JPH0469552A - Nondestructive inspecting method for ceramic member - Google Patents

Nondestructive inspecting method for ceramic member

Info

Publication number
JPH0469552A
JPH0469552A JP18229890A JP18229890A JPH0469552A JP H0469552 A JPH0469552 A JP H0469552A JP 18229890 A JP18229890 A JP 18229890A JP 18229890 A JP18229890 A JP 18229890A JP H0469552 A JPH0469552 A JP H0469552A
Authority
JP
Japan
Prior art keywords
light
defect
ceramic member
inspection
irradiating
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP18229890A
Other languages
Japanese (ja)
Inventor
Hiroki Sugiura
Shigeru Iijima
Takehiko Kato
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NGK Spark Plug Co Ltd
Original Assignee
NGK Spark Plug Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NGK Spark Plug Co Ltd filed Critical NGK Spark Plug Co Ltd
Priority to JP18229890A priority Critical patent/JPH0469552A/en
Publication of JPH0469552A publication Critical patent/JPH0469552A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE: To easily detect a defect in the surface of a ceramic member which has light transmissivity with high accuracy by irradiating one surface of the ceramic member with light and visualizing the defect in a view-side surface.
CONSTITUTION: A lighting device in use is constituted by converging light from the light source and holding specific illuminance from a light converging lens part S atop an optical fiber H through the operation fiber H. Further, the irradiation direction of the light converging lens part S is freely changed. For inspection, a proper inspection position of the ceramic member 1 is irradiated. Then light irradiating the defect 2 is used for back lighting to emboss blackishly and visualize the defect. Whether or not there is the embossed defect is discriminated to decide the product. Consequently, the inspection accuracy is improved without spoiling the convenience nor easiness of the visual inspection.
COPYRIGHT: (C)1992,JPO&Japio
JP18229890A 1990-07-10 1990-07-10 Nondestructive inspecting method for ceramic member Pending JPH0469552A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18229890A JPH0469552A (en) 1990-07-10 1990-07-10 Nondestructive inspecting method for ceramic member

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18229890A JPH0469552A (en) 1990-07-10 1990-07-10 Nondestructive inspecting method for ceramic member

Publications (1)

Publication Number Publication Date
JPH0469552A true JPH0469552A (en) 1992-03-04

Family

ID=16115843

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18229890A Pending JPH0469552A (en) 1990-07-10 1990-07-10 Nondestructive inspecting method for ceramic member

Country Status (1)

Country Link
JP (1) JPH0469552A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102937592A (en) * 2012-10-20 2013-02-20 山东理工大学 Ceramic radome pore and material loosening defect automatic detection method
JP2015197316A (en) * 2014-03-31 2015-11-09 古河電気工業株式会社 Method and device for inspecting tape for wafer processing and method for manufacturing tape for wafer processing
JP2016020854A (en) * 2014-07-15 2016-02-04 株式会社デンソー Spark plug insulator defect inspection method

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS623055B2 (en) * 1980-12-26 1987-01-23 Sharp Kk
JPH0210256A (en) * 1988-06-29 1990-01-16 Ishikawajima Kensa Keisoku Kk Method for detecting flaw in ceramic board

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS623055B2 (en) * 1980-12-26 1987-01-23 Sharp Kk
JPH0210256A (en) * 1988-06-29 1990-01-16 Ishikawajima Kensa Keisoku Kk Method for detecting flaw in ceramic board

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102937592A (en) * 2012-10-20 2013-02-20 山东理工大学 Ceramic radome pore and material loosening defect automatic detection method
CN102937592B (en) * 2012-10-20 2014-07-16 山东理工大学 Ceramic radome pore and material loosening defect automatic detection method
JP2015197316A (en) * 2014-03-31 2015-11-09 古河電気工業株式会社 Method and device for inspecting tape for wafer processing and method for manufacturing tape for wafer processing
JP2016020854A (en) * 2014-07-15 2016-02-04 株式会社デンソー Spark plug insulator defect inspection method

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