JPH04143645A - Melting point measuring method - Google Patents

Melting point measuring method

Info

Publication number
JPH04143645A
JPH04143645A JP26776990A JP26776990A JPH04143645A JP H04143645 A JPH04143645 A JP H04143645A JP 26776990 A JP26776990 A JP 26776990A JP 26776990 A JP26776990 A JP 26776990A JP H04143645 A JPH04143645 A JP H04143645A
Authority
JP
Japan
Prior art keywords
measured
substance
object
melted
light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP26776990A
Inventor
Akira Fukami
Original Assignee
Nuclear Fuel Ind Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nuclear Fuel Ind Ltd filed Critical Nuclear Fuel Ind Ltd
Priority to JP26776990A priority Critical patent/JPH04143645A/en
Publication of JPH04143645A publication Critical patent/JPH04143645A/en
Application status is Pending legal-status Critical

Links

Abstract

PURPOSE: To measure the m.p. of an object to be measured easily, rapidly and accurately by irradiating the object to be measured preliminarily mixed or coated with a specific heating auxiliary with light and measuring the temp. of the part melted by said light.
CONSTITUTION: A powder of a substance having an m.p. higher than that of a substance 3 whose m.p. must be measured and not mutually reacting with said substance and having high absorptivity to the wavelength distribution of irradiated light is added to and mixed with the substance 3 whose m.p. must be measured as a heating auxiliary 2 and this substance 3 is subjected to press processing to from a columnar object 1 to be measured. The object 1 to be measured is irradiated with the beam from a xenon lamp or laser beam 4 to be heated and melted. Even when the object 1 to be measured can not be sufficiently raised in temp. at this time, since the m.p. of the substance 3 is lower than that of the auxiliary 2, only the substance 3 is melted and the m.p. thereof can be measured by a radiation thermometer 5. By this method, the m.p. of the substance 3 can be measured easily, rapidly and accurately.
COPYRIGHT: (C)1992,JPO&Japio
JP26776990A 1990-10-05 1990-10-05 Melting point measuring method Pending JPH04143645A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP26776990A JPH04143645A (en) 1990-10-05 1990-10-05 Melting point measuring method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP26776990A JPH04143645A (en) 1990-10-05 1990-10-05 Melting point measuring method

Publications (1)

Publication Number Publication Date
JPH04143645A true JPH04143645A (en) 1992-05-18

Family

ID=17449335

Family Applications (1)

Application Number Title Priority Date Filing Date
JP26776990A Pending JPH04143645A (en) 1990-10-05 1990-10-05 Melting point measuring method

Country Status (1)

Country Link
JP (1) JPH04143645A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6443616B1 (en) * 1999-05-13 2002-09-03 Gregory R. Brotz Material melting point determination apparatus
JP2008170250A (en) * 2007-01-11 2008-07-24 Japan Atomic Energy Agency Specimen container for melting point measurement of mox fuel and melting point measurement specimen using the same
US9287177B2 (en) 2002-03-12 2016-03-15 Hamamatsu Photonics K.K. Substrate dividing method
US9837315B2 (en) 2000-09-13 2017-12-05 Hamamatsu Photonics K.K. Laser processing method and laser processing apparatus

Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6443616B1 (en) * 1999-05-13 2002-09-03 Gregory R. Brotz Material melting point determination apparatus
US9837315B2 (en) 2000-09-13 2017-12-05 Hamamatsu Photonics K.K. Laser processing method and laser processing apparatus
US9553023B2 (en) 2002-03-12 2017-01-24 Hamamatsu Photonics K.K. Substrate dividing method
US9711405B2 (en) 2002-03-12 2017-07-18 Hamamatsu Photonics K.K. Substrate dividing method
US9543256B2 (en) 2002-03-12 2017-01-10 Hamamatsu Photonics K.K. Substrate dividing method
US9543207B2 (en) 2002-03-12 2017-01-10 Hamamatsu Photonics K.K. Substrate dividing method
US9548246B2 (en) 2002-03-12 2017-01-17 Hamamatsu Photonics K.K. Substrate dividing method
US9287177B2 (en) 2002-03-12 2016-03-15 Hamamatsu Photonics K.K. Substrate dividing method
US10068801B2 (en) 2002-03-12 2018-09-04 Hamamatsu Photonics K.K. Substrate dividing method
JP2008170250A (en) * 2007-01-11 2008-07-24 Japan Atomic Energy Agency Specimen container for melting point measurement of mox fuel and melting point measurement specimen using the same
JP4604154B2 (en) * 2007-01-11 2010-12-22 独立行政法人 日本原子力研究開発機構 Melting point measurement sample Mox fuel

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