JPH05287541A - Substitution gold plating liquid - Google Patents

Substitution gold plating liquid

Info

Publication number
JPH05287541A
JPH05287541A JP12262292A JP12262292A JPH05287541A JP H05287541 A JPH05287541 A JP H05287541A JP 12262292 A JP12262292 A JP 12262292A JP 12262292 A JP12262292 A JP 12262292A JP H05287541 A JPH05287541 A JP H05287541A
Authority
JP
Japan
Prior art keywords
gold plating
displacement
plating solution
alkali
layer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP12262292A
Other languages
Japanese (ja)
Other versions
JP3083404B2 (en
Inventor
Masao Nakazawa
昌夫 中沢
Shinichi Wakabayashi
信一 若林
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shinko Electric Industries Co Ltd
Original Assignee
Shinko Electric Industries Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shinko Electric Industries Co Ltd filed Critical Shinko Electric Industries Co Ltd
Priority to JP04122622A priority Critical patent/JP3083404B2/en
Publication of JPH05287541A publication Critical patent/JPH05287541A/en
Application granted granted Critical
Publication of JP3083404B2 publication Critical patent/JP3083404B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Abstract

PURPOSE:To form a gold layer exhibiting good adhesion to a nickel layer by adding a buffer consisting of alkali hydrogen phthalate and alkali hydroxide to a substitution gold plating liquid. CONSTITUTION:The substitution gold plating liquid is prepd. by adding potassium cyanide to a buffer soln. which is added with the water soluble buffer consisting of the alkali hydrogen phthalate, such as potassium hydrogen phthalate and the alkali hydroxide, such as potassium hydroxide, and is adjusted to 4 to 7. The water soluble buffer consisting of water soluble amino acid, alkali chloride and hydrochloric acid is otherwise added to the buffer soln. and its pH is adjusted to 4 to 7. The nickel layer formed on parts consisting of a nonconductive material is subjected to an annealing treatment, and thereafter, the substitution gold plating liquid is applied thereon by using this substitution gold plating liquid, by which the dense gold layer exhibiting the good adhesion to the nickel layer is formed.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は置換金めっき液に関し、
更に詳細には緻密で且つ下地めっき層に対して良好な密
着性を呈する金層を置換金めっきによって形成し得る置
換金めっき液に関する。
The present invention relates to a displacement gold plating solution,
More specifically, the present invention relates to a displacement gold plating solution capable of forming a gold layer which is dense and has good adhesion to a base plating layer by displacement gold plating.

【0002】[0002]

【従来の技術】従来、半導体装置等の電子部品やコネク
ターの端子には、導電性に優れ且つ化学的に安定してい
る金層がめっきによって形成される。かかる電子部品や
コネクター等に金めっきを施す際には、通常、耐蝕性が
良好で且つ硬度の高いニッケルめっき(NiーP又はN
iーB)を下地めっきとして施した後に、金めっきが施
される。この様な金めっきを施す場合には、米国特許第
3162512号明細書に記載されている如く、下地め
っきで形成されたニッケル層の上面に置換金めっきが施
される。ところで、プラスチックやセラミック等の非導
電性材料から成る電子部品にニッケル層をめっきによっ
て形成するためには、無電解ニッケルめっきが採用され
る。
2. Description of the Related Art Conventionally, a gold layer having excellent conductivity and being chemically stable is formed by plating on terminals of electronic parts such as semiconductor devices and connectors. When gold plating is applied to such electronic parts and connectors, nickel plating (Ni-P or N) having good corrosion resistance and high hardness is usually used.
After i-B) is applied as a base plating, gold plating is applied. When such gold plating is applied, displacement gold plating is applied to the upper surface of the nickel layer formed by undercoating, as described in US Pat. No. 3,162,512. By the way, electroless nickel plating is adopted to form a nickel layer on an electronic component made of a non-conductive material such as plastic or ceramic by plating.

