JPH0454167B2 - - Google Patents
Info
- Publication number
- JPH0454167B2 JPH0454167B2 JP58073716A JP7371683A JPH0454167B2 JP H0454167 B2 JPH0454167 B2 JP H0454167B2 JP 58073716 A JP58073716 A JP 58073716A JP 7371683 A JP7371683 A JP 7371683A JP H0454167 B2 JPH0454167 B2 JP H0454167B2
- Authority
- JP
- Japan
- Prior art keywords
- resistance
- relay
- processing unit
- central processing
- output device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000000034 method Methods 0.000 claims description 26
- 238000012545 processing Methods 0.000 claims description 25
- 238000009529 body temperature measurement Methods 0.000 claims description 19
- 230000005856 abnormality Effects 0.000 claims description 5
- 238000001514 detection method Methods 0.000 claims description 3
- 238000012795 verification Methods 0.000 description 14
- 238000005259 measurement Methods 0.000 description 8
- 238000010586 diagram Methods 0.000 description 3
- 230000002159 abnormal effect Effects 0.000 description 1
- 238000004378 air conditioning Methods 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 238000011084 recovery Methods 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K15/00—Testing or calibrating of thermometers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
- G01K7/16—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements
- G01K7/18—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a linear resistance, e.g. platinum resistance thermometer
- G01K7/20—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a linear resistance, e.g. platinum resistance thermometer in a specially-adapted circuit, e.g. bridge circuit
Description
【発明の詳細な説明】
（技術分野）
本発明は、ビル管理システム等における測温抵
抗体と中央処理装置ならびに測温抵抗体と中央処
理装置とのインターフエースをつかさどるプロセ
ス入出力装置を使用した温度計測方法に関するも
のである。[Detailed Description of the Invention] (Technical Field) The present invention uses a process input/output device that controls the interface between a resistance temperature detector and a central processing unit as well as the resistance temperature detector and the central processing unit in a building management system, etc. This relates to a temperature measurement method.
（背景技術）
第１図は従来の測温抵抗体とプロセス入出力装
置と中央処理装置を使用した温度計測システムを
示したもので図中１は電子計算機の中央処理装
置、２はプロセス入出力装置、３は測温抵抗体で
ある。(Background Art) Figure 1 shows a conventional temperature measurement system using a resistance temperature detector, a process input/output device, and a central processing unit. In the figure, 1 is the central processing unit of an electronic computer, and 2 is the process input/output The device 3 is a resistance temperature sensor.
プロセス入出力装置２は、信号入力端子板２
１、リレーマルチプレクサ２２、抵抗／電圧交換
器２３、アナログ／デジタル変換器２４、ゲート
回路２５、ラツチ回路２６、デコーダ回路２７、
制御回路２８から構成されている。 The process input/output device 2 includes a signal input terminal board 2
1, relay multiplexer 22, resistance/voltage exchanger 23, analog/digital converter 24, gate circuit 25, latch circuit 26, decoder circuit 27,
It is composed of a control circuit 28.
リレーマルチプレクサ２２は、リレーＡ，Ｂ、
リレーＡの接点a1，a2，a3、リレーＢの接点b1，
b2，b3からなつている。 The relay multiplexer 22 has relays A, B,
Contacts a 1 , a 2 , a 3 of relay A, contacts b 1 of relay B,
It consists of b 2 and b 3 .
前記温度計測システムは、中央処理装置１によ
り、プロセス入出力装置２が選択されると制御回
路２８が作動し、ラツチ回路２６に中央処理装置
１より送出されたリレーマルチプレクサ２２のリ
レーの指定データがセツトされ、デコーダ回路２
７を介して、リレーマルチプレクサ２２が選択さ
れ、測温抵抗体３と接続される。たとえばリレー
Ａが選択されればリレーＡの接点a1，a2，a3が作
動し、測温抵抗体３１と接続されることになる。 In the temperature measurement system, when the process input/output device 2 is selected by the central processing unit 1, the control circuit 28 is activated, and the relay designation data of the relay multiplexer 22 sent from the central processing unit 1 is sent to the latch circuit 26. decoder circuit 2
7, the relay multiplexer 22 is selected and connected to the resistance temperature detector 3. For example, if relay A is selected, contacts a 1 , a 2 , and a 3 of relay A are activated and connected to resistance temperature detector 31 .
