JPH044285U - - Google Patents

Info

Publication number

JPH044285U

JPH044285U JP4595890U JP4595890U JPH044285U JP H044285 U JPH044285 U JP H044285U JP 4595890 U JP4595890 U JP 4595890U JP 4595890 U JP4595890 U JP 4595890U JP H044285 U JPH044285 U JP H044285U

Authority

JP

Japan

Prior art keywords

pin probe

test object

poor contact

prevent

signals

Prior art date

1990-04-27

Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)

Pending

Links

• Espacenet
• Global Dossier
• Discuss

• 239000000523 sample Substances 0.000 claims description 6
• 238000012360 testing method Methods 0.000 claims description 4
• 238000002788 crimping Methods 0.000 claims 1
• 238000005259 measurement Methods 0.000 claims 1
• 238000010586 diagram Methods 0.000 description 3
• 238000011990 functional testing Methods 0.000 description 2
• 230000002265 prevention Effects 0.000 description 1