【0003】[0003]

【発明が解決しようとする課題】この様な無電解ニッケ
ルめっきによって、非導電性材料から成る電子部品等に
もニッケルめっきを施すことができる。しかし、無電解
ニッケルめっきによって形成されたニッケル層の上面に
金めっきを施すと、ニッケル層を形成するニッケルが金
層に拡散する。かかるニッケルの金層への拡散は、先に
本発明者の一人が特願昭62ー268406号明細書に
おいて提案した様に、無電解ニッケルめっきを施して形
成されたニッケル層にアニール処理を施した後、置換金
めっきを施すことによって抑制できる。しかしながら、
ニッケル層にアニール処理を施した後に、置換金めっき
を施して得られた金層は、粗く且つニッケル層との密着
性が低いことが判明した。そこで、本発明の目的は、無
電解ニッケルめっきで形成されたニッケル層にアニール
処理を施した後、緻密で且つニッケル層に対して良好な
密着性を呈する金層を置換金めっきによって形成し得る
置換金めっき液を提供することにある。
By such electroless nickel plating, it is possible to apply nickel plating to electronic parts and the like made of a non-conductive material. However, when gold plating is applied to the upper surface of the nickel layer formed by electroless nickel plating, nickel forming the nickel layer diffuses into the gold layer. The diffusion of nickel into the gold layer is performed by annealing the nickel layer formed by electroless nickel plating, as previously proposed by one of the present inventors in Japanese Patent Application No. 62-268406. After that, it can be suppressed by performing displacement gold plating. However,
It was found that the gold layer obtained by subjecting the nickel layer to the annealing treatment and then the displacement gold plating was rough and had low adhesion to the nickel layer. Therefore, an object of the present invention is to perform a annealing treatment on a nickel layer formed by electroless nickel plating, and then form a dense gold layer exhibiting good adhesion to the nickel layer by displacement gold plating. To provide a displacement gold plating solution.

【0004】[0004]

【課題を解決するための手段】本発明者等は、前記目的
を達成すべく検討を重ねた結果、下地ニッケルの溶出や
酸化等を抑制する緩衝液を用いることによって、緻密で
且つ下地めっきに対して良好な密着性を呈する金層を形
成できることを見出し、本発明に到達した。即ち、本発
明は、フタル酸水素アルカリと水酸化アルカリとから成
る水溶性緩衝剤が添加されてpH値が4〜7に調整され
た緩衝液に、シアン化金カリウムが添加されていること
を特徴とする置換金めっき液である。また、本発明は、
水溶性アミノ酸、塩化アルカリ及び塩酸から成る水溶性
緩衝剤が添加されてpH値が4〜7に調整された緩衝液
に、シアン化金カリウムが添加されていることを特徴と
する置換金めっき液でもある。かかる構成の本発明にお
いて、水溶性緩衝剤がフタル酸水素カリウムと水酸化カ
リウムとから成ることが、半導体装置用の置換金めっき
液として好適に使用できる。更に、水溶性アミノ酸がグ
リシンであることが、置換金めっきに要するコストを低
減することができる。また、めっき液中にエチレンジア
ミン四酢酸(EDTA)等のキレート剤が添加されてい
ることが、置換めっき液中に溶出するニッケル等の金属
を錯化でき、置換めっき液の寿命を長くすることができ
る。
Means for Solving the Problems The inventors of the present invention have conducted extensive studies to achieve the above-mentioned object, and as a result, by using a buffer solution that suppresses elution and oxidation of nickel underlayer, it is possible to perform precise and underlayer plating. On the other hand, they have found that a gold layer exhibiting good adhesion can be formed, and have reached the present invention. That is, according to the present invention, potassium gold cyanide is added to a buffer solution having a pH value adjusted to 4 to 7 by adding a water-soluble buffering agent consisting of alkali hydrogen phthalate and alkali hydroxide. It is a characteristic displacement gold plating solution. Further, the present invention is
Displacement gold plating solution, wherein potassium cyanide is added to a buffer solution having a pH value adjusted to 4 to 7 by adding a water-soluble buffering agent comprising water-soluble amino acid, alkali chloride and hydrochloric acid But also. In the present invention having such a constitution, the water-soluble buffering agent composed of potassium hydrogen phthalate and potassium hydroxide can be preferably used as a displacement gold plating solution for a semiconductor device. Furthermore, when the water-soluble amino acid is glycine, the cost required for the displacement gold plating can be reduced. In addition, the addition of a chelating agent such as ethylenediaminetetraacetic acid (EDTA) to the plating solution can complex a metal such as nickel that is eluted in the displacement plating solution and prolong the life of the displacement plating solution. it can.

