JPH04141372A - Diamond grinding wheel - Google Patents

Diamond grinding wheel

Info

Publication number
JPH04141372A
JPH04141372A JP25959290A JP25959290A JPH04141372A JP H04141372 A JPH04141372 A JP H04141372A JP 25959290 A JP25959290 A JP 25959290A JP 25959290 A JP25959290 A JP 25959290A JP H04141372 A JPH04141372 A JP H04141372A
Authority
JP
Japan
Prior art keywords
grinding
diamond
grinding wheel
diamond film
film
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP25959290A
Other languages
Japanese (ja)
Inventor
Takumi Shibuya
巧 渋谷
Junya Oe
大江 潤也
Noribumi Kikuchi
菊池 則文
Hiroaki Yamashita
山下 博明
Tatsuyoshi Watanabe
渡辺 竜良
Hajime Ito
肇 伊藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Materials Corp
Original Assignee
Mitsubishi Materials Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Materials Corp filed Critical Mitsubishi Materials Corp
Priority to JP25959290A priority Critical patent/JPH04141372A/en
Publication of JPH04141372A publication Critical patent/JPH04141372A/en
Pending legal-status Critical Current

Links

Landscapes

  • Polishing Bodies And Polishing Tools (AREA)

Abstract

PURPOSE:To increase a grinding efficiency drastically, by forming a diamond film with a vapor phase composite method, at the projection part at least of the uneven grinding face formed with plural grooves crossed regularly with the surface of a grinding wheel base body. CONSTITUTION:An uneven face is formed by forming plural grooves 3 regularly crossed with the grindingwheel base body 1 surface. Then, a desired diamond grinding wheel is obtained by forming a vapor phase composite diamond film 5 at this projection part 4 at least of the uneven face. Consequently, no clogging is caused because of a grinding chip powder being discharged through this groove 3, so the grinding efficiency is not reduced for a long time.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 この発明は、砥石基体の表面に気相合成法によりダイヤ
モンド膜(以下、気相合成ダイヤモンド膜という)を形
成してなるダイヤモンド砥石に関するものであり、例え
ばストレートホイールカップホイール、ホーニングスト
ーン、ペンシルエツジホイール、ディスクホイール、カ
ーブジェネレーターの研削面に気相合成ダイヤモンド膜
を形成したダイヤモンドホイールに関するものである。
[Detailed Description of the Invention] [Field of Industrial Application] The present invention relates to a diamond whetstone in which a diamond film (hereinafter referred to as a vapor-phase synthesized diamond film) is formed on the surface of a whetstone base by a vapor phase synthesis method. For example, it relates to diamond wheels in which a vapor-phase synthetic diamond film is formed on the grinding surface of straight wheel cup wheels, honing stones, pencil edge wheels, disc wheels, and curve generators.

〔従来の技術〕[Conventional technology]

一般に、砥石基体表面に気相合成法により人工ダイヤモ
ンド膜を析出生成させたダイヤモンド砥石(以下、これ
をダイヤモンド砥石という)は知られており、このダイ
ヤモンド砥石は、ガラス、グラファイト、セラミックス
などの表面研削に使用されている。
Diamond grinding wheels (hereinafter referred to as diamond grinding wheels) are generally known, in which an artificial diamond film is precipitated and formed on the surface of the grinding wheel base using a vapor phase synthesis method. used in

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

しかし、従来の砥石基体表面に気相合成ダイヤモンド膜
を形成してなるダイヤモンド砥石は、上記気相合成ダイ
ヤモンド膜自体の表面粗さが小さいために、研削開始後
、短時間のうぢに微細な研削屑粉が気相合成ダイヤモン
ド膜に目づまりを起し、研削能率が激減するという課題
があった。
However, in conventional diamond grinding wheels, which are made by forming a vapor-phase synthetic diamond film on the surface of the grinding wheel base, because the surface roughness of the vapor-phase synthetic diamond film itself is small, after the start of grinding, the diamond grinding wheel has very fine grains for a short period of time. The problem was that grinding debris clogged the vapor-phase synthetic diamond film, drastically reducing grinding efficiency.

