JPH07234113A - Method and apparatus for detecting shape - Google Patents

Abstract

PURPOSE:To accurately detect a shape irrespective of a position of an object to be detected. CONSTITUTION:When a slight light of a fringe pattern is projected to a object 1 to be detected by irradiating means, fetched by image input means 2, and image-processed by image processing means 7 to obtain a three-dimensional position of the object 1, a plurality of irradiating means are switched and selectively used. A slit light of first irradiating means 3 and a slit light of second irradiating means 4 are emitted from different directions of about 90 deg., and a detection of more accurate shape is realized by obtaining the three-dimensional position by image-processing the image having more number of emission lines of the projected slit light.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a shape detecting method for detecting a three-dimensional position of a target object by projecting slit light on the target object and imaging reflected light thereof, and a shape detecting method. It relates to the device.

[0002]

2. Description of the Related Art For example, when a work placed on a predetermined position in a production line or the like is picked up by a pick-up robot and assembled, the shape of the work is
That is, it is necessary to identify the three-dimensional position and take the information into the pickup robot. As a method of detecting the shape of the work in such a case, for example, as disclosed in JP-A-62-32582, a slit light is projected on an object (the work), its reflected light is imaged, and its input image is obtained. There is known a method in which three-dimensional processing such as distance conversion is performed to obtain distance information, that is, three-dimensional information to recognize the shape, position, etc. of the object.

By the way, the principle of the method for detecting the three-dimensional position of an object by irradiating the slit light is that when the slit light is projected onto the object, the bright line of the slit light deviates from the portion corresponding to the object and the object. The shape and the like of the target object are identified by utilizing the difference between the part and the opened part. Therefore, in the detection method using this slit light, the information that is the basis of shape recognition, that is, the larger the number of slit light projected on the object, and the portion that becomes a shadow with respect to the irradiation of slit light are The smaller the number, the higher the detection accuracy.

[0004]

However, in the case of actually detecting the shape of an object by slit light irradiation, the object is irregularly placed at a predetermined position. When this object has a large aspect ratio such as an axis, the most slit light is the object when the long axis direction of the object is orthogonal to the bright line direction of the slit light projected on the object. Since the image is projected on, more position information can be obtained from the input image, and more accurate shape detection can be performed. On the other hand, since the number of slit rays projected on the object decreases as the major axis direction of the object approaches in the direction parallel to the bright line direction of the slit light, the position obtained from the input image The amount of information decreases, and as a result, the accuracy of detecting the shape and the like decreases.

That is, in the shape detecting method by irradiating slit light, in order to always ensure a high detection accuracy, more slit light is projected on the object in consideration of the relative position between the object and the irradiation means. However, effective technology based on this viewpoint has not been proposed yet.

Incidentally, the above-mentioned known example is premised on image input by a single image inputting means, but in addition to this, two image inputting means are used so that the object can be viewed from two different directions. A technique for capturing images has also been proposed (for example, Japanese Patent Publication No. 2
-4030). However, in the latter known example, the image processing time is reduced mainly by facilitating the correspondence between the left and right screens when the object is stereoscopically viewed using two image input means. This is for the purpose of shortening, and does not disclose the shape detection accuracy resulting from the relative relationship between the object and the bright line projected on the object as described above.

Therefore, an object of the present invention is to propose a shape detection method and an apparatus therefor capable of performing highly accurate shape detection regardless of the position of the object when detecting the shape of the object by slit light irradiation. It is what

[0008]

In the present invention, the following constitution is adopted as a concrete means for solving such a problem.

In the shape detecting method of the present invention, the irradiation means projects the slit light of a predetermined stripe pattern onto the object, the reflected light from the object is captured by the image input means, and the input image is processed by the image processing means. When the three-dimensional position of the object is obtained by performing image processing with, the irradiation means is configured to generate slit light having a plurality of stripe patterns, and the plurality of stripe patterns are switched and used according to imaging conditions. The basic configuration is to do. The "striped pattern" here means a pattern based on a difference in the emission line direction of the slit light emitted from the irradiation means and a pattern based on a different stripe width, and a gray code pattern of the slit light. It's not something to say.

In the present invention, as a method for further embodying the basic structure as described above, a method of switching the stripe pattern by switching the bright line direction of the slit light and a method of switching the stripe width of the slit light. Is proposed.

(1) Switching of Stripe Pattern by Switching Bright Line Direction of Slit Light In the case of this method, the following four methods can be considered.

1-a) First Method and Second Method Both the first method and the second method use two irradiation means to switch the direction of the bright line of the slit light projected on the object. It will be realized.

That is, in the first method, the irradiation means is
Of the first irradiation means and the second irradiation means, and the emission lines of the slit light emitted from the respective irradiation means are in the same direction, and the first irradiation means and the second irradiation means. And are arranged at a crossing angle of about 90 ° with respect to the object, and in this state, the first irradiation means and the second irradiation means are selectively used.

In a second method, the irradiating means is the first
The irradiation line of the slit light emitted from the first irradiation unit and the direction of the emission line of the slit light irradiated from the second irradiation unit. The first irradiating means and the second irradiating means are arranged at different intersecting angles with respect to the object, and in this state, the first irradiating means and the second irradiating means are arranged in different directions. It is a method of selectively using means and.

In the first and second methods, either of the following two processing method procedures can be adopted in actual image processing. That is, one of them is that after the image generated by the projection of the slit light from the first irradiation means is taken into the image processing means from the image input means and the image processing is performed, the image is processed under a specific condition. Only for capturing and processing the image generated by the projection of the slit light from the second irradiation means, and the other one is generated by the projection of the slit light from the first irradiation means. Image and the image generated by the projection of the slit light from the second irradiation means are simultaneously taken in from the image input means to the image processing means, and then the input image by the first irradiation means is subjected to image processing, The input image from the second irradiation means is subjected to image processing only under a specific condition according to the image processing state.

1-b) Third Method and Fourth Method The third method and the fourth method are different from the above first and second methods in that the switching of the bright line direction of the slit light is single. It is a method of performing by the irradiation means.

That is, the third method is a method of changing the installation position of the irradiating means with respect to the object when switching the direction of the bright line of the slit light emitted from the irradiating means. The fourth method is a method of switching the bright line direction of the slit light with respect to the object by fixing the irradiation means at a predetermined position and rotating the irradiation means around the irradiation axis.

In the third method, as the processing procedure for the actual image processing, the image generated by projecting the slit light from the irradiation means at the first installation position is changed from the image input means to the image processing means. A procedure for capturing and image-processing an image generated by projecting slit light from the irradiation means at the second installation position only under specific conditions according to the image-processing state, The image generated by the projection of the slit light from the irradiation means at the installation position and the image generated by the projection of the slit light from the irradiation means at the second installation position are simultaneously captured from the image input means to the image processing means. After that, first, the input image by the irradiation means at the first installation position is subjected to image processing, and the image is processed under specific conditions according to the image processing state. Any Oite only procedure for image processing an input image from the irradiation means in the second installation position can be adopted.

Further, in the fourth method, as an image processing procedure, an image generated by projecting slit light from the irradiation means at the first rotation position is fetched from the image input means to the image processing means, and the image is processed. After processing, a procedure of capturing an image generated by projecting the slit light from the irradiation unit at the second rotation position and performing image processing only under specific conditions according to the image processing state;
The image generated by the projection of the slit light from the irradiation means at the rotation position of 1 and the image generated by the projection of the slit light from the irradiation means at the second rotation position are simultaneously captured from the image input means to the image processing means. After that, any of the procedures of first image-processing the input image at the first rotation position and image-processing the input image at the second rotation position only under specific conditions depending on the image processing state can be adopted.

(2) When Switching Stripe Patterns by Switching Stripe Width of Slit Light In this case, the following two specific methods (hereinafter, the first to fourth methods described above are used. Considering this, for convenience, the fifth method and the sixth method are conceivable.

That is, in the fifth method, when switching the stripe pattern in the irradiation means by switching the stripe width of the slit light, the irradiation means is constituted by liquid crystal slits having a predetermined number of stripes, and the liquid crystal The sixth method is a method of switching the spatial resolution of the slit, and the sixth method is to generate slit light by giving an optical path difference to the laser light emitted from the laser light source by the irradiation means to form interference fringes. In this method, the stripe width of the slit light projected on the object is switched by changing the optical path difference.

