JPH05171432A - Sputtering device - Google Patents

Sputtering device

Info

Publication number
JPH05171432A
JPH05171432A JP34417891A JP34417891A JPH05171432A JP H05171432 A JPH05171432 A JP H05171432A JP 34417891 A JP34417891 A JP 34417891A JP 34417891 A JP34417891 A JP 34417891A JP H05171432 A JPH05171432 A JP H05171432A
Authority
JP
Japan
Prior art keywords
substrate
target
vacuum vessel
target holder
sputtering
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP34417891A
Other languages
Japanese (ja)
Inventor
Yasuo Arima
康雄 有馬
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP34417891A priority Critical patent/JPH05171432A/en
Publication of JPH05171432A publication Critical patent/JPH05171432A/en
Withdrawn legal-status Critical Current

Links

Abstract

PURPOSE:To continuously form plural thin films constituted of different kinds of materials in the same vacuum vessel in the structure of a sputtering device. CONSTITUTION:The inside of a vacuum vessel 11 is provided with a prismatic target holder 13 supported rotatably in a vacuum vessel 1. Plural target plates 14 are fixed along the outer circumference of the target holder 13. One piece among them is opposed against a substrate 1 arranged in the vacuum vessel 11 and the materials of the target plates 14 are formed on the substrate 1.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明はスパッタ装置の構造に関
する。スパッタ装置は真空容器内でアルゴン等のイオン
を陰極のターゲットに高速で衝突させてターゲット材の
原子を外部に叩き出し、これを対向電極上の基板に付着
させるものであり、半導体デバイスの製造等、広汎な分
野で金属等の薄膜の形成に使用されている。
FIELD OF THE INVENTION The present invention relates to the structure of a sputtering apparatus. Sputtering equipment collides ions such as argon with a cathode target at high speed in a vacuum container to knock out atoms of a target material to the outside and attach them to a substrate on a counter electrode. It is used in a wide range of fields to form thin films of metals and the like.

【0002】近年、半導体デバイスは高密度・高集積化
の要求に対応するため、配線パターンの微細化が進めら
れている。その結果、従来から広く使用されて来たアル
ミニウムやアルミニウム合金の配線ではストレスマイグ
レーションやエレクトロマイグレーションを生じる等、
信頼性の問題が生じており、その対策として、複数の金
属を積層した配線が採用されるようになって来た。その
ため、この積層構造を効率良く形成することが可能なス
パッタ装置が望まれている。
In recent years, in order to meet the demand for high density and high integration of semiconductor devices, miniaturization of wiring patterns has been advanced. As a result, stress migration and electromigration occur in the wiring of aluminum and aluminum alloys that have been widely used in the past.
The problem of reliability has arisen, and as a countermeasure against this, wiring in which a plurality of metals are laminated has been adopted. Therefore, a sputtering device capable of efficiently forming this laminated structure is desired.

【0003】[0003]

【従来の技術】従来のスパッタ装置では、一個の真空容
器に一個のターゲットが配設されていた。従って、スパ
ッタリング法により基板上に複数の金属薄膜を積層する
場合、それぞれ異なる材料のターゲットが配設された複
数のスパッタ装置を使用するか、或いはインライン方式
の製造ラインにおいては、それぞれ異なる材料のターゲ
ットが配設された複数の真空容器を真空搬送路で接続し
た構成の装置を使用していた。
2. Description of the Related Art In a conventional sputtering apparatus, one target is arranged in one vacuum container. Therefore, when stacking a plurality of metal thin films on a substrate by the sputtering method, use a plurality of sputtering devices in which targets of different materials are arranged, or in an in-line manufacturing line, targets of different materials are used. An apparatus having a configuration in which a plurality of vacuum containers in which the above are arranged are connected by a vacuum transfer path is used.

【0004】[0004]

【発明が解決しようとする課題】ところが、このような
従来の装置で基板上に複数の金属薄膜を積層する場合、
基板を複数の真空容器間を移動することによる基板着脱
・搬送のためのロスタイムにより装置のスループットを
低下させる、基板を成膜の途中で大気に曝すために膜の
品質を損なう(複数のスパッタ装置を使用する場合)、
という問題があった。
However, when a plurality of metal thin films are laminated on a substrate in such a conventional apparatus,
Loss time due to substrate attachment / detachment / transportation caused by moving the substrate between multiple vacuum chambers reduces the throughput of the device, and exposes the substrate to the atmosphere during film formation, impairing film quality (multiple sputtering devices). When using),
There was a problem.

【0005】本発明はこのような問題を解決して、基板
上に複数の金属薄膜を高品質で効率良く積層することが
可能なスパッタ装置を提供することを目的とする。
An object of the present invention is to solve such problems and to provide a sputtering apparatus capable of efficiently laminating a plurality of metal thin films on a substrate with high quality.

