JPH0245155B2 - - Google Patents

Info

Publication number
JPH0245155B2
JPH0245155B2 JP56147936A JP14793681A JPH0245155B2 JP H0245155 B2 JPH0245155 B2 JP H0245155B2 JP 56147936 A JP56147936 A JP 56147936A JP 14793681 A JP14793681 A JP 14793681A JP H0245155 B2 JPH0245155 B2 JP H0245155B2
Authority
JP
Japan
Prior art keywords
bridge circuit
voltage
resistors
circuit
continuity
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP56147936A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5850471A (ja
Inventor
Kaoru Kanda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SIGMA GIJUTSU KOGYO
Original Assignee
SIGMA GIJUTSU KOGYO
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SIGMA GIJUTSU KOGYO filed Critical SIGMA GIJUTSU KOGYO
Priority to JP56147936A priority Critical patent/JPS5850471A/ja
Publication of JPS5850471A publication Critical patent/JPS5850471A/ja
Publication of JPH0245155B2 publication Critical patent/JPH0245155B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/54—Testing for continuity

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Measurement Of Current Or Voltage (AREA)
JP56147936A 1981-09-21 1981-09-21 導通テスタ Granted JPS5850471A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56147936A JPS5850471A (ja) 1981-09-21 1981-09-21 導通テスタ

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56147936A JPS5850471A (ja) 1981-09-21 1981-09-21 導通テスタ

Publications (2)

Publication Number Publication Date
JPS5850471A JPS5850471A (ja) 1983-03-24
JPH0245155B2 true JPH0245155B2 (cs) 1990-10-08

Family

ID=15441407

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56147936A Granted JPS5850471A (ja) 1981-09-21 1981-09-21 導通テスタ

Country Status (1)

Country Link
JP (1) JPS5850471A (cs)

Also Published As

Publication number Publication date
JPS5850471A (ja) 1983-03-24

Similar Documents

Publication Publication Date Title
KR0168823B1 (ko) 전자 소자 테스트 및 리드 검사를 동시에 실행하는 시스템 및 방법
JPH0658974A (ja) 回路網検査装置及び方法
US5272445A (en) Resistance tester utilizing regulator circuits
JP3415681B2 (ja) インピーダンス測定装置
JPS6325572A (ja) 電位計増幅器の漏洩電流測定システム
EP0431034B1 (en) Circuit testing
JPH01502391A (ja) ケーブルの故障検出装置
JPH0245155B2 (cs)
US6563313B2 (en) Electronic device and manufacturing method thereof
CN114879009B (zh) 电容测量装置及电容测量方法
JP2730504B2 (ja) 試験用プローブピンの接触不良判断方法およびインサーキットテスタ
JP2580064Y2 (ja) 四端子測定回路
KR950007504Y1 (ko) 피씨비(pcb) 자동 검사기(ict) 핀 검색장치
JPS6244373Y2 (cs)
JPH05196678A (ja) 電気回路試験装置
JPS6241261Y2 (cs)
KR970022342A (ko) 반도체 장치의 테스트 장치
JPS629276A (ja) 半導体集積回路検査装置
CN120652164A (zh) 电容器的绝缘电阻检测系统
JPH07113850A (ja) 半導体集積回路
JP2000147071A (ja) アナログ回路の特性検査装置
JPH05273298A (ja) 半導体集積回路装置及びそのテスト方法
JPH0814591B2 (ja) 回路素子測定器の端子接続状態検出回路
JPS60138474A (ja) 電源電圧異常検知回路
JPH08105935A (ja) 半導体集積回路の検査装置