〔課題を解決するための手段〕[Means to solve the problem]

そこで、本発明者等は、研削能率を低下させることのな
い気相合成ダイヤモンド膜を有するダイヤモンド砥石を
製造すべく研究を行った結果、砥石基体表面に規則的に
交叉する複数本の溝を形成することにより凹凸面を形成
し、上記凹凸面の少なくとも凸部分に気相合成ダイヤモ
ンド膜を形成して得られたダイヤモンド砥石は、研削屑
粉が上記溝を通して排出されるため目づまりを起すこと
がなく、したがって研削能率が長時間にわたって低下す
ることがないという知見を得たのである。
Therefore, the present inventors conducted research to manufacture a diamond grinding wheel with a vapor-phase synthetic diamond film that does not reduce grinding efficiency, and as a result, they formed a plurality of regularly intersecting grooves on the surface of the grinding wheel base. A diamond grinding wheel obtained by forming an uneven surface and forming a vapor-phase synthetic diamond film on at least the convex portions of the uneven surface does not cause clogging because grinding dust is discharged through the grooves. Therefore, it was found that the grinding efficiency does not decrease over a long period of time.

この発明は、かかる知見にもとづいてなされたものであ
って、 砥石基体の表面に規則的に交叉する複数本の溝によって
形成された凹凸研削面の少なくとも凸部分に気相合成ダ
イヤモンド膜を形成してなるダイヤモンド砥石に特徴を
有するものである。
This invention was made based on this knowledge, and includes forming a vapor-phase synthetic diamond film on at least the convex portions of the uneven grinding surface formed by a plurality of regularly intersecting grooves on the surface of the grinding wheel base. This is a unique feature of a diamond whetstone.

」上記溝は、その断面形状はいかなる形状のものでもよ
く、砥石基体表面に形成される溝模様もいかなるもので
もよい。基体表面に溝が存在することか必要なのである
The grooves may have any cross-sectional shape, and any groove pattern may be formed on the surface of the grindstone base. It is necessary that grooves exist on the surface of the substrate.

上記人工気相ダイヤモンド砥石を作製するための砥石基
体の材料は、人工気相合成法によりダイヤモンドj摸が
析出生成されるならば、いかなる何科を用いてもよい。
The material of the grinding wheel base for producing the artificial vapor phase diamond grinding wheel may be any material as long as diamond grains can be precipitated and produced by the artificial vapor phase synthesis method.

この発明のダイヤモンド砥石およびその製造法を図面を
用いて−)N具体的に説明する。
The diamond grindstone of the present invention and its manufacturing method will be specifically explained with reference to the drawings.

第1図は、鏡面研磨された砥石基体表面に交叉するU字
溝を形成したこの発明のダイヤモンド砥石の製造に用い
る砥石基体表面拡大図、第2図は、交叉するU字溝によ
って砥石基体表面に形成された角柱突起の平面に人工ダ
イヤモンド膜を析出生成させた状態を示す拡大斜視説明
図、である。
Fig. 1 is an enlarged view of the surface of a grinding wheel base used for manufacturing the diamond grinding wheel of the present invention, in which intersecting U-shaped grooves are formed on the surface of the grinding wheel base, which has been mirror-polished. FIG. 2 is an enlarged perspective explanatory view showing a state in which an artificial diamond film is deposited and generated on a plane of a prismatic protrusion formed in the prismatic projection.

第1図に示されるように、通常のフォトエツチング法に
より鏡面研磨した砥石基体1の表面2にU字溝3を交叉
するように形成すると、第2図に示されるようにU字溝
3で囲まれた多数の角柱突起4が形成される。このよう
な角柱突起4を有する基体1に通常の気体合成法により
人工ダイヤモンド膜5を析出生成せしめると、角柱突起
4の少なくとも表面に人工ダイヤモンド膜5が形成され
る。
As shown in FIG. 1, when U-shaped grooves 3 are formed so as to intersect with each other on the surface 2 of the grinding wheel base 1 which has been mirror-polished by a normal photoetching method, the U-shaped grooves 3 are formed as shown in FIG. A large number of surrounded prismatic projections 4 are formed. When the artificial diamond film 5 is deposited on the substrate 1 having such a prismatic projection 4 by a normal gas synthesis method, the artificial diamond film 5 is formed on at least the surface of the prismatic projection 4.

第2図では、角柱突起4の表面のみに人工ダイヤモンド
膜5が形成されているか、」二層人工ダイヤモンド膜5
は上記角柱突起4の表面たけてなく、U字溝3の中に形
成されてもよい。
In FIG. 2, whether the artificial diamond film 5 is formed only on the surface of the prismatic protrusion 4 or not, the two-layer artificial diamond film 5
may be formed in the U-shaped groove 3 instead of extending over the surface of the prismatic protrusion 4 .

