JPH06349685A - Manufacture of organic semiconductor solid electrolytic capacitor - Google Patents
Manufacture of organic semiconductor solid electrolytic capacitorInfo
- Publication number
- JPH06349685A JPH06349685A JP13455993A JP13455993A JPH06349685A JP H06349685 A JPH06349685 A JP H06349685A JP 13455993 A JP13455993 A JP 13455993A JP 13455993 A JP13455993 A JP 13455993A JP H06349685 A JPH06349685 A JP H06349685A
- Authority
- JP
- Japan
- Prior art keywords
- solid electrolytic
- aqueous solution
- electrolytic capacitor
- organic semiconductor
- capacitor element
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Fixed Capacitors And Capacitor Manufacturing Machines (AREA)
Abstract
Description
【0001】[0001]
【産業上の利用分野】本発明は固体電解質としてTCN
Q錯塩を用いた有機半導体固体電解コンデンサの製造方
法に関するものである。The present invention relates to TCN as a solid electrolyte.
The present invention relates to a method for manufacturing an organic semiconductor solid electrolytic capacitor using a Q complex salt.
【0002】[0002]
【従来の技術】電解質としてTCNQ錯塩を使用する有
機半導体固体電解コンデンサの例は、特公平3−765
73号に開示されている。ここでTCNQとは、7,7,
8,8-テトラシアノキノジメタンの略称である。2. Description of the Related Art An example of an organic semiconductor solid electrolytic capacitor using a TCNQ complex salt as an electrolyte is disclosed in Japanese Patent Publication No. 3-765.
No. 73. Here, TCNQ is 7,7,
It is an abbreviation for 8,8-tetracyanoquinodimethane.
【0003】前記特公平3−76573号に開示され
た、N位をアルキル基で置換したイソキノリンとのTC
NQ錯塩を用いた固体電解コンデンサは、優れた高周波
特性を有し、スイッチング電源用等として利用されてい
る。TC with isoquinoline in which the N-position is substituted with an alkyl group, as disclosed in the above Japanese Patent Publication No. 3-76573.
Solid electrolytic capacitors using NQ complex salts have excellent high frequency characteristics and are used for switching power supplies and the like.
【0004】[0004]
【発明が解決しようとする課題】しかしながら、TCN
Q錯塩を用いた固体電解コンデンサは、液体の電解質を
用いた所謂アルミニウム乾式電解コンデンサに比べて、
陽極酸化、陽極化成により設けられた弁金属の酸化被膜
の修復性が弱く、25Vを超える電圧を印加して高温負
荷試験を行うとショート不良が頻発するという問題があ
った。[Problems to be Solved by the Invention] However, TCN
The solid electrolytic capacitor using the Q complex salt has a higher electric conductivity than a so-called aluminum dry electrolytic capacitor using a liquid electrolyte.
There is a problem that the repairability of the oxide film of the valve metal provided by anodic oxidation and anodization is weak, and short-circuit defects frequently occur when a high temperature load test is performed by applying a voltage exceeding 25V.
【0005】すなわち、TCNQ錯塩を用いた固体電解
コンデンサで定格電圧が25Vを超えるものを製品化す
ることは不可能であると考えられていた。That is, it was considered impossible to commercialize a solid electrolytic capacitor using a TCNQ complex salt with a rated voltage exceeding 25V.
【0006】これに対して本発明は、TCNQ錯塩を用
いた固体電解コンデンサの製造方法を改善することによ
って、定格電圧が25Vを超えるものの製品化を図ろう
とするものである。On the other hand, the present invention intends to commercialize a solid electrolytic capacitor using a TCNQ complex salt by improving the manufacturing method thereof, even if the rated voltage exceeds 25V.
【0007】[0007]
【課題を解決するための手段】本発明による有機半導体
固体電解コンデンサの製造方法は、陽極箔、陰極箔、セ
パレータ紙にて構成される巻回型のコンデンサ素子を、
少なくともリン酸イオンとナトリウムイオンとを含有す
る水溶液に浸漬する工程と、該コンデンサ素子内に残存
する水分を揮散させる工程と、該コンデンサ素子にTC
NQ錯塩を含浸させる工程とを備えることを特徴とする
ものである。A method of manufacturing an organic semiconductor solid electrolytic capacitor according to the present invention comprises a winding type capacitor element composed of an anode foil, a cathode foil and a separator paper.
A step of immersing in an aqueous solution containing at least phosphate ions and sodium ions; a step of volatilizing water remaining in the capacitor element;
And a step of impregnating with an NQ complex salt.
【0008】[0008]
【作用】本発明の製造方法によれば、コンデンサ素子内
の誘電体酸化被膜がリン酸イオンとナトリウムイオンと
の相互作用によって変性し、TCNQ錯塩に対する前記
酸化被膜の修復性が向上し、コンデンサ完成品としての
耐圧特性が向上する。According to the manufacturing method of the present invention, the dielectric oxide film in the capacitor element is modified by the interaction between the phosphate ion and the sodium ion, the recoverability of the oxide film against the TCNQ complex salt is improved, and the capacitor is completed. The withstand voltage characteristics of the product are improved.
