JPH0273987A - Method for duplicating stamper - Google Patents

Method for duplicating stamper

Info

Publication number
JPH0273987A
JPH0273987A JP22570488A JP22570488A JPH0273987A JP H0273987 A JPH0273987 A JP H0273987A JP 22570488 A JP22570488 A JP 22570488A JP 22570488 A JP22570488 A JP 22570488A JP H0273987 A JPH0273987 A JP H0273987A
Authority
JP
Japan
Prior art keywords
photoresist
glass master
film
layer
stamper
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP22570488A
Other languages
Japanese (ja)
Inventor
Masao Kanai
正夫 金井
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Epson Corp
Original Assignee
Seiko Epson Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Epson Corp filed Critical Seiko Epson Corp
Priority to JP22570488A priority Critical patent/JPH0273987A/en
Publication of JPH0273987A publication Critical patent/JPH0273987A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To easily duplicate a high-quality stamper at a low cost by forming a metallic Cr thin layer on a photoresist coated glass master, removing the photoresist, then forming a conductibilizing film and a releasing film, and applying Ni electroplating. CONSTITUTION:A pitted and grooved photoresist 2 is provided on the surface of a glass master disk 1 to obtain a glass master. A metallic Cr thin layer 3 is then formed on the whole surface of the glass master by vapor deposition, etc. The glass master disk 1 is dipped in a photoresist release soln. to remove the photoresist 2 along with the metallic Cr thin layer thereon, and a pitted and grooved metallic Cr thin layer 3 is left on the glass master disk 1. The conductibilizing film 4 of Ni, etc., is formed thereon in about 500-1000Angstrom thickness by vapor deposition, etc., and a releasing film is further formed. Ni electroplating is applied on the upper layer in specified thickness. The formed Ni electroplating layer 5 is released from the interface with the releasing film, and a high-quality duplicated stamper is obtained.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は光メモリー用スタンパの複製方法に関する。[Detailed description of the invention] [Industrial application field] The present invention relates to a method for copying a stamper for optical memory.

〔従来の技術〕[Conventional technology]

従来の光メモリー用スタンパの複製方法は、まずガラス
マスターを製作する。
In the conventional method for replicating an optical memory stamper, a glass master is first manufactured.

外径φ200mm、内径φ10mm、厚み6mmの鏡面
に磨かれたガラス原盤lを用意する。
A mirror-polished glass master l having an outer diameter of 200 mm, an inner diameter of 10 mm, and a thickness of 6 mm is prepared.

上記ガラス原盤1にホトレジストをコートする前にHM
DS (ヘキサメチレンデイシラザン)の蒸気中にガラ
ス原盤1をさらし、ガラス原盤1表面にSiカップリン
グ処理をする。このSiカップリング処理の目的は次工
程でのホトレジスト膜2とガラス表面との密着性を向上
させるためである。次に、スピン方式でホトレジストを
処定の厚みにコートする。
HM before coating the glass master 1 with photoresist.
The glass master disk 1 is exposed to the vapor of DS (hexamethylene disilazane), and the surface of the glass master disk 1 is subjected to Si coupling treatment. The purpose of this Si coupling treatment is to improve the adhesion between the photoresist film 2 and the glass surface in the next step. Next, photoresist is coated to a predetermined thickness using a spin method.

使用するホトレジストは、ヘキスト社のAZI350の
ポジレジストを用いた。
The photoresist used was AZI350 positive resist manufactured by Hoechst.

次に、専用のレーザー力ッテングM/Cを用いて、処理
の位置、形状のピット及びグルーブ部分にレーザー光を
照射し、露光する。
Next, a dedicated laser cutting M/C is used to irradiate and expose the pit and groove portions of the treatment position and shape with laser light.

次に、処定の現象液を用いて露光部分を化学的に溶解す
るとガラス基板1にホトレジスト2でピット及びグルー
ブが形成されたガラスマスターが出来る6 次に、Ni電鋳をするために必要となるNiの導体化処
理膜4を形成する。Niの導体化処理膜は蒸着又はスパ
ッタ法で行なうのが一般的である。
Next, by chemically dissolving the exposed area using a specified phenomenon liquid, a glass master with pits and grooves formed in the photoresist 2 is created on the glass substrate 1. A conductive treated Ni film 4 is formed. The conductive Ni film is generally formed by vapor deposition or sputtering.

厚みは1,0OOA位が適当である。Appropriate thickness is about 1.0OOA.