【0005】[0005]

【作用】本発明によれば、後述する実施例に示す様に、
置換ニッケルめっきで形成したニッケル層にアニール処
理を施した後、本発明の置換金めっき液を使用して置換
金めっきを施すことによって、緻密で且つニッケル層に
対して良好な密着性とを呈する金層を形成できる。
According to the present invention, as shown in Examples described later,
After the nickel layer formed by the displacement nickel plating is annealed, the displacement gold plating solution of the present invention is used to perform the displacement gold plating to provide a dense and good adhesion to the nickel layer. A gold layer can be formed.

【0006】[0006]

【発明の構成】本発明の置換めっき液は、フタル酸水素
アルカリと水酸化アルカリとから成る水溶性緩衝剤が添
加されている置換めっき液である。かかる水溶性緩衝剤
として使用するフタル酸水素アルカリ及び水酸化アルカ
リとしては、水溶性であれば任意の化合物を採用できる
が、ナトリウム化合物又はカリウム化合物が好ましい。
特に、緩衝剤として、フタル酸水素カリウムと水酸化カ
リウムとから成る緩衝剤を使用すると、半導体装置に置
換金めっきを施す際に、好適に使用できる。本発明の置
換めっき液は、かかる緩衝剤が添加されてpH値が4〜
7に維持された緩衝液にシアン化金カリウムが添加され
ているものである。緩衝液のpH値が4未満の場合、或
いは7を越える場合には、緻密で且つ無電解ニッケル層
との密着性が向上された金層を置換金めっきによって形
成することが困難となる。
BEST MODE FOR CARRYING OUT THE INVENTION The displacement plating solution of the present invention is a displacement plating solution to which a water-soluble buffering agent consisting of an alkali hydrogen phthalate and an alkali hydroxide is added. As the alkali hydrogen phthalate and the alkali hydroxide used as such a water-soluble buffer, any compound can be adopted as long as it is water-soluble, but a sodium compound or a potassium compound is preferable.
In particular, when a buffer composed of potassium hydrogen phthalate and potassium hydroxide is used as the buffer, it can be preferably used when performing displacement gold plating on the semiconductor device. The displacement plating solution of the present invention has a pH value of 4 to 4 with the addition of such a buffering agent.
The potassium gold cyanide is added to the buffer solution maintained at 7. If the pH value of the buffer solution is less than 4 or more than 7, it becomes difficult to form a dense gold layer having improved adhesion to the electroless nickel layer by displacement gold plating.

