JPH0452742U - - Google Patents

Info

Publication number
JPH0452742U
JPH0452742U JP9545090U JP9545090U JPH0452742U JP H0452742 U JPH0452742 U JP H0452742U JP 9545090 U JP9545090 U JP 9545090U JP 9545090 U JP9545090 U JP 9545090U JP H0452742 U JPH0452742 U JP H0452742U
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP9545090U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP9545090U priority Critical patent/JPH0452742U/ja
Publication of JPH0452742U publication Critical patent/JPH0452742U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Die Bonding (AREA)
JP9545090U 1990-09-10 1990-09-10 Pending JPH0452742U (enrdf_load_stackoverflow)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9545090U JPH0452742U (enrdf_load_stackoverflow) 1990-09-10 1990-09-10

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9545090U JPH0452742U (enrdf_load_stackoverflow) 1990-09-10 1990-09-10

Publications (1)

Publication Number Publication Date
JPH0452742U true JPH0452742U (enrdf_load_stackoverflow) 1992-05-06

Family

ID=31834168

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9545090U Pending JPH0452742U (enrdf_load_stackoverflow) 1990-09-10 1990-09-10

Country Status (1)

Country Link
JP (1) JPH0452742U (enrdf_load_stackoverflow)

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