As a processing procedure for actual image processing, in the fifth method, an image generated by projection of slit light having a low spatial resolution is fetched from the image input means to the image processing means. After image processing, the procedure of capturing and processing the image generated by the projection of slit light with high spatial resolution only under specific conditions according to the image processing state and the projection of slit light with low spatial resolution. Image and the image generated by the projection of the slit light having a high spatial resolution are simultaneously captured from the image input means to the image processing means, and then the input image by the slit light having a low spatial resolution is image-processed and the image processing state thereof is obtained. Therefore, any of the procedures for image processing of the input image by slit light with high spatial resolution can be adopted only under specific conditions. That.

In the sixth method, after the image generated by the projection of the slit light having a large stripe width is taken in from the image input means to the image processing means and the image processing is performed,
Depending on the image processing state, the procedure for capturing and processing the image generated by the projection of the slit light with a small stripe width only under a specific condition, and the image and the stripe width generated by the projection of the slit light with a large stripe width After the image generated by the projection of the slit light having a small width is simultaneously captured from the image input means to the image processing means, the input image by the slit light having a large stripe width is image-processed, and the specific condition is set according to the image processing state. Any of the procedures for performing image processing on an input image with slit light having a small stripe width only at the bottom can be adopted.

(3) On the other hand, as a shape detecting device for carrying out each of the above shape detecting methods, an irradiation means for projecting slit light having a predetermined stripe pattern onto an object, and the stripe pattern is projected by the irradiation means. And an image processing unit that captures an image of the target object and inputs it as an image; and an image processing unit that three-dimensionally converts the image information input from the image input unit to obtain the three-dimensional position of the target object. The basic configuration is that the irradiation means is configured so that the stripe pattern of the slit light to be irradiated can be switched.

When the basic structure is further embodied, the following two specific structures can be considered by the above-described stripe pattern switching method.

That is, one of them is a structure for switching the stripe pattern by switching the direction of the bright line of the slit light (hereinafter referred to as the first structure), and the other one is the stripe width of the slit light. Configuration to be realized by switching
(Hereinafter, referred to as the second configuration).

(3-a) First Structure As the first structure, the following three concrete structures can be considered.

That is, the irradiating means is constituted by a pair of irradiating means whose relative positions are set so that the irradiation direction of the slit light with respect to the object has an angle of about 90 °. What makes it possible to switch the bright line direction of the slit light emitted by switching and using a pair of irradiation means, and the irradiation means is constituted by a single irradiation means and the irradiation of the slit light to the object is performed. Direction is about 90 °
And the irradiation means is composed of a single irradiation means and the bright line direction of the slit light projected on the object is within a range of about 90 °. It can be rotated about its axis so that it can be changed.

(3-b) Second Configuration As the second configuration, the following two specific configurations can be considered. That is, one of them is configured such that the irradiation means is provided with a liquid crystal slit whose spatial resolution is switchable, and the stripe width of slit light is switched by switching the spatial resolution, and the other one is , The irradiation means,
A laser light source, a prism for deflecting a part of laser light from the laser light source, a reflector for reflecting the laser light deflected by the prism and returning to the prism, and a reflection angle of the reflector are variable. A variable mechanism is provided, and the stripe width of the slit light is switched by switching the reflection angle of the reflector.

[0030]

According to the present invention, with such a configuration, the following operation can be obtained.

The irradiation means projects a slit light of a predetermined stripe pattern on the object, and the reflected light from the object is captured by the image input means, and the input image is image-processed by the image processing means to subject the object. When determining the three-dimensional position of an object, the irradiation means is composed of two irradiation means, a first irradiation means and a second irradiation means, and the bright line direction of the slit light emitted from each irradiation means is the same direction. In addition, the first irradiating means and the second irradiating means are arranged at an intersection angle of about 90 ° with respect to the object, and in this state, the first irradiating means and the second irradiating means are arranged. When selectively used, the slit light projected on the object by the first irradiation means and the slit light projected on the object by the second irradiation means form an angle of about 90 °, For example, The case where the slit light is projected onto the object by the irradiating means and the case where the slit light is projected onto the object by the second irradiating means are compared. Of these two, the number of the slit light projected onto the object is large. More accurate shape detection is realized by capturing the image of one side (that is, the side having a lot of image information) and obtaining the three-dimensional position of the object by image processing.

Further, unlike the above case, when the direction of the bright line of the slit light emitted from each irradiation means is set to a different direction, the direction of the bright line of the slit light projected on the object is switched when the irradiation means are switched. Does not change before and after the switching, but since the irradiation direction of the slit light on the object changes by approximately 90 ° due to the switching of the irradiation means, for example, there is a shadow when the slit light is irradiated from the first irradiation means. The illuminated portion becomes an illuminated portion when the slit light is emitted from the second irradiation means. Therefore, accurate shape detection can be realized by selecting an image so that a portion that becomes an important point in the edge extraction of the object does not become a shadow.

In any of the above methods, as an image processing procedure, first, an image by slit light irradiation from the first irradiation means is captured and image processing is performed, and as a result, detection accuracy is poor. In this case, the procedure for capturing an image by slit light irradiation from the second irradiation means and performing shape detection based on this image is not compatible with the first procedure.
The image by slit light irradiation from the irradiation unit and the image by slit light irradiation from the second irradiation unit are simultaneously captured, and of the two images captured at the same time, the image by the first irradiation unit is processed first. Then, if the result is bad, any of the procedures for performing the shape detection based on the image by the second irradiating means can be adopted. However, when the former processing procedure is adopted, the image is first detected. When accurate shape detection is possible only with the image from the first irradiation means to be processed, it is not necessary to capture an image with the second irradiation means, so that more accurate shape detection can be performed quickly in a shorter time. Can be done. When the latter processing procedure is adopted, first the first and second
Since the image is taken in by the irradiation means of, when the image input is completed, the image input means can be moved to the next shape detection space at that time and made to stand by,
There is an advantage in terms of work speed.

When switching the stripe pattern projected on the object by switching the bright line direction of the slit light emitted from the irradiation means, the irradiation means is constituted by a single irradiation means, and the object of the irradiation means is the above-mentioned object. When it is realized by changing the installation position for the object, there is an advantage that the structure of the device can be simplified as compared with the case where two irradiation means are provided. Then, in this case, as a processing procedure at the time of image processing, an image when the irradiation unit is at the first installation position is captured and image processing is performed, and as a result, when the shape detection accuracy is not good (that is, when the object is an object). When the number of bright lines of the projected slit light is small and the image information is small), the procedure to capture the image at the second installation position and detect the shape for the first time, and the images at the first and second installation positions that cannot be combined It is possible to adopt any of the procedures in which the shape detection based on the image at the first installation position is first performed, and the shape detection based on the image at the second installation position is performed only when the accuracy is not good as a result of the shape detection based on the image at the first installation position. When the former processing procedure is adopted, when the shape detection based on the image at the first installation position enables highly accurate detection, it is not necessary to capture the image at the second installation position. Adopt a processing procedure After if completed image capture, in which immediately image input means can be waiting on the next shape detection.

Further, when the stripe pattern projected on the object is switched by switching the bright line direction of the slit light emitted from the irradiation means, the irradiation means is fixedly arranged at a predetermined position and the irradiation axis is set at the fixed position. Even when the method of switching the bright line direction of the slit light with respect to the object by rotating it around is adopted, the same effect as in the above case can be obtained.

When the stripe pattern is switched in the irradiation means by switching the stripe width of the slit light, the irradiation means is composed of liquid crystal slits having a predetermined number of stripes, and the spatial resolution of the liquid crystal slits is switched. In this case, even if high-precision shape detection cannot be expected by projecting slit light with low spatial resolution, instead of this, if high-precision shape detection is possible by projecting slit light with high spatial resolution. Therefore, highly accurate shape detection can always be realized regardless of the position of the object.

