JPH0533974Y2 - - Google Patents

Info

Publication number
JPH0533974Y2
JPH0533974Y2 JP19269187U JP19269187U JPH0533974Y2 JP H0533974 Y2 JPH0533974 Y2 JP H0533974Y2 JP 19269187 U JP19269187 U JP 19269187U JP 19269187 U JP19269187 U JP 19269187U JP H0533974 Y2 JPH0533974 Y2 JP H0533974Y2
Authority
JP
Japan
Prior art keywords
package
measurement probe
probe assembly
comb
measurement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP19269187U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0197263U (de
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP19269187U priority Critical patent/JPH0533974Y2/ja
Publication of JPH0197263U publication Critical patent/JPH0197263U/ja
Application granted granted Critical
Publication of JPH0533974Y2 publication Critical patent/JPH0533974Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
JP19269187U 1987-12-21 1987-12-21 Expired - Lifetime JPH0533974Y2 (de)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19269187U JPH0533974Y2 (de) 1987-12-21 1987-12-21

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19269187U JPH0533974Y2 (de) 1987-12-21 1987-12-21

Publications (2)

Publication Number Publication Date
JPH0197263U JPH0197263U (de) 1989-06-28
JPH0533974Y2 true JPH0533974Y2 (de) 1993-08-27

Family

ID=31483531

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19269187U Expired - Lifetime JPH0533974Y2 (de) 1987-12-21 1987-12-21

Country Status (1)

Country Link
JP (1) JPH0533974Y2 (de)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006261144A (ja) * 2005-03-15 2006-09-28 Minowa Koa Inc 抵抗器の製造法及び抵抗器の検測装置

Also Published As

Publication number Publication date
JPH0197263U (de) 1989-06-28

Similar Documents

Publication Publication Date Title
JP2709570B2 (ja) 電気試験プローブ用位置決め装置
US5646542A (en) Probing adapter for testing IC packages
US4308498A (en) Kelvin test fixture for electrically contacting miniature, two terminal, leadless, electrical components
US5184065A (en) Twist lock probe tip
JPH0533974Y2 (de)
JPH07508351A (ja) 電流を流す導体を結合するための端子
JPH0533973Y2 (de)
JP3790041B2 (ja) プローブおよび検査装置
JPH0342377Y2 (de)
JPH0533972Y2 (de)
JPS62222164A (ja) 電気プロ−ブ
JPS5828360Y2 (ja) Icクリツプ
JPH0742140Y2 (ja) プローブのアース構造
JP3132465B2 (ja) 半導体装置及びプローブユニット
JPH05240877A (ja) 半導体集積回路測定用プローバ
JPH065321A (ja) Icクリップ
JPS5826388Y2 (ja) 点検用アダプタ
JPH08179003A (ja) 表面実装部品測定端子取付器
JP2526212Y2 (ja) Icソケット
JP2725285B2 (ja) Icリード測定装置
JPH0541420A (ja) プローブカード
JPH0210462Y2 (de)
JPS61259176A (ja) プロ−ブ
JP3056088B2 (ja) 電子部品特性測定用治具
JPH0524061Y2 (de)