JPH0648163B2 - Automatic continuous measuring device for linear pitch - Google Patents

Automatic continuous measuring device for linear pitch

Info

Publication number
JPH0648163B2
JPH0648163B2 JP32442988A JP32442988A JPH0648163B2 JP H0648163 B2 JPH0648163 B2 JP H0648163B2 JP 32442988 A JP32442988 A JP 32442988A JP 32442988 A JP32442988 A JP 32442988A JP H0648163 B2 JPH0648163 B2 JP H0648163B2
Authority
JP
Japan
Prior art keywords
pedestal
pitch
cam
measured
surface plate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP32442988A
Other languages
Japanese (ja)
Other versions
JPH02168101A (en
Inventor
金平 鈴木
Original Assignee
金平 鈴木
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 金平 鈴木 filed Critical 金平 鈴木
Priority to JP32442988A priority Critical patent/JPH0648163B2/en
Publication of JPH02168101A publication Critical patent/JPH02168101A/en
Publication of JPH0648163B2 publication Critical patent/JPH0648163B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Description

【発明の詳細な説明】 [産業上の利用分野] 本発明は、直線状に溝をもつラック,ネジ,ラックカッ
ター,ボールネジなどの溝ピッチの自動連続測定装置に
関する。
TECHNICAL FIELD The present invention relates to an automatic continuous measuring device for groove pitches of racks, screws, rack cutters, ball screws, etc. having linear grooves.

[従来技術とその課題] 一般に、直線状の溝をもつ、例えば、ラック,ネジ,ラ
ックカッター,ボールネジなどのピッチの測定には、測
長機,万能測定顕微鏡,工具顕微鏡などが使用されてい
る。
[Prior art and its problems] Generally, a length measuring machine, a universal measuring microscope, a tool microscope, etc. are used for measuring the pitch of, for example, a rack, a screw, a rack cutter, and a ball screw having a linear groove. .

ピッチの測定を工具顕微鏡で行う場合について説明する
と、先ず、V形細線は測定しようとするネジ山の角度に
適合するものを選び、顕微鏡筒をネジのリード角の方向
に傾け、両センサー間にとりつけられた被測定物のネジ
溝の像が顕微鏡の視野に見られるようにする。ネジ山の
外径を結ぶ線が測定機テーブルの左右の滑り方向に一致
するように調整したのち、測定機テーブルを左右,前後
に微動してV形細線をネジ溝の両フランジに正しく一致
させ、その時の左右の送り量を読み取る。次に、被測定
物はそのままでテーブルを1ピッチ分送り、ネジ溝を視
野にあらわし、上記と同様にテーブルを左右,前後微動
してV形細線をネジ溝の両フランジに正しく一致させ
る。そのときの左右のテーブル送り量を読み取る。この
操作を繰り返して読みが得られたら、それらの値を計算
して単一ピッチ誤差,累積ピッチ誤差を求めるものであ
る。
Explaining the case where the pitch is measured with a tool microscope. First, select a V-shaped thin wire that matches the angle of the thread to be measured, tilt the microscope barrel in the direction of the screw lead angle, and place it between both sensors. The image of the thread groove of the attached object to be measured should be visible in the field of view of the microscope. After adjusting so that the line connecting the outer diameters of the screw threads matches the left and right sliding directions of the measuring machine table, slightly move the measuring machine table to the left and right and back and forth so that the V-shaped thin wire is correctly aligned with both flanges of the screw groove. , Read the left and right feed amount at that time. Next, the table to be measured is fed by one pitch with the object to be measured as it is, the screw groove is shown in the visual field, and the table is finely moved to the left and right and back and forth in the same manner as described above, so that the V-shaped thin wire is correctly aligned with both flanges of the screw groove. Read the left and right table feed amount at that time. When the reading is obtained by repeating this operation, those values are calculated to obtain the single pitch error and the cumulative pitch error.

一方、万能測定顕微鏡にてピッチの測定をする場合、使
用されるゲージとして上記と同様の手段による測定は勿
論のこと、それ以外に、測定ゲージ(ピン状のもの)を
両フランクに接触させてその中心以上にある刻線、もし
くは、外径線の位置を読むもの、あるいは、測定ナイフ
エッジを使用してナイフエッジの端面の位置を読むもの
など、いずれの場合の測定においても基準線を完全に測
定部と合致させなければならず、そのために、高度の技
能をもつ熟練者といっても一点注視のため目の疲労が著
しく、多量の被測定物を連続測定してゆくものや、多く
の測定時間を要するものには精神的にも肉体的にも苛酷
な作業が要求されるし、測定時間、および、データ処理
時間の短縮は望めない。
On the other hand, when measuring the pitch with a universal measuring microscope, not only the same gauge as the above is used as the gauge to be used, but also a measuring gauge (pin-shaped) is brought into contact with both flanks. In all cases, such as reading the position of the engraved line outside the center or the position of the outer diameter line, or reading the position of the end face of the knife edge using the measuring knife edge, complete the reference line. Therefore, even an expert with a high degree of skill has a great deal of eye fatigue due to one-point gaze, and many of them must continuously measure a large number of DUTs. Those requiring a long measurement time require severe work both mentally and physically, and it cannot be expected to reduce the measurement time and data processing time.