このようにU字溝3を有する第2図に示されるような人
工気相ダイヤモンド砥石を用いて研削を行った場合、研
削屑粉は上記U字溝3を通して排出されるので、いつま
でも研削能率は低下しない。
When grinding is performed using an artificial vapor phase diamond grinding wheel as shown in FIG. 2 having the U-shaped groove 3, the grinding dust is discharged through the U-shaped groove 3, so the grinding efficiency remains constant. Does not decrease.

先にも述べたように、砥石基体の材料は、Mo。As mentioned earlier, the material of the whetstone base is Mo.

W、超硬合金、SiOSiC,Si 2′ 813N4.AΩN、サイアロンなどを用いることか可
能である。
W, cemented carbide, SiOSiC, Si 2' 813N4. It is possible to use AΩN, Sialon, etc.

」ニ記砥石基体の研削面に溝を形成する方法としては、
レーザーによる加工法、放電加工法、印刷プリント後の
エツチングによる方法、ストレートホイール等の砥石に
よる加工法、半導体用フォトリゾグラフィー法等か知ら
れており、その砥石基体の材質、溝幅なとにより、任意
に選定することができる。
” The method for forming grooves on the grinding surface of the whetstone base is as follows:
Processing methods using lasers, electrical discharge machining, etching after printing, processing using grindstones such as straight wheels, photolithography for semiconductors, etc. are known, and depending on the material of the grindstone base, groove width, etc. , can be arbitrarily selected.

一例として半導体用フ第1・リゾグラフィー法により溝
加]二を行う方法を説明する。
As an example, a method for forming grooves using a lithography method for semiconductors will be described.

第3図には、通常のフォトエツチング法により砥石基体
表面に交叉するU字溝および角柱突起を有する砥石基体
を作製する工程が記載されている。
FIG. 3 shows the process of producing a grindstone base having a U-shaped groove and a prismatic protrusion intersecting the surface of the grindstone base by a normal photoetching method.

第3図の(a)工程に示されるように、表面を鏡面研磨
した砥石基体1の表面に、フォトレジスト6を塗布する
。フォトレジスト6にはポジ型フォトレジストおよびネ
ガ型フォトレジストがあり、第3図(a)工程では露光
部分のフ第1・レジストが残存するネガ型フォトレジス
トを使用したものが記載されている。このフオトレジス
I−6を塗布した砥石基体1の」二に、 (b)工程で
示されるように、不透明部分9を有するフォトマスク7
を重ね合せ、上から紫外線8を当てることによりフォト
レジスト6を感光させる。
As shown in step (a) of FIG. 3, a photoresist 6 is applied to the surface of the grindstone base 1 whose surface has been mirror-polished. The photoresist 6 includes a positive type photoresist and a negative type photoresist, and the process shown in FIG. 3A uses a negative type photoresist in which the first resist remains in the exposed portion. As shown in step (b), a photomask 7 having an opaque portion 9 is applied to the second part of the grinding wheel base 1 coated with this photoresist I-6.
The photoresist 6 is exposed by overlapping them and applying ultraviolet rays 8 from above.

この感光したフォトレジスト6を現像すると(C)工程
に示される如く未感光のフォトレジスト部分のみが除去
され、感光したフォトレジスト部分は基板1上に残存す
る。この残存したフォトレジスト6を有する砥石基体1
をエツチングすると(d)工程に示される如くフ第1・
レジスト膜のない部分のみかエツチングされてU字溝3
が形成され、最後に」1記残存したフ第1・レジスI−
6を除去することにより、この発明で使用する角柱突起
4を有する砥石基体1か作製される。
When this exposed photoresist 6 is developed, only the unexposed photoresist portion is removed, and the exposed photoresist portion remains on the substrate 1, as shown in step (C). Grinding wheel base 1 with this remaining photoresist 6
As shown in step (d), the first layer is etched.
Only the part without resist film is etched to form U-shaped groove 3.
was formed, and finally the 1st Regis I-
By removing 6, the grindstone base 1 having the prismatic protrusions 4 used in the present invention is manufactured.

