JPH0257675B2 - - Google Patents
Info
- Publication number
- JPH0257675B2 JPH0257675B2 JP61305155A JP30515586A JPH0257675B2 JP H0257675 B2 JPH0257675 B2 JP H0257675B2 JP 61305155 A JP61305155 A JP 61305155A JP 30515586 A JP30515586 A JP 30515586A JP H0257675 B2 JPH0257675 B2 JP H0257675B2
- Authority
- JP
- Japan
- Prior art keywords
- plunger
- spring
- cone portion
- test probe
- cone
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000000523 sample Substances 0.000 claims description 33
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 description 6
- 238000010586 diagram Methods 0.000 description 5
- 238000003780 insertion Methods 0.000 description 3
- 230000037431 insertion Effects 0.000 description 3
- 230000000694 effects Effects 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 229910000906 Bronze Inorganic materials 0.000 description 1
- 229910000881 Cu alloy Inorganic materials 0.000 description 1
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 1
- 229910052790 beryllium Inorganic materials 0.000 description 1
- ATBAMAFKBVZNFJ-UHFFFAOYSA-N beryllium atom Chemical compound [Be] ATBAMAFKBVZNFJ-UHFFFAOYSA-N 0.000 description 1
- DMFGNRRURHSENX-UHFFFAOYSA-N beryllium copper Chemical compound [Be].[Cu] DMFGNRRURHSENX-UHFFFAOYSA-N 0.000 description 1
- 239000010974 bronze Substances 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- KUNSUQLRTQLHQQ-UHFFFAOYSA-N copper tin Chemical compound [Cu].[Sn] KUNSUQLRTQLHQQ-UHFFFAOYSA-N 0.000 description 1
- 239000007769 metal material Substances 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
- 238000005476 soldering Methods 0.000 description 1
- 238000010618 wire wrap Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06716—Elastic
- G01R1/06722—Spring-loaded
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06733—Geometry aspects
- G01R1/06738—Geometry aspects related to tip portion
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R11/00—Individual connecting elements providing two or more spaced connecting locations for conductive members which are, or may be, thereby interconnected, e.g. end pieces for wires or cables supported by the wire or cable and having means for facilitating electrical connection to some other wire, terminal, or conductive member, blocks of binding posts
- H01R11/11—End pieces or tapping pieces for wires, supported by the wire and for facilitating electrical connection to some other wire, terminal or conductive member
- H01R11/18—End pieces terminating in a probe
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Geometry (AREA)
- Measuring Leads Or Probes (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US06/811,707 US4636026A (en) | 1985-12-20 | 1985-12-20 | Electrical test probe |
US811707 | 1985-12-20 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS62157576A JPS62157576A (ja) | 1987-07-13 |
JPH0257675B2 true JPH0257675B2 (US06486227-20021126-C00005.png) | 1990-12-05 |
Family
ID=25207324
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP61305155A Granted JPS62157576A (ja) | 1985-12-20 | 1986-12-20 | テストプロ−ブ |
Country Status (5)
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2014135171A (ja) * | 2013-01-09 | 2014-07-24 | Fujitsu Semiconductor Ltd | 接触子及びコンタクタ |
