JPH0582631B2 - - Google Patents

Info

Publication number
JPH0582631B2
JPH0582631B2 JP28063085A JP28063085A JPH0582631B2 JP H0582631 B2 JPH0582631 B2 JP H0582631B2 JP 28063085 A JP28063085 A JP 28063085A JP 28063085 A JP28063085 A JP 28063085A JP H0582631 B2 JPH0582631 B2 JP H0582631B2
Authority
JP
Grant status
Grant
Patent type
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP28063085A
Other versions
JPS62139000A (en )
Inventor
Masayuki Hiroguchi
Original Assignee
Nippon Electric Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Grant date

Links

JP28063085A 1985-12-12 1985-12-12 Expired - Lifetime JPH0582631B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP28063085A JPH0582631B2 (en) 1985-12-12 1985-12-12

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP28063085A JPH0582631B2 (en) 1985-12-12 1985-12-12

Publications (2)

Publication Number Publication Date
JPS62139000A true JPS62139000A (en) 1987-06-22
JPH0582631B2 true JPH0582631B2 (en) 1993-11-19

Family

ID=17627724

Family Applications (1)

Application Number Title Priority Date Filing Date
JP28063085A Expired - Lifetime JPH0582631B2 (en) 1985-12-12 1985-12-12

Country Status (1)

Country Link
JP (1) JPH0582631B2 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7355420B2 (en) 2001-08-21 2008-04-08 Cascade Microtech, Inc. Membrane probing system
US7492172B2 (en) 2003-05-23 2009-02-17 Cascade Microtech, Inc. Chuck for holding a device under test
US9429638B2 (en) 2008-11-21 2016-08-30 Cascade Microtech, Inc. Method of replacing an existing contact of a wafer probing assembly

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3141717U (en) * 2008-02-29 2008-05-22 有限会社精巧エンジニアリング Wireless structures of magnetic survey instrument

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7355420B2 (en) 2001-08-21 2008-04-08 Cascade Microtech, Inc. Membrane probing system
US7492175B2 (en) 2001-08-21 2009-02-17 Cascade Microtech, Inc. Membrane probing system
US7492172B2 (en) 2003-05-23 2009-02-17 Cascade Microtech, Inc. Chuck for holding a device under test
US7876115B2 (en) 2003-05-23 2011-01-25 Cascade Microtech, Inc. Chuck for holding a device under test
US9429638B2 (en) 2008-11-21 2016-08-30 Cascade Microtech, Inc. Method of replacing an existing contact of a wafer probing assembly

Also Published As

Publication number Publication date Type
JPS62139000A (en) 1987-06-22 application

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