次に、N iメッキを行ない、厚み300μmmのNi
電鋳層5を形成する。
Next, Ni plating is performed to give a thickness of 300 μmm.
An electroformed layer 5 is formed.

次に、Ni電鋳層5をガラス原盤1からはがし、Ni電
鋳層5に付着しているレジスト層を化学的に溶解し洗浄
乾燥するとガラスマスターに形成されたピット及びグル
ーブが転写されたNi電鋳層5が出来る。このNi電鋳
層5はファーザーと一般的に呼ばれている。
Next, the Ni electroformed layer 5 is peeled off from the glass master 1, the resist layer adhering to the Ni electroformed layer 5 is chemically dissolved, washed and dried, and the Ni electroformed layer 5 has the pits and grooves formed on the glass master transferred thereto. An electroformed layer 5 is formed. This Ni electroformed layer 5 is generally called a father.

なお、上記のファーザーを作ったときのガラスマスター
はガラスマスターとNi電鋳層5をはがすときに、ホト
レジスト層2がガラスマスター側に完全に残らないので
、はがす前の外観とは損なわれたものになっておりもう
一度使用できる品質のものではない。
In addition, when the glass master used to make the above father is removed, the photoresist layer 2 does not completely remain on the glass master side when the glass master and the Ni electroformed layer 5 are peeled off, so the appearance before peeling off is not the same. It is not of a quality that can be used again.

次に、上記ファーザーをクロム酸水溶液に浸漬し、離形
処理膜を形成した後、Ni電鋳メッキを行ない厚さ30
0μmmのNi電鋳層5を形成する。
Next, the father was immersed in a chromic acid aqueous solution to form a release film, and then Ni electroplated to a thickness of 30 mm.
A Ni electroformed layer 5 with a thickness of 0 μmm is formed.

次に、上記ファーザーと離形処理膜を介して形成された
Ni電鋳層5をはく離するとファーザーに形成されたピ
ット及びグルーブが転写されたNi電鋳層5が出来上る
。このNi電鋳層5はマザーと一般的に呼ばれている。
Next, when the Ni electroformed layer 5 formed through the father and the release treatment film is peeled off, the Ni electroformed layer 5 to which the pits and grooves formed on the father have been transferred is completed. This Ni electroformed layer 5 is generally called a mother.

次に、上記マザーをクロム酸水溶液に浸漬し、離形処理
膜を形成した後Ni@pメッキを行ない厚さ300μm
mのNi電鋳層5を形成する。
Next, the above mother was immersed in a chromic acid aqueous solution to form a release treatment film, and then Ni@P plating was performed to a thickness of 300 μm.
m of Ni electroformed layer 5 is formed.

次に、上記マザーと離形処理膜を介して形成されたNi
電鋳層5をはく敲するとマザーに形成されたピット及び
グルーブが転写されたNi電鋳層5が出来上る。このN
i電鋳層5はチャイルドと一般的に呼ばれ、実際の成形
加工に使用するスタンパとなる。
Next, Ni was formed through the mother and the release treatment film.
When the electroformed layer 5 is peeled off, a Ni electroformed layer 5 to which the pits and grooves formed in the mother are transferred is completed. This N
The electroformed layer 5 is generally called a child and serves as a stamper used in actual molding.

このように、従来のスタンパの複製方法は複製スタンパ
を完成させるために最低3回のNi電鋳メッキを必要と
している。
As described above, the conventional stamper duplication method requires Ni electroforming plating at least three times to complete a duplicate stamper.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

上記の従来の複製の方法は、まず最初にガラスマスター
からファーザーを作り、ファーザーからマザーを作り、
マザーからチャイルドを作るというNi電鋳を3回行な
って複製化するものであり、工数がかかる。
The conventional method of reproduction described above is to first make a father from a glass master, make a mother from a father,
Reproduction is done by performing Ni electroforming three times to create a child from a mother, which takes a lot of man-hours.

また、複製化回数が多いので、転写による品質劣化の影
響も受は易い。
Furthermore, since the number of copies is large, it is easily affected by quality deterioration due to transfer.

本発明の目的は複製化回数を減らし、低価格で高品質の
複製スタンパを提供するものである。
An object of the present invention is to reduce the number of times of duplication and to provide a low-cost, high-quality duplication stamper.