Families Citing this family (45)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4897043A (en) * | 1986-06-23 | 1990-01-30 | Feinmetall Gmbh | Resilient contact pin |
DE3720229A1 (de) * | 1986-06-23 | 1988-01-07 | Feinmetall Gmbh | Federkonaktstift und verfahren zu seiner herstellung |
US4803424A (en) * | 1987-08-31 | 1989-02-07 | Augat Inc. | Short-wire bed-of-nails test fixture |
US4838801A (en) * | 1987-11-02 | 1989-06-13 | Augat Inc. | Leadless component socket |
US5038467A (en) * | 1989-11-09 | 1991-08-13 | Advanced Interconnections Corporation | Apparatus and method for installation of multi-pin components on circuit boards |
US5205742A (en) * | 1991-08-22 | 1993-04-27 | Augat Inc. | High density grid array test socket |
US5221209A (en) * | 1991-08-22 | 1993-06-22 | Augat Inc. | Modular pad array interface |
US5215472A (en) * | 1991-08-22 | 1993-06-01 | Augat Inc. | High density grid array socket |
JPH05182729A (ja) * | 1991-12-26 | 1993-07-23 | Yamaichi Electron Co Ltd | 電気部品用接触子 |
US5227718A (en) * | 1992-03-10 | 1993-07-13 | Virginia Panel Corporation | Double-headed spring contact probe assembly |
US5420519A (en) * | 1992-03-10 | 1995-05-30 | Virginia Panel Corporation | Double-headed spring contact probe assembly |
US5936421A (en) * | 1994-10-11 | 1999-08-10 | Virginia Panel Corporation | Coaxial double-headed spring contact probe assembly and coaxial surface contact for engagement therewith |
US5942906A (en) * | 1994-11-18 | 1999-08-24 | Virginia Panel Corporation | Interface system utilizing engagement mechanism |
US6244904B1 (en) | 1998-01-16 | 2001-06-12 | The Whitaker Corporation | Electrical connector for attaching conductors to speaker leads |
US6132245A (en) * | 1998-05-04 | 2000-10-17 | The Whitaker Corporation | Electrical connector for a speaker cabinet |
US6007369A (en) * | 1998-06-17 | 1999-12-28 | The Whitaker Corporation | Wire retention contact in an electrical connector |
JP2002530841A (ja) * | 1998-11-25 | 2002-09-17 | リカ エレクトロニクス インターナショナル インコーポレイテッド | 電気的接触装置 |
US6106316A (en) * | 1999-02-10 | 2000-08-22 | International Business Machines Corporation | Multistage connector for carriers with combined pin-array and pad-array |
JP2000323241A (ja) * | 1999-05-12 | 2000-11-24 | Honda Tsushin Kogyo Co Ltd | コネクタ |
US6506082B1 (en) * | 2001-12-21 | 2003-01-14 | Interconnect Devices, Inc. | Electrical contact interface |
US6688906B2 (en) | 2002-05-28 | 2004-02-10 | Agilent Technologies Inc. | Probes and methods for testing electrical circuits |
TW200536211A (en) * | 2004-04-16 | 2005-11-01 | Advanced Connection Tech Inc | Electric connector |
US7690925B2 (en) * | 2005-02-24 | 2010-04-06 | Advanced Interconnections Corp. | Terminal assembly with pin-retaining socket |
US7154286B1 (en) * | 2005-06-30 | 2006-12-26 | Interconnect Devices, Inc. | Dual tapered spring probe |
CN2833960Y (zh) * | 2005-09-30 | 2006-11-01 | 番禺得意精密电子工业有限公司 | 电连接器 |
TWM289241U (en) * | 2005-10-07 | 2006-04-01 | Lotes Co Ltd | Electric connector |
SG131790A1 (en) * | 2005-10-14 | 2007-05-28 | Tan Yin Leong | Probe for testing integrated circuit devices |
US7097485B1 (en) * | 2005-12-02 | 2006-08-29 | Advanced Connection Technology Inc. | Electrical connector having resilient conductive terminals |
US7300288B1 (en) * | 2006-08-21 | 2007-11-27 | Lotes Co., Ltd. | Electrical connector |