以上、砥石基体表面にU字溝を形成する方法について第
1図〜第3図を用いて説明してきたが、この発明の砥石
基体表面に形成される溝はU字溝に限定されるものでは
なく、いかなる断面形状の溝であってもよく、その溝の
大きさは、幅: 0.05um −1m+n、深さ・0
1吋um−0,5mmの範囲内にあることか好ましい。
The method for forming U-shaped grooves on the surface of the whetstone base has been explained above using FIGS. 1 to 3, but the grooves formed on the surface of the whetstone base of this invention are not limited to U-shaped grooves. The groove may have any cross-sectional shape, and the size of the groove is: Width: 0.05um -1m+n, Depth: 0
Preferably, it is within the range of 1 inch um - 0.5 mm.

さらに、第2図の角柱突起4のダイヤモンド膜が密着し
ている平面部分の表面粗さは、0.OI〜IItrIl
であることが好ましい。
Furthermore, the surface roughness of the flat portion of the prismatic protrusion 4 in FIG. 2 to which the diamond film is in close contact is 0. OI~IItrIl
It is preferable that

上記砥石基体は、全体を気相合成ダイヤモンド膜析出i
+J能な飼料で作製することもできるが、これではコス
トが高くなるので、砥石基体の主要部分はアルミニウム
、鋼などて作製し、研削面のみを気相合成ダイヤモンド
膜が析出生成しやすい飼料で複合させるとよい。
The above grinding wheel base is entirely coated with a vapor-phase synthesized diamond film deposited
It is also possible to make the grinding wheel using feed that has high J-efficiency, but this increases the cost, so the main part of the grinding wheel base is made of aluminum, steel, etc., and only the grinding surface is made of feed that is likely to deposit a vapor-phase synthetic diamond film. It is better to combine them.

また、アルミニウム、鋼などて作製された砥石基体の研
削面に気相合成ダイヤモンド膜を析出生成させたチップ
を貼り付けることによりダイヤモンド砥石を作製するこ
とかできる。
Further, a diamond whetstone can be manufactured by attaching a chip on which a vapor-phase synthetic diamond film is deposited to the grinding surface of a whetstone base made of aluminum, steel, or the like.

〔実 施 例〕〔Example〕

つぎに、この発明を実施例を用いて一層具体的に説明す
る。
Next, the present invention will be explained in more detail using examples.

実施例 1 直径: 150 mms厚さ:3mmの合成石英円板を
用意し、この合成石英円板の表面をラッピングしたのち
、ポリッシングし、このポリッシングした合成石英円板
の表面をアルカリ脱脂により清浄し、水分を十分除去し
たのち、フォトレジスト液を塗布した。ここで使用した
フ第1・レジスト液はOF P R−800と称するポ
ジ型フ第1・レジスト液である。
Example 1 A synthetic quartz disk with a diameter of 150 mm and a thickness of 3 mm was prepared, and the surface of this synthetic quartz disk was lapped and polished, and the surface of the polished synthetic quartz disk was cleaned by alkaline degreasing. After sufficiently removing water, a photoresist solution was applied. The first resist liquid used here is a positive type first resist liquid called OF PR-800.

上記塗布したフ第1・レジス1盲rlの溶媒を、温度1
10℃、90秒間保持のプレベークすることにより蒸発
させ、ラップ仕上した合成石英円板の表面にフォトレジ
スト膜を形成した。
The solvent of the coated film No. 1 and Regis No. 1 blind rl was heated to 1
A photoresist film was formed on the surface of a lapped synthetic quartz disk by prebaking at 10° C. for 90 seconds.

一方、格子状フォトマスクを用意し、このフォトマスク
を上記フォトレジスト膜を有する合成石英円板の上に重
ね合せ、波長:43Gnmの水銀灯を用いて上記フォト
マスクの上から紫外線を照射し、」一層合成石英円板表
面のレジスト膜を感光させた。
On the other hand, a lattice-shaped photomask is prepared, this photomask is superimposed on the synthetic quartz disk having the photoresist film, and ultraviolet rays are irradiated from above the photomask using a mercury lamp with a wavelength of 43 Gnm. The resist film on the surface of the synthetic quartz disk was then exposed to light.