〔課題を解決するための手段〕[Means to solve the problem]

本発明のスタンパの複製化はピット及びグルーブが形成
されたホトレジスト付ガラスマスターに処理の厚みにC
r金属薄層3を形成した後、ホトレジストはくH液に浸
漬して、ホトレジスト2を取り除くことによってホトレ
ジスト上のCr金属薄膜層3を取り除き、その上に処理
の厚みに導体化処理膜4を形成後、処定の厚みにN1を
電鋳メッキし導体化処理膜上の離型処理膜とNi電鋳層
5との界面からはがすことを特徴とする。
The reproduction of the stamper of the present invention is performed by processing a glass master with photoresist on which pits and grooves are formed to a thickness of C.
After forming the r metal thin layer 3, the photoresist is immersed in a H solution to remove the photoresist 2, thereby removing the Cr metal thin film layer 3 on the photoresist, and then forming a conductive treatment film 4 on top of it to the desired thickness. After the formation, N1 is electroplated to a predetermined thickness and peeled off from the interface between the release film on the conductive film and the Ni electroform layer 5.

〔実施例〕〔Example〕

外径φ200mm、内径φ10mm、厚み6mmの鏡面
に磨かれたガラス原盤1を用意する。上記、ガラス原盤
1にホトレジストをコートする前にHMDS(ヘキサメ
チレンデイシラザン)の蒸気中にガラス原盤1をさらし
、ガラス原盤表面にSiカップリング処理する。
A mirror-polished glass master disk 1 having an outer diameter of 200 mm, an inner diameter of 10 mm, and a thickness of 6 mm is prepared. Before coating the glass master disk 1 with photoresist, the glass master disk 1 is exposed to HMDS (hexamethylene disilazane) vapor, and the surface of the glass master disk is subjected to Si coupling treatment.

このSiカップリング処理の目的は次工程でのホトレジ
スト膜2とガラス表面との密着上を向上させるためのも
のである。
The purpose of this Si coupling treatment is to improve the adhesion between the photoresist film 2 and the glass surface in the next step.

次に、スピン方式でホトレジスト2を処定の厚みにコー
トする。
Next, photoresist 2 is coated to a predetermined thickness using a spin method.

次に、専用のレーザー力ツテングM/Cを用いて処理の
位置、形状のピット及びグルーブ部分をレーザー光を照
射し、露光する。
Next, the pit and groove portions of the treatment position and shape are irradiated with laser light and exposed using a dedicated laser power cutting M/C.

上記の如く、レーザー力ツテングM/Cを用いて処理の
位置、形状のピット及びグルーブ部分をレーザー光を照
射し、露光する場合は、使用するホトレジストはネガレ
ジストが望ましい。なぜならば後上程で現像したときに
露光された部分のホトレジスト2が残らなければならな
いからである。
As mentioned above, when the pit and groove portions of the processing position and shape are exposed by irradiating laser light using the laser power drawing M/C, the photoresist used is preferably a negative resist. This is because the exposed portion of the photoresist 2 must remain when it is developed later.

また、ポジレジストを用いた場合はピット及びグルーブ
部分が黒抜きのカラスマスクを用いて、マスク露光する
When a positive resist is used, mask exposure is performed using a crow mask with black pits and grooves.

次に、始走の現像液を用いて、露光部分以外のホトレジ
ストを化学的に溶解すると、ガラス原盤にホトレジスト
2でピット及びグルーブが形成されたガラスマスターが
出来上る。
Next, by using the starting developer to chemically dissolve the photoresist in areas other than the exposed areas, a glass master in which pits and grooves are formed in the photoresist 2 on the glass master is completed.

次に、上記ガラスマスターの表面全面にCr金属薄層3
を形成する。
Next, a thin Cr metal layer 3 is applied to the entire surface of the glass master.
form.

Cr金属薄層3の形成方法は蒸着法、スパッタ法のドラ
イ方式が望ましい。
The method for forming the Cr metal thin layer 3 is preferably a dry method such as a vapor deposition method or a sputtering method.

Cr金属薄層3の厚みは形成しようとするビ・ント及び
グルーブの深さと同一にする。
The thickness of the Cr metal thin layer 3 is made the same as the depth of the grooves and grooves to be formed.

次に、上記Cr金属薄層3を形成したガラス原盤1を専
用のホトレジストはく離液に浸漬して、ガラス原盤上に
部分的に形成されたホトレジストを取り除く。
Next, the glass master 1 on which the Cr metal thin layer 3 has been formed is immersed in a special photoresist stripping solution to remove the photoresist partially formed on the glass master.

