JPH05347342A - Ic handling device - Google Patents

Ic handling device

Info

Publication number
JPH05347342A
JPH05347342A JP15487092A JP15487092A JPH05347342A JP H05347342 A JPH05347342 A JP H05347342A JP 15487092 A JP15487092 A JP 15487092A JP 15487092 A JP15487092 A JP 15487092A JP H05347342 A JPH05347342 A JP H05347342A
Authority
JP
Japan
Prior art keywords
unit
electrical
measurement
supply
defective
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP15487092A
Other languages
Japanese (ja)
Inventor
Hiroshi Nakao
浩士 中尾
Original Assignee
Nec Corp
日本電気株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nec Corp, 日本電気株式会社 filed Critical Nec Corp
Priority to JP15487092A priority Critical patent/JPH05347342A/en
Publication of JPH05347342A publication Critical patent/JPH05347342A/en
Withdrawn legal-status Critical Current

Links

Abstract

PURPOSE:To shorten the index time and improve measure processing capacity by performing the supply of an IC to an electric property measure and the accommodation of the IC from the measure with one carriage system in parallel. CONSTITUTION:The IC 2 inside a supply part 1 is held with the chuck of the carrier 9 attached to the top of a rotary arm, and is carried to a property measuring part 5 by rotating the arm, and the electric property of the IC2 is measured. At this time, the carrier 9 on opposite side holds the next IC2. After completion of measurement, in the case of superior goods, it is rotated 90 deg. right and in the case of inferior goods, 90 deg. left, and the ICs 2 are accommodated in a superior storage 3 and an inferior storage 4, respectively. The next IC2 is shifted to the property measuring part 5 by rotating further after accommodation.