本発明の目的は、2本の接触測定子を所定のピッチ間隔
にセットするとともに、被測定物と同じピッチで間欠送
りする動作と、両接触測定子を被測定物の測定点に押圧
接触させたときの指示値の差を電気的に検出し、単一ピ
ッチ誤差として表示、および、記録する動作を各ピッチ
毎に連続して行わせ、従来技術の課題が容易に解決しう
る装置を提供せんとするものである。
An object of the present invention is to set two contact measuring elements at a predetermined pitch interval, to perform an intermittent feed operation at the same pitch as the object to be measured, and to bring both contact measuring elements into pressure contact with the measuring point of the object to be measured. A device capable of electrically solving the problem of the prior art by electrically detecting the difference between the indicated values when the output is made and displaying and recording as a single pitch error continuously for each pitch is provided. It is something to do.

[課題を解決するための手段] 従来技術の課題を解決する本発明の構成は、機体の上部
一側に被測定物を交換可能にセットするとともに、上記
機体に、割出しギア構造体、および、ゼネバ機構などに
よって上記被測定物の設計ピッチに適合するピッチで被
測定物の軸線と平行に間欠移動する基台をを設け、該基
台上に、これの間欠移動方向と直交する方向にカム9aに
よって移動可能で、かつ、発条の作用で一側方向に付勢
された台座7を乗載するとともに、この台座7上に、該
台座7と直交する方向にカム9bによって移動可能で、か
つ、発条の作用で一側方向に付勢された台座8を乗載せ
しめ、一方、上記台座8上に検出台を設けるとともに、
この検出台上に、上記台座7の移動方向と同じ方向に調
節移動可能な定盤30を設け、更に、この定盤30上に、上
記台座8の移動方向と同じ方向に調節移動可能なスライ
ド盤32を乗載し、上記定盤30とスライド盤32の前部に、
夫々上記被測定物の溝内に介入しうる接触測定子34を先
端に交換可能に設けたレバー35,36 を軸支せしめ、該両
レバー35,36 の後端部に、上記定盤30とスライド盤32に
各別に設けた検出器の検出子を圧接させ、上記両検出器
を演算ユニツトをもつ指示計に電気的に接続するととも
に、更に、該指示計を記録計に電気的に接続したことを
特徴とする [実施例] 次に、図面について本発明実施例の詳細を説明する。
[Means for Solving the Problems] A configuration of the present invention for solving the problems of the prior art is such that an object to be measured is set on one side of the upper part of the machine body in an exchangeable manner, and the machine body has an indexing gear structure, and , A Geneva mechanism or the like is provided with a base that intermittently moves in parallel with the axis of the object to be measured at a pitch that matches the design pitch of the object to be measured, and on the base, in the direction orthogonal to the intermittent movement direction. It is movable by a cam 9a, and mounts a pedestal 7 that is biased in one direction by the action of a spring, and is movable on the pedestal 7 by a cam 9b in a direction orthogonal to the pedestal 7, Moreover, the pedestal 8 urged in one direction by the action of the spring is placed on the pedestal, while the detection base is provided on the pedestal 8, and
On this detection base, there is provided a surface plate 30 that can be adjusted and moved in the same direction as the moving direction of the pedestal 7, and on the surface plate 30, a slide that can be adjusted and moved in the same direction as the moving direction of the pedestal 8. Mount the board 32, in front of the surface plate 30 and the slide plate 32,
The levers 35 and 36, each of which has a replaceable contact tip 34 which can intervene in the groove of the object to be measured, are exchangeably provided at the tips, and the surface plate 30 and the platen 30 are attached to the rear ends of the levers 35 and 36, respectively. The detectors of the detectors provided separately on the slide board 32 were pressed into contact with each other, and both the detectors were electrically connected to an indicator having an arithmetic unit, and further, the indicator was electrically connected to a recorder. Embodiments Next, details of embodiments of the present invention will be described with reference to the drawings.

第1図は装置全体の概略を示す平面図,第2図は要部の
説明図,第3図は同上要部の一部切欠側面図,第4図は
同上一部切欠平面図,第5図は同上一部切欠正面図,第
6図は測定台座の自動復帰構造部の平面図,第7図は測
定駆動カム軸の側面図,第8図は同上正面図,第9図は
同上平面図,第10図a〜fは測定駆動カム軸の動きに対
応する測定台座の動きと、接触測定子の動きを示す流れ
図,第11図a〜iは本発明の測定対象とする被測定物の
一部正面図,第12図a,b,第3 図a,b,第14図a,
bは夫々接触測定子の種類を示す側面図と正面図であ
る。
FIG. 1 is a plan view showing an outline of the entire apparatus, FIG. 2 is an explanatory view of main parts, FIG. 3 is a partially cutaway side view of the same as above, and FIG. The figure shows a partially cutaway front view of the same as above, FIG. 6 is a plan view of the automatic return structure of the measurement pedestal, FIG. 7 is a side view of the measurement drive camshaft, FIG. 8 is a front view of the same, and FIG. 9 is a plan view of the same. Figures 10a to 10f are flow charts showing the movement of the measurement pedestal and the movement of the contact probe in response to the movement of the measurement drive cam shaft, and Figures 11a to 11f are the objects to be measured of the present invention. Partial front view, 12 a, b, 3 a, b, 14 a,
3B is a side view and a front view, respectively, showing the types of contact probes.