【0009】[0009]
【実施例】以下、本発明を導き出すに至った実験の経緯
に従いながら、本発明の実施例について説明する。EXAMPLES Examples of the present invention will be described below in accordance with the history of experiments leading to the present invention.
【0010】まず、アルミニウムの陽極箔とその対向陰
極箔との間にセパレータ紙を挟み、円筒状に巻回してコ
ンデンサ素子を作成する。First, a separator paper is sandwiched between an aluminum anode foil and an opposing cathode foil and wound in a cylindrical shape to form a capacitor element.
【0011】次に、このコンデンサ素子の陽極箔の化成
処理とセパレータ紙の炭化処理を行う。Next, the anode foil of this capacitor element is subjected to chemical conversion treatment and separator paper is subjected to carbonization treatment.
【0012】次に、このコンデンサ素子を表1に示すよ
うな各種水溶液に10分間浸漬する(比較例2は浸漬せ
ず)。Next, this capacitor element is dipped in various aqueous solutions as shown in Table 1 for 10 minutes (comparative example 2 is not dipped).
【0013】[0013]
【表1】 [Table 1]
【0014】次に、このコンデンサ素子を85℃で乾燥
し、残存する水分を揮散させる。Next, the capacitor element is dried at 85 ° C. to volatilize residual water.
【0015】次に、耐圧性に優れたTCNQ錯塩(本願
発明者らが特願平5−50674号にて説明した、N,
N’-1,8-n-オクチル・3,5-ルチジン2・TCN
Q4)を直径4mmのアルミケースに入れ、該TCNQ
錯塩を300℃の熱盤上で加熱して融解させ、該液状の
TCNQ錯塩に予熱しておいた前記コンデンサ素子を浸
漬した後急冷することによって、コンデンサ素子にTC
NQ錯塩を含浸させる。Next, a TCNQ complex salt having excellent pressure resistance (N, N, which was described by the present inventors in Japanese Patent Application No. 5-50674),
N'-1,8-n-octyl-3,5-lutidine 2 -TCN
Q 4) were placed in an aluminum case with a diameter of 4mm, the TCNQ
The complex salt is heated on a hot plate at 300 ° C. to be melted, and the preheated capacitor element is immersed in the liquid TCNQ complex salt, and then rapidly cooled, whereby the TC is added to the capacitor element.
Impregnate with NQ complex salt.
【0016】最後に、前記アルミケースの開口部をエポ
キシ樹脂にて封止し、約125℃で1時間、定格電圧
(DC35V)を印加してエイジングを行い、固体電解
コンデンサを得る。Finally, the opening of the aluminum case is sealed with an epoxy resin, and a rated voltage (DC35V) is applied at about 125 ° C. for 1 hour to perform aging to obtain a solid electrolytic capacitor.
【0017】このようにして得られた固体電解コンデン
サの各試料について、初期特性を測定した後、高温負荷
試験を行ってショート不良の発生状況を調べた。その結
果を表2に示す。ここで、高温負荷試験とは、105℃
に昇温して、定格電圧(DC35V)を印加しながら1
000時間放置するというものである。With respect to each sample of the solid electrolytic capacitor thus obtained, the initial characteristics were measured, and then a high temperature load test was conducted to examine the occurrence status of short circuit failure. The results are shown in Table 2. Here, the high temperature load test is 105 ° C.
1 while heating to and applying the rated voltage (DC35V)
It is to leave it for 000 hours.
【0018】[0018]
【表2】 [Table 2]
【0019】表2において、C(静電容量)及びtan
δ(損失角の正接)は120Hzで測定したものであ
り、ESR(等価直列抵抗)は100kHzで測定した
ものであり、LC(漏れ電流)は定格電圧を印加した
後、30秒後に測定したものである。また、各測定値は
試料数各100個の内の良品についての平均値であり、
LCの良否に関しては1μA以下を良品とし、LC良品
の試料についてのみ高温負荷試験を行った。In Table 2, C (electrostatic capacity) and tan
δ (tangent of loss angle) was measured at 120 Hz, ESR (equivalent series resistance) was measured at 100 kHz, and LC (leakage current) was measured 30 seconds after the rated voltage was applied. Is. In addition, each measured value is an average value for non-defective products out of 100 samples each,
Regarding LC quality, 1 μA or less was regarded as a good product, and a high temperature load test was performed only on the LC good sample.