【0006】[0006]

【課題を解決するための手段】この目的は本発明によれ
ば、真空容器内に回転可能に支持され、且つ外周に沿っ
て複数個のターゲット板が固着されたターゲット保持体
を備え、該ターゲット保持体を必要に応じて回転するこ
とにより所望のターゲット板一個を該真空容器内に配設
された基板に対向させて該基板に該ターゲット板の材料
を被着するように構成されていることを特徴とするスパ
ッタ装置とすることで、達成される。
According to the present invention, there is provided a target holder, which is rotatably supported in a vacuum container and has a plurality of target plates fixed along the outer periphery thereof. By rotating the holding body as necessary, one desired target plate is made to face a substrate arranged in the vacuum vessel, and the material of the target plate is deposited on the substrate. It is achieved by using a sputtering device characterized by

【0007】[0007]

【作用】基板を一個の真空容器にセットした後、ターゲ
ット保持体を回転するだけで異なった金属の薄膜を連続
して金属に被着することが出来るから、途中で基板を着
脱・搬送する必要がなく、又大気に曝されることもな
い。従って、途中で基板を着脱・搬送するためのロスタ
イムがなくなって装置のスループットが向上すると共
に、膜の品質を損なうことが防止される。
[Operation] After setting the substrate in one vacuum container, it is possible to continuously deposit thin films of different metals on the metal by simply rotating the target holder, so it is necessary to attach / detach / transfer the substrate on the way. There is also no exposure to the atmosphere. Therefore, the loss time for attaching / detaching / transporting the substrate is eliminated during the process, the throughput of the apparatus is improved, and the film quality is prevented from being impaired.

【0008】[0008]

【実施例】本発明に基づくスパッタ装置の実施例を、図
1を参照しながら説明する。図1は本発明の実施例を示
す断面図であり、インライン方式の製造ラインに組み込
んだスパッタ装置の真空容器部分を模式的に示してい
る。同図において、1は被処理物の基板(半導体ウェー
ハ等)、11は処理室となる真空容器、12は基板支持台、
13はターゲット保持体、14はターゲット板、15は遮蔽
板、16はシャッタである。
EXAMPLE An example of a sputtering apparatus according to the present invention will be described with reference to FIG. FIG. 1 is a cross-sectional view showing an embodiment of the present invention, and schematically shows a vacuum container part of a sputtering apparatus incorporated in an in-line type production line. In the figure, 1 is a substrate (semiconductor wafer or the like) of the object to be processed, 11 is a vacuum container serving as a processing chamber, 12 is a substrate support,
Reference numeral 13 is a target holder, 14 is a target plate, 15 is a shield plate, and 16 is a shutter.

【0009】真空容器11は真空排気口11a 及びガス導入
口11b 備えており、真空排気口11aを介して真空排気手
段(図示は省略)に連通し、ガス導入口11b を介してア
ルゴン等のガス供給源(図示は省略)に連通している。
基板支持台12は基板1を固着してこれを陽極とする。
The vacuum container 11 is provided with a vacuum exhaust port 11a and a gas inlet port 11b, communicates with a vacuum exhaust means (not shown) through the vacuum exhaust port 11a, and a gas such as argon is supplied through the gas inlet port 11b. It communicates with a supply source (not shown).
The substrate support 12 fixes the substrate 1 and uses it as an anode.

【0010】ターゲット保持体13は角柱状をなしており
(例えば正六角柱)、各側面に一個ずつのターゲット板
14を固着する。このターゲット保持体13はその中心線を
回転軸として回転するように真空容器11に支持されてお
り、回転・位置決め手段(図示は省略)により所望の一
個のターゲット板14を基板1と略平行となる位置まで回
転して固定することが出来る。
The target holder 13 has a prismatic shape (eg, regular hexagonal prism), and one target plate is provided on each side surface.
Stick 14 The target holder 13 is supported by the vacuum container 11 so as to rotate about its center line as a rotation axis, and one desired target plate 14 is made substantially parallel to the substrate 1 by rotation / positioning means (not shown). It can be fixed by rotating to the position.