上記ホトレジスト2をはく離することによってホトレジ
スト上のCr金属薄層3も取り除かれ、ガラス原盤上の
Cr金属薄層中にピット及びグルーブが形成される。
By peeling off the photoresist 2, the thin Cr metal layer 3 on the photoresist is also removed, and pits and grooves are formed in the thin Cr metal layer on the glass master.

次に、処理の厚みに導体化処理膜4を形成する。Next, a conductive treatment film 4 is formed to the thickness of the treatment.

導体化処理膜としての金属はNiが一般的である。The metal used as the conductive film is generally Ni.

Niの導体化処理膜4の形成方法は蒸着法、スパッタ法
のドライ方式が望ましい。
The method for forming the conductive Ni film 4 is preferably a dry method such as a vapor deposition method or a sputtering method.

Niの導体化処理膜4の厚みは500〜1000人が望
ましい。
The thickness of the conductive Ni film 4 is preferably 500 to 1,000.

次に、Niの導体化処理膜上に離型処理膜を形成する。Next, a release treatment film is formed on the Ni conductorization treatment film.

離型処理膜の形成は一般に行なわれているクロム酸水溶
液に浸漬する方法が採用できる。
The mold release treatment film can be formed by a commonly used method of immersion in an aqueous chromic acid solution.

使用出来るクロム酸化合物はクロム酸(Cr203)、
重クロム酸ナトリウム、重クロム酸カリウム、重クロム
酸アンモニウム等である。
The chromic acid compounds that can be used are chromic acid (Cr203),
These include sodium dichromate, potassium dichromate, ammonium dichromate, etc.

温度は0. 1%以下、浸漬時間は60秒以内、液温は
常温で良い。
The temperature is 0. 1% or less, the immersion time is 60 seconds or less, and the liquid temperature is room temperature.

離型処理膜を形成したら充分に水洗し、Ni電鋳メッキ
を行なう。厚みはスタンパに供し得る厚みの300μm
m位が一般的である。Ni電鋳メッキ浴はNiスルファ
ミン酸浴が一般的に用いられている。
After the mold release treatment film is formed, it is thoroughly washed with water and Ni electroplating is performed. The thickness is 300 μm, which is the thickness that can be used with a stamper.
m rank is common. As the Ni electroforming plating bath, a Ni sulfamic acid bath is generally used.

次に、Ni電鋳層5をガラスマスターのNiの導体化処
理膜の離型処理膜の界面からはがすとガラスマスターの
ピット及びグルーブが完全に転写されたNi電鋳層5が
できる。
Next, when the Ni electroformed layer 5 is peeled off from the interface of the release treatment film of the Ni conductorized film of the glass master, a Ni electroformed layer 5 is formed in which the pits and grooves of the glass master are completely transferred.

このN1電鋳層5の内外径加工、離面ポリッシュすると
1枚目の複製スタンパが完成する。
By processing the inner and outer diameters of this N1 electroformed layer 5 and polishing the release surface, the first duplicate stamper is completed.

1枚目の複製スタンパからはがされたガラスマスターは
2枚目以降の複製スタンパの製造に用いられる。
The glass master peeled off from the first duplicate stamper is used to manufacture the second and subsequent duplicate stampers.

2枚目以降のガラスマスターは離型処理膜はすでに形成
されているので、Ni電鋳メッキをし、厚さ300μm
mのN1電鋳層5を形成し、このNi電鋳層5をガラス
マスターのNiの導体化処理膜の離型処理膜界面からは
がすと2枚目の複製スタンパが出来る。3枚目以降につ
いても上記と同じ作業を繰り返すことによりスタンパが
複製される。
Since the mold release treatment film for the second and subsequent glass masters has already been formed, Ni electroforming plating is applied to the glass masters to a thickness of 300 μm.
A second replica stamper is obtained by forming an N1 electroformed layer 5 of m in thickness and peeling off this Ni electroformed layer 5 from the release-treated film interface of the Ni conductive-treated film of the glass master. The stamper is duplicated by repeating the same operation as above for the third and subsequent sheets.

上記ガラスマスターは記録部のピット及びグルーブ部以
外はCr金属薄層3で全面覆われており、そのCr金属
薄層はガラス基盤表面に密着良く固着されているので、
Cr金属薄層はガラス基盤表面からはがれることはない
The glass master is entirely covered with a thin Cr metal layer 3 except for the pits and grooves of the recording section, and the thin Cr metal layer is tightly adhered to the surface of the glass substrate.
The thin Cr metal layer does not peel off from the surface of the glass substrate.