第1図に示す1は機体であって、該機体1の上部には、
割出しギア構造体(図示略)、および、ゼネバ機構(図
示略)によって、被測定物2の設計ピッチに適合するピ
ッチで矢印方向に間欠的に送られ、終端から始端に帰戻
することのできる測定装置Aが搭載されている。上記被
測定物2は、上記測定装置Aの移動方向と平行に機体1
の一側にとりつけられる。図中3は演算ユニットをもつ
指示計,4は上記指示計3に電気的に接続された記録計
である。
1 shown in FIG. 1 is an airframe, and an upper part of the airframe 1 is
By an indexing gear structure (not shown) and a Geneva mechanism (not shown), intermittent feeding is performed in the direction of the arrow at a pitch that matches the design pitch of the DUT 2, and returning from the end to the start is possible. A measuring device A capable of being mounted is mounted. The DUT 2 is parallel to the moving direction of the measuring apparatus A
Attached to one side. In the figure, 3 is an indicator having an arithmetic unit, and 4 is a recorder electrically connected to the indicator 3.

次に、第2〜9図について本発明測定装置Aの詳細を説
明すると、第3図に示す5は、上記機体1の長手方向に
そって設けられたガイドレール6にそって所定のピッチ
で間欠移動する基台であって、この基台5上には、該基
台5の間欠移動方向、即ち、X座標方向にそって移動可
能とした台座7が乗載してあるとともに、更にこの台座
7上には、上記基台5の間欠移動方向と直交する方向、
即ち、Y座標方向にそって移動可能な台座8が乗載して
ある。上記台座7のX座標方向への移動、および、台座
8のY座標方向への移動は、第3,5,7,8,9図に
示されている測定駆動カム軸9に設けたカム9a,9b によ
って行われるもので、第3図は上記台座7のX座標方向
への移動機構を示し、また、第5図は上記台座8のY座
標方向への移動機構を示している。
Next, the details of the measuring apparatus A of the present invention will be described with reference to FIGS. 2 to 9. Reference numeral 5 in FIG. 3 is provided at a predetermined pitch along the guide rail 6 provided along the longitudinal direction of the machine body 1. A pedestal 7 which is intermittently moved, on which is mounted a pedestal 7 which is movable along the intermittent movement direction of the pedestal 5, that is, the X coordinate direction. On the pedestal 7, a direction orthogonal to the intermittent movement direction of the base 5,
That is, the pedestal 8 movable along the Y coordinate direction is mounted. The movement of the pedestal 7 in the X coordinate direction and the movement of the pedestal 8 in the Y coordinate direction are performed by a cam 9a provided on the measurement drive cam shaft 9 shown in FIGS. 3, 5, 7, 8, and 9. , 9b, FIG. 3 shows the moving mechanism of the pedestal 7 in the X coordinate direction, and FIG. 5 shows the moving mechanism of the pedestal 8 in the Y coordinate direction.

先ず、上記測定駆動カム軸9の構造について説明する
と、第7〜9図から明らかなように、測定駆動カム軸9
の上部にはこの測定駆動カム軸9の中心軸線から大きく
偏した平面形状が円形のカム9aが設けてあり、更に、こ
のカム9aの上面には、上記測定駆動カム軸9の中心軸線
と同一軸線上に一部を切除した平面カム部9cをもち、か
つ、測定駆動カム軸9と略同径のカム9bが一体に形成さ
れている。上記カム9aは上記台座7に、カム9bは上記台
座8に対して各別に作用するものであるが、両カム9aと
9bには次のような構成上の特定条件がある。即ち、上記
カム9bに形成した平面カム部9cの面は、第9図に示すよ
うに、上記測定駆動カム軸9の中心と、上記カム9aの中
心とを結ぶ線に対して平行であること、および、上記カ
ム9bの平面カム部9cは、カム9bの中心から例えば、1.5
mmずれ込んだ位置に設けられており、このずれ込みがカ
ム9bの円滑な動きを司っている。そして、上記測定駆動
カム軸9は第3,5図から明らかなように、上記基台5
に対して回転可能に軸支されるとともに、測定駆動カム
軸9の下端には傘歯車10が設けてあり、この傘歯車10
に、駆動軸11に設けた傘歯車12が噛合されており、上記
機体1に設けたモータ(図示略)の駆動が伝達されるよ
うにしてある。また、第3図に示すように、上記カム9a
には台座7に設けた作用板13の平面が、また、第5図に
示すように、上記カム9bには台座8に設けた作用板14の
端面が接触作用するようにしてある。尚、上記カム9a,9
b 、および、作用板13,14 は、ステンレス鋼のような超
硬鋼材料にて形成するものである。また、第3図におけ
る15は、被測定物2をセットする受台で、この受台15は
被測定物2のピッチの大小により適応するものと交換す
ることができるようにしてある。16は被測定物2を保定
するためのボルトである。
First, the structure of the measurement drive cam shaft 9 will be described. As is clear from FIGS.
A circular cam 9a having a circular planar shape, which is largely deviated from the central axis of the measurement drive cam shaft 9, is provided on the upper part of the same, and the upper surface of the cam 9a is the same as the central axis of the measurement drive cam shaft 9. A cam 9b having a flat cam portion 9c with a part cut off on the axis and having a diameter substantially the same as that of the measurement drive cam shaft 9 is integrally formed. The cam 9a acts on the pedestal 7 and the cam 9b acts on the pedestal 8 separately.
9b has the following specific configuration conditions. That is, as shown in FIG. 9, the surface of the flat cam portion 9c formed on the cam 9b is parallel to the line connecting the center of the measurement drive cam shaft 9 and the center of the cam 9a. , And the flat cam portion 9c of the cam 9b is, for example, 1.5 mm from the center of the cam 9b.
It is provided at a position displaced by mm, and this displacement controls smooth movement of the cam 9b. The measurement drive cam shaft 9 is mounted on the base 5 as shown in FIGS.
A bevel gear 10 is provided at the lower end of the measurement drive cam shaft 9 while being rotatably supported with respect to the bevel gear 10.
A bevel gear 12 provided on the drive shaft 11 is meshed with the drive shaft 11 so that the drive of a motor (not shown) provided on the machine body 1 is transmitted. Also, as shown in FIG. 3, the cam 9a is
The flat surface of the working plate 13 provided on the pedestal 7 is brought into contact with the cam 9b, and the end surface of the working plate 14 provided on the pedestal 8 is brought into contact with the cam 9b, as shown in FIG. The above cams 9a, 9
The b and the working plates 13 and 14 are made of a super hard steel material such as stainless steel. Further, reference numeral 15 in FIG. 3 denotes a cradle on which the DUT 2 is set, and the pedestal 15 can be replaced with a cradle suitable for the size of the pitch of the DUT 2. 16 is a bolt for retaining the DUT 2.

