JPH07176512A - Spin-dryer device - Google Patents

Spin-dryer device

Info

Publication number
JPH07176512A
JPH07176512A JP31867993A JP31867993A JPH07176512A JP H07176512 A JPH07176512 A JP H07176512A JP 31867993 A JP31867993 A JP 31867993A JP 31867993 A JP31867993 A JP 31867993A JP H07176512 A JPH07176512 A JP H07176512A
Authority
JP
Japan
Prior art keywords
cradle
cassette
wall
wafer
mounting table
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP31867993A
Other languages
Japanese (ja)
Inventor
Toyoaki Kiba
豊明 木庭
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Kyushu Ltd
Original Assignee
NEC Kyushu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Kyushu Ltd filed Critical NEC Kyushu Ltd
Priority to JP31867993A priority Critical patent/JPH07176512A/en
Publication of JPH07176512A publication Critical patent/JPH07176512A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To miniaturize a spin-dryer device and a washing vessel used in preprocessing, to improve washing and drying efficiency of wafers, and to prevent static electricity which impairs the efficiency of the device. CONSTITUTION:A receptacle stand 7, on which wafers are arranged and placed in grooves, is formed by removing the circumferential wall where guide grooves are provided on the conventional wafer having cassette, a retaining frame 8, having V-shaped grooves 8a on both walls of a cradle 3a, is provided. The cassette is made small by the amount of the thickness of the cassette wall, a washing vessel is made small by the thickness of the wall, and a cradle 3a is also made small. Also, the wall, which becomes the obstacle of the spreading of a washing solution to the receptacle stand 7, is eliminated and at the same time, there is no obstacle for scattering the washing solution. Moreover, the area, which directly comes in contact with the wafer 5, can be made small.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、ウェット処理した後の
半導体基板であるウェーハを高速回転させその遠心力で
表面に付着した処理液を飛散させ乾燥するスピンドライ
ヤー装置である。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a spin dryer apparatus for rotating a wafer, which is a semiconductor substrate after wet processing, at high speed and scattering and drying the processing liquid adhering to the surface by centrifugal force.

【0002】[0002]

【従来の技術】図3(a)〜(c)は従来のスピンドラ
イヤー装置の一例における構造を示す模式断面図(a)
およびクレードルとカセットの側面図(b)並びに正面
図(c)である。この種のスピンドライヤー装置は、例
えば、図3(a)に示すように、複数の円板状のウェー
ハ5を溝に嵌め込み該半導体基板を並べ収納するカセッ
ト4と、このカセット4を収納するクレードル3と、こ
のクレードル3の複数を内縁に回転自在に取付ける回転
ドラム2aと、この回転ドラム2aを回転させるターン
テ一ブル2と、このターンテーブル2および回転ドラム
2aを収納する容器1とを備えている。
2. Description of the Related Art FIGS. 3A to 3C are schematic sectional views showing a structure of an example of a conventional spin dryer device.
FIG. 3B is a side view (b) and a front view (c) of the cradle and the cassette. For example, as shown in FIG. 3A, this type of spin dryer device includes a cassette 4 in which a plurality of disk-shaped wafers 5 are fitted in grooves and the semiconductor substrates are arranged side by side, and a cradle in which the cassette 4 is stored. 3, a rotary drum 2a on which a plurality of the cradle 3 are rotatably attached to the inner edge, a turntable 2 for rotating the rotary drum 2a, and a container 1 for accommodating the turntable 2 and the rotary drum 2a. There is.

【0003】このスピンドライヤー装置で処理済みのウ
ェーハを乾燥する手順は、まず、クレードル3を水平に
し、ウェーハ5の複数枚を収納したカセット4をクレー
ドル3に収納する。次に、クレードル3をストッパ2に
当るまで90度回転させ回転ドラム2aに収納する。次
に、ターンテーブル2を高速回転させウェーハ5に付着
する処理液をその遠心力で飛散させ乾燥する。
In the procedure for drying a wafer that has been processed by this spin dryer, first, the cradle 3 is made horizontal, and the cassette 4 containing a plurality of wafers 5 is placed in the cradle 3. Next, the cradle 3 is rotated 90 degrees until it hits the stopper 2, and is stored in the rotary drum 2a. Next, the turntable 2 is rotated at a high speed, and the processing liquid adhering to the wafer 5 is scattered by the centrifugal force and dried.

