JPH0519692B2 - - Google Patents
Info
- Publication number
- JPH0519692B2 JPH0519692B2 JP59099559A JP9955984A JPH0519692B2 JP H0519692 B2 JPH0519692 B2 JP H0519692B2 JP 59099559 A JP59099559 A JP 59099559A JP 9955984 A JP9955984 A JP 9955984A JP H0519692 B2 JPH0519692 B2 JP H0519692B2
- Authority
- JP
- Japan
- Prior art keywords
- exposure
- light source
- mask
- optical system
- wafer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 230000003287 optical effect Effects 0.000 claims description 42
- 238000002955 isolation Methods 0.000 claims description 2
- 238000000034 method Methods 0.000 claims 1
- 238000005286 illumination Methods 0.000 description 24
- 230000004907 flux Effects 0.000 description 6
- 238000010586 diagram Methods 0.000 description 4
- 230000010355 oscillation Effects 0.000 description 3
- 230000003595 spectral effect Effects 0.000 description 3
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- 229910004261 CaF 2 Inorganic materials 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 230000004075 alteration Effects 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 239000005350 fused silica glass Substances 0.000 description 1
- 229910052736 halogen Inorganic materials 0.000 description 1
- 150000002367 halogens Chemical class 0.000 description 1
- 238000002347 injection Methods 0.000 description 1
- 239000007924 injection Substances 0.000 description 1
- 230000007774 longterm Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- QSHDDOUJBYECFT-UHFFFAOYSA-N mercury Chemical compound [Hg] QSHDDOUJBYECFT-UHFFFAOYSA-N 0.000 description 1
- 229910052753 mercury Inorganic materials 0.000 description 1
- 230000010287 polarization Effects 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/70858—Environment aspects, e.g. pressure of beam-path gas, temperature
- G03F7/709—Vibration, e.g. vibration detection, compensation, suppression or isolation
Landscapes
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Atmospheric Sciences (AREA)
- Toxicology (AREA)
- Engineering & Computer Science (AREA)
- Environmental & Geological Engineering (AREA)
- Epidemiology (AREA)
- Public Health (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Projection-Type Copiers In General (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP59099559A JPS60242421A (ja) | 1984-05-17 | 1984-05-17 | 露光装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP59099559A JPS60242421A (ja) | 1984-05-17 | 1984-05-17 | 露光装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS60242421A JPS60242421A (ja) | 1985-12-02 |
JPH0519692B2 true JPH0519692B2 (enrdf_load_stackoverflow) | 1993-03-17 |
Family
ID=14250502
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP59099559A Granted JPS60242421A (ja) | 1984-05-17 | 1984-05-17 | 露光装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS60242421A (enrdf_load_stackoverflow) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3588012T2 (de) * | 1984-06-21 | 1995-09-14 | At & T Corp., New York, N.Y. | Lithographie im fernen UV-Gebiet. |
DE102013202292A1 (de) * | 2013-02-13 | 2014-01-30 | Carl Zeiss Smt Gmbh | Schwingungsdämpfung optischer Elemente |
EP4390544A1 (en) * | 2022-12-23 | 2024-06-26 | ASML Netherlands B.V. | Optical system |
-
1984
- 1984-05-17 JP JP59099559A patent/JPS60242421A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS60242421A (ja) | 1985-12-02 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US6452723B1 (en) | Exposure apparatus and method | |
KR100200734B1 (ko) | 에어리얼 이미지 측정 장치 및 방법 | |
JP2001284228A (ja) | 露光装置及びデバイス製造方法 | |
US4922290A (en) | Semiconductor exposing system having apparatus for correcting change in wavelength of light source | |
US4798962A (en) | Multi-wavelength projection exposure and alignment apparatus | |
JPS61169815A (ja) | 露光装置 | |
KR20010030561A (ko) | 투영 노광 장치, 투영 노광 방법, 광 세정 방법 및 반도체디바이스의 제조 방법 | |
JP3473649B2 (ja) | 投影露光装置 | |
JP2633028B2 (ja) | 観察方法及び観察装置 | |
US5774205A (en) | Exposure and method which tests optical characteristics of optical elements in a projection lens system prior to exposure | |
US4964720A (en) | Exposure apparatus | |
JPH0519692B2 (enrdf_load_stackoverflow) | ||
JP2002151388A (ja) | 露光装置及びデバイス製造方法 | |
JP3278892B2 (ja) | 露光装置及び方法、並びにデバイス製造方法 | |
JP3230101B2 (ja) | 投影露光装置及び方法、並びに素子製造方法 | |
JPH0894338A (ja) | マスク検査装置 | |
KR20030074264A (ko) | 광원 유닛, 조명 장치, 노광 장치 및 노광 방법 | |
JPH0430412A (ja) | 投影露光装置 | |
KR102654989B1 (ko) | 노광장치 및 물품의 제조방법 | |
JP7446068B2 (ja) | 露光装置、および、物品の製造方法 | |
TWI674482B (zh) | 曝光設備及曝光方法 | |
JP2744274B2 (ja) | 照明装置、露光装置及び該露光装置を用いた半導体素子の製造方法 | |
JPH10163102A (ja) | 照明光学装置 | |
JP2003282430A (ja) | 露光装置及び露光方法、デバイス製造方法、並びに測定方法及び測定装置 | |
JPS60222862A (ja) | 露光装置 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
EXPY | Cancellation because of completion of term |