【0007】本発明においては、フタル酸水素アルカリ
と水酸化アルカリとから成る水溶性緩衝剤に代えて、水
溶性アミノ酸、塩化アルカリ及び塩酸から成る水溶性緩
衝剤を使用してもよい。ここで、水溶性アミノ酸として
グリシンを使用することが、置換めっき液のコストを低
下することができ好ましい。更に、塩化アルカリとして
は、NaClを好ましく使用できる。また、本発明の置
換めっき液には、エチレンジアミン四酢酸(EDTA)
等のキレート剤が添加されていることが、置換めっき中
に溶出したニッケル等の金属を錯化できるため、置換め
っき液の寿命を長くできる。このキレート剤としては、
EDTAの他に、CyDTA、DTPA、EDTA−O
H、GEDTA、TTHA及びこれらのアルカリ金属塩
を挙げることができる。また、これらキレート剤の添加
量は、0.1〜100g/リットルとすることが好まし
い。
In the present invention, instead of the water-soluble buffering agent composed of alkali hydrogen phthalate and alkali hydroxide, a water-soluble buffering agent composed of a water-soluble amino acid, alkali chloride and hydrochloric acid may be used. Here, it is preferable to use glycine as the water-soluble amino acid because the cost of the displacement plating solution can be reduced. Further, NaCl can be preferably used as the alkali chloride. The displacement plating solution of the present invention also includes ethylenediaminetetraacetic acid (EDTA).
When a chelating agent such as is added, the metal such as nickel eluted during the displacement plating can be complexed, so that the life of the displacement plating solution can be extended. As this chelating agent,
In addition to EDTA, CyDTA, DTPA, EDTA-O
Mention may be made of H, GEDTA, TTHA and their alkali metal salts. The amount of these chelating agents added is preferably 0.1 to 100 g / liter.

【0008】かかる本発明の置換めっき液は、プラスチ
ックやセラミック等の非導電性材料から成る半導体装置
に使用されるパッケージ等のめっき対象部材に、無電解
ニッケルめっきを施した後、ニッケルの金層への拡散を
防止すべく、本発明者の一人が先に特願昭62ー268
406号明細書において提案した様に、アニール処理を
施したニッケル層に更に置換金めっきを施す際に、好適
に使用できる。この際の置換金めっき条件としては、通
常のめっき条件を採用でき、90℃のめっき液中にめっ
き対象部材を3〜30分間浸漬することによって、置換
金めっきを施すことができる。かかる置換金めっきが施
されためっき対象部材には、更に無電解金めっきを施し
て金層を厚付けしてもよい。この様にして得られためっ
き対象部材上に形成された金層は、稠密で且つニッケル
層との密着性も良好のものである。かかる本発明の置換
めっき液は、半導体装置に使用されるパッケージ等の部
材のみならず、コネクター等の端子部の金めっきにも使
用することができる。尚、コネクター等に金めっきを施
す際には、フタル酸水素アルカリと水酸化アルカリとか
ら成る水溶性緩衝剤としては、フタル酸水素ナトリウム
と水酸化ナトリウムとから成る水溶性緩衝剤を使用する
こともできる。
The displacement plating solution of the present invention is used for electroless nickel plating on a member to be plated such as a package used in a semiconductor device made of a non-conductive material such as plastic or ceramic, and then a gold layer of nickel. One of the inventors of the present invention first disclosed in Japanese Patent Application No. 62-268
As proposed in Japanese Patent No. 406, it can be suitably used when further performing displacement gold plating on the annealed nickel layer. As the displacement gold plating conditions at this time, usual plating conditions can be adopted, and the displacement gold plating can be performed by immersing the member to be plated in a plating solution at 90 ° C. for 3 to 30 minutes. The member to be plated that has been subjected to the displacement gold plating may be further subjected to electroless gold plating to thicken the gold layer. The gold layer thus formed on the member to be plated is dense and has good adhesion to the nickel layer. The displacement plating solution of the present invention can be used not only for members such as packages used in semiconductor devices but also for gold plating of terminal portions such as connectors. When applying gold plating to connectors, etc., use a water-soluble buffer consisting of sodium hydrogen phthalate and sodium hydroxide as the water-soluble buffer consisting of alkali hydrogen phthalate and alkali hydroxide. You can also

【0009】[0009]