【0004】このスピンドライヤー装置に使用されるカ
セット4は前工程であるウェット処理装置と共用として
いるため、薬液に強いテフロン材で成形された箱体であ
って、ウェーハ5を囲む壁が変形しないように肉厚が厚
い堅牢なものであった。
Since the cassette 4 used in this spin dryer device is shared with the wet processing device which is the previous process, it is a box body made of Teflon material which is resistant to chemicals, and the wall surrounding the wafer 5 is not deformed. It was a solid one with a thick wall.

【0005】[0005]

【発明が解決しようとする課題】しかしなが上述したス
ピンドライヤー装置で使用するカセットは、ウェーハを
挿入する溝が周囲の壁に形成されており、しかもこの壁
が変形しないようにある程度の厚みをもっている。この
ため、このカセットを収納するクレードルの高さも高く
なりそれに伴ない回転ドラム自体が大きくなり装置が大
型化し設備費も高価となり据付面積を広くなるという欠
点がある。一方、このカセットを共用する前工程の洗浄
槽もそれ自体が大きくなり広い床面積を必要とするばか
りか、消費する薬液の量が増え運用コストが高くなる欠
点をもっている。また、洗浄に際しても、ウェーハの周
囲に壁があることから、洗浄液のまわり込みが不十分と
なり、汚染物が付着したまま乾燥されることが多々あ
る。さらに、この周囲壁とウェーハ面との接触面積が広
くそれだけ静電気を帯させウェーハに形成された集積回
路を破損させるという問題を含んでいる。
However, in the cassette used in the above-mentioned spin dryer, a groove for inserting a wafer is formed in the peripheral wall, and the wall has a certain thickness to prevent the wall from being deformed. There is. Therefore, the height of the cradle for accommodating the cassette is increased, and accordingly, the rotating drum itself is enlarged, the apparatus is enlarged, the equipment cost is increased, and the installation area is widened. On the other hand, the cleaning tank of the previous process which shares this cassette also has a drawback that not only the size of the cleaning tank itself becomes large and a large floor area is required, but also the amount of chemical solution consumed increases and the operating cost increases. Further, during cleaning, since there is a wall around the wafer, the cleaning liquid does not sufficiently flow around and is often dried with contaminants attached. Further, the contact area between the peripheral wall and the wafer surface is wide, and there is a problem in that static electricity is charged to that extent and the integrated circuit formed on the wafer is damaged.

【0006】従って、本発明の目的は、装置自体の小型
化を図ることは勿論、前工程の洗浄槽をも小型にし、ウ
ェーハの洗浄乾燥効率を向上せしめかつ性能を阻害させ
る静電気を帯びさせことがないカセットを適用できるス
ピンドライヤー装置を提供することである。
Therefore, an object of the present invention is not only to downsize the apparatus itself, but also to downsize the cleaning tank in the previous step, to improve the cleaning and drying efficiency of wafers and to impart static electricity which hinders the performance. It is an object of the present invention to provide a spin dryer device that can be applied to a cassette that does not exist.

【0007】[0007]

【課題を解決するための手段】本発明の特徴は、複数の
円板状の半導体基板の一円弧部分を溝に嵌め込み該半導
体基板を並べ載置する載置台と、この載置台を入れる箱
状部材であるとともに前記一円弧部と垂直方向となる該
半導体基板の他の円弧部分を挟み保持するV字状溝が形
成される保持枠をもつクレードルと、このクレードルの
複数を内縁に回転自在に取付ける回転ドラムと、この回
転ドラムを回転させるターンテ一ブルと、このターンテ
ーブルおよび回転ドラムを収納する容器とを備えるスピ
ンドライヤー装置である。
A feature of the present invention is that a plurality of disc-shaped semiconductor substrates are mounted in a groove by fitting one circular arc portion of the semiconductor substrates and the semiconductor substrates are mounted side by side, and a box-like shape in which the mounting tables are inserted. A cradle that is a member and has a holding frame in which a V-shaped groove that holds the other circular arc portion of the semiconductor substrate that is perpendicular to the one circular arc portion is formed, and a plurality of the cradle rotatably around the inner edge. This is a spin dryer device including a rotary drum to be attached, a turntable for rotating the rotary drum, and a container for accommodating the turntable and the rotary drum.

【0008】[0008]

【実施例】次に、本発明について図面を参照して説明す
る。
DESCRIPTION OF THE PREFERRED EMBODIMENTS Next, the present invention will be described with reference to the drawings.