Further, in this case, as an image processing procedure, an image generated by projection of slit light having a low spatial resolution is captured and image-processed. As a result, when the shape detection accuracy is not good (that is, the image is projected on the object, (When the number of bright lines of the slit light is small and the image information is small), the procedure for capturing and processing the image generated by the projection of the slit light with the high spatial resolution for the first time or the projection of the slit light with the low spatial resolution is generated. Image and the image generated by the projection of slit light with high spatial resolution are simultaneously captured, then the input image with slit light with low spatial resolution is image-processed, and the result is input with slit light with high spatial resolution. Any of the procedures for image processing of images can be adopted, but especially when the former processing procedure is adopted, the first spatial resolution When shape processing with sufficient accuracy can be performed by image processing based on an image by projection of low slit light, it is not necessary to perform processing by projection of slit light with high spatial resolution, and image processing can be simplified. . On the other hand, when the latter processing procedure is adopted, first, image input by projection of slit light with low spatial resolution and image input by projection of slit light with high spatial resolution are performed. After the completion, the image input means can be put on standby in preparation for the next shape detection, and the speed of work can be improved accordingly.

Further, when the image processing is performed based on the image projected by the slit light having a low spatial resolution to obtain the three-dimensional position of the object, this is calculated based on the image projected by the slit light having a high spatial resolution. Although the detection accuracy is reduced due to the lower spatial resolution compared to the case of performing it, there is an advantage that the calculation processing time in the image processing is shortened and rapid shape detection is realized.

When switching the stripe pattern in the irradiation means by switching the stripe width of the slit light, the irradiation means gives an optical path difference to the laser light emitted from the laser light source to form interference fringes. In the case of a method of switching the stripe width of the slit light projected on the object by changing the optical path difference, the slit light can be simply and easily changed only by changing the optical path difference. The stripe width can be switched to bring the number of bright lines of the slit light projected on the object into a state in which a predetermined shape detection accuracy can be obtained, and the operation is very simple.

The image processing procedure in this case is as follows.
Image processing is performed by capturing the image generated by the projection of the slit light with a large stripe width, and as a result, the image generated by the projection of the slit light with a small stripe width is captured only when the shape detection accuracy is poor. And the image generated by the projection of the slit light having a large stripe width and the image generated by the projection of the slit light having a small stripe width at the same time. If the processing is performed and the shape detection accuracy is not good, any of the procedures for image processing of the input image by the slit light with a small stripe width can be adopted for the first time, but especially if the former processing procedure is adopted, the first stripe width If the shape can be detected with sufficient accuracy by image processing based on the projection of slit light with a large It is not necessary to perform management, simplification of the image processing can be achieved. On the other hand, when the latter processing procedure is adopted, the image input by projecting the slit light having a large stripe width and the image input by projecting the slit light having a small stripe width are performed first. After completion, the image input means can be put on standby in preparation for the next shape detection,
The speed of the work is increased accordingly.

When image processing is performed based on an image projected by slit light having a large stripe width to obtain a three-dimensional position of an object, this is calculated based on an image projected by slit light having a small stripe width. Compared with the case of performing the detection, the detection accuracy is reduced due to the large stripe width and the smaller amount of information obtained, but there is an advantage that the calculation processing time in the image processing is shortened and rapid shape detection is realized.

As the shape detection device, an irradiation unit, an image input unit, and an image processing unit are provided, and the irradiation unit is arranged relative to the object so that the slit light irradiation direction forms an angle of about 90 °. In the case of a pair of irradiating means whose arrangement positions are set, it is possible to switch the emission line direction of the slit light to be irradiated by switching and using the pair of irradiating means.

As the shape detection device, an irradiation unit, an image input unit, and an image processing unit are provided, and the irradiation unit is constituted by a single irradiation unit, and the irradiation direction of the slit light to the object is approximately 90. In the case of a movable unit that can be changed within a range of °, a slit light projected onto an object can be used while using a single irradiation unit by changing the installation position of the irradiation unit. It is possible to switch the direction of the bright line in the range of approximately 90 °.

As the shape detection device, an irradiation unit, an image input unit, and an image processing unit are provided, and the irradiation unit is constituted by a single irradiation unit, which is in the direction of the bright line of the slit light projected on the object. When the irradiation means is rotatable about its axis so that it can be changed within a range of approximately 90 °, the stripe pattern can be switched only by the rotating operation of the irradiation means. The simplification of the apparatus is further promoted as compared with the case of providing one or moving a single irradiation means.

When the shape detecting device is provided with an irradiating means, an image inputting means, and an image processing means, and the irradiating means is provided with a liquid crystal slit whose spatial resolution can be switched, the spatial resolution can be improved. It becomes possible to switch the stripe width of the slit light by switching.

The shape detection device includes an irradiation unit, an image input unit, and an image processing unit, and the irradiation unit includes a laser light source, a prism for deflecting a part of the laser light from the laser light source, and the prism. When a reflecting plate that reflects the laser light deflected by the reflector and returns to the prism and a variable mechanism that changes the reflecting angle of the reflecting plate are provided, the slit is formed by switching the reflecting angle of the reflecting plate. The stripe width of light can be easily and steplessly switched.

[0047]

Therefore, according to the shape detecting method of the present invention, the slit light emitted from the irradiating means is projected onto the object to capture an image, and the image is processed based on the image to detect the shape of the object. In the case of performing shape detection based on more image information by switching the stripe pattern of slit light according to the relative position of the object with respect to the irradiation means and always projecting the bright lines of many slit light on the object. Since it is performed, accurate shape detection is always realized irrespective of the position of the target object, and especially when the operation of a work machine such as a pickup robot is controlled using the result of this shape detection, the operation is performed. The accuracy of is further enhanced, and highly reliable work is possible.

According to the shape detecting device of the present invention,
Depending on the projection state of the slit light on the target object, two irradiation means can be selectively used, one irradiation means can be changed in position or rotated, and the spatial resolution can be changed by using one irradiation means equipped with a liquid crystal slit. By switching or switching the optical path difference using a single irradiation means equipped with a laser light source, it is possible to switch the stripe pattern of the slit light projected on the object, so it is a simple structure The effect that it is possible to always realize highly accurate shape detection is obtained.

Further, particularly in the case of using a single irradiation means, the cost can be reduced by simplifying the structure and reducing the number of parts.

Further, in the case of using the irradiation means having the liquid crystal slit or the irradiation means having the laser light source, the irradiation means can be constituted by a single irradiation means, and the irradiation means itself. Since it is not necessary to move or rotate, the structure is simplified, the cost is reduced, and the operation is facilitated.

[0051]

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS The shape detecting method and apparatus according to the present invention will be specifically described below with reference to the accompanying drawings.

First Embodiment FIG. 1 shows an arrangement state of constituent members of a shape detection apparatus applied to the implementation of the shape detection method according to the first embodiment of the present invention. In FIG. Is an object whose shape is to be detected by the shape detecting device, and an image input means 2 constituted by, for example, a CCD camera supported by a robot arm 9 is located directly above the object 1 by the shape detecting device 1. It is placed in a state of being oriented to. Further, in the figure, reference numerals 3 and 4 are first and second irradiating means which will be described below, and the first irradiating means 3 and the second irradiating means 4 are the above-mentioned object from obliquely above. 1
The two irradiation means 3 and 4 are set relative to each other in the plane direction so that the irradiation direction of the slit light with respect to the object 1 has an angle of 90 °.

The structure of the first irradiating means 3 and the second irradiating means 4 will be described with reference to FIG. 2 by taking the first irradiating means 3 as an example. The irradiation means 3 is configured by sequentially arranging a halogen light source 13, a condensation lens 14, a liquid crystal slit 15, and a light projecting lens 16 coaxially and integrating them. The liquid crystal slit 15 is composed of a stripe shutter array having 256 stripes, and is configured so that the measurement space can be divided into 256 by an 8-bit gray code pattern.