次に、第4図に示す17,18 は、上記台座7の一側面、つ
まり、基台5の間欠移動方向と直交する一側面(X座標
方向と平行)の左右2個所に設けた取付片で、紙面左方
の取付片17にはストローク規制用のボルト19を進退調節
可能に設け、また、紙面右方の取付片18にはボルト20を
進退調節可能にとりつける。そして、上記両取付片17,1
8 の中間部には、上記基台5の側面に固定したバネ支持
片21を介装し、このバネ支持片21と上記取付片18のボル
ト20との間に、台座7を上記被測定物2と反対方向に付
勢するスパイラル発条22が弾設してある。図中21a は、
上記一方のボルト19に当接するストッパーである。
Next, reference numerals 17 and 18 shown in FIG. 4 denote mounting pieces provided on two left and right sides of one side of the pedestal 7, that is, one side (parallel to the X coordinate direction) orthogonal to the intermittent movement direction of the base 5. Then, a stroke restricting bolt 19 is provided on the mounting piece 17 on the left side of the paper so as to be adjustable forward and backward, and a bolt 20 is mounted on the mounting piece 18 on the right side of the paper so as to be adjustable forward and backward. Then, both mounting pieces 17,1
A spring support piece 21 fixed to the side surface of the base 5 is interposed in the middle of 8, and the pedestal 7 is placed between the spring support piece 21 and the bolt 20 of the attachment piece 18 to be measured. A spiral spring 22 that urges in the direction opposite to 2 is installed. 21a in the figure is
It is a stopper that comes into contact with the one bolt 19 described above.

また、第6図に示すように、上記台座8の前面には上記
と同様に取付片23,24 が固定してあり、この取付片23,2
4 には夫々ボルト25,26 を螺合させ、上記取付片23と24
の中間に上記台座7に固定したバネ支持片27を介装し、
このバネ支持片27と上記一方の取付片24のボルト26との
間に、台座8を常時基台5の間欠移動方向と逆方向に付
勢するためのスパイラル発条28を弾設する。図中27a
は、上記ボルト25に当接するストッパーである。
Also, as shown in FIG. 6, mounting pieces 23, 24 are fixed to the front surface of the pedestal 8 in the same manner as described above.
Bolts 25 and 26 are screwed into 4 respectively, and the above-mentioned mounting pieces 23 and 24
The spring support piece 27 fixed to the pedestal 7 is interposed in the middle of
A spiral spring 28 for elastically urging the pedestal 8 in the direction opposite to the intermittent movement direction of the base 5 is elastically provided between the spring support piece 27 and the bolt 26 of the one mounting piece 24. 27a in the figure
Is a stopper that comes into contact with the bolt 25.

次に、第2〜5図について本発明測定装置Aの要部につ
いて説明する。
Next, the main part of the measuring apparatus A of the present invention will be described with reference to FIGS.

29は、上記台座8上に固定された平面形状が方形状の検
出台であって、この検出台29は上述したカム機構によっ
て台座7,8を介してX,Y座標方向に移動するもので
ある。また、この検出台29上には、定盤30が乗載してあ
り、この定盤30の一側には、これをX座標方向のみに微
調整し、かつ、上記検出台29上に設けた調節ボルト31が
螺合してある。更に、上記定盤30上には、第5図から明
らかなように、Y座標方向にのみ移動可能となしたスラ
イド盤32が設けてあり、このスライド盤32の一側には、
上記定盤30に設けた調節ボルト33が螺合してあって、こ
の調節ボルト33の回動操作により、上記スライド盤32が
定盤30に対してY座標方向に微調整移動ができるように
したものである。
Reference numeral 29 denotes a detection base fixed on the pedestal 8 and having a rectangular planar shape. The detection base 29 is moved by the above-mentioned cam mechanism in the X and Y coordinate directions via the pedestals 7 and 8. is there. A surface plate 30 is mounted on the detection table 29, and one surface of the surface plate 30 is finely adjusted only in the X coordinate direction and is provided on the detection table 29. The adjusting bolt 31 is screwed. Further, as is clear from FIG. 5, a slide plate 32 that is movable only in the Y coordinate direction is provided on the surface plate 30. One side of this slide plate 32 is
An adjusting bolt 33 provided on the surface plate 30 is screwed, and by rotating the adjusting bolt 33, the slide plate 32 can be finely adjusted and moved in the Y coordinate direction with respect to the surface plate 30. It was done.