【0009】図1(a)〜(d)は本発明のスピンドラ
イヤー装置の一実施例における構成を示す模式断面図
(a)およびクレードルの上面図(b)と断面図(c)
ならびにカセット台とクレードルとの関係を示す図
(d)である。このスピンドライヤー装置は、図1に示
すように、従来、使用してウェーハを収納する箱状のカ
セットを複数の円板状のウェーハ5の一円弧部分を溝に
嵌め込みウェーハ5を並べ載置する載置台7とし、この
載置台7を入れる箱状のクレードル3aに前記一円弧部
と垂直方向となるウェーハ5の他の円弧部分を挟み保持
するV字状溝8aが形成される保持枠8を箱体の両側壁
に設けたことである。それ以外は従来例と同じである。
1 (a) to 1 (d) are schematic sectional views (a) showing the structure of an embodiment of the spin dryer of the present invention, and a top view (b) and a sectional view (c) of a cradle.
It is also a diagram (d) showing the relationship between the cassette base and the cradle. As shown in FIG. 1, in this spin dryer device, conventionally, a box-shaped cassette used to store wafers is fitted into one groove of one circular arc portion of a plurality of disk-shaped wafers 5 and the wafers 5 are placed side by side. The mounting table 7 is a box-shaped cradle 3a in which the mounting table 7 is mounted. A holding frame 8 is formed in which a V-shaped groove 8a for holding another arc portion of the wafer 5 perpendicular to the one arc portion is formed. It is provided on both side walls of the box. Otherwise, it is the same as the conventional example.

【0010】このスピンドライヤー装置において、ウェ
ーハ5を載置する載置台7をクレードル3aに入れる。
このときウェーハ5の円弧部分がクレードル3aのV字
状溝8aに案内され載置台7はクレードル3aの底面と
載置台7の突起部11とが接触して完全に収納される。
また、V字状溝8aと載置台7の溝とは精度よく一致さ
せるように加工する必要がなく、単にV字状の溝に形成
してあれば、一致させるのに通常のモールド成形した精
度で十分である。むしろ、ずれが多少あった方がV字状
溝8aと載置台7の溝とでウェーハ5に規制力を与え、
この規制力がグレードル3aを回転したときにウェーハ
が飛び出すことを防止する。
In this spin dryer device, the mounting table 7 on which the wafer 5 is mounted is placed in the cradle 3a.
At this time, the circular arc portion of the wafer 5 is guided by the V-shaped groove 8a of the cradle 3a, and the mounting table 7 is completely accommodated by the bottom surface of the cradle 3a and the projection 11 of the mounting table 7 contacting each other.
Further, it is not necessary to process the V-shaped groove 8a and the groove of the mounting table 7 so as to be accurately aligned with each other. Is enough. Rather, if there is a slight deviation, the V-shaped groove 8a and the groove of the mounting table 7 give a restricting force to the wafer 5,
This restricting force prevents the wafer from jumping out when the grade 3a is rotated.

【0011】グレードル3aは図面ではウェーハ5を囲
むように壁をもっているが、軽量にするために捨穴など
を施すと良い。これは飛散する薬液がウェーハ5に再付
着することを避ける意味でも必要である。さらに、載置
台7にウェーハ5を囲む壁がないことからこの装置によ
る洗浄乾燥効率の向上が期待できる。
Although the grader 3a has a wall so as to surround the wafer 5 in the drawing, it is preferable to make a cut hole or the like to reduce the weight. This is necessary also in the sense of avoiding the re-adhesion of the scattered chemical liquid to the wafer 5. Further, since there is no wall surrounding the wafer 5 on the mounting table 7, improvement in cleaning and drying efficiency by this device can be expected.

【0012】図2(a)および(b)は図1のスピンド
ライヤー装置に自動搬送装置の適用例を説明するための
載置台とクレードルとの位置関係を示す図である。この
実施例における載置台は、図2に示すように、ウェーハ
5が並べられる方向と垂直な側面に搬送部9から伸びる
アーム9aに吊されたフック10が引掛ける突起物11
を設け、フック10が上下するときおよびフック10が
アーム10の回転によりフック10とクレードル3aと
干渉しないようにクレードル3aの壁に切欠き12が形
成されている。
FIGS. 2 (a) and 2 (b) are views showing the positional relationship between the mounting table and the cradle for explaining an application example of the automatic transfer apparatus to the spin dryer apparatus of FIG. As shown in FIG. 2, the mounting table in this embodiment has protrusions 11 hooked by hooks 10 suspended from an arm 9a extending from a transfer section 9 on a side surface perpendicular to a direction in which wafers 5 are arranged.
The notch 12 is formed in the wall of the cradle 3a so that the hook 10 does not interfere with the hook 10 and the cradle 3a when the hook 10 moves up and down and the arm 10 rotates.