【0011】ターゲット保持体13の内部には各側面に沿
って冷却水流路(図示は省略)を設けてあり、冷却水を
流して側面を冷却することが出来る。又、その内側には
永久磁石等からなる磁界発生手段(図示は省略)が配設
されており、ターゲット板14近傍に磁界を発生させる。
遮蔽板15は所望のターゲット板14一個だけをスパッタす
るためのものであり、真空容器11に固着されており、基
板1に対向するターゲット板14以外のターゲット板14
を、それらの直近で覆うと共に陽極と同電位となってい
る。これに包囲された部分ではプラズマが発生しない。
Inside the target holder 13, cooling water flow paths (not shown) are provided along each side surface, and cooling water can be flowed to cool the side surfaces. Further, a magnetic field generating means (not shown) made of a permanent magnet or the like is arranged inside thereof to generate a magnetic field in the vicinity of the target plate 14.
The shield plate 15 is for sputtering only one desired target plate 14, is fixed to the vacuum container 11, and is a target plate 14 other than the target plate 14 facing the substrate 1.
Are covered in the immediate vicinity thereof and have the same potential as the anode. Plasma is not generated in the portion surrounded by this.

【0012】このスパッタ装置により基板1の表面に複
数種の金属薄膜を積層させるには、それらの金属からな
る複数のターゲット板14をターゲット保持体13の異なる
側面に固着し、これらを逐次基板1に対向させてスパッ
タする。従って、ターゲット保持体13が例えば正六角柱
の場合には六種類までの異なる金属の薄膜を連続して形
成することが出来る。その結果、積層構造の金属薄膜を
極めて効率良く形成することが出来た。
In order to stack a plurality of kinds of metal thin films on the surface of the substrate 1 by this sputtering apparatus, a plurality of target plates 14 made of those metals are fixed to different side surfaces of the target holder 13 and these are successively placed on the substrate 1. Sputter facing the. Therefore, when the target holder 13 is, for example, a regular hexagonal prism, it is possible to continuously form thin films of up to six different metals. As a result, a metal thin film having a laminated structure could be formed extremely efficiently.

【0013】本発明者は、このスパッタ装置を上記のよ
うな積層構造の形成以外に、合金や金属珪化物の薄膜の
形成にも使用して好結果を得た。即ち、先ずこれらを構
成する各元素のターゲット板14をターゲット保持体13の
異なる側面に固着し、これらを逐次基板1に対向させて
短時間ずつスパッタすることにより基板1に極めて薄い
薄膜からなる積層構造を形成する。これを所定の膜厚に
なるまで繰り返す。その後この基板1をこのスパッタ装
置から取り出し、別途、熱処理を行い、所望の合金や金
属珪化物を得た。この方法によれば、各元素のスパッタ
時間を制御することにより合金や金属珪化物の組成を高
精度で制御することが出来た。
The present inventor has obtained favorable results by using this sputtering apparatus for forming a thin film of an alloy or a metal silicide, in addition to forming the above-mentioned laminated structure. That is, first, the target plates 14 of the respective elements constituting these are fixed to different side surfaces of the target holder 13, and these are successively opposed to the substrate 1 and sputtered for a short period of time to form a stack of extremely thin thin films on the substrate 1. Form a structure. This is repeated until the film has a predetermined thickness. After that, the substrate 1 was taken out of the sputtering apparatus and separately heat-treated to obtain a desired alloy or metal silicide. According to this method, the composition of the alloy or metal silicide can be controlled with high accuracy by controlling the sputtering time of each element.

【0014】更に、このスパッタ装置を一層の単一金属
薄膜形成にも使用して好結果を得た。即ち、同一材料の
複数のターゲット板14をターゲット保持体13の異なる側
面に固着し、その内の一個を使用し、消耗すればターゲ
ット保持体13を回転して他のターゲット板14に切り替え
る、という使用方法により、装置の稼働率を向上させる
ことが出来た。ターゲット板は使用により次第に消耗す
るから交換が必要であるが、交換時、真空容器11の真空
を破らなければならないから、装置を長時間にわたり停
止することになる。本装置のこのような使用方法によ
り、この装置停止時間を節減した訳である。
Further, the sputtering apparatus was also used for forming a single metal thin film, and good results were obtained. That is, a plurality of target plates 14 of the same material are fixed to different side surfaces of the target holder 13, one of them is used, and if consumed, the target holder 13 is rotated to switch to another target plate 14. Depending on the method of use, the operating rate of the device could be improved. The target plate is gradually consumed by use and needs to be replaced. However, since the vacuum of the vacuum container 11 must be broken at the time of replacement, the apparatus is stopped for a long time. Due to such usage of the device, the down time of the device is reduced.