US7862391B2 (en) | 2007-09-18 | 2011-01-04 | Delaware Capital Formation, Inc. | Spring contact assembly |
WO2011013731A1 (ja) * | 2009-07-30 | 2011-02-03 | 株式会社ヨコオ | コンタクトプローブ及びソケット |
JP5624740B2 (ja) * | 2009-07-30 | 2014-11-12 | 株式会社ヨコオ | コンタクトプローブ及びソケット |
US7794237B1 (en) * | 2009-08-21 | 2010-09-14 | Hon Hai Precision Ind. Co., Ltd. | Electrical connector having improved retaining arrangement between the housing and the contacts |
US7927109B1 (en) | 2009-10-30 | 2011-04-19 | Hon Hai Precision Ind. Co., Ltd. | Electrical connector having plated conductive layer |
JP5647869B2 (ja) * | 2010-11-18 | 2015-01-07 | 株式会社エンプラス | 電気接触子及び電気部品用ソケット |
US8210855B1 (en) * | 2011-03-11 | 2012-07-03 | Cheng Uei Precision Industry Co., Ltd. | Electrical connector |
JP6013731B2 (ja) * | 2011-12-27 | 2016-10-25 | 株式会社エンプラス | コンタクトプローブおよびその製造方法 |
MY168237A (en) * | 2012-10-12 | 2018-10-15 | Jf Microtechnology Sdn Bhd | Ground contact of an integrated circuit testing apparatus |
US9172160B2 (en) | 2013-03-13 | 2015-10-27 | Intel Corporation | Vertical socket contact with flat force response |
US9853385B1 (en) | 2015-02-19 | 2017-12-26 | Ohio Associated Enterprises, Llc | Axial compliant compression electrical connector |
US10074923B1 (en) | 2015-02-19 | 2018-09-11 | Ohio Associated Enterprises, Llc | Axial compliant compression electrical connector |
DE102015004151B4 (de) | 2015-03-31 | 2022-01-27 | Feinmetall Gmbh | Verfahren zur Herstellung einer Federkontaktstift-Anordnung mit mehreren Federkontaktstiften |
US10476191B2 (en) | 2018-02-28 | 2019-11-12 | Ohio Associated Enterprises, Llc | Forked electrical contact pair with elastic tail |
US10431920B1 (en) * | 2018-04-17 | 2019-10-01 | John O. Tate | One-piece parallel multi-finger contact |
JP2020017428A (ja) * | 2018-07-26 | 2020-01-30 | 株式会社エンプラス | プローブピンおよびソケット |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2934738A (en) * | 1956-06-07 | 1960-04-26 | Cambridge Thermionic Corp | Electric meter probe |
US2894205A (en) * | 1957-01-08 | 1959-07-07 | Hewlett Packard Co | Probe assembly |
DE1756777U (de) * | 1957-09-28 | 1957-11-28 | Pertrix Union Gmbh | Elektrischer momentschalter. |
US3435168A (en) * | 1968-03-28 | 1969-03-25 | Pylon Co Inc | Electrical contact |
GB2008337B (en) * | 1977-11-18 | 1982-03-31 | Bicc Ltd | Electric contacts |
US4200351A (en) * | 1978-06-12 | 1980-04-29 | Everett/Charles, Inc. | Straight through electrical spring probe |
-
1985
- 1985-12-20 US US06/811,707 patent/US4636026A/en not_active Expired - Fee Related
-
1986
- 1986-10-30 CA CA000521782A patent/CA1241992A/en not_active Expired
- 1986-12-19 EP EP86402883A patent/EP0232653B1/en not_active Expired - Lifetime
- 1986-12-19 DE DE8686402883T patent/DE3679809D1/de not_active Expired - Fee Related
- 1986-12-20 JP JP61305155A patent/JPS62157576A/ja active Granted
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2014135171A (ja) * | 2013-01-09 | 2014-07-24 | Fujitsu Semiconductor Ltd | 接触子及びコンタクタ |
Also Published As
Publication number | Publication date |
---|---|
JPS62157576A (ja) | 1987-07-13 |
CA1241992A (en) | 1988-09-13 |
DE3679809D1 (de) | 1991-07-18 |
US4636026A (en) | 1987-01-13 |
EP0232653B1 (en) | 1991-06-12 |
EP0232653A1 (en) | 1987-08-19 |
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