JPH04106447A - Optical system for eccentricity measuring apparatus - Google Patents

Optical system for eccentricity measuring apparatus

Info

Publication number
JPH04106447A
JPH04106447A JP22494390A JP22494390A JPH04106447A JP H04106447 A JPH04106447 A JP H04106447A JP 22494390 A JP22494390 A JP 22494390A JP 22494390 A JP22494390 A JP 22494390A JP H04106447 A JPH04106447 A JP H04106447A
Authority
JP
Japan
Prior art keywords
lens
convergence
point
image
eccentricity
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP22494390A
Other languages
Japanese (ja)
Inventor
Yoichi Iba
Original Assignee
Olympus Optical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Olympus Optical Co Ltd filed Critical Olympus Optical Co Ltd
Priority to JP22494390A priority Critical patent/JPH04106447A/en
Publication of JPH04106447A publication Critical patent/JPH04106447A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE: To make it possible to measure even the eccentricity of a specific meniscus lens of which the centers of curvature of first and second surfaces are the same, by forming the primary image of an index at a position being different from the center of curvature of the surface of a lens to be inspected.
CONSTITUTION: When the eccentricity of a meniscus lens is measured, a point of convergence of an objective lens 14 is formed at a position deviating in the direction of the optical axis by δ from the center O of curvature of a lens 15 to be inspected. Thereby a slippage by Δ is made to occur in the direction of the optical axis between the positions of the points of convergence formed by reflection on second and first surfaces of the lens 15 to be inspected. As to an image of the point of convergence to be relayed 16, therefore, the image of the point of convergence by a light flux reflected on the first surface of the lens 15 is formed to be fuzzy when the image of the point of convergence by a light flux reflected on the second surface of the lens 15 is formed correctly on the light-sensing surface of a position sensor 17. By selecting the sharper one out of the points of convergence on the light-sensing surface of the position sensor 17 and by measuring the position thereof, accordingly, it is possible to measure correctly even the eccentricity of the specific meniscus lens.
COPYRIGHT: (C)1992,JPO&Japio
JP22494390A 1990-08-27 1990-08-27 Optical system for eccentricity measuring apparatus Pending JPH04106447A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP22494390A JPH04106447A (en) 1990-08-27 1990-08-27 Optical system for eccentricity measuring apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP22494390A JPH04106447A (en) 1990-08-27 1990-08-27 Optical system for eccentricity measuring apparatus

Publications (1)

Publication Number Publication Date
JPH04106447A true JPH04106447A (en) 1992-04-08

Family

ID=16821627

Family Applications (1)

Application Number Title Priority Date Filing Date
JP22494390A Pending JPH04106447A (en) 1990-08-27 1990-08-27 Optical system for eccentricity measuring apparatus

Country Status (1)

Country Link
JP (1) JPH04106447A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010002287A (en) * 2008-06-20 2010-01-07 Nikon Corp Decentration measuring device and decentration measuring method
US8665425B2 (en) 2010-04-13 2014-03-04 Konica Minolta Advanced Layers, Inc. Eccentricity measuring method

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010002287A (en) * 2008-06-20 2010-01-07 Nikon Corp Decentration measuring device and decentration measuring method
US8665425B2 (en) 2010-04-13 2014-03-04 Konica Minolta Advanced Layers, Inc. Eccentricity measuring method

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