第4,5図から明らかなように、上記定盤30の前部、お
よび、上記スライド盤32の前部には、夫々上記被測定物
2のピッチ溝内に介入しうる第12〜14図に示すような接
触測定子34を着脱交換可能にとりつけたレバー35,36 が
とりつけられている。該両レバー35,36 の上記定盤30,
スライド盤32に対する取付け構造を説明すると、両レバ
ー35,36 の前部上下面には、平面形状が直角二等辺三角
形をした突起37a,38a を後向きに突設した支持片37,38
を上下対称的に固定する。一方、上記支持片37,38 の後
方に、該支持片37,38 の突起37a,38a に対向する平面形
状が直角二等辺三角形をした突起39a,40a を前向きに突
設した支持片39,40 を配設し、この支持片39,40 を上記
レバー35,36 の上下に配設するとともに、一方の支持片
39は上記定盤30上に固定し、また、他方の支持片40は上
記スライド盤32上に固定する。そして、相対向した両支
持片37,38,39,40 の相対向する突起37a,38a,39a,40a の
斜面間に板バネ41,42 をX状にとりつけ、この板バネ4
1,42 の交点を軸として上記レバー35,36 が揺動しうる
ようにしたもので、いわゆる、無軸軸支構造としたもの
である。
As is clear from FIGS. 4 and 5, the front part of the surface plate 30 and the front part of the slide plate 32 can intervene in the pitch groove of the DUT 2 respectively. Attached are levers 35 and 36 to which a contact probe 34 as shown in FIG. The surface plate 30 of the levers 35 and 36,
Explaining the mounting structure for the slide board 32, the support pieces 37, 38 in which projections 37a, 38a each having a plane shape of an isosceles right triangle are projected rearward on the front upper and lower surfaces of both levers 35, 36 are described.
Are fixed vertically symmetrically. On the other hand, in the rear of the support pieces 37, 38, the support pieces 39, 40 are provided with projections 39a, 40a having a plane shape of an isosceles right triangle facing the projections 37a, 38a of the support pieces 37, 38 in a forward direction. The support pieces 39, 40 are arranged above and below the levers 35, 36, and one support piece
39 is fixed on the surface plate 30, and the other support piece 40 is fixed on the slide plate 32. Then, the leaf springs 41, 42 are attached in an X shape between the slopes of the protrusions 37a, 38a, 39a, 40a facing each other of the supporting pieces 37, 38, 39, 40 facing each other.
The levers 35 and 36 can be swung about an intersection of 1,42 as an axis, which is a so-called non-axial support structure.

上記レバー35,36 の後端部には、上記定盤30とスライド
盤32上に各別にとりつけた検出器43,44 の検出子43a,44
a が圧接されている。この検出子43a,44a は検出器43,4
4 に対して回動付勢されており、この回動付勢が常態で
は上記レバー35,36 によって阻止されているもので、こ
の検出子43a,44a がレバー35,36 の回動に追従した動き
を電気信号に変換するようにしてあり、上記各検出器4
3,44 は上記指示計3の演算ユニットに夫々各別に接続
されている。尚、図中45,46 はレバー35,36 の復帰バネ
である。
At the rear ends of the levers 35 and 36, the detectors 43a and 44 of the detectors 43 and 44 mounted separately on the surface plate 30 and the slide plate 32, respectively.
a is pressed. This detector 43a, 44a is a detector 43,4
It is biased against rotation with respect to 4, and this rotation bias is normally blocked by the levers 35 and 36, and the detectors 43a and 44a follow the rotation of the levers 35 and 36. The motion is converted into an electric signal, and each of the above detectors 4
3,44 are respectively connected to the arithmetic units of the above-mentioned indicator 3 respectively. In the figure, 45 and 46 are return springs for the levers 35 and 36.

尚、被測定物2の種類としては、第11図a〜iに示すも
のがあり、a図、および、g図はラック,b図,d図、
および、e図は位置決めゲージ,c図、および、h図は
ラックカッターなどの刃物,f図はネジ,i図はボール
ネジである。Pはピッチである。
The types of the DUT 2 include those shown in FIGS. 11 a to 11 i, in which a and g are racks, b, d,
And, e is a positioning gauge, c is a drawing, h is a blade such as a rack cutter, f is a screw, and i is a ball screw. P is the pitch.

[作用の説明] 上記実施例に基づいて本発明の作用を説明する。[Description of Operation] The operation of the present invention will be described based on the above-described embodiment.