【0013】この搬送部は前工程の洗浄槽まで伸びてお
り、洗浄終了後のウェーハ5と載置台7はスピンドライ
ヤー装置の上に搬送され、図2(a)から図2(b)に
示すように搬送部9が下降し、突起部11で載置台7を
吊したフック10が切欠き12の間を通過し載置台7を
クレードル3aに収納する。そしてアーム9aの回転に
よりフック10は突起部11から外れ、アーム9aを上
昇させ載置台7のクレードル3aへの移載を完了する。
This transfer section extends to the cleaning tank of the previous step, and the wafer 5 and the mounting table 7 after the cleaning are transferred onto the spin dryer device, and are shown in FIGS. 2 (a) to 2 (b). As described above, the transport unit 9 descends, the hooks 10 that suspend the mounting table 7 by the protrusions 11 pass between the notches 12, and store the mounting table 7 in the cradle 3a. Then, by the rotation of the arm 9a, the hook 10 is disengaged from the protrusion 11, and the arm 9a is lifted to complete the transfer of the mounting table 7 to the cradle 3a.

【0014】[0014]

【発明の効果】以上説明したように本発明は、ウェーハ
を並べ収納する従来のカセットの案内溝が施された周囲
壁を取外し単にウェーハを並べ溝に載置する載置台に
し、クレードルの両壁に案内溝を形成することによっ
て、カセットの壁の厚さだけカセットを小さくしたの
で、前工程の洗浄槽を壁の厚みだけ小さくすることがで
き、さらにクレードルも小さくでき洗浄装置も乾燥装置
も小型化が図れるという効果がある。
As described above, according to the present invention, the peripheral wall provided with the guide groove of the conventional cassette for storing the wafers side by side is removed to form a mounting table on which the wafers are simply placed, and both walls of the cradle are mounted. By forming a guide groove in the cassette, the size of the cassette is reduced by the thickness of the wall of the cassette, so that the cleaning tank in the previous process can be reduced by the thickness of the wall, and the cradle can be made smaller, and the cleaning device and drying device can be made smaller. There is an effect that it can be realized.

【0015】また、載置台に洗浄液のまわり込みの障害
となる壁がなくなると同時に洗浄液の飛散に対しても障
害とならないので、洗浄乾燥効率を向上させるという効
果がある。
Further, since there is no wall on the mounting table which obstructs the permeation of the cleaning liquid, the cleaning liquid is not obstructed at the same time, so that the cleaning and drying efficiency can be improved.

【0016】さらに、別の効果としてウェーハと直接接
触する面積が小さくなり、静電気による集積回路の破損
が著しく低減できる。
Further, as another effect, the area of direct contact with the wafer is reduced, and damage to the integrated circuit due to static electricity can be significantly reduced.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明のスピンドライヤー装置の一実施例にお
ける構成を示す模式断面図(a)およびクレードルの上
面図(b)と断面図(c)ならびにカセット台とクレー
ドルとの関係を示す図(d)である。
FIG. 1 is a schematic cross-sectional view (a) showing a configuration of an embodiment of a spin dryer according to the present invention, a top view (b) and a cross-sectional view (c) of a cradle, and a view showing a relationship between a cassette table and a cradle ( d).

【図2】図1のスピンドライヤー装置に自動搬送装置の
適用例を説明するための載置台とクレードルとの位置関
係を示す図である。
FIG. 2 is a diagram showing a positional relationship between a mounting table and a cradle for explaining an application example of an automatic transfer device to the spin dryer device of FIG.

【図3】従来のスピンドライヤー装置の一例における構
造を示す模式断面図(a)およびクレードルとカセット
の側面図(b)並びに正面図(c)である。
FIG. 3 is a schematic cross-sectional view (a) showing a structure of an example of a conventional spin dryer device, a side view (b) and a front view (c) of a cradle and a cassette.