また、Niの導体化処理膜とCr金属薄層の密着力は、
Niの導体化処理膜4」二の離型処理膜とNi電鋳層5
の密着力より格段に優れているのでNiの導体化処理膜
がCr金属薄層3からはがれることはない。Cr金属薄
層3とNiの導体化処理膜4との密着性を完全にするた
めには、例えばNiをスパッタするときに同一バツヂ内
でCrを最初にスパッタし、次にNiをスパッタすると
良い。Crの厚みは100人以内の膜厚で充分効果があ
る。
In addition, the adhesion between the conductive Ni film and the Cr metal thin layer is as follows:
Ni conductorization treatment film 4”2 release treatment film and Ni electroforming layer 5
Since the adhesion is much superior to that of the Cr metal thin layer 3, the conductive Ni film will not peel off from the Cr metal thin layer 3. In order to perfect the adhesion between the Cr metal thin layer 3 and the conductive Ni film 4, for example, when sputtering Ni, it is recommended to first sputter Cr and then sputter Ni in the same batch. . A Cr thickness of 100 or less is sufficiently effective.

以上のように、ガラス原盤上に形成されたCr金属薄層
3、Niの導体化処理膜4はガラス原盤1に密着良く固
着されているので、同一ガラスマスターから10回以」
二の複製スタンパを作っても、ガラス原盤からCr金属
薄層3、Niの導体化処理WA4がはがれてしまうなど
の外観不良は全く発生せず、複製することによってガラ
スマスターの外観が損なわれることはない。
As described above, the Cr metal thin layer 3 and the Ni conductive treatment film 4 formed on the glass master are well-adhered to the glass master 1, so that the same glass master can be used more than 10 times.
Even if the second duplicate stamper is made, there will be no appearance defects such as peeling off of the Cr metal thin layer 3 and Ni conductor treatment WA4 from the glass master, and the appearance of the glass master will not be damaged by duplication. There isn't.

〔発明の効果〕〔Effect of the invention〕

以」二述べたように、本発明のスタンパの複製方法はピ
ット及びグルーブが形成されたホトレジスト付ガラスマ
スターに処理の厚みにCr金属薄層3を形成した後、ホ
トレジストはく離液に浸漬して、ホトレジスト2を取り
除くことによってホトレジスト上のCr金属薄層3を取
り除き、その上に処理の厚みに導体化処理膜4を形成し
、次に離型処理膜を形成後、処定の厚みにNiを電鋳メ
ッキし導体化処理膜上の離型処理膜とN1電鋳層5の界
面からはがすことにより、1回の電鋳工程により複製ス
タンパを作ることが可能となり、従来法では最低3回の
N1電鋳メッキ工程を必要とする複製スタンパに較べて
低価格の複製スタンパが可能になる。また、品質的にも
複製回数が少ないので、本発明の方法による複製スタン
パは、従来法による複製スタンパに較べて高品質のもの
が得られる。
As described above, in the method for replicating a stamper of the present invention, a thin Cr metal layer 3 is formed to the desired thickness on a photoresist-attached glass master in which pits and grooves are formed, and then immersed in a photoresist stripping solution. By removing the photoresist 2, the Cr metal thin layer 3 on the photoresist is removed, a conductive treatment film 4 is formed on it to the desired thickness, and then a release treatment film is formed, and then Ni is deposited to the desired thickness. By peeling off from the interface between the electroformed release film on the conductorized film and the N1 electroformed layer 5, it is possible to make a duplicate stamper in one electroforming process, whereas the conventional method requires at least three times. A replica stamper can be produced at a lower cost than a replica stamper that requires an N1 electroforming plating process. Furthermore, in terms of quality, since the number of times of replication is small, a replica stamper produced by the method of the present invention has a higher quality than a replica stamper produced by the conventional method.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図(a)〜(e)は本発明のスタンパの複製方法の
製造工程を示す工程断面図であり、第2図(a)〜(g
)は従来のスタンパの製造方法の製造工程を示す工程断
面図である。 以  上 出願人 セイコーエプソン株式会社
FIGS. 1(a) to (e) are process cross-sectional views showing the manufacturing process of the stamper duplication method of the present invention, and FIGS. 2(a) to (g)
) is a process sectional view showing the manufacturing process of a conventional stamper manufacturing method. Applicant: Seiko Epson Corporation

Claims (1)