Further, in this embodiment, the bright line directions of the slit light emitted from the first irradiating means 3 and the second irradiating means 4 are the same (that is, the stripe patterns are set to be the same). ). Therefore, this first irradiation means 3
When the slit light emitted from the object 1 is projected onto the object 1 and when the slit light emitted from the second irradiation means 4 is projected onto the object 1, the first irradiation means 3 is used.
And the object 1 due to the installation angle of the second irradiation means 4.
The upper bright line directions have an angle of 90 ° with each other as in the image A shown in FIG. 7A and the image B shown in FIG.
7 (a) and 7 (b) are drawn so that the long axis direction of the object image 29 and the bright line direction of the slit light are parallel or orthogonal to each other for convenience of explanation of the bright line direction. Since the object 1 is actually placed irregularly, the relationship between the long axis direction of the object 1 and the direction of the bright line of the slit light and the arrangement position on the screen (that is, in the measurement space) are not constant. .

Next, a processing procedure and the like in the case of detecting the shape of the object 1 using the shape detecting apparatus thus constructed will be described. Particularly, in this embodiment, as described below, the first method will be described. The method of sequentially capturing the image when the slit light is projected from the irradiation means 3 onto the object 1 and the image when the slit light is projected from the second irradiation means 4 onto the object 1 is adopted. is doing. A detailed description will be given below with reference to the flowchart shown in FIG.

After the measurement is started, first, in step S1, the slit light is projected from the first irradiation means 3 to the object 1, the image thereof is taken in by the image input means 2, and this is processed by the image processing means 7. This is displayed on the monitor 8 via.

Next, in step S2, the influence of the shadow caused by the illumination is judged from the input image. If the object 1 cannot be sufficiently detected due to the influence of the shadow, the detection state is bad.
(NG), and in this case, the process shifts to projection by the second irradiation means 4 described later (step S5).

On the other hand, if it is determined in step S2 that the detection state is good without the influence of shadows, the image processing means 7 performs image processing such as distance conversion on the input image in step S3. Then, the current position and direction of the target object 1 are measured.

Next, in step S4, based on the measurement result in step S3, the direction of the object 1 (long axis direction)
Is within ± 45 ° with respect to the bright line 30 of the slit light projected on the object 1.

This is because when the major axis direction of the object 1 and the bright line direction are within an angle of ± 45 °, the image A of FIG.
Line 30 projected on the object 1 in a state close to
Therefore, it can be determined that accurate shape detection cannot be expected because the amount of information obtained from this is small, and the long-axis direction and the bright line direction of the object 1 are ± 45.
When the angle is other than 0 ° (that is, within the range of 45 ° to 135 °), the state is close to the image B in FIG. 7B, and the number of the bright lines 30 projected on the object 1 is large. Therefore, it can be determined that the amount of information obtained from this is large, and that accurate shape detection can be expected.

Therefore, in step S4, the object 1
When it is determined that the direction is other than the angle ± 45 °, accurate shape detection can be expected from the current input image. In this case, therefore, in step S6, the shape of the object 1 based on the image is detected. The detection result is output and displayed on the monitor 8.

On the other hand, when it is determined in step S4 that the direction of the object 1 is within the angle of ± 45 °, the shape of the required accuracy is obtained in the image by the slit light irradiation from the first irradiation means 3. Since detection cannot be expected, in this case, the process proceeds to step S5, this time, the slit light is projected from the second irradiation unit 4 onto the object 1, and the image is captured by the image input unit 2, and This is displayed on the monitor 8 via the image processing means 7.

Here, it is further judged whether or not the detection state of the input image is deteriorated by the shadow (step S6), and the influence of the shadow is large in this input image as well, and the detection state is judged to be defective. In that case, the shape detection control of the object 1 is stopped at that time, and the detection result is not output.

On the other hand, when it is determined that the detection state is good without the influence of the shadow due to the illumination, the position and direction of the object 1 are measured in step S7, and the measurement result is output ( In step S6), this is displayed on the monitor 8. This completes the shape detection control of the object 1.
The shape detection control as described above is sequentially performed for each object 1 when there are a plurality of objects 1.

As described above, the first irradiation means 3 and the second irradiation means 4 arranged at an angle of 90 ° are provided as the irradiation means, and first, the slit light is projected from the first irradiation means 3. When the direction of the obtained image is measured, and it can be determined that the direction is a state in which a highly accurate detection result can be obtained (that is, the number of the bright lines 30 of the slit light projected on the object 1 is large and a large amount). When the amount of information is obtained), the shape of the target object 1 is detected based on this input image, while when it is determined from the direction of the target object 1 that the shape of the input image cannot be detected accurately. Instead of this, by performing shape detection of the object 1 based on the image obtained by projecting the slit light from the second irradiation means 4,
The shape detection with good accuracy is surely realized.

In particular, when the projection of the slit light from the first irradiating means 3 and the projection of the slit light from the second irradiating means 4 are performed before and after as in this embodiment, for example, If the image obtained by the first irradiation means 3 which is initially projected can be expected to have sufficiently accurate shape detection, it is not necessary to project the second irradiation means 4, and thus the shape detection is performed accordingly. The processing time can be expected to be shortened.

Second Embodiment FIG. 11 shows a flowchart of the shape detection control of the object 1 by the shape detection method according to the second embodiment of the present invention. The shape detection method of this embodiment is carried out by using the same apparatus as that shown in FIG. 1 as in the case of the first embodiment, but the first point is described below.
It differs from that of the embodiment.

That is, in the first embodiment, the first
The image capturing by projecting the slit light from the irradiating means 3 and the image capturing by projecting the slit light by the second irradiating means 4 are performed before and after the first irradiating means 3
When it is determined that the shape detection with sufficient accuracy can be performed by the image obtained by projecting the slit light from, the image capturing by the projection of the slit light from the second irradiation means 4 is not performed. On the other hand, in the second embodiment, first, slit light is projected from the first irradiation means 3 and the second irradiation means 4, respectively, and the images thereof are respectively captured.

As described above, by capturing the images obtained by projecting the slit light from the respective irradiation means 3 and 4 at the beginning of the detection control, the image input means 2 thereafter detects the shape of the object 1. Since it is not necessary to use this during control, for example, after the completion of capturing both images, this image input means 2 is made to stand by at a predetermined position in preparation for the shape detection of another object 1 at the next time. In the case where shape detection is successively performed on a plurality of objects 1, work time for each shape detection process can be shortened, which is effective in improving workability. is there.

The shape detection control in the second embodiment will be described below with reference to the flow chart of FIG.

After the measurement is started, first, in step S1, slit light is sequentially projected from the first irradiation means 3 and the second irradiation means 4 onto the object 1, and the images thereof are sequentially processed by the image input means 2. take in. At this point, the work of the image input means 2 is completed.

Next, in step S2, it is determined whether or not the image obtained by the slit light projection from the first irradiation means 3 has an influence of the shadow due to the illumination among the input images. Here, when it is determined that sufficient detection accuracy cannot be obtained due to the large influence of the shadow, the process proceeds to step S5 described below.

On the other hand, when it is determined that the shape can be detected with sufficient accuracy without the influence of the shadow, the position and direction of the object 1 are measured based on the image in step S3. . Then, in this measurement result, with respect to the direction of the object 1, whether or not the angle in the long axis direction of the object 1 with respect to the bright line direction of the slit light is ± 45 ° or less in step S4 (that is, whether the object 1 has a predetermined number It is determined whether or not the above slit bright lines are projected. If the angle is ± 45 ° or more, it is possible to detect the shape with sufficient accuracy, and the measurement result is directly output as the shape detection result (step S
7).

On the other hand, when the angle is within ± 45 °, it is determined that sufficient detection accuracy cannot be expected based on the image, and in this case, the second irradiation means 4 determines In step S5, the shape detection is performed based on the image obtained by the slit light projection.

In step S5, as in the case of step S2 described above, the influence of the shadow on the image obtained by the slit light projection from the second irradiation means 4 is judged. Then, if it is determined that the influence of the shadow is large in this image as well and sufficient detection accuracy cannot be expected, the shape detection control is stopped at that point. On the other hand, when it is determined that sufficient detection accuracy can be expected without the influence of the shadow, the position and direction of the target object 1 are measured based on this image in step S6, and the result is output ( Step S6).

Third Embodiment FIG. 12 shows a flowchart of the shape detection control of the object 1 by the shape detection method according to the third embodiment of the present invention. The shape detecting method of the third embodiment is carried out by using the shape detecting device shown in FIG. 1 as in the first and second embodiments, and the specific shape detecting processing procedure is It is similar to that of the first embodiment. And
The difference between the shape detection method of the third embodiment and the shape detection method of the first embodiment is that the bright line directions of the slit light emitted from the pair of irradiation means 3 and 4 are set to the same direction. Is.