この感光した合成石英円板表■】のレジスト膜を現像す
ると感光部分のフォトレジストは溶出し、フォトレジス
ト ル状フォトレジスト膜の付着した合成石英円板をボスト
ベークすることにより現像液、リンス液を除去し、さら
に熱架橋で接着性を改善したのち、エツチング液に浸漬
してフ第1・レジスト膜のない合成石英円板部分をエツ
チングし、合成石英円板表面に格子状のU字溝を形成し
た。
When the resist film on the exposed synthetic quartz disc surface ■ is developed, the photoresist in the exposed areas is eluted, and the synthetic quartz disc with the photoresist-like photoresist film is post-baked to remove the developer and rinse solution. After removing the resist film and improving the adhesion through thermal crosslinking, the synthetic quartz disk part without the first resist film was etched by immersing it in an etching solution to form a lattice-shaped U-shaped groove on the surface of the synthetic quartz disk. Formed.

上記エツチング条件は、次の通りである。The above etching conditions are as follows.

エツチング液: 硝酸第2セリウム・アンモニウム・17g1過塩素酸+
5cc、 純  水: LOOcc 。
Etching solution: Ceric nitrate ammonium 17g 1 perchloric acid +
5cc, pure water: LOOcc.

エツチング液の温度・室温、 上記エツチング終了後、不用のフォトレジスト膜を剥離
液を用いて剥離し、表面に幅:5μm、深さ71μmの
寸法のU字溝および、たて:5μm1横5伽の寸法の平
面をもつ角柱突起を有する合成石英円板基体を作製した
Etching solution temperature/room temperature: After the above etching is completed, the unnecessary photoresist film is peeled off using a stripping solution, and a U-shaped groove with a width of 5 μm and a depth of 71 μm is formed on the surface. A synthetic quartz disk substrate having a prismatic protrusion with a plane dimension of was fabricated.

この合成石英円板基体を、反応混合ガスを加熱し活性化
する手段として金属タングステン製フィラメントの熱電
子放射材を用いる特開昭5891.100号公報に記載
されるような人工ダイヤモンド析出生成装置に装入し、 反応容器:内径:200mmφの石英管、反応混合ガス
組成: CH4/H2=1./1.00(容量割合)熱
電子放射材と円板状合成石英基体表面との距離:30m
m。
This synthetic quartz disk substrate is used in an artificial diamond precipitation generating apparatus as described in Japanese Patent Application Laid-Open No. 5891.100, which uses a thermionic emitting material of a metallic tungsten filament as a means for heating and activating the reaction mixture gas. Reaction vessel: quartz tube with inner diameter: 200 mmφ, reaction mixture gas composition: CH4/H2 = 1. /1.00 (capacity ratio) Distance between thermionic emitting material and the surface of the disk-shaped synthetic quartz substrate: 30 m
m.

反応容器内雰囲気圧力・30Torr。Atmospheric pressure inside the reaction vessel: 30 Torr.

熱電子放射材の加熱温度: 2000℃、熱電子放射材
による円板状合成石英基体の加熱] 0 温度:850°C1 反応処理時間:3時間、 の条件で処理することにより、人工ダイヤモンド膜を上
記円板状合成石英基体上に析出生成させ、この発明の超
精密研削用ダイヤモンド砥石を作製し、このダイヤモン
ド砥石を直径:200mmのバックアップ回転テーブル
に取付けた。
Heating temperature of thermionic emitting material: 2000°C, heating of disk-shaped synthetic quartz substrate by thermionic emitting material] 0 Temperature: 850°C Reaction treatment time: 3 hours By processing under the following conditions, an artificial diamond film was formed. A diamond grinding wheel for ultra-precision grinding of the present invention was produced by depositing on the disk-shaped synthetic quartz substrate, and this diamond grinding wheel was attached to a backup rotary table having a diameter of 200 mm.

一方、たて 1cm、横:1cmz厚さ:0.6mmの
寸法を有し、重さ: 0.15f!:の板状のシリコン
ウェハーを用意し、この板状シリコンウェハーを、バッ
クアップ周速度:90m/minで回転しているバック
アップ回転テーブル上のダイヤモンド砥石に圧力・30
0g/c+&で5分間押付けて表面研削し、上記板状シ
リコンウェハーの研削前後の重さを測定して研削量を求
め、それらの結果を第1表に示した。
On the other hand, it has dimensions of 1cm in height, 1cm in width, 0.6mm in thickness, and weighs 0.15f! : Prepare a plate-shaped silicon wafer, and apply pressure of 30 m/min to a diamond grindstone on a backup rotary table rotating at a backup circumferential speed of 90 m/min.
The surface was ground by pressing at 0g/c+& for 5 minutes, and the weight of the plate-shaped silicon wafer before and after grinding was measured to determine the amount of grinding, and the results are shown in Table 1.

