JPH03180776A - Logic circuit provided with self-diagnostic function - Google Patents

Logic circuit provided with self-diagnostic function

Info

Publication number
JPH03180776A
JPH03180776A JP31929789A JP31929789A JPH03180776A JP H03180776 A JPH03180776 A JP H03180776A JP 31929789 A JP31929789 A JP 31929789A JP 31929789 A JP31929789 A JP 31929789A JP H03180776 A JPH03180776 A JP H03180776A
Authority
JP
Grant status
Application
Patent type
Prior art keywords
logic circuit
supplied
comparator
expected value
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP31929789A
Inventor
Kazutoshi Takahashi
Ryoji Watanabe
Original Assignee
Fujitsu Ltd
Fujitsu Vlsi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date

Links

Abstract

PURPOSE: To easily decide the fault part of logic circuit with a simple circuit constitution by providing a 1st selecting means common to each parial logic circuit, input pattern storing means, expected value pattern storing means and comparison means.
CONSTITUTION: When a self-diagnosis is made, the input patterns for test are supplied to the logic circuit 12 from a ROM 14 through a selector 10 and, for example, the output data of logic circuit 12c are supplied to a comparator 18. The data and the expected value patterns from a ROM 16A are compared by a comparator 18, and when the decision is made as noncoincident, new selecting signal is supplied to a selector 20 by an FF 22 through an AND gate 28 and also an additional address signal corresponding to this selecting signal is supplied to the ROM 16A. With this procedure, the output data of other logic circuits 12b, 12a and the expected value patterns corresponding thereto are compared by the comparator 18, and when both data are noncoincident, such a process is further repeated. Consequently, the fault part of circuit 12 can be detected with the simple circuit constitution in accordance with the condition of FF 22 or ROM 16A.
COPYRIGHT: (C)1991,JPO&Japio
JP31929789A 1989-12-08 1989-12-08 Logic circuit provided with self-diagnostic function Pending JPH03180776A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP31929789A JPH03180776A (en) 1989-12-08 1989-12-08 Logic circuit provided with self-diagnostic function

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP31929789A JPH03180776A (en) 1989-12-08 1989-12-08 Logic circuit provided with self-diagnostic function

Publications (1)

Publication Number Publication Date
JPH03180776A true true JPH03180776A (en) 1991-08-06

Family

ID=18108625

Family Applications (1)

Application Number Title Priority Date Filing Date
JP31929789A Pending JPH03180776A (en) 1989-12-08 1989-12-08 Logic circuit provided with self-diagnostic function

Country Status (1)

Country Link
JP (1) JPH03180776A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7800131B2 (en) 2005-06-10 2010-09-21 Nec Corporation Field effect transistor

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7800131B2 (en) 2005-06-10 2010-09-21 Nec Corporation Field effect transistor

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