JPH03117836A - Air conditioner - Google Patents

Air conditioner

Info

Publication number
JPH03117836A
JPH03117836A JP25491389A JP25491389A JPH03117836A JP H03117836 A JPH03117836 A JP H03117836A JP 25491389 A JP25491389 A JP 25491389A JP 25491389 A JP25491389 A JP 25491389A JP H03117836 A JPH03117836 A JP H03117836A
Authority
JP
Japan
Prior art keywords
indoor
refrigerant
way valve
temperature
turned
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP25491389A
Other languages
Japanese (ja)
Inventor
Yasuji Ogoshi
Eiji Kuwabara
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP25491389A priority Critical patent/JPH03117836A/en
Publication of JPH03117836A publication Critical patent/JPH03117836A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE: To prevent rapid variation of pressure and reduce refrigerant noise and vibration of piping by a method wherein when the indoor heating temperature reaches a set value during a cooling preference mode and a room temperature sensing means is turned off, a timer is provided for interrupting a refrigerant flow passage in an indoor device for a specified period of time.
CONSTITUTION: When a first indoor device 11 and a second indoor device 12 are in a cooling operation and a third indoor device 13 is in a heating operation, a two-way valve 23 and a two-way valve 26 in an outdoor device A are closed, refrigerant from a compressor 1 flows to an indoor device 13 and an outdoor heat exchanger 3, a heating operation is carried out at the indoor device 13 and then the refrigerant is merged with liquid refrigerant got from the outdoor heat exchanger 3. The liquid refrigerant may cool the room interior with the indoor devices 11 and 12 and then the refrigerant is sucked into the compressor 1. As the chamber temperature of the indoor device 13 is increased and reaches a set value, a temperature sensor 55 is turned off, a timer 50 starts to count the time and then a flow rate control valve 14c and a two-way valve 29c are closed. In the event that the temperature in the chamber room is decreased within five minutes, the temperature sensor 55 is turned on and returned to its original state. The flow rate control valve 14c and the two-way valve 29c are closed, the pressure is gradually decreased, a rapid variation of the pressure is eliminated and then vibration of piping and refrigerant noise can be reduced.
COPYRIGHT: (C)1991,JPO&Japio
JP25491389A 1989-09-29 1989-09-29 Air conditioner Pending JPH03117836A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP25491389A JPH03117836A (en) 1989-09-29 1989-09-29 Air conditioner

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP25491389A JPH03117836A (en) 1989-09-29 1989-09-29 Air conditioner

Publications (1)

Publication Number Publication Date
JPH03117836A true JPH03117836A (en) 1991-05-20

Family

ID=17271593

Family Applications (1)

Application Number Title Priority Date Filing Date
JP25491389A Pending JPH03117836A (en) 1989-09-29 1989-09-29 Air conditioner

Country Status (1)

Country Link
JP (1) JPH03117836A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5801545A (en) * 1995-07-14 1998-09-01 Tokyo Electron Limited LCD testing apparatus
DE102008013511A1 (en) 2007-03-12 2008-09-18 Sii Nano Technology Inc. Apparatus for processing and observing samples and methods for processing and observing cross-sections

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5801545A (en) * 1995-07-14 1998-09-01 Tokyo Electron Limited LCD testing apparatus
DE102008013511A1 (en) 2007-03-12 2008-09-18 Sii Nano Technology Inc. Apparatus for processing and observing samples and methods for processing and observing cross-sections

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