比較例 1 実施例で用意した合成石英円板の表面をラッピングした
のちポリッシングし、このポリッシングしたままの満な
しの合成石英円板表面に実施例1 ] 1と同じ条件で人工ダイヤモンド膜を析出生成させ、比
較ダイヤモンド砥石を作製した。このダイヤモンド砥石
を用いて実施例1と全く同一条件で板状シリコンウェハ
ーを研削し、この板状シリコンウェハーの研削前後の重
さを求めて研削量を測定し、その測定結果を第1表に示
した。
Comparative Example 1 The surface of the synthetic quartz disk prepared in Example 1 was lapped and then polished, and an artificial diamond film was deposited and formed on the polished surface of the synthetic quartz disk under the same conditions as Example 1. A comparative diamond grinding wheel was prepared using the following methods. Using this diamond grindstone, a plate-shaped silicon wafer was ground under exactly the same conditions as in Example 1, and the amount of grinding was measured by determining the weight of this plate-shaped silicon wafer before and after grinding. The measurement results are shown in Table 1. Indicated.

実施例 2 直径:150mm、厚さ・1 mmの金属Si製円板を
用意し、この金属Si製円板を、 エツチング液:Pt度80%のフッ酸:1、濃度80%
の硝酸=4、 濃度80%の酢酸:3、 の割合で混合した混合液、 エツチング液の温度、室温、 の条件でエツチング処理を行う以外はすべて実施例1と
全く同様に処理をすることにより、角柱突起を有する金
属St製円板基体を作製し、ついで」二層金属Sj製円
板基体表面に、 反応時間=3時間、 己する以外は上記実施例1と全く同一条件で人工ダイヤ
モンド膜を析出生成させ、この発明の超精密研削用ダイ
ヤモンド砥石を作製した。
Example 2 A metal Si disk with a diameter of 150 mm and a thickness of 1 mm was prepared, and the metal Si disk was etched with: 1 hydrofluoric acid with a Pt content of 80% and a concentration of 80%.
The etching process was carried out in exactly the same manner as in Example 1, except that the etching process was carried out using a mixed solution of nitric acid = 4, acetic acid with a concentration of 80%: 3, etching solution temperature, room temperature, and the following conditions. A disk substrate made of metal St having prismatic protrusions was prepared, and then an artificial diamond film was formed on the surface of the disk substrate made of two-layer metal Sj under exactly the same conditions as in Example 1, except that the reaction time was 3 hours. was precipitated to produce the ultra-precision grinding diamond grindstone of the present invention.

このダイヤモンド砥石を用いて実施例]と全く同様にし
て板状シリコンウェハーを研削し、その板状シリコンウ
ェハーの研削前後の重さを求めて研削量を測定し、その
結果を第1表に示した。
Using this diamond grindstone, a plate-shaped silicon wafer was ground in exactly the same manner as in Example], and the amount of grinding was measured by determining the weight of the plate-shaped silicon wafer before and after grinding. The results are shown in Table 1. Ta.

比較例 2 実施例2で用意した金属Sl製円板の表面をラッピング
したのちポリッシングし、ポリッシングしたままの溝な
しの金属SL製内円板砥石基体として実施例2と同一条
件で人工ダイヤモンド膜を析出生成させ、比較ダイヤモ
ンド砥石を作製した。このダイヤモンド砥石を用いて実
施例1と全く同一条件でシリコンウェハーを研削し、そ
のシリコンウェハーの研削量をΔ1り定し、その結果を
第1表に示した。
Comparative Example 2 The surface of the metal SL disk prepared in Example 2 was lapped and then polished, and an artificial diamond film was applied under the same conditions as Example 2 as the polished SL inner disk grindstone substrate without grooves. A comparative diamond grinding wheel was produced by precipitation. A silicon wafer was ground using this diamond grindstone under exactly the same conditions as in Example 1, and the amount of grinding of the silicon wafer was determined by Δ1, and the results are shown in Table 1.

実施例 3 直径:150mm、厚さ:3mmのMo製円板を用意し
、このMo製円板の表面をラッピングしたのち、外径 
52n++n、厚さ、15μmのダイヤモンド超薄刃砥
石14.1.372 (5) を用いて上記ラッピングしたMo製円板の表面に幅+l
[inm、深さ 5μmの寸法を有するU字溝および縦
:25un+、横:25μmの寸法の平面をもつ角柱突
起を有するMo製砥石基体を作製した。
Example 3 A Mo disk with a diameter of 150 mm and a thickness of 3 mm was prepared, and the surface of this Mo disk was lapped, and the outer diameter was
52n++n, thickness, 15μm diamond ultra-thin blade grindstone 14.1.372 (5) Width +l on the surface of the above lapped Mo disk
A Mo grindstone base body was prepared which had a U-shaped groove having dimensions of [in.