【実施例】本発明を実施例によって更に一層詳細に説明
する。 実施例1 セラミックパッケージに市販の無電解ニッケルめっき液
(上村工業製)を用い、厚さ4,0mμのニッケル層を
形成した。次いで、ニッケル層が形成されたセラミック
パッケージを、還元雰囲気下で760℃、10分間のア
ニール処理を行った後、90℃の置換金めっき液中に4
分間浸漬して置換金めっきを行った。この際に使用した
置換金めっき液は、フタル酸水素カリウムと水酸化ナト
リウムとから成る水溶性緩衝剤を使用してpH値が5.
5に調整された緩衝液に、シアン化金カリウム1.5g
/リットルを添加したものである。尚、フタル酸水素カ
リウムの添加量は40.8g/リットル、水酸化ナトリ
ウムの添加量は4.0g/リットルであった。この様に
置換金めっきが施されたセラミックパッケージ面の肉眼
観察によると、緻密な置換金めっき層が形成されてい
た。また、セラミックパッケージ面にワイヤブラシによ
って引っかき傷を形成し、形成した引っかき傷の部分を
顕微鏡観察して置換金めっき層のニッケル層に対する密
着性を観察したところ、置換金めっき層の剥離は見られ
なかった。
EXAMPLES The present invention will be described in more detail with reference to Examples. Example 1 A commercially available electroless nickel plating solution (manufactured by Uemura Kogyo Co., Ltd.) was used for a ceramic package to form a nickel layer having a thickness of 40 mμ. Then, the ceramic package on which the nickel layer is formed is annealed at 760 ° C. for 10 minutes in a reducing atmosphere, and then placed in a displacement gold plating solution at 90 ° C. for 4 minutes.
Substitution gold plating was performed by immersion for a minute. The displacement gold plating solution used at this time uses a water-soluble buffer consisting of potassium hydrogen phthalate and sodium hydroxide and has a pH value of 5.
In the buffer solution adjusted to 5, 1.5 g of potassium gold cyanide
/ Liter is added. The amount of potassium hydrogen phthalate added was 40.8 g / liter, and the amount of sodium hydroxide added was 4.0 g / liter. As a result of visual observation of the surface of the ceramic package plated with the displacement gold as described above, a dense displacement gold plating layer was formed. In addition, when scratches were formed on the ceramic package surface with a wire brush and the scratched portion was observed under a microscope to observe the adhesion of the replacement gold plating layer to the nickel layer, peeling of the replacement gold plating layer was observed. There wasn't.

【0010】実施例2 実施例1において、水溶性緩衝剤として、グリシン3
5.5g/リットル、NaCl27.5g/リットル、
及び塩酸(0.1N)0.25ml/リットルが添加さ
れてpH値が4.5に調整された緩衝液に、シアン化金
カリウム1.5g/リットルを添加した置換めっき液を
使用した他は、実施例1と同様に置換金めっきを行っ
た。置換金めっきが施されたセラミックパッケージ面の
肉眼観察によると、緻密な置換金めっき層が形成されて
いた。また、セラミックパッケージ面にワイヤブラシに
よって引っかき傷を形成し、形成した引っかき傷の部分
を顕微鏡観察して置換金めっき層のニッケル層に対する
密着性を観察したところ、置換金めっき層の剥離は見ら
れなかった。
Example 2 In Example 1, glycine 3 was used as the water-soluble buffer.
5.5 g / liter, NaCl 27.5 g / liter,
And a displacement plating solution prepared by adding potassium gold cyanide (1.5 g / liter) to a buffer solution in which 0.25 ml / liter of hydrochloric acid (0.1N) was added to adjust the pH value to 4.5. The displacement gold plating was performed in the same manner as in Example 1. Visual observation of the surface of the ceramic package plated with the displacement gold plating revealed that a dense displacement gold plating layer was formed. In addition, when scratches were formed on the ceramic package surface with a wire brush and the scratched portion was observed under a microscope to observe the adhesion of the replacement gold plating layer to the nickel layer, peeling of the replacement gold plating layer was observed. There wasn't.

