an opening for allowing the beam to pass vertically toward the printed circuit board to be inspected, covering a beam irradiation surface of the printed circuit board to be inspected, and having a light receiving surface surrounding the beam to be irradiated. , Receiving the specular reflection light from the solder surface of the printed circuit board to be inspected of the beam swept in the vertical irradiation state by the light receiving unit, and soldering in the sweeping process. Implemented PCB automatic inspection apparatus characterized by the the to detect the angle of.
JP1987005622U 1987-01-19 1987-01-19 Mounted printed circuit board automatic inspection device Expired - Lifetime JPH0729483Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1987005622U JPH0729483Y2 (en) 1987-01-19 1987-01-19 Mounted printed circuit board automatic inspection device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1987005622U JPH0729483Y2 (en) 1987-01-19 1987-01-19 Mounted printed circuit board automatic inspection device

Publications (2)

Publication Number Publication Date
JPS63113946U JPS63113946U (en) 1988-07-22
JPH0729483Y2 true JPH0729483Y2 (en) 1995-07-05

Family

ID=30787378

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1987005622U Expired - Lifetime JPH0729483Y2 (en) 1987-01-19 1987-01-19 Mounted printed circuit board automatic inspection device

Country Status (1)

Country Link
JP (1) JPH0729483Y2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010279299A (en) * 2009-06-04 2010-12-16 Dainippon Printing Co Ltd Method of fixing predetermined seed to sending medium, and seed-sending medium by the same method

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5387258A (en) * 1977-01-11 1978-08-01 Canon Inc Measuring device
JPS53146171A (en) * 1977-05-26 1978-12-19 Fujitsu Ltd Method of inspecting printed board
JPS57165704A (en) * 1981-04-03 1982-10-12 Hitachi Ltd Detecting system for light spot position
JPS57196140A (en) * 1981-05-27 1982-12-02 Fujitsu Ltd Tester for inspecting appearance of soldered printed board
JPS6176940A (en) * 1984-09-25 1986-04-19 Nagoya Denki Kogyo Kk Automatic inspecting device of mounted printed board
JPS61114307U (en) * 1984-12-28 1986-07-19

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010279299A (en) * 2009-06-04 2010-12-16 Dainippon Printing Co Ltd Method of fixing predetermined seed to sending medium, and seed-sending medium by the same method

Also Published As

Publication number Publication date
JPS63113946U (en) 1988-07-22

Similar Documents

Publication Publication Date Title
KR100283834B1 (en) Bonding method of semiconductor chip and its device
JPH0572961B2 (en)
JPS6229737B2 (en)
JP4434417B2 (en) Inspection equipment for printed wiring boards
JPH06204307A (en) Method and device for making optical inspection
JPH0729483Y2 (en) Mounted printed circuit board automatic inspection device
JPS63177045A (en) Detection system for non-soldered part in mounted printed circuit board automatic inspection apparatus
JPS63177042A (en) Detection system for non-soldered part in mounted printed circuit board automatic inspection apparatus
JPH0641164Y2 (en) Mounted printed circuit board automatic inspection device
JP3162872B2 (en) Electronic component outline recognition apparatus and outline recognition method
JPS63177044A (en) Bridge detection system in mounted printed circuit board automatic inspection apparatus
JP2847351B2 (en) Automatic printed wiring board inspection system
JPH04355309A (en) Method for inspecting soldering of printed-circuit board to be inspected
JPS63177071A (en) Bridge inspection system of flat package in mounted printed circuit board automatic inspection apparatus
JPH071231B2 (en) Mounted printed circuit board automatic inspection device
JPS63177046A (en) Lead lifting inspection system of flat package in mounted printed circuit board automatic inspection apparatus
JPH04190145A (en) Apparatus for automatically inspecting mounted printed circuit board
JPS63177040A (en) Apparatus for automatically inspecting mounted printed circuit board
JP3754144B2 (en) Lead float inspection method
JPS61189443A (en) Pattern inspecting device for printed board
JPH0786467B2 (en) Mounted printed circuit board automatic inspection device
JPH03188307A (en) Apparatus for inspecting viahole
JPS6157869A (en) Inspecting device for printed wiring circuit
JPH0256812B2 (en)
JPH03239953A (en) Inspecting device for solder paste applied state