先ず準備作用として、第1図に示すように、機体1の一
側に設けた受台15に被測定物2をセットし、ボルト16に
て固定する。一方、被測定物2のピッチにセットされた
ピッチゲージ(図示略)を固定し、該ピッチゲージの一
端定盤30に固定されている一方の接触測定子34を接触さ
せ、検出器43を介して指示計3の演算ユニットに入力さ
れる信号による指示計を0に合わせる。次に、調節ボル
ト33の作用でスライド盤32をY座標方向に動かしてピッ
チゲージの他端に他方の接触測定子34を接触させ、検出
器43を介して演算ユニットに入力される信号による指示
計が0を示す位置にする。更に、上記被測定物2のピッ
チに従って、調節ボルト31によって定盤30を前後動させ
るとともに、両接触測定子34を被測定物2の始端部の溝
の中間にセットすることにより準備は終わる。
First, as a preparatory action, as shown in FIG. 1, the DUT 2 is set on a pedestal 15 provided on one side of the machine body 1 and is fixed with bolts 16. On the other hand, a pitch gauge (not shown) set to the pitch of the object to be measured 2 is fixed, and one of the contact gauges 34 fixed to the surface plate 30 at one end of the pitch gauge is brought into contact with the pitch gauge. The indicator based on the signal input to the arithmetic unit of the indicator 3 is set to 0. Next, the slide board 32 is moved in the Y-coordinate direction by the action of the adjusting bolt 33 to bring the other contact probe 34 into contact with the other end of the pitch gauge, and an instruction is given by a signal input to the arithmetic unit via the detector 43. Set the position where the total shows 0. Further, according to the pitch of the object 2 to be measured, the surface plate 30 is moved back and forth by the adjusting bolt 31, and both contact measuring elements 34 are set in the middle of the groove at the starting end of the object 2 to be prepared.

次に、ピッチ測定の流れを第10図a〜fについて説明す
ると、a図は測定のスタート時点、または、ある個所の
ピッチ測定が終り、測定装置Aが1ピッチY座標方向に
送られた状態を示している。このとき、カム9aの最長偏
心部が台座7に設けた作用板13の平面部に接触してお
り、また、カム9bの円弧部中心が台座8に設けた作用板
14の面に接触し、カム9bの平面カム部9cが作用板の平面
と平行状態にある。この状態で、測定駆動カム軸9、即
ち、カム9a,9b が回動すると、カム9aの作用で台座7、
即ち、両接触測定子34はX座標方向に前進し、b図に示
すように両接触測定子34が相隣れる被測定物2の溝の中
央部に各別に介入し、カム9aの偏心量が0の点で停止す
る。更に回転が続行すると、カム9bの平面カム部9cに作
用板14の平面部が当接するまで台座8がY座標方向に移
動する。つまり、c図で示すように、溝内に介入した両
接触測定子34が仮想線の位置から実線の位置まで横行
し、両接触測定子34の先端エッジ部が、例えば、被測定
物2のラック歯のピッチライン近傍に夫々圧接される。
Next, the flow of pitch measurement will be described with reference to FIGS. 10A to 10F. FIG. 10A shows a state in which the measurement apparatus A is sent in the 1-coordinate Y-coordinate direction at the start of measurement or after the pitch measurement at a certain point is completed. Is shown. At this time, the longest eccentric part of the cam 9a is in contact with the flat part of the working plate 13 provided on the pedestal 7, and the center of the arc portion of the cam 9b is the working plate provided on the pedestal 8.
The flat cam portion 9c of the cam 9b is in contact with the surface 14 and is parallel to the flat surface of the working plate. In this state, when the measurement drive cam shaft 9, that is, the cams 9a and 9b rotate, the pedestal 7,
That is, both contact measuring elements 34 move forward in the X-coordinate direction, and as shown in FIG. 2B, both contact measuring elements 34 individually intervene in the central portion of the groove of the DUT 2 adjacent to each other, and the eccentricity of the cam 9a is increased. Stops at 0. When the rotation is further continued, the pedestal 8 moves in the Y coordinate direction until the flat surface portion of the action plate 14 contacts the flat surface cam portion 9c of the cam 9b. That is, as shown in FIG. C, both contact measuring elements 34 intervening in the groove traverse from the position of the imaginary line to the position of the solid line, and the tip edge portions of both contact measuring elements 34 are, for example, of the DUT 2. The rack teeth are pressed against each other in the vicinity of the pitch line.

両接触測定子34が夫々ラック歯のピッチライン近傍に圧
接されると、レバー35,36 が無軸軸支構造とした板バネ
41,42 の交点を中心として揺動する。両レバー35,36 の
回動は検出子43a,44a を回動することになり、検出器4
3,44 には検出子43a,44a の回動量に見合った電気信号
が発生し、この両検出器43,44 の検出信号が指示計3の
演算ユニットに入力され、ここで両入力信号は比較演算
され、両信号の差が指示計3に表示されるとともに、同
時に記録計4の記録紙4aに印書せしめられる。この測定
は、d図に示すように、カム9bがc図の状態から回転
し、圧接状態にある接触測定子34がラック歯から離反さ
れる圧接解除までの間行われる。更にカム9a,9b の回転
続行により、e図に示すように、カム9bの円弧面が作用
板14の平面部に接触すると、両接触測定子34は溝の中央
部まで戻され、更に、カム9aの作用で両接触測定子34は
台座7のX座標方向の移動により被測定物2と関係のな
い位置まで後退する。
When both contact probes 34 are pressed into the vicinity of the pitch line of the rack teeth, the levers 35 and 36 have a leaf spring with a non-axial support structure.
It swings around the intersection of 41 and 42. The rotation of both levers 35 and 36 will rotate the detectors 43a and 44a.
An electric signal corresponding to the amount of rotation of the detectors 43a, 44a is generated at 3, 44, and the detection signals of both detectors 43, 44 are input to the arithmetic unit of the indicator 3, where both input signals are compared. The difference between the two signals is calculated and displayed on the indicator 3 and simultaneously printed on the recording paper 4a of the recorder 4. This measurement is performed until the cam 9b rotates from the state shown in c and the contact probe 34 in the pressure contact state is separated from the rack teeth until the pressure contact is released, as shown in FIG. Further, as the cams 9a and 9b continue to rotate, when the arc surface of the cam 9b comes into contact with the flat surface portion of the working plate 14 as shown in FIG. By the action of 9a, both contact measuring elements 34 are retracted to a position irrelevant to the DUT 2 by the movement of the pedestal 7 in the X coordinate direction.