【特許請求の範囲】[Claims] 1)ピット及びグルーブが形成されたホトレジスト付ガ
ラスマスターに処望の厚みにCr金属薄層を形成した後
、ホトレジストはく離液に浸漬して、ホトレジストを取
り除くことによってホトレジスト上のCr金属薄層を取
り除き、その上に処望の厚みに導体化処理膜を形成し、
次に離形処理膜を形成後、処定の厚みにNiを電鋳メッ
キし導体化処理膜上の離型処理膜とNi電鋳層の界面か
らはがすことを特徴とするスタンパの複製方法。
1) After forming a thin Cr metal layer to a desired thickness on a glass master with photoresist in which pits and grooves are formed, the thin Cr metal layer on the photoresist is removed by immersing it in a photoresist stripping solution and removing the photoresist. , form a conductive treatment film on it to a desired thickness,
Next, after forming a release film, Ni is electroplated to a predetermined thickness and then peeled off from the interface between the release film and the Ni electroformed layer on the conductive film.
JP22570488A 1988-09-09 1988-09-09 Method for duplicating stamper Pending JPH0273987A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP22570488A JPH0273987A (en) 1988-09-09 1988-09-09 Method for duplicating stamper

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP22570488A JPH0273987A (en) 1988-09-09 1988-09-09 Method for duplicating stamper

Publications (1)

Publication Number Publication Date
JPH0273987A true JPH0273987A (en) 1990-03-13

Family

ID=16833493

Family Applications (1)

Application Number Title Priority Date Filing Date
JP22570488A Pending JPH0273987A (en) 1988-09-09 1988-09-09 Method for duplicating stamper

Country Status (1)

Country Link
JP (1) JPH0273987A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6221228B1 (en) 1997-12-03 2001-04-24 Seiko Instruments Inc. Part fabricating method and part fabricating apparatus
EP2242341A1 (en) * 2008-02-08 2010-10-20 Tokyo University Of Science Educational Foundation Administrative Organization Process for producing structure with metal film, mother die for use in the process, and structure produced by the process

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6221228B1 (en) 1997-12-03 2001-04-24 Seiko Instruments Inc. Part fabricating method and part fabricating apparatus
EP2242341A1 (en) * 2008-02-08 2010-10-20 Tokyo University Of Science Educational Foundation Administrative Organization Process for producing structure with metal film, mother die for use in the process, and structure produced by the process
EP2242341A4 (en) * 2008-02-08 2011-12-28 Univ Tokyo Sci Educ Found Process for producing structure with metal film, mother die for use in the process, and structure produced by the process
JP2014144639A (en) * 2008-02-08 2014-08-14 Tokyo Univ Of Science Method for producing structure having metal film, matrix used therefor, and structure produced thereby
US9332651B2 (en) 2008-02-08 2016-05-03 Tokyo University Of Science Foundation Process for producing structure with metal film, mother die for use in the process, and structure produced by the process

Similar Documents

Publication Publication Date Title
JP2000040268A (en) Manufacture of stamper, stamper obtained by carrying out such a method, as well as optical disk obtained by using such a stamper
JPH0273987A (en) Method for duplicating stamper
JPH02149691A (en) Making of metallic matrix
JP2005343115A (en) Preparation method of resist pattern, method of preparing elecroforming, and preparation method of mold
JPH0118996B2 (en)
JPH01301880A (en) Production of stamper for substrate of optical disk
JPH0230786A (en) Method for duplicating stamper
JPH01252793A (en) Duplicating method for stamper
JPH07241856A (en) Manufacture of electroformed duplicate stamper
JP3221627B2 (en) Manufacturing method of stamper for optical disk
JPH04259936A (en) Production of stamper for producing information recording medium
JPH03291392A (en) Method for electroforming electroformed master disk and electroformed master disk
JPS63266058A (en) Manufacture of stamper for optical disk
JPH02149952A (en) Production of stamper
JPH0250995A (en) Production of stamper for duplicating optical disk
JPS6028048A (en) Production of master stamper
JPS59173288A (en) Manufacture of electroformed mold
JPS60182031A (en) Information recording mother disk and its production
JPH09274744A (en) Production of metal master disk
JPH1153777A (en) Method for duplicating stamper
JP2517161B2 (en) Optical disc master and master stamper manufacturing method
JPH02290991A (en) Production of stamper
JPH03170690A (en) Device and method for electroforming stamper for reproducing optical disk
JP2901989B2 (en) Manufacturing method of duplication stamper
JPS6339162A (en) Production of stamper