JPH07113658B2 - Circuit test equipment - Google Patents

Description

DETAILED DESCRIPTION OF THE INVENTION (Industrial field of application) The present invention extracts a signal at a predetermined measuring point of a circuit board to be tested while keeping the circuit board to be tested in an actual operating state, and then extracts the signal from the state of the signal. The present invention relates to a circuit test device for determining quality of.

(Prior Art) As a conventional device of this type of circuit test device, a so-called 1
There was a probe type device. This device gives electric power and a signal for performing a predetermined operation to a circuit board to be tested attached to an XY table to perform a so-called actual operation. In this state, the probe is moved and brought into contact with a required measurement point on the circuit board to acquire a signal at the measurement point.
The quality of the circuit board is determined by checking whether the acquired signal is similar to the expected signal.

(Problems to be Solved by the Invention) This conventional device has only one probe that comes in contact with a predetermined measurement point of a circuit board to be tested to take out a signal. Therefore, for example, when trying to measure the voltage at a certain measurement point, the standard must be fixed. That is, since there is only one probe that takes out a signal, the measurement is performed with reference to the ground of the circuit board, for example, and the relative voltage between two arbitrary points cannot be measured at one time. Further, there is a drawback that the measurement speed becomes slow for the same reason.

The present invention aims to improve this point.

(Means for Solving Problems) For this reason, the circuit test apparatus of the present invention includes an XY table to which a circuit board to be inspected can be detachably attached and a circuit board to be inspected attached to the XY table. Signal applying means for applying the same or pseudo power and signal as the actual device to which the circuit board is to be attached, and a predetermined value for the circuit board when the circuit board is performing so-called actual operation by the signal applying means. Probe means having at least two signal extraction probes for extracting the signals flowing through the measurement points, and independently moving each probe of the probe means in the XY direction based on the signal extraction command and in the Z-axis direction. At least one of the pairs of probes moves up and down almost at the same time to come into contact with the predetermined measurement point on the circuit board and The probe moving means for acquiring the signal of the predetermined measurement point of the board and the predetermined measurement point of the circuit board are input prior to the test, and the measurement procedure related to these measurement points is held in the form of a program to move the probe. The processing means is provided for sequentially giving the signal extraction command to the means, and the determination means for determining the quality of the circuit board based on the signal extracted by the probe moving means.

(Operation) Since the device according to the present invention has a plurality of probes, it can be used in various ways and the measurement time can be improved.

(Embodiment) FIG. 1, FIG. 2, FIG. 3 and FIG. 4 are explanatory views showing a circuit testing device according to the present invention, and FIG. 1 is an electrical schematic diagram of this device. 2 is an explanatory view mainly showing the configuration of the XY table, FIG. 3 is an explanatory view showing an example of the arrangement of the probes, and FIG. 4 is an explanatory view showing the probe holding means. In the figure, 1 is an XY table, 2 is an XY table 1
Board control means 3 which is a signal giving means for actually operating the circuit board attached to the probe board, 3 is a probe moving means for contacting a predetermined measurement point of the circuit board attached to the XY table 1 to take out a signal, A computer 4 is a processing means for giving a signal extraction command to the probe moving means 3 and a computer as a judging means for judging the quality of the circuit board based on the signal taken out from the probe moving means 32. A changeover switch for switching whether the acquisition signal is sent to the judging means or another test apparatus 9, and 7 is a pre-process for sending the acquisition signal obtained by the probe moving means 3 to the judging means. Is a signal preprocessing device for

First, the overall configuration and operation of this device will be described with reference to FIG.

A circuit board to be tested (FIG. 18) is mounted on the XY table 1. Prior to the test, the computer 4 constituting the processing means first executes a measurement procedure determination mode for determining which point on the circuit board 18 should be measured by the probe moving means 3. In this measurement procedure determination mode, the digitizer 41 or the keyboard 42 is used. In the case of using the digitizer 41, "the coordinates of the first measurement point of the first probe 31; the coordinates of the first measurement point of the second probe 32", "first probe 31" Second measurement point coordinates; second probe 32 second measurement point coordinates "," first probe 31 third measurement point coordinates; second probe 32 third measurement ""Pointcoordinates","fourth measurement point coordinates of the first probe 31; fourth measurement point coordinates of the second probe 32",
.., and so on until the measurement point coordinates of each probe 31, 32 at the stage of each measurement of each probe 31, 32 are completed. At this time, the processing means 4 stores the measurement point coordinates of the probes 31 and 32 at each stage as a set in a storage means (not shown) to create a procedure of measurement operation for each probe. At this time, the processing means 4
For each measurement point coordinate of each probe 31, 32 stored for each measurement stage, call the measurement point coordinate of each probe 31, 32 of the immediately preceding stage and each probe 31, 32 leading to this measurement stage. The movement locus of is calculated. Then, when each probe 31, 32 has a possibility of collision on this trajectory, an alarm is output to notify the user and the user is prompted to input the measurement point again. ing.