Therefore, an image obtained by projecting the slit light from the first irradiating means 3 onto the object 1 (image C in FIG. 8 (a)) and the first irradiating means 3 and 90 ° In the image obtained by projecting the slit light from the second irradiation means 4 having the installation angle (image D in FIG. 8B), the way the bright line of the slit light is applied to the object 1 is the same. Therefore, unlike the first and second embodiments, since the number of bright lines of the slit light on the object 1 does not change, the amount of information obtained from both images is the same, but the slit light for the object 1 is the same. Has an angle of 90 °, for example, the shadowed portion when the slit light is projected from the first irradiation means 3 becomes the irradiation surface when the slit light is projected from the second irradiation means 4. . Therefore, in the edge extraction processing and the like in the image processing, it is possible to select an image in which a characteristic portion of the image does not become a shadow, and as a result, it is possible to perform shape detection with high accuracy. Hereinafter, this shape detection control will be described with reference to FIG.

After the measurement is started, first, in step S1, the slit light is projected from the first irradiation means 3 onto the object 1, and the image is taken in by the image input means 2. Determine the effect of shadows. If it is determined that the characteristic portion of the object 1 is not affected by the shadow, the position and direction of the object 1 are measured in step S3, and the result is output as it is (step S7).

On the other hand, when it is determined that the influence of the shadow cannot be overlooked, the process proceeds to step S4, where slit light is projected from the second irradiation means 4 and the image is captured. At the same time, the influence of the shadow on the input image is determined in step S5. If it is determined that there is no influence of the shadow, the position and direction of the target object 1 are measured based on the image in step S, and the result is output (step S7). If it is determined in step S5 that the input image has a shadow that cannot be overlooked, the shape detection control is stopped at that point.

Fourth Embodiment FIG. 13 shows a flow chart of the shape detection control of the object 1 by the shape detection method according to the fourth embodiment of the present invention. The shape detecting method of the fourth embodiment is the same as the third embodiment.
In the shape detecting method of the embodiment, the image capturing by the slit light projection of the first irradiating means 3 and the image capturing by the slit light projection from the second irradiating means 4 are performed before and after,
When the image based on the first irradiation means 3 is not suitable, the image acquisition based on the second irradiation means 4 is performed for the first time, whereas these two image acquisitions are performed in the first stage of the shape detection control. This is performed simultaneously (that is, the same as the image capturing process in the second embodiment).

Therefore, in the fourth embodiment, the basic operation and effect (that is, the effect of eliminating the shadow portion in the image) in the third embodiment can be obtained, and at the same time, the image processing in the second embodiment. The effect based on the procedure (that is, the work time can be shortened by making the first irradiation unit 3 and the second irradiation unit 4 stand by for the next work at the time of completion of image capturing). It is a thing.

Regarding the specific contents of the flow chart shown in FIG. 13, the description in the above second or third embodiment is cited, and the description thereof is omitted here.

Fifth Embodiment FIG. 3 shows an arrangement state of constituent members of a shape detecting apparatus used for carrying out a shape detecting method according to a fifth embodiment of the present invention. In this shape detection device, the object 1
The point of arranging the image input means 2 immediately above is similar to the case of the shape detecting apparatus shown in FIG. 1 (that is, the shape detecting apparatus applied to the first to fourth embodiments). In this respect, the configuration is different from that of the shape detection device of FIG. That is, in the shape detecting apparatus of this embodiment,
Instead of arranging the two irradiation means 3 and 4 at an installation angle of 90 ° as in the shape detection device shown in Fig. 1, a single irradiation means 5 is movably arranged by the robot arm 10, and the irradiation means 5 is The first position shown by a solid line in FIG. 3 and the second position shown by a chain line in FIG. 3 can be selectively installed. Then, in this case, an angle of 90 ° is provided between the first position and the second position. The specific structure of the irradiation means 5 is the same as the first irradiation means 3 and the second irradiation means 4 described above.

In this embodiment, the irradiation means 5 movably arranged in this way captures images by capturing images at both the first position and the second position. . The actual operation will be described below with reference to the flowchart shown in FIG.

After the measurement is started, first, in step S1, slit light is projected from the irradiation means 5 onto the object 1 at the first position and the image thereof is captured, and in step S2, the detected state of this input image is detected. To judge.
If the detection state is poor, the process proceeds to step S5 to perform imaging at the second position, but if the detection state is good, the position and direction of the target object 1 are determined in step S3. The measurement is further performed, and the adequacy of the direction of the object 1 is determined in step S4. Here, when the direction of the object 1 is unsuitable, that is, when the slit light projected on the object 1 absorbs little bright lines and a large amount of information cannot be obtained, this detection result is obtained. The process proceeds to step S5 without outputting.

In step S5, slit light is projected onto the object 1 with the irradiation means 5 installed at the second position, and this is imaged and captured as an image. Then, the detection state of this input image is determined in step S6. Here, if it is determined that good detection accuracy can be obtained without the influence of shadows in this input image, the position and direction of the object 1 are measured based on this input image in step S7, and the result is obtained. Is output (step S
8). If it is determined in step S6 that the detection state is bad, the shape detection is stopped at that point.

The images captured at the first and second positions are images in which the bright line directions of the slit light are orthogonal to each other, as shown in FIGS. 7A and 7B.

As described above, since the object 1 is imaged from two different directions by using the single irradiation means 5 in this embodiment, for example, two irradiation means are used. Compared to the case, the number of parts can be reduced and the structure can be simplified. Sixth Embodiment FIG. 15 shows a flowchart of a shape detecting method according to a sixth embodiment of the present invention. The device of this embodiment is implemented by using the same device as the shape detecting device used in the fifth embodiment, and
The difference from the fifth embodiment is that the fifth embodiment has an irradiation means 5
The configuration is such that the images at the first position and the second position are sequentially captured, and when the detection state of the image captured by the imaging at the first position is poor and the target in the image captured at the first position In this embodiment, the image is captured at the second position only when the number of bright lines of the slit light on the object 1 is small in the direction of the object 1 and accurate detection is difficult. First in first
The point is configured to complete the image capturing at both the position and the second position.

The images picked up at the first and second positions in this embodiment are the images A shown in FIG.
It is like the image B shown in (b).

With this configuration, the same operational effect as that of the fifth embodiment can be expected, and the work time by waiting the irradiation means 5 for the next shape detection of the object 1 after the completion of the imaging is reduced. It can be shortened.

Seventh Embodiment FIG. 4 shows the arrangement state of each component of the shape detecting apparatus used for carrying out the shape detecting method according to the seventh embodiment of the present invention. Also in the shape detecting device of this embodiment, the image input means 2 is arranged at a position directly above the object 1 as in the shape detecting devices of the above embodiments. As for the irradiation means, a single irradiation means 5 is used to configure the same as the shape detection device used in the fifth and sixth embodiments shown in FIG. However, in the irradiation means 5 in this embodiment, the irradiation means 5 shown in FIG. 3 is provided so as to be movable between the first position and the second position by the robot arm 10. 5 differs in that the robot arm 10 is rotatably supported by the robot arm 10 within an angle range of 90 ° around its irradiation axis.

With this configuration, even if the irradiation means 5 is installed at a fixed position with respect to the object 1,
By selectively setting this to the first rotation position and the second rotation position, the images picked up by the irradiation means 5 are shown in the images A and B of FIG. 7A. As in the image B, an image in which the bright line directions of the slit light with respect to the object 1 are orthogonal to each other is obtained. Therefore, when the image captured at either the first rotation position or the second rotation position has a small number of bright lines of the slit light applied to the object 1 as in the image A shown in FIG. 7A, By switching the irradiation means 5 to another rotation position and capturing an image, an image with a large number of bright lines of slit light such as the image B shown in FIG. 7B can be obtained, and an accurate shape can be obtained based on a larger amount of information. It is possible to detect.