【符号の説明】[Explanation of symbols]

1 容器 2 ターンテーブル 2a 回転ドラム 2b ストッパ 3,3a クレードル 4 カセット 5 ウェーハ 7 載置台 8 保持枠 8a V字状溝 9 搬送部 9a アーム 10 フック 11 突起部 12 切欠き 1 Container 2 Turntable 2a Rotating Drum 2b Stopper 3,3a Cradle 4 Cassette 5 Wafer 7 Loading Table 8 Holding Frame 8a V-Shaped Groove 9 Transfer Part 9a Arm 10 Hook 11 Projection 12 Notch

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 複数の円板状の半導体基板の一円弧部分
を溝に嵌め込み該半導体基板を並べ載置する載置台と、
この載置台を入れる箱状部材であるとともに前記一円弧
部と垂直方向となる該半導体基板の他の円弧部分を挟み
保持するV字状溝が形成される保持枠をもつクレードル
と、このクレードルの複数を内縁に回転自在に取付ける
回転ドラムと、この回転ドラムを回転させるターンテ一
ブルと、このターンテーブルおよび回転ドラムを収納す
る容器とを備えることを特徴とするスピンドライヤー装
置。
1. A mounting table for fitting one circular arc portion of a plurality of disc-shaped semiconductor substrates into a groove and mounting the semiconductor substrates side by side.
A cradle having a box-shaped member for accommodating the mounting table and having a holding frame in which a V-shaped groove for holding and holding another circular arc portion of the semiconductor substrate perpendicular to the one circular arc portion is formed, and a cradle of this cradle. A spin dryer device comprising: a rotary drum having a plurality of rotatably attached to an inner edge thereof; a turntable for rotating the rotary drum; and a container for accommodating the turntable and the rotary drum.
【請求項2】 前記載置台の前記溝が伸びる方向と平行
な側面に搬送部のフックが引掛ける突起物が形成されて
いることを特徴とする請求項1記載のスピンドライヤー
装置。
2. The spin dryer device according to claim 1, wherein a protrusion on which a hook of the transfer unit is hooked is formed on a side surface parallel to a direction in which the groove of the mounting table extends.
JP31867993A 1993-12-17 1993-12-17 Spin-dryer device Pending JPH07176512A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP31867993A JPH07176512A (en) 1993-12-17 1993-12-17 Spin-dryer device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP31867993A JPH07176512A (en) 1993-12-17 1993-12-17 Spin-dryer device

Publications (1)

Publication Number Publication Date
JPH07176512A true JPH07176512A (en) 1995-07-14

Family

ID=18101820

Family Applications (1)

Application Number Title Priority Date Filing Date
JP31867993A Pending JPH07176512A (en) 1993-12-17 1993-12-17 Spin-dryer device

Country Status (1)

Country Link
JP (1) JPH07176512A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5873177A (en) * 1996-05-20 1999-02-23 Tokyo Electron Limited Spin dryer and substrate drying method
JP2007095781A (en) * 2005-09-27 2007-04-12 Oki Electric Ind Co Ltd Wafer carrier and manufacturing method of semiconductor device using the same
CN110034051A (en) * 2019-04-18 2019-07-19 北京半导体专用设备研究所(中国电子科技集团公司第四十五研究所) Overturn structure and wafer drying equipment
CN111822437A (en) * 2020-08-27 2020-10-27 梅州市尚善光电有限公司 Washing and dewatering method for optical lens

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5873177A (en) * 1996-05-20 1999-02-23 Tokyo Electron Limited Spin dryer and substrate drying method
JP2007095781A (en) * 2005-09-27 2007-04-12 Oki Electric Ind Co Ltd Wafer carrier and manufacturing method of semiconductor device using the same
JP4606294B2 (en) * 2005-09-27 2011-01-05 Okiセミコンダクタ株式会社 Wafer carrier and method of manufacturing semiconductor device using the same
CN110034051A (en) * 2019-04-18 2019-07-19 北京半导体专用设备研究所(中国电子科技集团公司第四十五研究所) Overturn structure and wafer drying equipment
CN110034051B (en) * 2019-04-18 2021-07-13 北京半导体专用设备研究所(中国电子科技集团公司第四十五研究所) Turnover structure and wafer spin-drying equipment
CN111822437A (en) * 2020-08-27 2020-10-27 梅州市尚善光电有限公司 Washing and dewatering method for optical lens

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