JPH04138382A - Testing apparatus of sliding contact - Google Patents

Testing apparatus of sliding contact

Info

Publication number
JPH04138382A
JPH04138382A JP26022590A JP26022590A JPH04138382A JP H04138382 A JPH04138382 A JP H04138382A JP 26022590 A JP26022590 A JP 26022590A JP 26022590 A JP26022590 A JP 26022590A JP H04138382 A JPH04138382 A JP H04138382A
Authority
JP
Japan
Prior art keywords
sliding contact
spring
rack
fitted
brush
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP26022590A
Other languages
Japanese (ja)
Inventor
Shinichiro Shimura
志村 伸一郎
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tanaka Kikinzoku Kogyo KK
Original Assignee
Tanaka Kikinzoku Kogyo KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tanaka Kikinzoku Kogyo KK filed Critical Tanaka Kikinzoku Kogyo KK
Priority to JP26022590A priority Critical patent/JPH04138382A/en
Publication of JPH04138382A publication Critical patent/JPH04138382A/en
Pending legal-status Critical Current

Links

Landscapes

  • Testing Electric Properties And Detecting Electric Faults (AREA)

Abstract

PURPOSE:To enable easy and sure fitting and removal of a test sample and to enable attainment of accurate evaluation and execution of a test with high reproducibility, by providing a rack, a pinion and another rack on one end of which a pre-load is applied by a spring. CONSTITUTION:A driving element makes the rotational force of a motor be a reciprocating motion through the intermediary of a crank 21 and this motion is turned into a rotary reciprocating motion by a rack 22 and a pinion 23, while a pre-load is applied on another rack 25 by a spring 24 to prevent unstableness of a sliding contact surface at the time of stoppage. This rotary reciprocating motion is transmitted to a rotary body 6 by a shaft 5 supported by a bearing 4 and a rotary holder 9 is fitted in the rotary body 6 with mutual indentation. A jig 1 fitted with a brush is fitted removably to this holder 9. Besides, a jig 2 fitted with a base is fitted removably to a slide stage 13 by a bolt 27. The brush 14 and the disk rotary base 15 are fixed to the jigs 1 and 2 respectively and the slide stage 13 is pushed on one side by a spring 12, while contact between them is adjusted by a micrometer 11 provided on the other side.

Description

【発明の詳細な説明】 (産業上の利用分野) 本発明は、円板回路基板とブラシの摺動接点試験装置に
関するものである。
DETAILED DESCRIPTION OF THE INVENTION (Field of Industrial Application) The present invention relates to a sliding contact testing device for a disc circuit board and a brush.

(従来技術と問題点) 近年の電子機器部品の高密度化、高性能化に伴い、各部
品についても日々開発が行われている。
(Prior Art and Problems) With the recent increase in the density and performance of electronic device parts, each part is being developed on a daily basis.

開発材料の性能評価については用途、機能特有の試験装
置が要求される。
Test equipment specific to the application and function is required to evaluate the performance of developed materials.

エンコーダ、ポテンショメータ等においては、厚膜抵抗
体で回路構成した円板回路基板と多数の極細線からなる
多線束摺動ブラシとの組合せで広く用いられている。そ
の性能評価用の摺動接点試験装置においても、1]:、
確な評価・再現性等の本来の目的は勿論の事、それ以外
に特に微小な試験試料取付けが容易で確実に着脱できる
ことが要求されるが、既存の試験装置においてはこれら
全てを満足できるものがなかった。
In encoders, potentiometers, etc., a combination of a disc circuit board with a thick-film resistor circuit and a multi-wire bundle sliding brush made of a large number of ultra-fine wires is widely used. Also in the sliding contact testing device for performance evaluation, 1]:,
In addition to the original purpose of accurate evaluation and reproducibility, it is also necessary to be able to attach and detach particularly small test samples easily and reliably, but existing test equipment can satisfy all of these requirements. There was no.

(発明の目的) 本発明は、上記要望を満たすへくなされたもので、試験
試料を容易に確実に着脱でき、正確な評価、再現性の高
い試験ができる摺動接点試験装置を提供するものである
(Objective of the Invention) The present invention has been made to meet the above-mentioned needs, and provides a sliding contact testing device that allows test samples to be easily and reliably attached and removed, and that allows for accurate evaluation and highly reproducible testing. It is.

