JPH0289378U - - Google Patents

Info

Publication number
JPH0289378U
JPH0289378U JP17060488U JP17060488U JPH0289378U JP H0289378 U JPH0289378 U JP H0289378U JP 17060488 U JP17060488 U JP 17060488U JP 17060488 U JP17060488 U JP 17060488U JP H0289378 U JPH0289378 U JP H0289378U
Authority
JP
Japan
Prior art keywords
input
output pin
delay
circuit
evaluated
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP17060488U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP17060488U priority Critical patent/JPH0289378U/ja
Publication of JPH0289378U publication Critical patent/JPH0289378U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
  • Tests Of Electronic Circuits (AREA)
JP17060488U 1988-12-27 1988-12-27 Pending JPH0289378U (US07943777-20110517-C00090.png)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17060488U JPH0289378U (US07943777-20110517-C00090.png) 1988-12-27 1988-12-27

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17060488U JPH0289378U (US07943777-20110517-C00090.png) 1988-12-27 1988-12-27

Publications (1)

Publication Number Publication Date
JPH0289378U true JPH0289378U (US07943777-20110517-C00090.png) 1990-07-16

Family

ID=31461697

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17060488U Pending JPH0289378U (US07943777-20110517-C00090.png) 1988-12-27 1988-12-27

Country Status (1)

Country Link
JP (1) JPH0289378U (US07943777-20110517-C00090.png)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2003067273A1 (fr) * 2002-02-06 2003-08-14 Fujitsu Limited Procede de diagnostic de tolerance de gigue, et dispositif correspondant

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2003067273A1 (fr) * 2002-02-06 2003-08-14 Fujitsu Limited Procede de diagnostic de tolerance de gigue, et dispositif correspondant

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