JPH054034B2 - - Google Patents
Info
- Publication number
- JPH054034B2 JPH054034B2 JP60140767A JP14076785A JPH054034B2 JP H054034 B2 JPH054034 B2 JP H054034B2 JP 60140767 A JP60140767 A JP 60140767A JP 14076785 A JP14076785 A JP 14076785A JP H054034 B2 JPH054034 B2 JP H054034B2
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor integrated
- switch means
- integrated circuit
- signal line
- test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60140767A JPS62876A (ja) | 1985-06-27 | 1985-06-27 | 半導体集積回路用試験装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60140767A JPS62876A (ja) | 1985-06-27 | 1985-06-27 | 半導体集積回路用試験装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS62876A JPS62876A (ja) | 1987-01-06 |
| JPH054034B2 true JPH054034B2 (en, 2012) | 1993-01-19 |
Family
ID=15276270
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP60140767A Granted JPS62876A (ja) | 1985-06-27 | 1985-06-27 | 半導体集積回路用試験装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS62876A (en, 2012) |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5751734B2 (en, 2012) * | 1973-12-26 | 1982-11-04 | ||
| JPS5694965U (en, 2012) * | 1979-12-21 | 1981-07-28 |
-
1985
- 1985-06-27 JP JP60140767A patent/JPS62876A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS62876A (ja) | 1987-01-06 |
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