【0015】本発明は以上の実施例に限定されることな
く、更に種々変形して実施することが出来る。例えば、
上記の遮蔽板15を設けず、各ターゲット板14とターゲッ
ト保持体13とを電気的に絶縁し、基板1に対向する位置
となるターゲット板14だけが陰極に接続されるように構
成して、所望のターゲット板14一個だけをスパッタする
ようにしてもよい。又、ターゲット保持体13は角柱状で
なく、円柱状としてもよい。
The present invention is not limited to the above embodiments, but can be implemented with various modifications. For example,
The shielding plate 15 is not provided, each target plate 14 and the target holder 13 are electrically insulated, and only the target plate 14 facing the substrate 1 is connected to the cathode. Alternatively, only one desired target plate 14 may be sputtered. Further, the target holder 13 may have a cylindrical shape instead of the prismatic shape.

【0016】[0016]

【発明の効果】以上説明したように、本発明によれば、
基板上に複数の金属薄膜を高品質で効率良く積層するこ
とが可能なスパッタ装置を提供することが出来、半導体
装置等の製造における生産性向上等に寄与する。
As described above, according to the present invention,
It is possible to provide a sputtering apparatus capable of efficiently laminating a plurality of metal thin films on a substrate with high quality, which contributes to improvement in productivity in manufacturing semiconductor devices and the like.

【図面の簡単な説明】[Brief description of drawings]

【図1】 本発明の実施例を示す断面図である。FIG. 1 is a sectional view showing an embodiment of the present invention.

【符号の説明】[Explanation of symbols]

1 基板 11 真空容器 11a 真空排気口 11b ガス導入口 12 基板支持台 13 ターゲット保持体 14 ターゲット板 15 遮蔽板 16 シャッタ 1 substrate 11 vacuum container 11a vacuum exhaust port 11b gas inlet 12 substrate support 13 target holder 14 target plate 15 shielding plate 16 shutter

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 真空容器(11)内に回転可能に支持され、
且つ外周に沿って複数個のターゲット板(14)が固着され
たターゲット保持体(13)を備え、 該ターゲット保持体(13)を必要に応じて回転することに
より所望のターゲット板(14)一個を該真空容器(11)内に
配設された基板(1) に対向させて該基板(1) に該ターゲ
ット板(14)の材料を被着するように構成されていること
を特徴とするスパッタ装置。
1. A vacuum container (11) is rotatably supported in the container,
A target holder (13) having a plurality of target plates (14) fixed along the outer periphery is provided, and one desired target plate (14) is provided by rotating the target holder (13) as necessary. Is arranged so as to face the substrate (1) arranged in the vacuum container (11), and the material of the target plate (14) is applied to the substrate (1). Sputtering equipment.
JP34417891A 1991-12-26 1991-12-26 Sputtering device Withdrawn JPH05171432A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP34417891A JPH05171432A (en) 1991-12-26 1991-12-26 Sputtering device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP34417891A JPH05171432A (en) 1991-12-26 1991-12-26 Sputtering device

Publications (1)

Publication Number Publication Date
JPH05171432A true JPH05171432A (en) 1993-07-09

Family

ID=18367233

Family Applications (1)

Application Number Title Priority Date Filing Date
JP34417891A Withdrawn JPH05171432A (en) 1991-12-26 1991-12-26 Sputtering device

Country Status (1)

Country Link
JP (1) JPH05171432A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2000018979A1 (en) * 1998-10-01 2000-04-06 Applied Science And Technology, Inc. Sputter deposition apparatus
EP1336985A1 (en) * 2002-02-19 2003-08-20 Singulus Technologies AG Sputtering cathode, and device and method for coating a substrate with a plurality of layers
EP2280407A3 (en) * 2009-07-31 2014-04-30 Centre Luxembourgeois de Recherches pour le Verre et la Céramique S.A. Sputtering apparatus including cathode with rotatable targets, and related methods

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2000018979A1 (en) * 1998-10-01 2000-04-06 Applied Science And Technology, Inc. Sputter deposition apparatus
EP1336985A1 (en) * 2002-02-19 2003-08-20 Singulus Technologies AG Sputtering cathode, and device and method for coating a substrate with a plurality of layers
WO2003071579A1 (en) * 2002-02-19 2003-08-28 Singulus Technologies Ag Sputtering cathode and device and method for coating a substrate with several layers
US7799179B2 (en) 2002-02-19 2010-09-21 Singulus Technologies Ag Sputtering cathode and device and method for coating a substrate with several layers
EP2280407A3 (en) * 2009-07-31 2014-04-30 Centre Luxembourgeois de Recherches pour le Verre et la Céramique S.A. Sputtering apparatus including cathode with rotatable targets, and related methods
US10586689B2 (en) 2009-07-31 2020-03-10 Guardian Europe S.A.R.L. Sputtering apparatus including cathode with rotatable targets, and related methods
US11094513B2 (en) 2009-07-31 2021-08-17 Guardian Europe S.à r.l. Sputtering apparatus including cathode with rotatable targets, and related methods

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Effective date: 19990311