Classifications

• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
  • G01N2291/00—Indexing codes associated with group G01N29/00
  • G01N2291/02—Indexing codes associated with the analysed material
  • G01N2291/028—Material parameters
  • G01N2291/0289—Internal structure, e.g. defects, grain size, texture
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
  • G01N2291/00—Indexing codes associated with group G01N29/00
  • G01N2291/04—Wave modes and trajectories
  • G01N2291/044—Internal reflections (echoes), e.g. on walls or defects

Landscapes

• Length Measuring Devices Characterised By Use Of Acoustic Means (AREA)
• Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)

Priority Applications (1)

Applications Claiming Priority (3)

Publications (2)

Family

ID=34424933

Family Applications (1)

Country Status (1)

Cited By (1)

• 1989
  • 1989-03-30 JP JP3555389U patent/JPH0645880Y2/ja not_active Expired - Lifetime

Also Published As

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