(構成) 上記課題を解決する為の本発明の技術的手段は、円板回
路基板とブラシの摺動接点試験装置において、回転運動
をクランクを介して接続するラックとピニオンの、一端
をスプリングにて予圧をかけたもう一つのラックを設け
た駆動部と、該駆動部からの回転往復運動をシャフトで
接続された回転体と相lT、の凹凸ではめ込まれる回転
体ホルダーと該回転体ホルダーにポルトで取付けられる
ブラシ取付治具と、マイクロメータで、他方をスプリン
グで受けた左右方向に移動するスライド台と該スライド
台にボルトで取付けられる基板取付治具からなる摺動接
点試験部を有したことを特徴とするものである。
(Structure) The technical means of the present invention for solving the above problem is that, in a sliding contact testing device for a disc circuit board and a brush, one end of the rack and pinion, which connect rotational motion via a crank, is connected to a spring. A drive section is provided with another rack preloaded with a preload, and a rotating body holder that is fitted in the unevenness of the rotary body holder and a rotating body holder that is fitted with the unevenness of the rotating body and the phase lT, which transfers the rotational reciprocating motion from the drive unit to the rotating body connected by a shaft. It had a sliding contact test section consisting of a brush mounting jig that can be attached with a port, a micrometer, a slide table that moves from side to side with the other supported by a spring, and a board mounting jig that is attached to the slide table with bolts. It is characterized by this.

(作用) 上記のように構成された本発明の摺動接点試験装置によ
れば、ラックとピニオンの、一端をスプリングにて予圧
をかけたもう一つのラックを設けであるので、停止時の
ギヤのバックラッシュによる摺動接点面のがたつきが発
生せず正確な回転往復運動が得られる。
(Function) According to the sliding contact test device of the present invention configured as described above, since another rack is provided with one end of the rack and pinion preloaded with a spring, the gear during stoppage is Accurate rotational reciprocating motion is achieved without rattling of the sliding contact surface due to backlash.

またはめ込みまたはホルト締めにて着脱するので、予め
試験試料を取イ・jけた後、着脱が容易にてきるもので
ある。
Alternatively, it can be attached and detached by fitting or bolting, so it can be easily attached and detached after the test sample has been prepared in advance.

さらに、マイクロメータて他方をスプリンつて受けて左
右方向にスライドできるので、正確に接触力が調整設定
できるものである。
Furthermore, since the micrometer can be received by the other spring and slid horizontally, the contact force can be adjusted and set accurately.

(実施例) 以下、実施例について詳細に説明する1、第1図にはめ
込み又はボルトにて着脱するカセット式の各治具をL字
型基台26に組込んた摺動接点試験部の全体側面図を示
す1,1はホルトにて回転体ホルダー9と着脱可能なブ
ラシ取付治具1と、駆動部からの回転往復運動をカップ
ラー3に接続されてベアリンク4により受けたシャフI
−5トー体となった回転体6及び回転体6中央の凸部7
と回転体ホルダー9の中央部の凹部8とてはめ込まれた
着脱可能な回転体ホルダー9にホルト■0にて取りつけ
られる。一方2はホルト27にてスライド台13に着脱
可能な基板取付治具2で、マイクロメータ11で、他方
をスプリング12で受けたスライド台13を押し、左右
方向にスライドでき前記ブラシ数例治具1のブラシ14
と基板取付治具2の円板回路基板15との接触力を調整
設定する。第2図に、スライド台13と基板取付治具2
をはずして、ブラシ取付治具■を取刊けた状態を示す。
(Example) Examples will be explained in detail below. 1. The entire sliding contact test section in which cassette-type jigs that can be attached or detached by fitting or bolting are assembled into an L-shaped base 26 as shown in Figure 1. Reference numerals 1 and 1 in the side view indicate a rotating body holder 9, a removable brush mounting jig 1, and a shaft I connected to a coupler 3 and receiving rotational reciprocating motion from a drive unit by a bear link 4.
-5 The rotating body 6 which has become a toe body and the convex portion 7 at the center of the rotating body 6
It is attached to the removable rotary body holder 9 fitted into the recess 8 in the center of the rotary body holder 9 with a bolt 0. On the other hand, 2 is a substrate mounting jig 2 which can be attached to and detached from the slide table 13 using a bolt 27. The jig 2 can be slid in the left and right direction by pushing the slide table 13 which is supported by a micrometer 11 and a spring 12 on the other side. 1 brush 14
The contact force between the board mounting jig 2 and the disc circuit board 15 is adjusted and set. Figure 2 shows the slide stand 13 and board mounting jig 2.
The figure shows the state with the brush mounting jig ■ removed.

