JPH051584B2 - - Google Patents
Info
- Publication number
- JPH051584B2 JPH051584B2 JP61025525A JP2552586A JPH051584B2 JP H051584 B2 JPH051584 B2 JP H051584B2 JP 61025525 A JP61025525 A JP 61025525A JP 2552586 A JP2552586 A JP 2552586A JP H051584 B2 JPH051584 B2 JP H051584B2
- Authority
- JP
- Japan
- Prior art keywords
- sample
- charged particle
- microchannel plate
- mcp
- potential
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Landscapes
- Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP61025525A JPS62184752A (ja) | 1986-02-07 | 1986-02-07 | 荷電粒子ビ−ム測長機 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP61025525A JPS62184752A (ja) | 1986-02-07 | 1986-02-07 | 荷電粒子ビ−ム測長機 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS62184752A JPS62184752A (ja) | 1987-08-13 |
| JPH051584B2 true JPH051584B2 (c_deeref_Disk_and_Scratch_Disk_Pools_and_Their_Defaults.html) | 1993-01-08 |
Family
ID=12168464
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP61025525A Granted JPS62184752A (ja) | 1986-02-07 | 1986-02-07 | 荷電粒子ビ−ム測長機 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS62184752A (c_deeref_Disk_and_Scratch_Disk_Pools_and_Their_Defaults.html) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5202348A (en) * | 1989-12-07 | 1993-04-13 | The University Of British Columbia | Thiarubrine antifungal agents |
| PL207199B1 (pl) * | 2003-04-17 | 2010-11-30 | Politechnika Wroclawska | Układ detekcyjny elektronów wtórnych do skaningowego mikroskopu elektronowego |
| PL210038B1 (pl) * | 2004-01-21 | 2011-11-30 | Politechnika Wroclawska | Sposób i układ do kierunkowej detekcji elektronów w skaningowym mikroskopie elektronowym |
| US7531812B2 (en) | 2003-10-27 | 2009-05-12 | Politechnika Wroclawska | Method and system for the directional detection of electrons in a scanning electron microscope |
| EP3203494B1 (en) * | 2014-09-24 | 2019-12-18 | National Institute for Materials Science | Energy-discrimination electron detector and scanning electron microscope in which same is used |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60124852U (ja) * | 1984-02-01 | 1985-08-22 | 日本電子株式会社 | 電子線装置 |
-
1986
- 1986-02-07 JP JP61025525A patent/JPS62184752A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS62184752A (ja) | 1987-08-13 |
Similar Documents
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| EXPY | Cancellation because of completion of term |