Shape detection control in this embodiment is shown in FIG.
Describing based on the flowchart of No. 6, after the measurement is started, first in step S1, slit light is projected from the irradiation means 5 to the object 1 at the first rotation position and the image is captured. In step S2, the detection state of this input image is determined. Then, if the detection state is poor, the process proceeds to step S5 to perform imaging at the second rotation position, but if the detection state is good, the position and direction of the target object 1 are determined in step S3. Is further measured, and the adequacy of the direction of the object 1 is determined in step S4. Here, when the direction of the object 1 is inappropriate, that is, when the number of bright lines of the slit light projected on the object 1 is small and a large amount of information cannot be obtained, this detection result is The process proceeds to step S5 without outputting.

In step S5, slit light is projected onto the object 1 with the irradiation means 5 installed at the second rotation position, and this is imaged and captured as an image. Then, the detection state of this input image is determined in step S6. Here, if it is determined that good detection accuracy can be obtained without the influence of shadows in this input image, the position and direction of the object 1 are measured based on this input image in step S7, and the result is obtained. Is output (step S8). If it is determined in step S6 that the detection state is bad, the shape detection is stopped at that point.

Therefore, in this embodiment, it is possible to obtain two images in which the bright line directions of the slit light are different only by rotating the irradiation means 5 and switching the rotation position. By selecting any of the images, accurate shape detection can be realized.

Further, in this case, when accurate shape detection can be performed based on the image captured by the image pickup at the first rotation position, the image pickup at the second rotation position is not necessary. The point that the shape detection processing time can be shortened is the same as in the first, third and fifth embodiments.

Eighth Embodiment FIG. 17 shows a flow chart of the shape detection control in the shape detection method according to the eighth embodiment of the present invention. The shape detecting method of this embodiment is carried out by using the same shape detecting device as that of the seventh embodiment.
The difference from the seventh embodiment is that the seventh embodiment is configured such that images are sequentially captured by the irradiation means 5 at the first rotation position and the second rotation position, and the first rotation position is also changed. If the detection state of the image captured by the imaging is poor, and in the direction of the object 1 in the image captured at the first rotation position, the number of bright lines of the slit light on the object 1 is small and accurate detection is difficult. In this case, the image was captured at the second rotation position for the first time, whereas in this embodiment, the image capture at both the first rotation position and the second rotation position is completed first. It is the point configured in.

With such a structure, the same effects as those of the seventh embodiment can be expected, and the work time by waiting the irradiation means 5 for the next shape detection of the object 1 after the completion of the image pickup is reduced. It can be shortened.

Ninth Embodiment FIG. 5 shows an arrangement state of constituent members of a shape detecting device used in a shape detecting method according to a ninth embodiment of the present invention. The shape detection apparatus of this embodiment is similar to the shape detection apparatus (shape detection apparatus used in the seventh and eighth embodiments) shown in FIG. 4 in basic configuration, but the irradiation used here is the same. The structure of the means 5 is different from that of the irradiation means 3, 4, 5 in the shape detecting device of each of the above embodiments. That is, the irradiation means 3, 4, 5 in each of the above-described embodiments is configured to include the liquid crystal slit 15 (see FIG. 2) as described above, but the liquid crystal slit 15 has a number of stripes of 256. The shutter array is configured so that the measurement space can be divided into 256 by an 8-bit gray code pattern, whereas the liquid crystal slit 15 of the irradiation means 5 used in this embodiment has 128 stripes. It consists of a striped shutter array, and is configured so that the measurement space can be divided into 128 by a 7-bit gray code pattern, and the measurement space can be divided into 256 times by a half pitch shift operation of the space code pattern. There is. Therefore, the irradiation means 5 of this embodiment has a first spatial resolution of dividing the measurement space into 128 and a measurement space of 256.
When the slit light is projected to the object 1 at the second spatial resolution, the slit light is projected at the first spatial resolution. The number of bright lines of the slit light projected on the object 1 is doubled, and as a result, a double amount of information is obtained, resulting in double detection accuracy.

That is, in each of the above-described embodiments (excluding the third and fourth embodiments), the bright line direction of the slit light projected on the object 1 is switched to project it on the object 1. While the number of bright lines is switched to ensure good detection accuracy, the object of this embodiment is switched by switching the number of slits of the slit light emitted from the irradiation means 5 to the object 1. The stripe width of the stripe pattern is switched without changing the relative position between the irradiation pattern 1 and the irradiation means 5, and thus the number of bright lines projected on the object 1 is switched between high and low steps. An image at the first spatial resolution is like an image E shown in FIG. 9 (a), and an image at the second spatial resolution is like an image F shown in FIG. 9 (b).

In the shape detecting apparatus of this embodiment, the spatial resolution of the irradiation means 5 is selectively used as shown in the flow chart of FIG. That is, after the measurement is started, first, in step S1, the irradiation means 5 is set to a state in which the first spatial resolution is obtained, the slit light is projected on the object 1, the image thereof is captured, and in step S2, Determine the detection state of the input image. Then, if the detection state is poor, the process proceeds to step S5 to perform imaging with the irradiation unit 5 switched to the second spatial resolution, but if the detection state is good, step S3. In step S4, the position and direction of the object 1 are measured, and in step S4, the adequacy of the direction of the object 1 is determined. Here, when the direction of the object 1 is inappropriate, that is, the angle between the bright line direction and the long axis direction of the object 1 is ±
When it is considered that the number of bright lines projected on the object 1 is small and good detection accuracy cannot be expected by projection of slit light with the first spatial resolution of 45 ° or less and the number of slits is small, this detection is performed. The process proceeds to step S5 without outputting the result.

In step S5, the irradiation means 5 is set in a state where the second spatial resolution is obtained, and in this state slit light is projected on the object 1 to capture the image. In this case, even if the irradiation direction of the slit light is the same (that is, even if the angle between the bright line direction of the slit light and the long axis direction of the object 1 is the same), the stripe width of the stripe pattern is halved, so the object A double bright line will be projected on 1.

Next, with respect to this input image, step S6 is performed.
The detection state is determined in. Here, if it is determined that good detection accuracy can be obtained without the influence of shadows in this input image, the position and direction of the object 1 are measured based on this input image in step S7, and the result is obtained. Is output (step S8). If it is determined in step S6 that the detection state is bad, the shape detection is stopped at that point.

Therefore, in this embodiment, only by changing the spatial resolution of the irradiation means 5,
This makes it possible to obtain an image in which the number of bright lines projected onto the object 1 is twice and to perform double-precision detection.

Also in this embodiment, since it is not necessary to capture an image at the second spatial resolution when the shape can be detected with high accuracy based on the image at the first spatial resolution, The detection processing time can be shortened.

Tenth Embodiment FIG. 19 shows a control flow chart of a shape detecting method according to a tenth embodiment of the present invention. This embodiment has the same basic configuration as that of the ninth embodiment, but the ninth embodiment uses the first spatial resolution for image capturing and the second spatial resolution. And the image capturing at the first spatial resolution are performed sequentially, and the image capturing at the second spatial resolution is not performed when the shape detection with sufficient detection accuracy can be performed by the first captured image at the first spatial resolution. On the other hand, in this embodiment, as shown in the flowchart of FIG. 19, first, image acquisition at the first spatial resolution and image acquisition at the second spatial resolution are simultaneously performed. The difference is that after that, the two images captured at the same time are selected to perform shape detection.

With such a structure, the same effect as the ninth embodiment can be expected, and the work by making the irradiation means 5 stand by in preparation for the next shape detection of the object 1 after the completion of imaging. The time can be shortened.

Eleventh Embodiment FIG. 6 shows an arrangement state of constituent members of a shape detecting device used for carrying out a shape detecting method according to an eleventh embodiment of the present invention. The shape detection device of this embodiment is configured by arranging the image input means 2 and the irradiation means 6 on the information of the object 1 as in the above embodiments, but the irradiation means in this embodiment is the same. Reference numeral 6 is completely different from the irradiation means 3, 4 and 5 in the above-mentioned embodiments. That is, the irradiation means 6 of this embodiment is not provided with the liquid crystal slit as in each of the above embodiments, but as shown in FIG. 6, the laser light source 20, the condensation lens 21, the prism 22 and the light projecting lens. 23 and 23 are sequentially arranged on the same axis, and a reflecting plate 24 which is tilted and changed by a piezoelectric actuator 25 is arranged on the side of the prism 22.