第3図は、ブラシ取付治具1てブラシ14を傾けて押え
板16にて締付は固定する。1第4図は、基板取付治具
2て、円板回路基板15の中央部丸穴17と基板取付治
具2の中央部丸穴18とをリベット状ポルトI9及びナ
ツト20にて締付は固定する。第5図は駆動部を示す図
で、モーターの回転がクランク21を介して往復運動に
変換され、ラック22とピニオン23で回転往復運動に
変換している。この際、停止時のギヤのバックラッシュ
による摺動接点面へのがたつきが発生しないように、反
対側にもう一つのラックを備え、一端にスプリング24
にて予圧をかけておく。
In FIG. 3, the brush 14 is tilted using the brush mounting jig 1, and the clamping plate 16 is used to fix the brush 14. 1. FIG. 4 shows that the board mounting jig 2 is used to tighten the center round hole 17 of the circular circuit board 15 and the center round hole 18 of the board mounting jig 2 using a rivet-like port I9 and a nut 20. Fix it. FIG. 5 is a diagram showing the drive unit, in which the rotation of the motor is converted into reciprocating motion via the crank 21, and converted into rotational reciprocating motion by the rack 22 and pinion 23. At this time, in order to prevent rattling of the sliding contact surface due to backlash of the gear when stopped, another rack is provided on the opposite side, and a spring 24 is installed at one end.
Apply preload.

」1記摺動接点試験部を上下に合計6組設けた摺動接点
試験装置である。
This is a sliding contact testing device with a total of 6 sets of sliding contact testing sections above and below.

(発明の効果) 以トのように本発明の摺動接点試験装置によれば、はめ
込みまたはボルト締めにて着脱するカセット方式の試験
試料取付治具なので、着脱が容易で確実に取付けること
ができ、また対向するブラシと基板との相互位置はマイ
クロメータで他方をスプリングで受けて左右方向にスラ
イドできるので正確に接触力が調整設定でき、さらにラ
ックとピニオンの反対側にもう一つのラックを備え、端
にスプリングにて予圧をかけておくので、停止時のギヤ
のバックラッシュによる摺動接点面のがたつきが発生せ
ず、正確な回転往復運動が可能となり、従って微小な試
験試料でも容易に確実に着脱でき、また正確な評価、再
現性の高い試験ができるという優れた効果を有するもの
である。
(Effects of the Invention) As described above, according to the sliding contact testing device of the present invention, it is a cassette-type test sample mounting jig that can be attached and detached by fitting or bolting, so it can be easily attached and detached and can be installed reliably. In addition, the mutual position of the facing brush and the board is determined by a micrometer, and the other is supported by a spring and can be slid in the left and right direction, so the contact force can be adjusted and set accurately.Furthermore, there is another rack on the opposite side of the rack and pinion. Since the end is preloaded with a spring, there is no wobbling of the sliding contact surface due to gear backlash when stopped, and accurate rotation and reciprocation is possible, making it easy to use even with small test samples. It has the excellent effect of being able to be reliably attached and detached, as well as allowing for accurate evaluation and highly reproducible testing.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の一実施例の摺動接点試験装置における
摺動接点試験部を示す側面図、第2図は第1図における
基板取付治具をはずした状態を示す斜視図、第3図は本
発明の一実施例におけるブラシ取付治具を示す斜視図、
第4図は本発明の一実施例における基板取(=I治具を
示す斜視図、第5図は本発明の一実施例における駆動部
を示す側面図である。 ■・・・ブラシ取付治具、2・・・基板取付治具、3・
・・カップラー、4・・・ベアリング、5・・・シャフ
ト、6・・・回転体、7・・・凸部、8・・・凹部、9
・・・回転体ホルダー、lO・・・ボルト、11・・・
マイクロメータ、12・・・スプリング、13・・・ス
ライド台、14・・・ブラシ、15・・・円板回路基板
、1G・・押え板、17.18・・・丸穴、19・・・
リベット状ボルト、20・・・ナツト、21・・・クラ
ンク、22・・・ラック、23・・・ピニオン、24・
・スプリング、25・・・もう一方のラック、26・・
・L字型基台、27・・・ボルト。 出願人  田中貴金属工業株式会社
FIG. 1 is a side view showing a sliding contact testing section in a sliding contact testing device according to an embodiment of the present invention, FIG. 2 is a perspective view showing a state in which the board mounting jig in FIG. 1 is removed, and FIG. The figure is a perspective view showing a brush mounting jig in one embodiment of the present invention.
Fig. 4 is a perspective view showing a substrate removal (=I jig) in an embodiment of the present invention, and Fig. 5 is a side view showing a drive unit in an embodiment of the present invention. Tool, 2... Board mounting jig, 3.
...Coupler, 4... Bearing, 5... Shaft, 6... Rotating body, 7... Convex part, 8... Concave part, 9
... Rotating body holder, lO... Bolt, 11...
Micrometer, 12... Spring, 13... Slide stand, 14... Brush, 15... Disc circuit board, 1G... Holding plate, 17.18... Round hole, 19...
Rivet-shaped bolt, 20... Nut, 21... Crank, 22... Rack, 23... Pinion, 24...
・Spring, 25...Other rack, 26...
・L-shaped base, 27 bolts. Applicant Tanaka Kikinzoku Kogyo Co., Ltd.