測温抵抗体３の抵抗値は、信号入力端子板２
１、リレーマルチプレクサ２２を介して、抵抗／
電圧変換器２３で電圧値に変換され、アナログ／
デジタル変換器２４でデジタル化されゲート回路
２５に送られ中央処理装置１で認識する様動作す
る。 The resistance value of the resistance temperature detector 3 is the same as that of the signal input terminal board 2.
1. Through the relay multiplexer 22, the resistor/
It is converted into a voltage value by the voltage converter 23 and converted into an analog/
The data is digitized by the digital converter 24, sent to the gate circuit 25, and operated to be recognized by the central processing unit 1.
しかしながら、プロセス入出力装置２に何らか
の障害が発生し全体的に誤つた温度計測値が中央
処理装置１に送られたとしても計測値が誤データ
であることを中央処理装置１に通知する手段がな
いため計測値が誤データであることをオペレータ
が気づくまで時間がかかり、かつ、その間は誤計
測値が採用されてしまうという欠点があつた。 However, even if some kind of failure occurs in the process input/output device 2 and an entirely incorrect temperature measurement value is sent to the central processing unit 1, there is no means to notify the central processing unit 1 that the measured value is incorrect data. Because there is no data, it takes time for the operator to realize that the measured value is erroneous data, and during that time, the erroneous measured value is adopted.
（発明の課題）
本発明の目的は、これらの欠点を解決すること
にあり、温度センサにより測定された計測値をプ
ロセス入出力装置を介して中央処理装置に送るよ
うにした温度測定方法であつて、前記プロセス入
出力装置に検出用の基準抵抗を備え、温度測定時
には、前記基準抵抗及び前記温度センサからの計
測値を交互に前記プロセス入出力装置に読み込
み、前記基準抵抗による計測値が所定の許容範囲
外にあるときは、中央処理装置はプロセス入出力
装置に異常があると判断することを特徴とするも
のであり、計測値の信頼性の向上ならびに障害の
早期発見と早期復旧を可能とする。以下詳細に説
明する。(Problems to be solved by the invention) An object of the present invention is to solve these drawbacks, and to provide a temperature measurement method in which measured values measured by a temperature sensor are sent to a central processing unit via a process input/output device. The process input/output device is provided with a reference resistance for detection, and when measuring temperature, the measured values from the reference resistance and the temperature sensor are alternately read into the process input/output device, and the measured value by the reference resistance is set to a predetermined value. is outside the allowable range, the central processing unit determines that there is an abnormality in the process input/output device, which improves the reliability of measured values and enables early detection and recovery of failures. shall be. This will be explained in detail below.
（発明の構成および作用）
第２図は、本発明の一実施例を示すもので図中
第１図と同一構成部品は、同一符合をもつて表わ
す。すなわち１は電子計算機の中央処理装置、２
はプロセス入出力装置、３は測温抵抗体であり、
信号入力端子板２１、リレーマルチプレクサ２
２、リレーＡ，Ｂ，Ｃ、リレーＡの接点a1，a2，
a3、リレーＢの接点b1，b2，b3、リレーＣの接点
c1，c2，c3、抵抗／電圧変換器２３、アナログ／
デジタル変換器２４、ゲート回路２５、ラツチ回
路２６、デコーダ回路２７、制御回路２８、検定
用基準抵抗２９で構成されている。(Structure and operation of the invention) FIG. 2 shows an embodiment of the present invention, and the same components as in FIG. 1 are represented by the same reference numerals. In other words, 1 is the central processing unit of the computer, 2
is a process input/output device, 3 is a resistance temperature sensor,
Signal input terminal board 21, relay multiplexer 2
2. Relays A, B, C, contacts a 1 , a 2 of relay A,
a 3 , relay B contacts b 1 , b 2 , b 3 , relay C contacts
c 1 , c 2 , c 3 , resistance/voltage converter 23, analog/
It is composed of a digital converter 24, a gate circuit 25, a latch circuit 26, a decoder circuit 27, a control circuit 28, and a reference resistor 29 for verification.
