JPH0321489Y2 - - Google Patents

Description

[Detailed description of the invention] (a) Industrial application field This invention relates to improvement of contact pins used for testing electronic components such as semiconductor devices.

(b) Prior Art Conventionally, a contact pin shown in FIG. 4a is known as a contact pin used for functional testing of electronic components such as semiconductor devices.

In this conventional contact pin 21, the lower half of the pin 26 is inserted into a sheath-like frame 22 from above so as to be able to pivot. 28 and is configured to be biased above the pin 26.

When in use, the contact pin 21 is press-fitted into a sheath-shaped (or cylindrical) socket 29 that is inserted through the support substrate 10 made of one or more layers and the printed circuit board 31 provided on the lower surface of the support substrate 10. used.

(c) Problems to be solved by the invention In the conventional contact pin 21 mentioned above, the diameter of the pin 26 is small, about 1 mm, and if an excessive force is applied in the lateral direction, the contact pin 21 will break as shown in Fig. 4b. In addition, the pin 26 may break and the contact pin 21 may be damaged, making it necessary to remove the damaged contact pin 21 from the socket 29 and install a new one. However, the upper end of the frame 22 is connected to the socket 29.
The contact pin 21 protrudes only a little from the lower end, making it difficult to pinch the upper end of the frame even with tools such as radio pliers or nippers.
Since the contact pin 21 is press-fitted into the socket 29, it is often impossible to remove the damaged contact pin 21 from the socket 29. In this case, the socket 29 also had to be replaced with a new one, resulting in the inconvenience that replacing the contact pin 21 required time and effort.

This invention was devised in view of the above-mentioned inconveniences, and the purpose of this invention is to provide a contact pin that can be replaced quickly and easily.

(d) Means and operation for solving the problem As a means for solving the above-mentioned disadvantages, the contact pin of this invention has a first step portion and a second step portion formed in sequence on the open end side of the outer periphery of the frame. The outer diameter of the first step portion is larger than the outer peripheral diameter of the frame.
An insertion space is formed between the second step part and the support substrate with the outer diameter smaller than the outer diameter of the step part, and the first part of this insertion space is By holding the stepped portion with a tool and pulling out the contact pin from the socket, the work is made easier and faster.

(e) Embodiment An embodiment of this invention will be described below with reference to FIGS. 1 to 3.

FIG. 1 shows a longitudinal sectional view of a contact pin 1 according to an embodiment of the invention, in which 2 is a sheath-like frame made of metal, and a hollow part 3 has an opening 3a at the upper end of the frame 2. are doing. A circular flange portion 4 is provided around the opening 3a.
The flange portion 4 consists of a first step portion 4a and a second step portion 4b formed sequentially from the bottom to the top. It is made smaller than the outer diameter of the portion 4b. The outer diameter of the first step portion 4a is made smaller than the outer diameter of the second step portion 4b to form an insertion space 5, which enables engagement with a tool when removing the contact pin 1. be.

The lower half of a metal pin 6 is gently inserted from above into the hollow part 3 of the frame 2 so as to be able to pivot. A biasing means) 8 is provided to bias the pin 6 upward. It should be noted that an appropriate retaining means (not shown) is provided between the lower end of the pin 6 and the frame 2 to prevent the pin 6 from coming off from the frame 2. Further, a large-diameter head 7 is provided at the upper end of the pin 6, and is connected to an electrode 13 of a test board 12, which will be described later.
The contact is ensured by the biasing force of the coil spring 8.

FIG. 2 is a longitudinal cross-sectional view showing how the contact pin 1 is used. Reference numeral 10 denotes an insulating support substrate made of one or more layers. This support substrate 1
A printed circuit board 11 is provided in close contact with the lower surface. The support substrate 10 and the printed circuit board 11 include
Sheath-shaped sockets 9, . . . , 9 made of metal are inserted. The lower ends of the sockets 9, . . . , 9 protrude from the lower surface of the printed circuit board 11.
It is soldered to a conductive pattern (not shown) formed on the lower surface, and the sockets 9, . . . , 9 are connected to the test circuit via this conductive pattern.

A test substrate 12 is placed on the support substrate 10 . A socket (not shown) into which an electronic component is mounted and other contact pins (not shown) that contact leads or electrodes of the electronic component are arranged on the upper surface of the test board 12. The lower surface of the test board 12 has a recess 13 into which the head 7 of the pin 6 is inserted,...
..., 13 are provided. This recess 13,...,1
3 is provided with an electrode (not shown) made of a conductive pattern or the like that is electrically connected to a socket or the like on the test board 12, and the pin head 7 is brought into contact with this electrode by the biasing force of the coil spring 8. Test board 1
The socket etc. on 2 are connected to the test circuit. still,
The recesses 13, . . . , 13 also play the role of positioning the test substrate 12 with respect to the support substrate 10.

The test board 12 is prepared with various specifications, and one suitable for the electronic component to be tested is selected and used. When a lateral force is applied, the inner surfaces of the recesses 13, . In this case, as shown in FIG. 3, hold the frame 2 with a hand tool such as a nipper N so that its blade engages the insertion space 5 of the flange portion 4, and pull the contact pin 1 from the socket 9. Pull it out. Even if upward slippage occurs due to the pull-out force of the tool, the tool engages the second step and the contact pin can be easily pulled out.

In the above embodiment, a circular flange is provided over the entire periphery of the flange portion 4 and the upper end of the frame 2, but it may be of any suitable shape, such as a rectangular shape, or it may be provided partially on the outer periphery of the upper end of the frame 2. The design may be changed as appropriate.

(F) Effect of the invention The contact pin of this invention has a first step part and a second step part formed in sequence on the open end side of the outer periphery of the frame, and the outer diameter of the first step part is larger than the outer diameter of the frame. An insertion space is formed between the second stage part and the support board for inserting a contact pin insertion/extraction member, with the outer diameter of the second stage part being smaller than the outer diameter of the second stage part, and with the contact pin provided on the support board. Since the first stage part is held by a tool and the contact pin is pulled out from the socket, the contact pin can be easily pulled out from the socket in which it is installed, and the contact pin replacement work is quick and easy. It has the advantage of being able to perform

[Brief explanation of drawings]

Fig. 1 is a longitudinal cross-sectional view of a contact pin according to an embodiment of the invention, Fig. 2 is a longitudinal cross-sectional view showing how the contact pin is used, and Fig. 3 is an illustration of the extraction operation of the contact pin. The vertical cross-sectional views, FIGS. 4a and 4b, are diagrams for explaining the conventional contact pin and its problems. 2: Frame, 3: Hollow part, 3a: Opening part, 4
a: 1st stage part, 4b: 2nd stage part, 6: pin, 8:
coil spring.

Claims (1)

[Claims for Utility Model Registration] A frame having a hollow part opening to the outside, a pin whose part is inserted into the hollow part so as to be able to pivot, and which is interposed between the pin and the frame and which allows the pin to move. In the contact pin comprising a biasing means for biasing the frame outward, a first step portion and a second step portion are sequentially formed on the open end side of the outer periphery of the frame, and the outside of the first step portion The diameter is larger than the outer circumferential diameter of the frame and smaller than the outer diameter of the second stage part, and an insertion space for inserting a contact pin insertion/removal member is provided between the second stage part and the support board with the contact pin provided on the support board. A contact pin characterized by being formed.