Claims (1)

【特許請求の範囲】[Claims] 1)円板回路基板とブラシの摺動接点試験装置において
、回転運動をクランクを介して接続するラックとピニオ
ンの、一端をスプリングにて予圧をかけたもう一つのラ
ックを設けた駆動部と、該駆動部からの回転往復運動を
シャフトで接続された回転体と相互の凹凸ではめ込まれ
る回転体ホルダーと該回転体ホルダーにボルトで取付け
られるブラシ取付治具と、マイクロメータで、他方をス
プリングで受けた左右方向に移動するスライド台と該ス
ライド台にボルトで取付けられる基板取付治具からなる
摺動接点試験部を有したことを特徴とする摺動接点試験
装置。
1) In a sliding contact test device for a disc circuit board and a brush, a drive unit includes a rack and pinion that connect rotational motion via a crank, and another rack with one end preloaded with a spring; The rotational reciprocating motion from the drive unit is transferred to a rotating body connected by a shaft, a rotating body holder that fits into the mutual unevenness, a brush mounting jig that is attached to the rotating body holder with bolts, a micrometer, and a spring. 1. A sliding contact testing device comprising a sliding contact testing section consisting of a sliding pedestal that moves in the left-right direction and a board mounting jig that is attached to the sliding pedestal with bolts.
JP26022590A 1990-09-28 1990-09-28 Testing apparatus of sliding contact Pending JPH04138382A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP26022590A JPH04138382A (en) 1990-09-28 1990-09-28 Testing apparatus of sliding contact

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP26022590A JPH04138382A (en) 1990-09-28 1990-09-28 Testing apparatus of sliding contact

Publications (1)

Publication Number Publication Date
JPH04138382A true JPH04138382A (en) 1992-05-12

Family

ID=17345094

Family Applications (1)

Application Number Title Priority Date Filing Date
JP26022590A Pending JPH04138382A (en) 1990-09-28 1990-09-28 Testing apparatus of sliding contact

Country Status (1)

Country Link
JP (1) JPH04138382A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0698900A1 (en) * 1994-08-22 1996-02-28 S+B TECHNOLOGIE Schätzle + Bergmann GmbH Test device for push button switches
KR100664785B1 (en) * 2004-12-28 2007-01-04 동부일렉트로닉스 주식회사 Inspection device of semiconductor

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0698900A1 (en) * 1994-08-22 1996-02-28 S+B TECHNOLOGIE Schätzle + Bergmann GmbH Test device for push button switches
KR100664785B1 (en) * 2004-12-28 2007-01-04 동부일렉트로닉스 주식회사 Inspection device of semiconductor

Similar Documents

Publication Publication Date Title
JP2004531060A (en) Support rack for vibration testing of printed circuit boards
JPH0464423B2 (en)
JPH04138382A (en) Testing apparatus of sliding contact
US6622571B2 (en) Apparatus for measuring tension and stress capable of adjusting an angle of measurement
CN107328644B (en) Composite material scratch test device
CN111336978B (en) Circumferential clearance measuring device and circumferential clearance measuring method
JP2005077176A (en) Drop impact testing machine and clamping device of jig used therein
CN115922535A (en) Auxiliary sample grinding device and method of embedding-free metallographic grinding and polishing machine
JPH06341927A (en) Gear mesh testing device
KR102178745B1 (en) Clamping apparatus for test piece
JPH0729402U (en) Parallelism measuring device
US5461325A (en) Probe clamp assembly
US6427541B1 (en) Apparatus for testing rolling contact fatigue resistance of materials with possible interruptions
CN218352567U (en) Positioning mechanism and camera module pressure testing device
CN111122156A (en) Measuring system for shaft parts
CN214818117U (en) Modular joint assembly platform
JP2674781B2 (en) Jig connection device and connection means
JP2004028614A (en) Sample fixing device for hardness tester
CN211669465U (en) Screen pressing and lighting mechanism
JPS63163183A (en) Mounting apparatus for measuring motor
CN221378051U (en) Positioning device with adjustable PCB board tests
CN220018920U (en) Switch life tester
JPH0645227Y2 (en) Transmission test equipment
JP3466402B2 (en) Bracket for measuring instrument clamp and stand for supporting measuring instrument
JPH059632Y2 (en)