JPH0496006U - - Google Patents

Info

Publication number
JPH0496006U
JPH0496006U JP577491U JP577491U JPH0496006U JP H0496006 U JPH0496006 U JP H0496006U JP 577491 U JP577491 U JP 577491U JP 577491 U JP577491 U JP 577491U JP H0496006 U JPH0496006 U JP H0496006U
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP577491U
Other languages
Japanese (ja)
Other versions
JP2552802Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1991005774U priority Critical patent/JP2552802Y2/ja
Publication of JPH0496006U publication Critical patent/JPH0496006U/ja
Application granted granted Critical
Publication of JP2552802Y2 publication Critical patent/JP2552802Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
JP1991005774U 1991-01-20 1991-01-20 ガラス厚み測定装置 Expired - Lifetime JP2552802Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1991005774U JP2552802Y2 (ja) 1991-01-20 1991-01-20 ガラス厚み測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1991005774U JP2552802Y2 (ja) 1991-01-20 1991-01-20 ガラス厚み測定装置

Publications (2)

Publication Number Publication Date
JPH0496006U true JPH0496006U (enrdf_load_stackoverflow) 1992-08-20
JP2552802Y2 JP2552802Y2 (ja) 1997-10-29

Family

ID=31736569

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1991005774U Expired - Lifetime JP2552802Y2 (ja) 1991-01-20 1991-01-20 ガラス厚み測定装置

Country Status (1)

Country Link
JP (1) JP2552802Y2 (enrdf_load_stackoverflow)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5231762A (en) * 1975-09-05 1977-03-10 Hitachi Ltd Method of measuring thickness and composition of thin film formed on s ubstrate
JPS5682511U (enrdf_load_stackoverflow) * 1979-11-14 1981-07-03
JPS60143705A (ja) * 1983-12-29 1985-07-30 Kawasaki Steel Corp グレイメモリ−を用いた板厚測定装置

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5231762A (en) * 1975-09-05 1977-03-10 Hitachi Ltd Method of measuring thickness and composition of thin film formed on s ubstrate
JPS5682511U (enrdf_load_stackoverflow) * 1979-11-14 1981-07-03
JPS60143705A (ja) * 1983-12-29 1985-07-30 Kawasaki Steel Corp グレイメモリ−を用いた板厚測定装置

Also Published As

Publication number Publication date
JP2552802Y2 (ja) 1997-10-29

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