次に動作について第３図と共に説明する。温度
計測を行なう場合、中央処理装置１によりプロセ
ス入出力装置２が選択されると（第３図の100）
制御回路２８が作動し、ラツチ回路２６に中央処
理装置１より送出されたリレーマルチプレクサ２
２のリレーの指定データがセツトされる。初めに
検定用基準抵抗２９を選択する為データとしてリ
レーＣが指定され、デコーダ回路２７を介してリ
レーマルチプレクサ２２においてリレーＣが選択
されリレーＣの接点、c1，c2，c3、が作動し、検
定用基準抵抗２９と接続されることになる
（102）。 Next, the operation will be explained with reference to FIG. When performing temperature measurement, when the process input/output device 2 is selected by the central processing unit 1 (100 in Fig. 3)
The control circuit 28 operates, and the relay multiplexer 2 sent from the central processing unit 1 to the latch circuit 26
The designation data for the second relay is set. First, relay C is specified as data to select the reference resistance 29 for verification, and relay C is selected in the relay multiplexer 22 via the decoder circuit 27, and the contacts of relay C, c 1 , c 2 , and c 3 are activated. Then, it is connected to the verification reference resistance 29 (102).
検定用基準抵抗２９の抵抗値は、リレーマルチ
プレクサ２２を介して抵抗／電圧変換器２３で電
圧値に変換され、アナログ／デジタル変換器２４
でデジタル化され、ゲート回路２５に送られ中央
処理装置１で認識される（104）。 The resistance value of the verification reference resistance 29 is converted to a voltage value by the resistance/voltage converter 23 via the relay multiplexer 22, and then converted to a voltage value by the analog/digital converter 24.
The data is digitized, sent to the gate circuit 25, and recognized by the central processing unit 1 (104).
次に温度計測をすべく中央処理装置１によりプ
ロセス入出力装置２が選択されると制御回路２８
が作動し、ラツチ回路２６に中央処理装置１より
送出されたリレーマルチプレクサ２２の指定デー
タがセツトされる。 Next, when the process input/output device 2 is selected by the central processing unit 1 for temperature measurement, the control circuit 28
is activated, and the designation data of the relay multiplexer 22 sent from the central processing unit 1 is set in the latch circuit 26.
測温抵抗体３１を選択する為データとして、リ
レーＡが指定だれデコーダ回路２７を介してリレ
ーマルチプレクサ２２においてリレーＡが選択さ
れリレーＡの接点a1，a2，a3が作動し、測温抵抗
体３１と接続されることとなる（108）。 Relay A is designated as data for selecting the resistance temperature sensor 31. Relay A is selected in relay multiplexer 22 via decoder circuit 27, contacts a 1 , a 2 , and a 3 of relay A are activated, and temperature measurement is performed. It will be connected to the resistor 31 (108).
測温抵抗体３１の抵抗値は、リレーマルチプレ
クサ２２を介して抵抗／電圧変換器２３で電圧値
に変換され、アナログ／デジタル変換器２４でデ
ジタル化され、ゲート回路２５に送られ、中央処
理装置１で認識される（110）。 The resistance value of the resistance temperature detector 31 is converted into a voltage value by a resistance/voltage converter 23 via a relay multiplexer 22, digitized by an analog/digital converter 24, and sent to a gate circuit 25, where it is sent to a central processing unit. 1 (110).