【0011】実施例3 実施例1において、置換金めっき液にキレート剤として
EDTA・2Naを20g/リットル添加した他は、実
施例1と同様に置換金めっきを行った。置換金めっきが
施されたセラミックパッケージ面には緻密な置換金めっ
き層が形成され、且つセラミックパッケージ面のワイヤ
ブラシによる置換金めっき層とニッケル層との密着性試
験においても、置換金めっき層の剥離が見られず良好で
あった。しかも、本実施例の置換金めっき液は、実施例
1の置換金めっき液に比較して、置換金めっき液の寿命
を延長できた。
Example 3 The displacement gold plating was performed in the same manner as in Example 1 except that 20 g / liter of EDTA.2Na as a chelating agent was added to the displacement gold plating solution. A dense substitutional gold plating layer is formed on the surface of the substitutional gold-plated ceramic package, and even in the adhesion test between the substitutional gold plating layer and the nickel layer by the wire brush on the ceramic package surface, No peeling was observed and it was good. Moreover, the displacement gold plating solution of this example was able to extend the life of the displacement gold plating solution as compared with the displacement gold plating solution of Example 1.

【0012】比較例 実施例1において、米国特許第3162512号明細書
に、ニッケル層に対して良好な密着性を呈する置換金め
っき層を形成する置換金めっき液として記載されている
下記組成の置換金めっき液を使用した他は、実施例1と
同様に置換金めっきを施した。 置換金めっき液組成 クエン酸アンモニウム 20g/リットル シアン化カリウム 5g/リットル EDTA・2Na 25g/リットル 尚、本比較例で使用した置換金めっき液は、アンモニア
水でpH値が6.0〜6.5に調整されている。置換金
めっきが施されたセラミックパッケージ面の肉眼観察に
よると、形成された置換金めっき層は粗いものであっ
た。また、セラミックパッケージ面にワイヤブラシによ
って引っかき傷を形成し、形成した引っかき傷の部分を
顕微鏡観察して置換金めっき層のニッケル層に対する密
着性を観察したところ、置換金めっき層のニッケル層か
ら剥離している部分が所々に存在していた。
Comparative Example In Example 1, the substitution of the following composition described in US Pat. No. 3,162,512 as a substitution gold plating solution for forming a substitution gold plating layer exhibiting good adhesion to a nickel layer. The displacement gold plating was performed in the same manner as in Example 1 except that the gold plating solution was used. Composition of displacement gold plating solution Ammonium citrate 20 g / liter Potassium cyanide 5 g / liter EDTA.2Na 25 g / liter The displacement gold plating solution used in this comparative example was adjusted to a pH value of 6.0 to 6.5 with ammonia water. Has been done. Visual observation of the surface of the ceramic package plated with the displacement gold plating revealed that the formed displacement gold plating layer was rough. In addition, scratches were formed on the ceramic package surface with a wire brush, and the scratched portion was observed under a microscope to observe the adhesion of the replacement gold plating layer to the nickel layer. There were parts that were doing in places.

【0013】[0013]

【発明の効果】本発明によれば、非導電性材料から成る
電子部品等に緻密で且つ下地めっきとの密着性良好な金
めっき層を置換金めっきによって形成できる。
According to the present invention, it is possible to form a gold plating layer, which is dense and has good adhesion to the undercoat, on an electronic component or the like made of a non-conductive material by displacement gold plating.

Claims (5)