以上で1ピッチの測定は終わるが、測定装置Aはこの時
点で、機体1に内蔵した割出しギア構造体、および、ゼ
ネバ機構によって被測定物2のピッチに適合するストロ
ークだけY座標方向に間欠移送され、a図の状態とな
る。そして上記測定操作を被測定物2終端に至るまで行
ったのち、装置の駆動を停止するとともに、測定装置A
を始点まで戻す。記録計4の記録紙に記録されたデータ
に基づき、被測定物2の良否の判断がなされるものであ
る。尚、接触測定子34の動きは、台座7,8のX,Y座
標方向への動きの合成で行われることから、図示のよう
な直線的,直角的な動きはしない。
Although the measurement of one pitch is completed by the above, the measuring device A is intermittently moved at this point in the Y coordinate direction by a stroke adapted to the pitch of the DUT 2 by the index gear structure built in the machine body 1 and the Geneva mechanism. After being transferred, the state shown in FIG. After the measurement operation is performed until the end of the DUT 2, the drive of the device is stopped and the measurement device A
Return to the starting point. The quality of the DUT 2 is judged based on the data recorded on the recording paper of the recorder 4. Since the movement of the contact probe 34 is performed by combining the movements of the pedestals 7 and 8 in the X and Y coordinate directions, there is no linear or right angle movement as illustrated.

[発明の効果] 上述のように本発明の構成によれば、次のような効果が
得られる。
[Effects of the Invention] According to the configuration of the present invention as described above, the following effects can be obtained.

(a) 従来技術に比べて熟練を要することなく、全てのピ
ッチが自動連続的に行うことができ、短時間で測定しう
るとともに、測定結果が全て記録されることから、良否
の判定が正確に、かつ、迅速になしうる。
(a) Compared to the conventional technology, all pitches can be automatically and continuously performed without requiring skill, and measurement can be performed in a short time, and all measurement results are recorded, so that the judgment of pass / fail is accurate. It can be done quickly and quickly.

(b) 2本平行した接触測定子のX,Y座標方向への動き
が、基台に対するX座標方向へ動く台座7,この台座7
に対するY座標方向へ動く台座8と、各台座7,8に各
別に作用するカム9a,9bによって行われるため、機構の
簡略化が図れるとともに、装置全体のコンパクト化が図
れ、更に、接触測定子の動きの精度が向上でき、正確な
ピッチ測定がなしうる。
(b) The pedestal 7, in which the movement of the two parallel contact measuring elements in the X and Y coordinate directions moves in the X coordinate direction with respect to the base.
Is performed by the pedestal 8 that moves in the Y-coordinate direction and the cams 9a and 9b that act on the pedestals 7 and 8 separately, so that the mechanism can be simplified and the entire device can be made compact, and the contact probe It is possible to improve the accuracy of the movement of the, and to make accurate pitch measurement.

【図面の簡単な説明】[Brief description of drawings]

第1図は装置全体の概略を示す平面図,第2図は要部の
説明図,第3図は同上要部の一部切欠側面図,第4図は
同上一部切欠平面図,第5図は同上一部切欠正面図,第
6図は測定台座の自動復帰構造部の平面図,第7図は測
定駆動カム軸の側面図,第8図は同上正面図,第9図は
同上平面図,第10図a〜fは測定駆動カム軸の動きに対
応する測定台座の動きと、接触測定子の動きを示す流れ
図,第11図a〜iは本発明の測定対象とする被測定物の
一部正面図,第12図a,b,第13図a,b,第14図a,
bは夫々接触測定子の種類を示す側面図と正面図であ
る。 1……機体,2……被測定物,3……指示計,4……記
録計,5……基台,6……ガイドレール,7……台座,
8……台座,9……測定駆動カム軸,9a,9b ……カム,
9c……平面カム部,13,14 ……作用板,15……受台,1
7,18 ……取付片,19,20 ……ボルト,21……バネ支持
片,22……スパイラル発条,23,24 ……取付片,25,26
……ボルト,27……バネ支持片,28……スパイラル発
条,29……検出台,30……定盤,31……調節ボルト,32
……スライド盤,33……調節ボルト,34……接触測定
子,35,36 ……レバー,37,38 ……支持片,37a,38a …
…突起,39,40 ……支持片,39a,40a ……突起,41,42
……板バネ,43,44 ……検出器,43a,44a ……検出子,
45,46 ……復帰バネ。
FIG. 1 is a plan view showing an outline of the entire apparatus, FIG. 2 is an explanatory view of main parts, FIG. 3 is a partially cutaway side view of the same as above, and FIG. The figure shows a partially cutaway front view of the same as above, FIG. 6 is a plan view of the automatic return structure of the measurement pedestal, FIG. 7 is a side view of the measurement drive camshaft, FIG. 8 is a front view of the same, and FIG. 9 is a plan view of the same. Figures 10a to 10f are flow charts showing the movement of the measurement pedestal and the movement of the contact probe in response to the movement of the measurement drive cam shaft, and Figures 11a to 11f are the objects to be measured of the present invention. 12 a, b, 13 a, b, 14 a,
3B is a side view and a front view, respectively, showing the types of contact probes. 1 ... Airframe, 2 ... DUT, 3 ... Indicator, 4 ... Recorder, 5 ... Base, 6 ... Guide rail, 7 ... Pedestal,
8 ... Pedestal, 9 ... Measurement drive cam shaft, 9a, 9b ... Cam,
9c …… Plane cam part, 13, 14 …… Working plate, 15 …… Cradle, 1
7,18 …… Mounting piece, 19,20 …… Bolt, 21 …… Spring support piece, 22 …… Spiral spring, 23,24 …… Mounting piece, 25,26
...... Bolts, 27 ...... Spring support pieces, 28 ...... Spiral springs, 29 ...... Detection base, 30 ...... Surface plate, 31 ...... Adjustment bolts, 32
…… Slide board, 33 …… Adjustment bolt, 34 …… Contact probe, 35,36 …… Lever, 37,38 …… Supporting piece, 37a, 38a ……
… Protrusion, 39,40 …… Supporting piece, 39a, 40a …… Protrusion, 41,42
...... Leaf springs, 43,44 …… Detectors, 43a, 44a …… Detectors,
45,46 ...... Return spring.