その次に同様にデータとしてリレーＢが指定さ
れ、リレーＢが選択されリレーＢの接点、b1，
b2，b3が作動し、測温抵抗体３２と接続され、測
温抵抗体３２の抵抗値は電圧値、デジタル値と変
換され中央処理装置２で認識される（114）。 Next, relay B is specified as data in the same way, relay B is selected, and the contacts of relay B, b 1 ,
b 2 and b 3 are activated and connected to the resistance temperature detector 32, and the resistance value of the resistance temperature detector 32 is converted into a voltage value and a digital value and recognized by the central processing unit 2 (114).
ここで中央処理装置１は、検定用基準抵抗２９
の計測値が許容誤差内になければ（106）、プロセ
ス入出力装置２に障害が発生し全体的に誤つた温
度計測値が送られたと判断し、その時点の測温抵
抗体３からの温度計測値をすべて廃棄する（112）
とともにオペレータに検定用基準抵抗２９の計測
値が異常であることを通知する。 Here, the central processing unit 1 has a reference resistance for verification 29.
If the measured value is not within the allowable error (106), it is determined that a failure has occurred in the process input/output device 2 and an entirely incorrect temperature measurement value has been sent, and the temperature from the resistance thermometer 3 at that point is determined. Discard all measured values (112)
At the same time, the operator is notified that the measured value of the verification reference resistance 29 is abnormal.
以上説明したように実施例では、プロセス入出
力装置２に検定用の基準抵抗を内蔵していて、プ
ロセス入出力装置の障害で全体的に誤つた温度計
測値が中央処理装置１に送られても誤測値である
ことを中央処理装置に通知出来るので誤つた温度
計測値を廃棄することにより、後計測値の採用を
妨げるとともに、すみやかにオペレータに検定用
基準抵抗計測値の異常を通知出来る。 As explained above, in the embodiment, the process input/output device 2 has a built-in reference resistance for verification, and a temperature measurement value that is entirely incorrect due to a failure in the process input/output device is sent to the central processing unit 1. By discarding the erroneous temperature measurement value, it is possible to notify the central processing unit that the temperature measurement value is also an erroneous measurement value, thereby preventing the adoption of a later measurement value, and promptly notifying the operator of an abnormality in the reference resistance measurement value for verification. .
上記実施例では、２つの測温抵抗体に対応した
測温抵抗体計測方法で説明したが、１つまたは３
つ以上に対応するものであつてもよい。 In the above embodiment, the resistance temperature detector measurement method was explained that corresponds to two resistance temperature detectors, but one or three
It may correspond to more than one.
また、検定用の基準抵抗の計測を測温抵抗体を
計測する前に１回行なつて説明したが測温抵抗体
の計測とその次の測温抵抗体の計測の間あるいは
最後の測温抵抗体の計測後でもよく、かつ検定用
の基準抵抗の計測は２回以上行なつてもよい。 In addition, although we explained that the standard resistance for verification was measured once before measuring the resistance temperature detector, it is not possible to measure the reference resistance for the test between the measurement of the resistance temperature detector and the next measurement or the last temperature measurement. The measurement may be performed after the measurement of the resistor, and the measurement of the reference resistance for verification may be performed two or more times.
また初めに検定用の基準抵抗の計測をする場合
は、計測値が許容範囲外となればただちに異常と
して、測温抵抗体の計測を中断し再び検定用の基
準抵抗の計測を行なつてもよい。 In addition, when first measuring the standard resistance for verification, if the measured value is outside the allowable range, immediately treat it as an abnormality, stop measuring the resistance temperature sensor, and measure the standard resistance for verification again. good.
（発明の効果）
本発明はプロセス入出力装置に検定用の基準抵
抗を内蔵しているので誤つた温度計測データを廃
棄することが出来るとともにオペレータに異常を
通知出来るので、ビル管理システムのように24時
間運用で温度計測値を空調の制御に利用している
ものに適用すれば、誤制御防止省エネルギー、省
力化に有益である。(Effects of the Invention) The present invention has a built-in reference resistance for verification in the process input/output device, so erroneous temperature measurement data can be discarded and the operator can be notified of an abnormality, so it can be used as a building management system. If applied to systems that use temperature measurement values to control air conditioning during 24-hour operation, it would be beneficial to prevent incorrect control and save energy and labor.