The principle of stripe pattern formation in the irradiation means 6, that is, the principle of slit light generation is as follows. That is, when the laser light is emitted from the laser light source 20 to the prism 22 side through the condensation lens 21, a part of the laser light goes straight to the object 1 and the other part is emitted from the prism 22. At the same time, the light is deflected to reach the reflecting plate 24, is reflected by the reflecting plate 24, returns to the prism 22 side, is deflected again, and is irradiated to the object 1 side. In this case, there is an optical path difference between the laser light deflected by the prism 22 and the laser light that travels straight without being deflected, and the optical path difference causes the object 1 to move.
Interference fringes are generated in the slit light projected on.

The fringe width of the interference fringes increases or decreases depending on the reflection angle of the retroreflected light which changes corresponding to the tilt angle of the reflection plate 24. Therefore, in this embodiment, the reflection angle of the reflection plate 24 is switched between the first reflection plate angle and the second reflection plate angle, and the stripe width of the slit light projected on the object 1 is increased or decreased. By making it possible to switch to two steps, the number of bright lines of the slit light projected on the object 1 is switched to two steps, large and small, by switching the stripe width of the stripe pattern as in the ninth and tenth embodiments. This is for realizing highly accurate shape detection.

In this embodiment, the reflection plate angle of the reflection plate 24 is set to the first reflection plate angle at which the slit light having a large stripe width is obtained and the second reflection plate angle at which the small stripe width is obtained. The image at the first reflector angle is set as image E shown in FIG. 9 (a), and the image at the second reflector angle is set as image F shown in FIG. 9 (b). Become.

The shape detection method involving switching the reflector angle of the reflector 24 will be described below with reference to the flow chart shown in FIG. 20.
In 1, the slit light is projected from the irradiation means 6 onto the object 1 and the image thereof is captured while the reflector 24 is set to the first reflector angle, and the detection state of this input image is determined in step S2. To do. Then, if the detection state is poor, the process proceeds to step S5 to perform imaging in the state where the reflection plate 24 is set to the second reflection plate angle, but if the detection state is good, the step is performed. S
In step 3, the position and direction of the object 1 are measured, and in step S4, the adequacy of the direction of the object 1 is determined.
Here, when the direction of the object 1 is unsuitable, that is, the angle between the bright line direction and the long axis direction of the object 1 is ± 45 ° or less, and the reflection plate 24 is set as the first reflection plate angle. When it is considered that the number of bright lines projected on the object 1 cannot be expected by projection of slit light having a small number of slits and good detection accuracy cannot be expected, the process proceeds to step S5 without outputting this detection result. .

In step S5, the slit light is projected onto the object 1 with the reflection plate 24 of the irradiation means 6 set to the second reflection plate angle, and the image is captured. In this case, even if there is no change in the irradiation direction of the slit light (that is, even if the angle between the bright line direction of the slit light and the major axis direction of the object 1 is the same), the stripe width of the stripe pattern is halved. Therefore, twice as many bright lines are projected on the object 1.

Next, with respect to this input image, step S6 is performed.
The detection state is determined in. Here, if it is determined that good detection accuracy can be obtained without the influence of shadows in this input image, the position and direction of the object 1 are measured based on this input image in step S7, and the result is obtained. Is output (step S8). If it is determined in step S6 that the detection state is bad, the shape detection is stopped at that point.

Therefore, in the present embodiment, an image in which the number of bright lines projected on the object 1 is doubled can be obtained only by switching the reflector angle of the reflector 24 of the irradiation means 6. This enables double-precision detection.

Also in this embodiment, if accurate shape detection is possible based on an image in the state where the reflector 24 is set at the first reflector angle, the reflector 24 is set to the second reflector.
Since it is not necessary to capture an image by switching to the angle of the reflector plate, it is possible to shorten the shape detection processing time.

Twelfth Embodiment FIG. 21 shows a control flowchart of the shape detecting method according to the twelfth embodiment of the present invention. This embodiment has the same basic structure as that of the eleventh embodiment, but in the eleventh embodiment, the reflector 24 is set to the first reflector angle. The image capturing and the image capturing in the state where the second reflecting plate angle is set are sequentially executed, and the shape detection with sufficient detection accuracy can be performed by the first captured image at the first reflecting plate angle. In this case, the image is not taken in at the second reflection plate angle, whereas in this embodiment, as shown in the flowchart of FIG. The difference is that the image capturing at the angle and the image capturing at the second reflector angle are simultaneously performed, and then the two images captured at the same time are selected to perform the shape detection.

With such a structure, the eleventh aspect described above is obtained.
The same effect as the embodiment can be expected, and the working time can be shortened by making the irradiation means 6 stand by in preparation for the next shape detection of the object 1 after the completion of the imaging.

[Brief description of drawings]

FIG. 1 is a layout conceptual diagram of constituent members in a shape detection device according to first to fourth embodiments of the present invention.

FIG. 2 is a specific structural explanatory view of the irradiation means shown in FIG.

FIG. 3 is an arrangement conceptual diagram of constituent members in a shape detecting device according to fifth and sixth embodiments of the present invention.

FIG. 4 is a layout conceptual diagram of constituent members in a shape detecting device according to seventh and eighth embodiments of the present invention.

FIG. 5 is a layout conceptual diagram of constituent members in a shape detection device according to ninth and tenth embodiments of the present invention.

FIG. 6 is an arrangement conceptual diagram of constituent members in a shape detecting device according to eleventh and twelfth embodiments of the present invention.

FIG. 7 is an explanatory diagram of a generated image when the shape detection method according to the first, second, fifth to eighth embodiments of the present invention is carried out.

FIG. 8 is an explanatory diagram of a generated image when the shape detecting method according to the third and fourth embodiments of the present invention is implemented.

FIG. 9 is an explanatory diagram of a generated image when the shape detection method according to the ninth to the 412th embodiments of the present invention is executed.

FIG. 10 is a control flowchart of image processing in the shape detecting method according to the first embodiment of the present invention.

FIG. 11 is a control flowchart of image processing in the shape detecting method according to the second embodiment of the present invention.

FIG. 12 is a control flowchart of image processing in the shape detecting method according to the third embodiment of the present invention.

FIG. 13 is a control flowchart of image processing in the shape detecting method according to the fourth embodiment of the present invention.

FIG. 14 is a control flowchart of image processing in the shape detecting method according to the fifth embodiment of the present invention.

FIG. 15 is a control flowchart of image processing in the shape detecting method according to the sixth embodiment of the present invention.

FIG. 16 is a control flowchart of image processing in the shape detecting method according to the seventh embodiment of the present invention.

FIG. 17 is a control flowchart of image processing in the shape detecting method according to the eighth embodiment of the present invention.

FIG. 18 is a control flowchart of image processing in the shape detecting method according to the ninth embodiment of the present invention.

FIG. 19 is a control flowchart of image processing in the shape detecting method according to the tenth embodiment of the present invention.

FIG. 20 is a control flowchart of image processing in the shape detecting method according to the eleventh embodiment of the present invention.

FIG. 21 is a control flowchart of image processing in the shape detecting method according to the twelfth embodiment of the present invention.

[Explanation of symbols]

1 is an object, 2 is an image input means, 3 is a first irradiation means,
4 is a second irradiation means, 5 and 6 are irradiation means, 7 is an image processing means, 8 is a monitor, 9 is a robot arm, 10 is a robot arm, 13 is a halogen light source, 14 is a condensation lens, 15 is a liquid crystal slit, 16 is a projection lens, 20
Is a laser light source, 21 is a condensation lens, 22 is a prism, 23 is a projection lens, 24 is a reflector, 25 is a piezoelectric actuator, 29 is an object image, 30 is a bright line, and AF are
Is an image.