【特許請求の範囲】[Claims] 【請求項1】 フタル酸水素アルカリと水酸化アルカリ
とから成る水溶性緩衝剤が添加されてpH値が4〜7に
調整された緩衝液に、シアン化金カリウムが添加されて
いることを特徴とする置換金めっき液。
1. Potassium cyanide is added to a buffer solution having a pH value adjusted to 4 to 7 by adding a water-soluble buffering agent comprising alkali hydrogen phthalate and alkali hydroxide. Replacement gold plating solution.
【請求項2】 水溶性緩衝剤がフタル酸水素カリウムと
水酸化カリウムとから成る請求項1記載の置換金めっき
液。
2. The displacement gold plating solution according to claim 1, wherein the water-soluble buffer comprises potassium hydrogen phthalate and potassium hydroxide.
【請求項3】 水溶性アミノ酸、塩化アルカリ及び塩酸
から成る水溶性緩衝剤が添加されてpH値が4〜7に調
整された緩衝液に、シアン化金カリウムが添加されてい
ることを特徴とする置換金めっき液。
3. A potassium gold cyanide is added to a buffer solution having a pH value adjusted to 4 to 7 by adding a water-soluble buffering agent comprising a water-soluble amino acid, alkali chloride and hydrochloric acid. Replacement gold plating solution.
【請求項4】 水溶性アミノ酸がグリシンである請求項
3記載の置換金めっき液。
4. The substituted gold plating solution according to claim 3, wherein the water-soluble amino acid is glycine.
【請求項5】 めっき液中にエチレンジアミン四酢酸
(EDTA)等のキレート剤が添加されている請求項1
又は請求項3記載の置換金めっき液。
5. A chelating agent such as ethylenediaminetetraacetic acid (EDTA) is added to the plating solution.
Alternatively, the displacement gold plating solution according to claim 3.
JP04122622A 1992-04-15 1992-04-15 Replacement gold plating solution Expired - Fee Related JP3083404B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP04122622A JP3083404B2 (en) 1992-04-15 1992-04-15 Replacement gold plating solution

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP04122622A JP3083404B2 (en) 1992-04-15 1992-04-15 Replacement gold plating solution

Publications (2)

Publication Number Publication Date
JPH05287541A true JPH05287541A (en) 1993-11-02
JP3083404B2 JP3083404B2 (en) 2000-09-04

Family

ID=14840525

Family Applications (1)

Application Number Title Priority Date Filing Date
JP04122622A Expired - Fee Related JP3083404B2 (en) 1992-04-15 1992-04-15 Replacement gold plating solution

Country Status (1)

Country Link
JP (1) JP3083404B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6136702A (en) * 1999-11-29 2000-10-24 Lucent Technologies Inc. Thin film transistors

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6136702A (en) * 1999-11-29 2000-10-24 Lucent Technologies Inc. Thin film transistors

Also Published As

Publication number Publication date
JP3083404B2 (en) 2000-09-04

Similar Documents

Publication Publication Date Title
TWI306908B (en) Aqueous acidic immersion plating solutions and methods for plating on aluminum and aluminum alloys
CN100476025C (en) Aqueous alkaline zincate solutions and method for depositing zincate coating on aluminium or aluminium substrate
JPH0949085A (en) Composition of electroless black plating bath and formation of coating film
JPH028026B2 (en)
JPH0776436B2 (en) How to plate conductive surface
JP2002317294A (en) Electroplating palladium alloy composition and electroplating method using the composition
TW200902757A (en) Electroless gold plating bath, electroless gold plating method and electronic parts
JP3203247B2 (en) Jewelry with colored coating and method of manufacturing the same
JP3482402B2 (en) Replacement gold plating solution
JP3083404B2 (en) Replacement gold plating solution
JP3673445B2 (en) Zinc replacement solution
JPH0248981B2 (en)
TWI284157B (en) Electroless gold plating solution
JPS60258473A (en) Manufacture of corrosion resistant film
JPH0734254A (en) Electroless plating method to aluminum material
US3667991A (en) Processes for nickel plating metals
JP3035763B2 (en) Electroless palladium plating solution
JPH0711448A (en) Catalytic solution for electroless plating selective to copper-based material
US4975160A (en) Process for wet chemical metallization of a substrate
JP2003226993A (en) Gold plating solution and gold plating treatment method
JP3175562B2 (en) Electroless gold plating bath and electroless gold plating method
JPH06101054A (en) Catalyst liquid selective of copper-base material for electroless plating
JP3262929B2 (en) Gold alloy plating solution
JP3087163B2 (en) Thickening method of electroless gold plating
JPH05271979A (en) Gold plating bath and production of gold-plated article using the bath

Legal Events

Date Code Title Description
LAPS Cancellation because of no payment of annual fees