When this mode setting is performed using the keyboard 42 instead of the digitizer, it is achieved by directly inputting the measurement point coordinates of each probe 31, 32 using the numeric keys directly. Similarly, when an error is input, an alarm is output.

In this way, when the measuring means is determined, the test operation is started next.

The processing means 4 successively outputs signal extraction commands to the two probes 31 and 32 of the probe moving means 3 in accordance with the measurement procedure determined as described above. At this time, the processing means 4 gives a board operation signal to the board control means 2.
The circuit board 18 attached to the XY table 1 is actually operated.

The above-mentioned signal extraction command is a command to move the probes 31 and 32 to the measurement point coordinates input previously and a predetermined measurement of the circuit board 18 by moving the probes 31 and 32 in the Z-axis direction at the measurement point coordinates. At least for contacting the point for a predetermined time. By contacting the measurement point of each probe 31, 32, the signal of the circuit board 18 at the contact point can be acquired. This acquisition signal is sent to either or both of the signal preprocessing device 7 and the other test device 6 via a changeover switch 5 controlled by a switch changeover command of the processing means 4. The acquired signal sent to another test apparatus 6, for example, an oscilloscope, is used according to the purpose of the user. On the other hand, in the signal preprocessing device 7, preprocessing for inputting to the determination means (computer 4) is performed. For example, if the acquired signal is an analog signal, convert it to a digital signal,
Alternatively, necessary processing such as level adjustment is performed. The processed acquisition signal is input to the computer 4 that constitutes the determination means. This determination means stores non-defective product data at each measurement point acquired from the non-defective circuit board in advance or data (judgment data) at each measurement point calculated from the design data of the circuit board. The circuit board 18 is judged to be non-defective when the corresponding data is compared and the degree of coincidence is within a predetermined range. Then, this determination result is output to an output device such as the CRT 43.

At this stage, the test of one circuit board 18 is completed, and if there is a next circuit board, the test is started from the above-described measurement operation.

In the apparatus of this embodiment, an example in which the number of probes is two has been shown, but the number of probes may be more than that and the same processing may be performed. Further, although the acquisition signals of the two probes are configured to be input to the determination means at the same time, in this case, the computer 4 needs to have high performance. The changeover switch may be controlled so as to be time-divisionally sent to the determination means.

FIG. 2 illustrates the configuration of the XY table 1 of this device. Substrate supporting means 13 and 14 are provided on the XY table 1 so that the test substrate 18 and the relay substrate 16 can be supported. Power and signals for actually operating the test board 18 of the board control means 2 shown in FIG. 1 are input to the test board 18 via the relay board 16.

FIG. 3 is an explanatory view showing the probe moving means 3 of this apparatus.

The first probe 31 is held by the first probe holding means 33. The first probe holding means 33 is attached to the Y axis 35 so as to move in the Y direction along the first Y axis 35. Further, an X motor for moving the Y axis 35 in the X direction and a Y motor for moving the first probe holding means 31 in the Y direction are held at one end 351 of the Y axis 35. The first Y axis 35 is the first
Are engaged to move along the X rail of the. Another part identical to the first Y-axis 35 and the first X-rail 37 is prepared and assembled so that the probe holding means 31, 32 face each other. With such a configuration, it is possible to standardize the parts and also to standardize the programs that control the movements of the probe holding means 33 and 34.

Furthermore, in this device, when performing the initialization operation so that the two probes do not collide with each other,
The origins of 31 and 32 are set to diagonal symbols FO and SO, respectively.

As shown in FIG. 4, actuators 311 and 321 for moving the probes 31 and 32 up and down are provided in the respective probe holding means 33 and 34. The probe up / down signal of the signal extraction command of the processing means 4 shown in FIG. 1 is sent to the respective actuators 311 and 321 of the probe holding means through the probe signal cable 300. Each probe signal cable 300 extends left and right from approximately the center of the first X rail 37 and terminates in the respective Y axes 35 and 36.
Cable protective members 303, 305 that are foldable and are locked to
And cable actuators 311, 321 of the respective probe holding means through the cable protection members 304, 306 which are locked to the respective Y axes and can be folded back.

The probe movement command, which is another command of the signal extraction command, is connected to the respective X and Y motors via cables 301 and 302, respectively. These cables are also protected by the cable protection members 307 and 308. In this way, by protecting each cable, so-called cracking of the cable can be prevented and the probe can be protected.

Further, in the device of the present invention, as shown in FIG. 4, the collision protection means 31 is attached to the respective probe holding means 33, 34.
2,322 are provided. Even if it malfunctions for some reason due to this protection measure, it is elongated and has no strength.
It is possible to prevent damage to 1 and 32.

(Effects of the Invention) As described above, according to the present invention, there is an advantage that a circuit test apparatus having a high measurement speed and capable of adopting various measurement methods can be obtained.

