JPH0570297B2 - - Google Patents

Info

Publication number
JPH0570297B2
JPH0570297B2 JP2176465A JP17646590A JPH0570297B2 JP H0570297 B2 JPH0570297 B2 JP H0570297B2 JP 2176465 A JP2176465 A JP 2176465A JP 17646590 A JP17646590 A JP 17646590A JP H0570297 B2 JPH0570297 B2 JP H0570297B2
Authority
JP
Japan
Prior art keywords
mask
masking blade
alignment
rays
light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP2176465A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0465110A (ja
Inventor
Koichi Hara
Iwao Tokawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SOLEX KK
SORUTETSUKU KK
Original Assignee
SOLEX KK
SORUTETSUKU KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SOLEX KK, SORUTETSUKU KK filed Critical SOLEX KK
Priority to JP2176465A priority Critical patent/JPH0465110A/ja
Publication of JPH0465110A publication Critical patent/JPH0465110A/ja
Publication of JPH0570297B2 publication Critical patent/JPH0570297B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70058Mask illumination systems
    • G03F7/70066Size and form of the illuminated area in the mask plane, e.g. reticle masking blades or blinds

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
JP2176465A 1990-07-05 1990-07-05 X線転写装置 Granted JPH0465110A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2176465A JPH0465110A (ja) 1990-07-05 1990-07-05 X線転写装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2176465A JPH0465110A (ja) 1990-07-05 1990-07-05 X線転写装置

Publications (2)

Publication Number Publication Date
JPH0465110A JPH0465110A (ja) 1992-03-02
JPH0570297B2 true JPH0570297B2 (ko) 1993-10-04

Family

ID=16014161

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2176465A Granted JPH0465110A (ja) 1990-07-05 1990-07-05 X線転写装置

Country Status (1)

Country Link
JP (1) JPH0465110A (ko)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4630567B2 (ja) * 2004-04-23 2011-02-09 キヤノン株式会社 露光装置およびデバイス製造方法
JP2007095767A (ja) * 2005-09-27 2007-04-12 Nikon Corp 露光装置

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0311613A (ja) * 1989-06-08 1991-01-18 Nippon Telegr & Teleph Corp <Ntt> ブラインド装置

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0311613A (ja) * 1989-06-08 1991-01-18 Nippon Telegr & Teleph Corp <Ntt> ブラインド装置

Also Published As

Publication number Publication date
JPH0465110A (ja) 1992-03-02

Similar Documents

Publication Publication Date Title
JP5127875B2 (ja) リソグラフィ装置及び物品の製造方法
KR100465254B1 (ko) 투영리소그래피장치및그제조방법
US5055871A (en) Method and apparatus for enhancing illumination uniformity in wafer steppers using photochromic glass in the optical path
JP2860578B2 (ja) 露光装置
US5600698A (en) X-ray exposure apparatus
US20240094647A1 (en) Patterning device conditioning system and method
JP2805220B2 (ja) 露光装置
JPH0570297B2 (ko)
US6453000B1 (en) Exposure method, exposure device and semiconductor device manufacturing method
JPH08227851A (ja) ホトリソグラフィ方法及びそれに使用するホトリソグラフィシステム
JP3180133B2 (ja) 投影露光装置
KR0179297B1 (ko) 반도체 노광 장치
US6463119B1 (en) Exposure method, exposure apparatus and semiconductor manufacturing apparatus
JPH09230610A (ja) 投影露光方法および装置
JPS5915380B2 (ja) 微細パタ−ンの転写装置
JP3405500B2 (ja) X線露光方法
JPH04307923A (ja) X線露光装置
JPS62217616A (ja) X線マスクの製造方法
JPH0943851A (ja) 投影露光装置
JPH05175103A (ja) X線露光装置
JPS6352409A (ja) 縮小投影露光装置
JPH0277112A (ja) 電子ビーム露光法
JPS599663A (ja) 縮小投影露光方法
JPS61144020A (ja) 露光装置
JPS62160724A (ja) X線露光方法