第１図は従来の温度計測システムのブロツク
図、第２図は本発明による温度計測システムのブ
ロツク図、第３図は本発明の動作フロー図であ
る。
１……中央処理装置、２……プロセス入出力装
置、３……測温抵抗体、２１……信号入力端子
板、２２……リレーマルチプレクサ、２３……抵
抗／電圧変換器、２４……アナログ／デジタル変
換器、２５……ゲート回路、２６……ラツチ回
路、２７……デコーダ回路、２８……制御回路、
２９……検定用基準抵抗、Ａ，Ｂ，Ｃ……リレ
ー、a1，a2，a3，b1，b2，b3，c1，c2，c3……リ
レー接点、３１，３２……測温抵抗体。
FIG. 1 is a block diagram of a conventional temperature measurement system, FIG. 2 is a block diagram of a temperature measurement system according to the present invention, and FIG. 3 is an operation flow diagram of the present invention. DESCRIPTION OF SYMBOLS 1...Central processing unit, 2...Process input/output device, 3...Resistance temperature sensor, 21...Signal input terminal board, 22...Relay multiplexer, 23...Resistance/voltage converter, 24...Analog /digital converter, 25... gate circuit, 26... latch circuit, 27... decoder circuit, 28... control circuit,
29... Reference resistance for verification, A, B, C... Relay, a 1 , a 2 , a 3 , b 1 , b 2 , b 3 , c 1 , c 2 , c 3 ... Relay contact, 31, 32...Resistance temperature sensor.
Claims (1)
ス入出力装置を介して中央処理装置に送るように
した温度測定方法において、 前記プロセス入出力装置に検出用の基準抵抗を
備え、 温度測定時には、前記基準抵抗及び前記温度セ
ンサからの計測値を交互に前記プロセス入出力装
置に読み込み、 前記基準抵抗による計測値が所定の許容範囲外
にあるときは、中央処理装置はプロセス入出力装
置に異常があると判断することを特徴とする温度
測定方法。[Claims] 1. A temperature measurement method in which a measured value measured by a temperature sensor is sent to a central processing unit via a process input/output device, comprising: a reference resistance for detection in the process input/output device; When measuring temperature, the measured values from the reference resistance and the temperature sensor are alternately read into the process input/output device, and when the measured value by the reference resistance is outside a predetermined tolerance range, the central processing unit reads the measured values from the reference resistance and the temperature sensor into the process input/output device. A temperature measurement method characterized by determining that there is an abnormality in the device.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7371683A JPS59200934A (en) | 1983-04-28 | 1983-04-28 | Measuring method of temperature measuring resistor |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7371683A JPS59200934A (en) | 1983-04-28 | 1983-04-28 | Measuring method of temperature measuring resistor |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS59200934A JPS59200934A (en) | 1984-11-14 |
| JPH0454167B2 true JPH0454167B2 (en) | 1992-08-28 |
Family
ID=13526219
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP7371683A Granted JPS59200934A (en) | 1983-04-28 | 1983-04-28 | Measuring method of temperature measuring resistor |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS59200934A (en) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0331731A (en) * | 1989-06-29 | 1991-02-12 | Komatsu Ltd | Method and circuit for detecting disconnection of thermistor temperature sensor circuit |
| DE102006021543A1 (en) * | 2006-05-08 | 2007-11-15 | Abb Technology Ag | System and method for the automated acceptance and evaluation of the quality of mass data of a technical process or a technical project |
| US8788233B2 (en) * | 2011-01-18 | 2014-07-22 | General Electric Company | Diagnostic system and method for a thermistor amplifier circuit |
| CN103267593B (en) * | 2013-04-23 | 2015-05-06 | 沈艳秋 | Automatic thermocouple verifying system |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5674312U (en) * | 1979-11-12 | 1981-06-18 |
-
1983
- 1983-04-28 JP JP7371683A patent/JPS59200934A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS59200934A (en) | 1984-11-14 |
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