 ─────────────────────────────────────────────────── ─── Continuation of the front page (72) Inventor Yasuo Kyoren 3-1, Shinchi, Fuchu-cho, Aki-gun, Hiroshima Prefecture Mazda Motor Corporation

Claims (32)

[Claims] 1. The irradiation means projects a slit light of a predetermined stripe pattern onto an object, the reflected light from the object is captured by an image input means, and the input image is processed by an image processing means. A shape detection method for obtaining the three-dimensional position of the object, wherein the irradiation means is capable of generating slit light of a plurality of stripe patterns, and the plurality of stripe patterns are switched and used according to imaging conditions. Characteristic shape detection method. 2. The shape detection method according to claim 1, wherein the switching of the stripe pattern in the irradiation means is performed by switching the direction of the bright line of the slit light emitted from the irradiation means. 3. The switching of the bright line direction of the slit light according to claim 2, wherein the irradiation means is composed of a first irradiation means and a second irradiation means, and the first irradiation means and the second irradiation means. A shape detection method, which is performed by selectively using an irradiation unit. 4. The shape detecting method according to claim 3, wherein the first irradiating means and the second irradiating means are arranged at an intersection angle of about 90 ° with respect to the object. 5. The bright line direction of the slit light emitted from the first irradiation means and the bright line direction of the slit light emitted from the second irradiation means are the same direction. Characteristic shape detection method. 6. The method according to claim 3, 4 or 5, wherein:
After the image generated by the projection of the slit light from the irradiating means is fetched from the image inputting means to the image processing means and subjected to the image processing, the second irradiating means from the second irradiating means is operated only under a specific condition according to the image processing state. A shape detecting method characterized by capturing an image generated by projection of slit light and performing image processing. 7. The method according to claim 3, 4 or 5, wherein:
After the image generated by the projection of the slit light from the irradiating means and the image generated by the projection of the slit light from the second irradiating means are simultaneously taken into the image processing means from the image inputting means, first the first 2. The shape detecting method, wherein the input image from the irradiating means is image-processed, and the input image from the second irradiating means is image-processed only under a specific condition according to the image processing state. 8. The bright line direction of the slit light emitted from the first irradiation means and the bright line direction of the slit light emitted from the second irradiation means are different from each other. Characteristic shape detection method. 9. The method according to claim 3, 4 or 8, wherein:
After the image generated by the projection of the slit light from the irradiating means is fetched from the image inputting means to the image processing means and subjected to the image processing, the second irradiating means from the second irradiating means is operated only under a specific condition according to the image processing state. A shape detecting method characterized by capturing an image generated by projection of slit light and performing image processing. 10. The image produced by projecting the slit light from the first irradiating means and the image produced by projecting the slit light from the second irradiating means according to claim 3, 4, or 8. At the same time, after the image is input from the image input means to the image processing means, the input image from the first irradiation means is first subjected to image processing, and the input image from the second irradiation means only under specific conditions according to the image processing state. A shape detection method comprising: 11. The shape detecting method according to claim 2, wherein switching of the bright line direction of the slit light projected on the object is performed by a single irradiation unit. 12. The shape detection method according to claim 11, wherein the illuminating means changes the installation position of the object to switch the bright line direction of the slit light projected on the object. 13. The method according to claim 11 or 12,
After the image generated by projecting the slit light from the irradiating means at the installation position is taken in from the image input means to the image processing means and subjected to image processing, the second installation position is provided only under specific conditions according to the image processing state. 2. A shape detecting method, comprising: capturing an image generated by projecting slit light from an irradiating means and processing the image. 14. The image according to claim 11 or 12, which is generated by projecting the slit light from the irradiation means at the first installation position and the image generated by projection of the slit light from the irradiation means at the second installation position. After simultaneously capturing the image and the image from the image input means into the image processing means, first, the input image by the irradiation means at the first installation position is subjected to image processing, and the second image is processed only under specific conditions according to the image processing state. A shape detecting method characterized by performing image processing on an input image from an irradiation unit at an installation position. 15. The illuminating device according to claim 11, wherein the irradiating means is fixedly arranged at a predetermined position and is rotatable about its irradiating axis, and by rotating the irradiating means, the bright line direction of the slit light with respect to the target object. A shape detection method characterized by switching between. 16. The method according to claim 11 or 15,
After the image generated by projecting the slit light from the irradiating means at the rotating position is captured from the image inputting means into the image processing means and subjected to the image processing, the second rotating position only under a specific condition depending on the image processing state. 2. A shape detecting method, comprising: capturing an image generated by projecting slit light from an irradiating means and processing the image. 17. The image according to claim 11 or 12, which is generated by projecting the slit light from the irradiation unit at the first rotation position and the image generated by projection of the slit light from the irradiation unit at the second rotation position. After the image and the image are simultaneously captured from the image input means to the image processing means, the input image at the first rotation position is first image-processed, and the second image is processed only under a specific condition depending on the image processing state.
A shape detection method characterized by performing image processing on an input image at a rotation position of. 18. The shape detecting method according to claim 1, wherein the switching of the stripe pattern in the irradiation unit is performed by switching the stripe width of the slit light. 19. The shape according to claim 18, wherein the irradiation means is composed of a liquid crystal slit having a predetermined number of stripes, and the stripe width of the slit light is switched by switching the spatial resolution of the liquid crystal slit. Detection method. 20. The image processing method according to claim 18 or 19, wherein an image generated by projecting slit light having a low spatial resolution is captured from the image input means to the image processing means and subjected to image processing, and then a specific condition is set according to the image processing state. A shape detection method characterized in that an image generated by projection of slit light having a high spatial resolution is captured only in the lower side and image processing is performed. 21. The image generated by the projection of slit light having low spatial resolution and the image generated by the projection of slit light having high spatial resolution at the same time from the image input means to the image processing means. After being captured, first, the input image with slit light having low spatial resolution is subjected to image processing, and the input image with slit light having high spatial resolution is subjected to image processing only under specific conditions according to the image processing state. Detection method. 22. The illuminating device according to claim 18, wherein the slit light can be generated by giving an optical path difference to the laser light emitted from the laser light source to form interference fringes, and the optical path difference is changed. In this way, the shape detection method is characterized in that the stripe width of the slit light projected on the object is switched. 23. In claim 18 or 22, after an image generated by projection of slit light having a large fringe width is captured from the image input means to the image processing means and image processed,
A shape detecting method characterized in that an image generated by projecting slit light having a small stripe width is captured and image processed only under a specific condition according to the image processing state. 24. The image generated by projection of slit light having a large stripe width and the image generated by projection of slit light having a small stripe width are simultaneously transferred from the image input means to the image processing means according to claim 18 or 22. After capturing, first process the input image by slit light with large stripe width,
A shape detecting method characterized by performing image processing on an input image with slit light having a small stripe width only under specific conditions according to the image processing state. 25. An irradiation means for projecting a slit light of a predetermined stripe pattern onto an object, an image input means for picking up an object on which the stripe pattern is projected by the irradiation means and inputting it as an image, and the image input means. A shape detecting device comprising: an image processing unit that obtains a three-dimensional position of the object by performing a three-dimensional conversion process on the image information input from the irradiation unit; A shape detection device, which is configured to be switchable. 26. The shape detecting device according to claim 25, wherein the irradiation means is configured so that the bright line direction of the slit light to be irradiated can be switched. 27. The irradiation means according to claim 26, wherein the irradiation direction of the slit light with respect to the object is approximately 90.
A shape detection device comprising a pair of irradiation means whose arrangement positions are relatively set so as to have an angle of °. 28. The irradiation means according to claim 26, wherein the irradiation means is composed of a single irradiation means, and is movable so that the irradiation direction of the slit light on the object can be changed within a range of about 90 °. A shape detection device characterized in that. 29. The irradiation means according to claim 26, wherein the irradiation means is composed of a single irradiation means, and the luminescent line direction of the slit light projected on the object can be changed within a range of about 90 °. A shape detection device, which is rotatable about an axis. 30. The shape detecting device according to claim 25, wherein the irradiation unit is configured to be capable of switching the stripe width of the slit light to be irradiated. 31. The shape detecting device according to claim 30, wherein the irradiating means comprises a liquid crystal slit whose spatial resolution is switchable. 32. The irradiating means according to claim 30, wherein the laser light source, a prism for deflecting a part of the laser light from the laser light source, the laser light deflected by the prism are reflected, and the laser light is returned to the prism. A shape detecting device comprising: a reflecting plate for changing the reflection angle of the reflecting plate; and a variable mechanism for changing the reflection angle of the reflecting plate.