このMo製砥石基体を実施例1と全く同し条件で処理す
ることにより気相合成ダイヤモンド膜を上記M□製製布
石基体表面析出生成させダイヤモンド砥石を作製した。
This Mo grindstone base was treated under exactly the same conditions as in Example 1, whereby a vapor-phase synthetic diamond film was deposited on the surface of the M□ base and a diamond whetstone was produced.

このダイヤモンド砥石を用いて板状シリコンウェハーを
研削し、その板状シリコンウェハーの研削前後の重さを
求めて研削量を測定し、その結果を第1表に示した。
A plate-shaped silicon wafer was ground using this diamond grindstone, and the amount of grinding was measured by determining the weight of the plate-shaped silicon wafer before and after grinding. The results are shown in Table 1.

比較例 3 実施例3で用意したM□製同円板表面をラッピングした
ままの溝なしのMo製円板を砥石基体とし、実施例1と
同一条件で気相合成ダイヤモンド膜を析出生成させ、比
較ダイヤモンド砥石を作製し、実施例1と同一条件でシ
リコンウェハーを研削し、シリコンウェハーの研削量を
測定してその結果を第1表に示した。
Comparative Example 3 Using a molybdenum disc without grooves, which had been lapped from the surface of the M□ disc prepared in Example 3, as a grinding wheel substrate, a vapor-phase synthetic diamond film was precipitated and formed under the same conditions as in Example 1. A comparative diamond grindstone was prepared, and a silicon wafer was ground under the same conditions as in Example 1. The amount of grinding of the silicon wafer was measured, and the results are shown in Table 1.

〔発明の効果〕〔Effect of the invention〕

] 5 第1表の結果から、同一材料砥石基体からなるダイヤモ
ンド砥石であってもダイヤモンド砥石の表面に溝を設け
ることにより、研削能率が大幅に向上することが4つか
り、この発明のダイヤモンド砥石を用いることにより研
削コストを大幅に削減することができるなと産業上すぐ
れた効果を奏するものである。
] 5 From the results in Table 1, it was found that even if the diamond grinding wheel is made of the same material as the grinding wheel base, the grinding efficiency can be greatly improved by providing grooves on the surface of the diamond grinding wheel. By using it, grinding costs can be significantly reduced, which is an excellent industrial effect.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は、表面に交叉するU字溝を形成したこの発明の
ダイヤモンド砥石の製造に用いる砥石基体表面拡大図、 第2図は、交叉するU字溝によって基体表面に形成され
た角柱突起の平面に人工ダイヤモンド膜を析出させた状
態を示す斜視説明拡大図、第3図は、フォトエツチング
法により基体表面にU字溝を形成する方法を示す説明図
、である。 1・・・砥石基体、     2・・・表 面、3・・
・U字溝、      4・・・角柱突起、5・・・大
王ダイヤモンド、 6・ フォトレジスト、 フォトマスク、 8・ 紫外線、 9・ 不透明部分。 出 願 人 菱 金 属 株 式 ]
Fig. 1 is an enlarged view of the surface of a grinding wheel base used for manufacturing the diamond grindstone of the present invention, which has intersecting U-shaped grooves formed on its surface, and Fig. 2 shows prismatic protrusions formed on the base surface by intersecting U-shaped grooves. FIG. 3 is a perspective explanatory enlarged view showing a state in which an artificial diamond film is deposited on a flat surface, and FIG. 1... Grinding wheel base, 2... Surface, 3...
・U-shaped groove, 4...Prismatic projection, 5...Daio Diamond, 6. Photoresist, photomask, 8. Ultraviolet light, 9. Opaque part. Applicant Ryo Metal Co., Ltd.]