[Brief description of drawings]

1, FIG. 2, FIG. 3 and FIG. 4 are explanatory views showing a circuit test apparatus according to the present invention, FIG. 1 shows an electrical schematic view of this apparatus, and FIG. FIG. 3 is an explanatory diagram showing the structure of an XY table, FIG. 3 is an explanatory diagram showing an example of the arrangement of probes, and FIG. 4 is an explanatory diagram showing probe holding means. In the figure, 1 is an XY table, 2 is an XY table 1
Board control means 3 which is a signal giving means for actually operating the circuit board attached to the probe board, 3 is a probe moving means for contacting a predetermined measurement point of the circuit board attached to the XY table 1 to take out a signal, A computer 4 is a processing means for giving a signal extraction command to the probe moving means 3 and a computer as a judging means for judging the quality of the circuit board based on the signal taken out from the probe moving means 32. A changeover switch for switching whether the acquisition signal is sent to the judging means or to another test device 6, and 7 is a signal preprocessing device for preprocessing this acquisition signal when sending it to the probe moving means 3. is there.

 ─────────────────────────────────────────────────── ─── Continuation of front page (72) Inventor Akihiko Hase 3-19-6 Nishishinagawa, Shinagawa-ku, Tokyo Nobuhiko Egashira, Examiner, Graftech Co., Ltd. (56) Bibliography 52-138257 (JP, U) )

Claims (3)

[Claims] 1. An XY table to which a circuit board to be inspected is detachably attached, a signal applying means for giving a predetermined operation signal to the circuit board to be inspected attached to the XY table, and based on the operation signal. Probe means having at least two signal extraction probes for extracting signals at predetermined measurement points of the circuit board in operation, and each probe of the probe means is independently moved in the XY direction based on a signal extraction command. Along with the probe moving means for contacting the predetermined measurement point of the circuit board to obtain the signal of the predetermined measurement point of the circuit board, and the predetermined measurement point of the circuit board are input prior to the test, and these measurement points are input. A processing means for holding the procedure of measures regarding the above in the form of a program and giving the above-mentioned signal extraction command to the probe moving means one after another; In a circuit test apparatus having a judging means for judging the quality of the circuit board based on a signal taken out by the plug moving means, the processing means inputs the coordinates of a predetermined measuring point of the circuit board to the measuring point coordinates. The input means, a storage means for storing the measurement point coordinates for each probe at each stage for performing the measurement operation at each time point based on the input coordinates of the measurement point coordinate input means, and the storage means for the input probe. And a calculation means for calculating the movement locus of each probe during the measurement operation from each coordinate value at the time point and each coordinate value of each probe input for the measurement operation at the immediately preceding time point, and The alarm means is provided to warn the user when the movement locus of each probe determined by the computing means causes each probe to collide. To circuit testing device. 2. An XY table to which a circuit board to be inspected is detachably attached, a signal applying means for giving a predetermined operation signal to the circuit board to be inspected attached to the XY table, and based on the operation signal. Probe means having at least two signal extraction probes for extracting signals at predetermined measurement points of the circuit board in operation, and each probe of the probe means is independently moved in the XY direction based on a signal extraction command. Along with the probe moving means for contacting the predetermined measurement point of the circuit board to obtain the signal of the predetermined measurement point of the circuit board, and the predetermined measurement point of the circuit board are input prior to the test, and these measurement points are input. Processing means for holding the measurement procedure regarding the above in the form of a program and giving the signal moving command to the probe moving means one after another; In a circuit test apparatus having a determining means for determining the quality of the circuit board based on a signal taken out by the probe moving means, the probe moving means includes two Y axes that move in the X axis direction and a Y axis. Probe holding means attached to each Y-axis so as to be movable in the axial direction so as to face each Y-axis, and at least one of the probe holding means is provided with a collision protection means. Characteristic circuit test equipment. 3. An XY table to which a circuit board to be inspected is detachably attached, a signal applying means for giving a predetermined operation signal to the circuit board to be inspected attached to the XY table, and based on the operation signal. Probe means having at least two signal extraction probes for extracting signals at predetermined measurement points of the circuit board in operation, and each probe of the probe means is independently moved in the XY direction based on a signal extraction command. Along with the probe moving means for contacting the predetermined measurement point of the circuit board to obtain the signal of the predetermined measurement point of the circuit board, and the predetermined measurement point of the circuit board are input prior to the test, and these measurement points are input. Processing means for holding the measurement procedure regarding the above in the form of a program and giving the signal moving command to the probe moving means one after another; In a circuit test apparatus having a determining means for determining the quality of the circuit board based on a signal taken out by the probe moving means, the probe moving means includes two Y axes that move in the X axis direction and a Y axis. The probe holding means is attached so as to face the Y-axis so as to be movable in the axial direction. The Y-axis on one side receives the output of the X-axis motor and extends along the X-axis direction. One end of the X-axis rail is engaged and X
A circuit test apparatus characterized in that two sets of the Y-axis and the X-rail configured to move in the axial direction and formed of the same component are prepared and assembled so as to face each other.