Description

【発明の詳細な説明】Detailed Description of the Invention
【0001】[0001]
【産業上の利用分野】本発明はICのハンドリング装置
に関し、特に電気的特性の測定に用いられるハンドリン
グ装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an IC handling device, and more particularly to a handling device used for measuring electrical characteristics.
【0002】[0002]
【従来の技術】従来のICのハンドリング装置は、図4
の側面図に示す様に、IC2を保持するチャック部10
と電気的特性の測定時にソケット7にIC2を押え付け
るプッシャ部11とからなる搬送部9が搬送用レール1
2に取り付けられる。また、装置基板8には、電気的特
性の測定を行う前のIC2を供給する供給部1と、電気
的特性の測定の結果IC2が良品の時に収納する良品収
納部3及び不良の時に収納する不良品収納部4とが取り
付けられる。
2. Description of the Related Art A conventional IC handling device is shown in FIG.
As shown in the side view of FIG.
And a pusher portion 11 that holds the IC 2 against the socket 7 when measuring the electrical characteristics.
It is attached to 2. Further, the device substrate 8 is provided with a supply unit 1 for supplying the IC 2 before the measurement of the electrical characteristics, a good product storage unit 3 for storing the IC 2 when the result of the measurement of the electrical characteristics is non-defective, and a non-defective product. The defective product storage unit 4 is attached.
【0003】その動作は、搬送部9が搬送用レール12
上を移動することにより、まず供給部1でIC2を保持
し、次に、テスター等と接続された特性測定部5上に取
り付けられたIC2の品種に対応した配線および部品の
取り付けを施こされたテストボード6上のソケット7
に、IC2をプッシャ部11で挿入または押さえ付ける
ことによりIC2の電気的特性の測定を行い、次に、I
C2の電気的特性の結果により、IC2を良品収納部3
及び不良品収納部4に収納する。
In the operation, the carrier 9 is carried by the carrier rail 12
By moving up, the IC 2 is first held by the supply unit 1, and then the wiring and components corresponding to the type of the IC 2 mounted on the characteristic measuring unit 5 connected to the tester or the like are attached. Socket on test board 6
Then, the electric characteristics of the IC2 are measured by inserting or pressing the IC2 with the pusher portion 11. Next, I
According to the result of the electrical characteristics of C2, the IC2 is set to the non-defective product storage unit 3
And the defective product storage unit 4.
【0004】[0004]
【発明が解決しようとする課題】この従来のICのハン
ドリング装置では、ICの供給,電気的特性の測定,I
Cの収納を1つの搬送系で行うため、ICの電気的特性
の測定に要する時間に対しICの搬送に要する時間の比
率が高くなり、テスターの測定処理能力が低下するとい
う問題点があった。
In this conventional IC handling device, IC supply, measurement of electrical characteristics, and I
Since C is stored in one transport system, the ratio of the time required to transport the IC to the time required to measure the electrical characteristics of the IC is increased, and the measurement processing capability of the tester is reduced. .
【0005】[0005]
【課題を解決するための手段】本発明のICのハンドリ
ング装置は、回転アームの先端に取り付けられたそれぞ
れ同等の機能を持つ複数のIC搬送部と、前記搬送部が
回転運動を行う円周上にICの供給部,特性測定部,良
品収納部,不良品収納部とを備え、一搬送部でのICの
電気的特性の測定と並列して他の搬送部ではICの供
給,収納および分類を行う構造を有する。
SUMMARY OF THE INVENTION An IC handling device of the present invention comprises a plurality of IC transfer parts, each having an equivalent function, attached to the tip of a rotating arm, and a circular motion of the transfer parts. Is equipped with an IC supply unit, a characteristic measuring unit, a non-defective product storage unit, and a defective product storage unit, and in parallel with the measurement of the electrical characteristics of the IC in one transfer unit, the IC supply, storage and classification in the other transfer unit. Has a structure for performing.
【0006】[0006]
【実施例】次に本発明について図面を参照して説明す
る。図1は本発明の第1の実施例の平面図,図2はその
側面図を示す。
The present invention will be described below with reference to the drawings. 1 is a plan view of a first embodiment of the present invention, and FIG. 2 is a side view thereof.
【0007】回転アームの両端に搬送部9が取り付けら
れ、IC2の電気的特性の測定に際し、一方の搬送部9
が供給部1の上部に回転移動し、搬送部9のチャック部
10でIC2を保持する。次に180°回転した搬送部
9が特性測定部5上に取り付けられたIC2の品種に対
応した配線および部品の取り付けを施されたテストボー
ド6上のソケット7に、IC2をプッシャ部11で挿入
または押さえ付けることによりIC2の電気的特性を測
定する。
Transporting parts 9 are attached to both ends of the rotary arm, and one of the transporting parts 9 is used for measuring the electrical characteristics of the IC 2.
Rotates to the upper portion of the supply unit 1, and the chuck unit 10 of the transfer unit 9 holds the IC 2. Next, the IC 2 is inserted by the pusher unit 11 into the socket 7 on the test board 6 on which the wiring unit and the component corresponding to the type of the IC 2 mounted on the characteristic measuring unit 5 are attached by the conveying unit 9 rotated by 180 °. Alternatively, the electrical characteristics of IC2 are measured by pressing.
【0008】この時、反対側の搬送部9では、次のIC
2を供給部1で保持している。一方の側のIC2の電気
的特性の測定が完了後、良品の場合は右回転に90°,
不良品の場合は左回転に90°搬送部9が回転動作を行
い、それぞれ良品収納部3あるいは不良品収納部4にI
C2を収納する。さらに90°回転し、反対側の搬送部
に保持した次のIC2を特性測定部5に搬送する。後
は、90°回転の繰り返しで、2つの搬送部9により供
給,測定,収納が行なわれる。この例では、IC2の供
給と同時に反対側の搬送部9で測定が行なわれるため効
率が良い。
At this time, in the carrying section 9 on the opposite side, the next IC
2 is held by the supply unit 1. After the measurement of the electrical characteristics of IC2 on one side is completed, in the case of a good product, it is rotated clockwise by 90 °,
In the case of a defective product, the conveying unit 9 rotates 90 ° counterclockwise, and I is stored in the good product storage unit 3 or the defective product storage unit 4, respectively.
Store C2. Further, the IC2 is rotated by 90 °, and the next IC2 held in the conveying section on the opposite side is conveyed to the characteristic measuring section 5. After that, the 90 ° rotation is repeated to supply, measure, and store by the two transport units 9. In this example, the efficiency is good because the measurement is performed by the transport unit 9 on the opposite side at the same time when the IC 2 is supplied.
【0009】図3は本発明の第2の実施例の平面図であ
る。第2の実施例では、電気的特性の測定において、良
品のランク分けに応じた良品収納部3a〜3cが搬送部
9の回転運動の円周上に設けられており、電気的特性の
測定結果によりIC2を分類することが出来る。
FIG. 3 is a plan view of the second embodiment of the present invention. In the second embodiment, in the measurement of electrical characteristics, the non-defective item storage portions 3a to 3c according to the rank classification of non-defective items are provided on the circumference of the rotational movement of the transport portion 9, and the measurement result of the electrical characteristic is obtained. IC2 can be classified by.
【0010】[0010]
【発明の効果】以上説明した様に本発明は、ICの電気
的特性の測定とICの供給,収納とを並列に行うことに
より、ICの電気的特性の測定時間に対するICの搬送
に要する時間の比率を下げることが出来るので、テスタ
ーの測定処理能力が向上するという効果を有する。
As described above, according to the present invention, by measuring the electric characteristics of the IC and supplying and housing the ICs in parallel, the time required to convey the ICs with respect to the time for measuring the electric characteristics of the ICs. Since it is possible to reduce the ratio, the measurement processing capability of the tester is improved.
【図面の簡単な説明】[Brief description of drawings]
【図1】本発明の第1の実施例の平面図である。FIG. 1 is a plan view of a first embodiment of the present invention.
【図2】図1の側面図である。FIG. 2 is a side view of FIG.
【図3】本発明の第2の実施例の平面図である。FIG. 3 is a plan view of a second embodiment of the present invention.
【図4】従来のICのハンドリング装置の側面図であ
る。
FIG. 4 is a side view of a conventional IC handling device.
【符号の説明】[Explanation of symbols]
1 供給部 2 IC 3 良品収納部 3a〜3c 良品収納部 4 不良品収納部 5 特性測定部 6 テストボード 7 ソケット 8 装置基板 9 搬送部 10 チャック部 11 プッシャー部 12 搬送用レール 1 Supply Unit 2 IC 3 Goods Storage Units 3a to 3c Goods Storage Unit 4 Defective Products Storage Unit 5 Characteristic Measurement Unit 6 Test Board 7 Socket 8 Device Board 9 Transport Unit 10 Chuck Unit 11 Pusher Unit 12 Transport Rail