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】機体の上部一側に被測定物を交換可能にセ
ットするとともに、上記機体に、割出しギア構造体、お
よび、ゼネバ機構などによって上記被測定物の設計ピッ
チに適合するピッチで被測定物の軸線と平行に間欠移動
する基台を設け、該基台上に、これの間欠移動方向と直
交する方向にカム(9a)によって移動可能で、かつ、発条
の作用で一側方向に付勢された台座(7)を乗載するとと
もに、この台座(7)上に、該台座(7)と直交する方向にカ
ム(9b)によって移動可能で、かつ、発条の作用で一側方
向に付勢された台座(8)を乗載せしめ、 一方、上記台座(8)上に検出台を設けるとともに、この
検出台上に、上記台座(7)の移動方向と同じ方向に調節
移動可能な定盤(30)を設け、更に、この定盤(30)上に、
上記台座(8)の移動方向と同じ方向に調節移動可能なス
ライド盤(32)を乗載し、上記定盤(30)とスライド盤(32)
の前部に、夫々上記被測定物の溝内に介入しうる接触測
定子(34)を先端に交換可能に設けたレバー(35),(36) を
各別に軸支せしめ、該両レバー(35),(36) の後端部に、
上記定盤(30)とスライド盤(32)に各別に設けた検出器の
検出子を圧接させ、上記両検出器を演算ユニツトをもつ
指示計に電気的に接続するとともに、更に、該指示計を
記録計に電気的に接続したことを特徴とする直線状ピッ
チの自動連続測定装置。
1. An object to be measured is set so as to be replaceable on one side of an upper part of the machine body, and the machine body is arranged at a pitch suitable for a designed pitch of the object to be measured by an indexing gear structure and a Geneva mechanism. A base that intermittently moves in parallel with the axis of the object to be measured is provided, and the base can be moved by a cam (9a) in a direction orthogonal to the intermittent movement direction of the base, and a unidirectional direction by the action of a spring. The pedestal (7) is urged on the pedestal, and the cam (9b) is movable on the pedestal (7) in the direction orthogonal to the pedestal (7), and one side is formed by the action of the spring. The pedestal (8) urged in the direction is mounted on the pedestal, while the detection base is provided on the pedestal (8), and the detection base is adjusted and moved in the same direction as the movement direction of the pedestal (7). A possible surface plate (30) is provided, and further on this surface plate (30),
A slide board (32) that can be adjusted and moved in the same direction as the movement direction of the pedestal (8) is mounted, and the surface plate (30) and the slide board (32) are mounted.
The levers (35) and (36), each of which has a replaceable contact probe (34) which can intervene in the groove of the object to be measured, are provided at the front of the lever, respectively. 35), (36) at the rear end,
The detectors of the detectors provided separately on the surface plate (30) and the slide plate (32) are brought into pressure contact with each other, and both detectors are electrically connected to an indicator having an arithmetic unit. An automatic continuous measuring device for a linear pitch, which is characterized in that the is electrically connected to a recorder.
JP32442988A 1988-12-21 1988-12-21 Automatic continuous measuring device for linear pitch Expired - Lifetime JPH0648163B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP32442988A JPH0648163B2 (en) 1988-12-21 1988-12-21 Automatic continuous measuring device for linear pitch

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP32442988A JPH0648163B2 (en) 1988-12-21 1988-12-21 Automatic continuous measuring device for linear pitch

Publications (2)

Publication Number Publication Date
JPH02168101A JPH02168101A (en) 1990-06-28
JPH0648163B2 true JPH0648163B2 (en) 1994-06-22

Family

ID=18165702

Family Applications (1)

Application Number Title Priority Date Filing Date
JP32442988A Expired - Lifetime JPH0648163B2 (en) 1988-12-21 1988-12-21 Automatic continuous measuring device for linear pitch

Country Status (1)

Country Link
JP (1) JPH0648163B2 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2331368A (en) 1997-11-12 1999-05-19 Technologies Research Holding Method and apparatus for measuring double-toothing sprocket wheels
CN104760001B (en) * 2015-04-02 2017-01-18 中航飞机股份有限公司西安飞机分公司 Pitch measuring method and clamp for screw

Also Published As

Publication number Publication date
JPH02168101A (en) 1990-06-28

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