Claims (1)

【特許請求の範囲】[Claims] (1)砥石基体の表面に規則的に交叉する複数本の溝に
よって形成された凹凸研削面の少なくとも凸部分に気相
合成法により形成されたダイヤモンド膜を形成してなる
ことを特徴とするダイヤモンド砥石。
(1) A diamond characterized by forming a diamond film formed by vapor phase synthesis on at least the convex portions of the uneven grinding surface formed by a plurality of regularly intersecting grooves on the surface of the grinding wheel base. Whetstone.
JP25959290A 1990-09-28 1990-09-28 Diamond grinding wheel Pending JPH04141372A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP25959290A JPH04141372A (en) 1990-09-28 1990-09-28 Diamond grinding wheel

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP25959290A JPH04141372A (en) 1990-09-28 1990-09-28 Diamond grinding wheel

Publications (1)

Publication Number Publication Date
JPH04141372A true JPH04141372A (en) 1992-05-14

Family

ID=17336252

Family Applications (1)

Application Number Title Priority Date Filing Date
JP25959290A Pending JPH04141372A (en) 1990-09-28 1990-09-28 Diamond grinding wheel

Country Status (1)

Country Link
JP (1) JPH04141372A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20030031403A (en) * 2001-10-15 2003-04-21 신에쓰 가가꾸 고교 가부시끼가이샤 An abrasive machining plate

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60201877A (en) * 1984-03-28 1985-10-12 Mitsubishi Metal Corp Diamond grinding wheel composed of deposited artificial diamond particles
JPS60242976A (en) * 1984-02-24 1985-12-02 ノ−ス ベエル エス.ピ−.エイ. Rotary tool having operating area, which is separated by groove and coated with diamond grain
JPS6136112A (en) * 1984-07-26 1986-02-20 Sumitomo Electric Ind Ltd Preparation of whetstone granule of poly-crystalline diamond
JPS6288570A (en) * 1985-10-14 1987-04-23 Agency Of Ind Science & Technol Grinding wheel

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60242976A (en) * 1984-02-24 1985-12-02 ノ−ス ベエル エス.ピ−.エイ. Rotary tool having operating area, which is separated by groove and coated with diamond grain
JPS60201877A (en) * 1984-03-28 1985-10-12 Mitsubishi Metal Corp Diamond grinding wheel composed of deposited artificial diamond particles
JPS6136112A (en) * 1984-07-26 1986-02-20 Sumitomo Electric Ind Ltd Preparation of whetstone granule of poly-crystalline diamond
JPS6288570A (en) * 1985-10-14 1987-04-23 Agency Of Ind Science & Technol Grinding wheel

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20030031403A (en) * 2001-10-15 2003-04-21 신에쓰 가가꾸 고교 가부시끼가이샤 An abrasive machining plate

Similar Documents

Publication Publication Date Title
US9505166B2 (en) Rectangular mold-forming substrate
JPH0864524A (en) Preparation of x-ray absorption mask
JP2957519B2 (en) Dresser for semiconductor wafer polishing pad and method of manufacturing the same
EP0880128B1 (en) Process for producing a magnetic head
JP2018014515A (en) Electrostatic chuck and manufacturing method therefor, and generation method for electrostatic chuck
JPH03251370A (en) Diamond grindstone for superfine grinding and manufacture thereof
JPH04141372A (en) Diamond grinding wheel
JPH04331075A (en) Diamond wheel and manufacture thereof
EP1201367A1 (en) Dresser for polishing cloth and manufacturing method therefor
JPH03208560A (en) Grindstone and manufacture thereof
CN111590467A (en) Sapphire wafer with abrasive particles, preparation method thereof and sapphire dresser
JP2001274227A (en) Method of manufacturing ceramic member for holding wafer
JP3329594B2 (en) Method of manufacturing sapphire substrate for photomask
JP2613219B2 (en) Method for manufacturing wrapping tape and method for polishing magnetic recording medium
JPH0673818B2 (en) Method for manufacturing thin blade rotary whetstone for cutting
JP2862029B2 (en) Method of manufacturing mask for X-ray lithography
JPH0113994B2 (en)
JPH06179166A (en) Polishing tool and manufacture thereof
JP2003282664A (en) SiC PARTICLE MONITORING WAFER
JP2023162941A (en) Glass member for euv mask blanks, method for producing the same, and method for producing glass substrate for euv mask blanks
JPS6080567A (en) Manufacture of fixed grain abrasive structure of segment type
JPH04244377A (en) Manufacture for diamond truing roll
JP3198566B2 (en) Acicular abrasive grains and method for producing the same
JPH1177547A (en) Manufacture of grinding wheel using lithography and grinding wheel
JPS62149872A (en) Coating method with hard carbon film