【0020】表2からわかるように、リン酸イオンとナ
トリウムイオンの両方を含む水溶液に浸漬する処理を施
した実施例1〜6においては、リン酸イオンとアンモニ
ウムイオンを含む水溶液に浸漬する処理を施した比較例
1や、そのような浸漬処理を施さなかった比較例2に比
べて、初期特性におけるLC歩留りが高く、高温負荷試
験でのショート不良も全く発生していない。As can be seen from Table 2, in Examples 1 to 6 which were immersed in an aqueous solution containing both phosphate ions and sodium ions, the immersion treatment in an aqueous solution containing phosphate ions and ammonium ions was performed. Compared to Comparative Example 1 in which the dipping treatment was performed and Comparative Example 2 in which such a dipping treatment was not performed, the LC yield in the initial characteristics was high, and no short circuit failure occurred in the high temperature load test.
【0021】このようにして、「有機半導体固体電解コ
ンデンサの製造工程において、コンデンサ素子を、少な
くともリン酸イオンとナトリウムイオンとを含有する水
溶液に浸漬する処理を施せば、該コンデンサの耐圧が向
上する。」という本発明の主題が導き出された。Thus, in the process of manufacturing an organic semiconductor solid electrolytic capacitor, if the capacitor element is immersed in an aqueous solution containing at least phosphate ions and sodium ions, the withstand voltage of the capacitor is improved. Has been derived.
【0022】なお、前記実施例の1〜4を比較すると、
リン酸イオンとナトリウムイオンとを含有する水溶液の
濃度が高くなると、Cが低下、tanδが上昇、ESR
が上昇するという特性劣化の傾向が見られ、該濃度をあ
まり高くしすぎることは好ましくない。Incidentally, comparing 1 to 4 of the above embodiments,
When the concentration of the aqueous solution containing phosphate ion and sodium ion increases, C decreases, tan δ increases, ESR increases.
There is a tendency for the characteristics to deteriorate, that is, it is not preferable to make the concentration too high.
【0023】[0023]
【発明の効果】本発明によれば、高周波特性や漏れ電流
特性に優れ、高温負荷試験におけるショート不良も発生
しないような、耐圧の高い固体電解コンデンサが得られ
る。According to the present invention, it is possible to obtain a solid electrolytic capacitor having a high withstand voltage which is excellent in high frequency characteristics and leakage current characteristics and which does not cause a short circuit failure in a high temperature load test.
Claims (4)
される巻回型のコンデンサ素子を、少なくともリン酸イ
オンとナトリウムイオンとを含有する水溶液に浸漬する
工程と、該コンデンサ素子内に残存する水分を揮散させ
る工程と、該コンデンサ素子内にTCNQ錯塩を含浸さ
せる工程とを備えることを特徴とする有機半導体固体電
解コンデンサの製造方法。1. A step of immersing a wound-type capacitor element composed of an anode foil, a cathode foil, and separator paper in an aqueous solution containing at least phosphate ions and sodium ions, and remaining in the capacitor element. And a step of impregnating the capacitor element with a TCNQ complex salt, the method for producing an organic semiconductor solid electrolytic capacitor.
ムイオンとを含有する水溶液は、リン酸二水素ナトリウ
ムの水溶液であることを特徴とする請求項1記載の有機
半導体固体電解コンデンサの製造方法。2. The method for producing an organic semiconductor solid electrolytic capacitor according to claim 1, wherein the aqueous solution containing at least phosphate ions and sodium ions is an aqueous solution of sodium dihydrogen phosphate.
ムイオンとを含有する水溶液は、リン酸一水素二ナトリ
ウムの水溶液であることを特徴とする請求項1記載の有
機半導体固体電解コンデンサの製造方法。3. The method for producing an organic semiconductor solid electrolytic capacitor according to claim 1, wherein the aqueous solution containing at least phosphate ions and sodium ions is an aqueous solution of disodium monohydrogen phosphate.
ムイオンとを含有する水溶液は、リン酸三ナトリウムの
水溶液であることを特徴とする請求項1記載の有機半導
体固体電解コンデンサの製造方法。4. The method for producing an organic semiconductor solid electrolytic capacitor according to claim 1, wherein the aqueous solution containing at least phosphate ion and sodium ion is an aqueous solution of trisodium phosphate.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13455993A JP2840522B2 (en) | 1993-06-04 | 1993-06-04 | Manufacturing method of organic semiconductor solid electrolytic capacitor |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13455993A JP2840522B2 (en) | 1993-06-04 | 1993-06-04 | Manufacturing method of organic semiconductor solid electrolytic capacitor |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH06349685A true JPH06349685A (en) | 1994-12-22 |
JP2840522B2 JP2840522B2 (en) | 1998-12-24 |
Family
ID=15131167
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP13455993A Expired - Fee Related JP2840522B2 (en) | 1993-06-04 | 1993-06-04 | Manufacturing method of organic semiconductor solid electrolytic capacitor |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2840522B2 (en) |
-
1993
- 1993-06-04 JP JP13455993A patent/JP2840522B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
JP2840522B2 (en) | 1998-12-24 |
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