JPH0410744B2 - - Google Patents

Info

Publication number
JPH0410744B2
JPH0410744B2 JP1154286A JP1154286A JPH0410744B2 JP H0410744 B2 JPH0410744 B2 JP H0410744B2 JP 1154286 A JP1154286 A JP 1154286A JP 1154286 A JP1154286 A JP 1154286A JP H0410744 B2 JPH0410744 B2 JP H0410744B2
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP1154286A
Other versions
JPS62169355A (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1154286A priority Critical patent/JPH0410744B2/ja
Publication of JPS62169355A publication Critical patent/JPS62169355A/en
Priority claimed from US07/267,679 external-priority patent/US4888631A/en
Publication of JPH0410744B2 publication Critical patent/JPH0410744B2/ja
Anticipated expiration legal-status Critical
Application status is Expired - Lifetime legal-status Critical

Links

Classifications

    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier
    • H01L27/04Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being a semiconductor body
    • H01L27/06Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration
    • H01L27/0688Integrated circuits having a three-dimensional layout
JP1154286A 1986-01-21 1986-01-21 Expired - Lifetime JPH0410744B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1154286A JPH0410744B2 (en) 1986-01-21 1986-01-21

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP1154286A JPH0410744B2 (en) 1986-01-21 1986-01-21
US07/267,679 US4888631A (en) 1986-01-17 1988-11-03 Semiconductor dynamic memory device

Publications (2)

Publication Number Publication Date
JPS62169355A JPS62169355A (en) 1987-07-25
JPH0410744B2 true JPH0410744B2 (en) 1992-02-26

Family

ID=11780849

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1154286A Expired - Lifetime JPH0410744B2 (en) 1986-01-21 1986-01-21

Country Status (1)

Country Link
JP (1) JPH0410744B2 (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01125951A (en) * 1987-11-11 1989-05-18 Hitachi Ltd Transistor circuit device
KR940006676B1 (en) * 1991-10-14 1994-07-25 김광호 Semiconductor ic having test cirucit for memory
JP6413711B2 (en) 2014-12-02 2018-10-31 富士通株式会社 The method of testing circuit and test circuit
JP6488699B2 (en) 2014-12-26 2019-03-27 富士通株式会社 The method of testing circuit and test circuit

Also Published As

Publication number Publication date
JPS62169355A (en) 1987-07-25

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