Claims (1)

    【特許請求の範囲】[Claims]
  1. 【請求項1】 組立てられたICの電気的特性を測定す
    るICのハンドリング装置において、同等の機能を有す
    る少なくとも2つ以上のIC搬送部をそれぞれ回転アー
    ムの先端に取り付け、前記搬送部が回転運動を行うこと
    により一搬送部でのICの電気的特性の測定と並列して
    他の搬送部ではICの供給,収納及び分類を行うことを
    特徴とするICのハンドリング装置。
    1. An IC handling device for measuring the electrical characteristics of an assembled IC, wherein at least two or more IC transfer parts having the same function are attached to the tips of respective rotary arms, and said transfer parts rotate. By carrying out the above, the IC handling device is characterized in that, in parallel with the measurement of the electrical characteristics of the IC in one transfer section, the IC is supplied, stored and sorted in the other transfer section.
JP15487092A 1992-06-15 1992-06-15 Ic handling device Withdrawn JPH05347342A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15487092A JPH05347342A (en) 1992-06-15 1992-06-15 Ic handling device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15487092A JPH05347342A (en) 1992-06-15 1992-06-15 Ic handling device

Publications (1)

Publication Number Publication Date
JPH05347342A true JPH05347342A (en) 1993-12-27

Family

ID=15593729

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15487092A Withdrawn JPH05347342A (en) 1992-06-15 1992-06-15 Ic handling device

Country Status (1)

Country Link
JP (1) JPH05347342A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL1017272C2 (en) * 2001-01-16 2002-07-17 Fico Bv Device and method for testing electronic components.
KR100857580B1 (en) * 2004-11-30 2008-09-09 엔이씨 일렉트로닉스 가부시키가이샤 Visual inspection apparatus and carrier for visual inspection apparatus
CN102288119A (en) * 2011-06-27 2011-12-21 上海卓晶半导体科技有限公司 Device for automatically detecting flatness and thickness of substrates and separating substrates

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL1017272C2 (en) * 2001-01-16 2002-07-17 Fico Bv Device and method for testing electronic components.
WO2002056037A1 (en) * 2001-01-16 2002-07-18 Fico B.V. Device and method for testing electronic components
JP2004526131A (en) * 2001-01-16 2004-08-26 フィーコ ビー.ブイ. Apparatus and method for testing electronic components
KR100857580B1 (en) * 2004-11-30 2008-09-09 엔이씨 일렉트로닉스 가부시키가이샤 Visual inspection apparatus and carrier for visual inspection apparatus
CN102288119A (en) * 2011-06-27 2011-12-21 上海卓晶半导体科技有限公司 Device for automatically detecting flatness and thickness of substrates and separating substrates

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Legal Events

Date Code Title Description
A300 Withdrawal of application because of no request for examination

Free format text: JAPANESE INTERMEDIATE CODE: A300

Effective date: 19990831